JP2002094061A - 半導体装置及びその製造方法 - Google Patents
半導体装置及びその製造方法Info
- Publication number
- JP2002094061A JP2002094061A JP2000279355A JP2000279355A JP2002094061A JP 2002094061 A JP2002094061 A JP 2002094061A JP 2000279355 A JP2000279355 A JP 2000279355A JP 2000279355 A JP2000279355 A JP 2000279355A JP 2002094061 A JP2002094061 A JP 2002094061A
- Authority
- JP
- Japan
- Prior art keywords
- conductivity type
- layer
- trench
- base layer
- type base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Insulated Gate Type Field-Effect Transistor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000279355A JP2002094061A (ja) | 2000-09-14 | 2000-09-14 | 半導体装置及びその製造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000279355A JP2002094061A (ja) | 2000-09-14 | 2000-09-14 | 半導体装置及びその製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2002094061A true JP2002094061A (ja) | 2002-03-29 |
| JP2002094061A5 JP2002094061A5 (enExample) | 2004-12-24 |
Family
ID=18764371
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000279355A Pending JP2002094061A (ja) | 2000-09-14 | 2000-09-14 | 半導体装置及びその製造方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2002094061A (enExample) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005072356A (ja) * | 2003-08-26 | 2005-03-17 | Sanyo Electric Co Ltd | 絶縁ゲート型電界効果半導体装置およびその製造方法 |
| US7064384B2 (en) | 2002-09-02 | 2006-06-20 | Kabushiki Kaisha Toshiba | Semiconductor device |
| CN1309093C (zh) * | 2002-12-03 | 2007-04-04 | 株式会社东芝 | 半导体器件 |
| US7227225B2 (en) | 2003-04-23 | 2007-06-05 | Kabushiki Kaisha Toshiba | Semiconductor device having a vertical MOS trench gate structure |
| JP2011055017A (ja) * | 2010-12-17 | 2011-03-17 | Toshiba Corp | 半導体装置 |
| JP2012195367A (ja) * | 2011-03-15 | 2012-10-11 | Toyota Central R&D Labs Inc | 半導体装置とその製造方法 |
-
2000
- 2000-09-14 JP JP2000279355A patent/JP2002094061A/ja active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7064384B2 (en) | 2002-09-02 | 2006-06-20 | Kabushiki Kaisha Toshiba | Semiconductor device |
| CN1309093C (zh) * | 2002-12-03 | 2007-04-04 | 株式会社东芝 | 半导体器件 |
| US7227225B2 (en) | 2003-04-23 | 2007-06-05 | Kabushiki Kaisha Toshiba | Semiconductor device having a vertical MOS trench gate structure |
| JP2005072356A (ja) * | 2003-08-26 | 2005-03-17 | Sanyo Electric Co Ltd | 絶縁ゲート型電界効果半導体装置およびその製造方法 |
| JP2011055017A (ja) * | 2010-12-17 | 2011-03-17 | Toshiba Corp | 半導体装置 |
| JP2012195367A (ja) * | 2011-03-15 | 2012-10-11 | Toyota Central R&D Labs Inc | 半導体装置とその製造方法 |
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Legal Events
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