JP2001516017A - 波長及び角感度を有する略垂直入射式光学的検定方法及びシステム - Google Patents

波長及び角感度を有する略垂直入射式光学的検定方法及びシステム

Info

Publication number
JP2001516017A
JP2001516017A JP2000510008A JP2000510008A JP2001516017A JP 2001516017 A JP2001516017 A JP 2001516017A JP 2000510008 A JP2000510008 A JP 2000510008A JP 2000510008 A JP2000510008 A JP 2000510008A JP 2001516017 A JP2001516017 A JP 2001516017A
Authority
JP
Japan
Prior art keywords
sensor
angle
angles
light
abnormal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000510008A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001516017A5 (enExample
Inventor
ウィリアム・エイ・チャレナー・ザ・フォース
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GlassBridge Enterprises Inc
Original Assignee
Imation Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Imation Corp filed Critical Imation Corp
Publication of JP2001516017A publication Critical patent/JP2001516017A/ja
Publication of JP2001516017A5 publication Critical patent/JP2001516017A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/7703—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
    • G01N21/774—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides the reagent being on a grating or periodic structure
    • G01N21/7743—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides the reagent being on a grating or periodic structure the reagent-coated grating coupling light in or out of the waveguide
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S436/00—Chemistry: analytical and immunological testing
    • Y10S436/805—Optical property
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S436/00—Chemistry: analytical and immunological testing
    • Y10S436/806—Electrical property or magnetic property
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S436/00—Chemistry: analytical and immunological testing
    • Y10S436/807—Apparatus included in process claim, e.g. physical support structures

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2000510008A 1997-08-20 1998-08-18 波長及び角感度を有する略垂直入射式光学的検定方法及びシステム Pending JP2001516017A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/915,057 US5955378A (en) 1997-08-20 1997-08-20 Near normal incidence optical assaying method and system having wavelength and angle sensitivity
US08/915,057 1997-08-20
PCT/US1998/017084 WO1999009392A2 (en) 1997-08-20 1998-08-18 Near normal incidence optical assaying method and system having wavelength and angle sensitivity

Publications (2)

Publication Number Publication Date
JP2001516017A true JP2001516017A (ja) 2001-09-25
JP2001516017A5 JP2001516017A5 (enExample) 2006-01-05

Family

ID=25435145

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000510008A Pending JP2001516017A (ja) 1997-08-20 1998-08-18 波長及び角感度を有する略垂直入射式光学的検定方法及びシステム

Country Status (5)

Country Link
US (2) US5955378A (enExample)
EP (1) EP1005634B1 (enExample)
JP (1) JP2001516017A (enExample)
DE (1) DE69821242T2 (enExample)
WO (1) WO1999009392A2 (enExample)

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JP2008544226A (ja) * 2005-08-08 2008-12-04 エス アール ユー バイオシステムズ，インコーポレイテッド 生体分子センサーの標的領域の画像を形成させるための方法と装置

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JP4866903B2 (ja) * 2005-08-08 2012-02-01 エス アール ユー バイオシステムズ，インコーポレイテッド 生体分子センサーの標的領域の画像を形成させるための方法と装置

Also Published As

Publication number Publication date
DE69821242T2 (de) 2004-11-04
WO1999009392A2 (en) 1999-02-25
EP1005634B1 (en) 2004-01-21
US6100991A (en) 2000-08-08
EP1005634A2 (en) 2000-06-07
WO1999009392A3 (en) 1999-06-03
DE69821242D1 (de) 2004-02-26
US5955378A (en) 1999-09-21

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