JP2001512230A5 - - Google Patents

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Publication number
JP2001512230A5
JP2001512230A5 JP2000505482A JP2000505482A JP2001512230A5 JP 2001512230 A5 JP2001512230 A5 JP 2001512230A5 JP 2000505482 A JP2000505482 A JP 2000505482A JP 2000505482 A JP2000505482 A JP 2000505482A JP 2001512230 A5 JP2001512230 A5 JP 2001512230A5
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JP
Japan
Prior art keywords
probe tip
driving force
probe
microscope
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000505482A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001512230A (ja
JP4314328B2 (ja
Filing date
Publication date
Priority claimed from US08/905,815 external-priority patent/US5983712A/en
Application filed filed Critical
Publication of JP2001512230A publication Critical patent/JP2001512230A/ja
Publication of JP2001512230A5 publication Critical patent/JP2001512230A5/ja
Application granted granted Critical
Publication of JP4314328B2 publication Critical patent/JP4314328B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2000505482A 1997-08-04 1998-07-27 コンプライアンス測定用顕微鏡 Expired - Fee Related JP4314328B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/905,815 1997-08-04
US08/905,815 US5983712A (en) 1994-05-19 1997-08-04 Microscope for compliance measurement
PCT/US1998/015498 WO1999006793A1 (en) 1997-08-04 1998-07-27 Microscope for compliance measurement

Publications (3)

Publication Number Publication Date
JP2001512230A JP2001512230A (ja) 2001-08-21
JP2001512230A5 true JP2001512230A5 (enExample) 2006-02-09
JP4314328B2 JP4314328B2 (ja) 2009-08-12

Family

ID=25421523

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000505482A Expired - Fee Related JP4314328B2 (ja) 1997-08-04 1998-07-27 コンプライアンス測定用顕微鏡

Country Status (5)

Country Link
US (1) US5983712A (enExample)
EP (1) EP1002216B1 (enExample)
JP (1) JP4314328B2 (enExample)
DE (1) DE69819008T2 (enExample)
WO (1) WO1999006793A1 (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2145055C1 (ru) * 1999-02-08 2000-01-27 Ао "Автэкс" Способ сбора и обработки информации о поверхности образца
US6377066B1 (en) * 1999-07-09 2002-04-23 Mfi Technologies Corporation Method and apparatus for sub-micron imaging and probing on probe station
US6188322B1 (en) * 1999-09-28 2001-02-13 Rockwell Technologies, Llc Method for sensing electrical current
FR2807162B1 (fr) * 2000-03-31 2002-06-28 Inst Curie Sonde d'analyse de surface pour un microscope a force atomique et microscope a force atomique la comportant
EP1197726A1 (en) * 2000-10-04 2002-04-17 Eidgenössische Technische Hochschule Zürich Multipurpose Sensor and cantilever for it
US6989075B1 (en) 2000-11-03 2006-01-24 The Procter & Gamble Company Tension activatable substrate
US6734438B1 (en) 2001-06-14 2004-05-11 Molecular Imaging Corporation Scanning probe microscope and solenoid driven cantilever assembly
EP1428236A4 (en) * 2001-06-21 2009-08-26 Honeywell Int Inc SOLENOID ACTUATOR WITH INDEPENDENT FORCE OF THE POSITION
US8252316B2 (en) 2002-05-03 2012-08-28 Purepharm Inc. Method of topically applying glycopyrrolate solution using absorbent pad to reduce sweating
CA2384922C (en) * 2002-05-03 2008-09-02 Purepharm Inc. Topical glycopyrrolate product for the reduction of sweating
WO2005008679A1 (en) 2003-07-15 2005-01-27 University Of Bristol Probe for an atomic force microscope
US7146282B1 (en) * 2005-05-06 2006-12-05 Wisconsin Alumni Research Foundation Mechanical force detection of magnetic fields using heterodyne demodulation
JP5046039B2 (ja) * 2008-04-16 2012-10-10 エスアイアイ・ナノテクノロジー株式会社 液中観察用センサ及び液中観察装置
JP5654477B2 (ja) * 2008-12-11 2015-01-14 インフィニテシマ・リミテッド 動的なプローブ検出システム
EP2831600B1 (en) * 2012-03-27 2017-07-19 Hysitron, Inc. Microscope objective mechanical testing instrument
US8973161B2 (en) * 2012-06-22 2015-03-03 Rutgers, The State University Of New Jersey Method and apparatus for nanomechanical measurement using an atomic force microscope
WO2017123779A1 (en) 2016-01-12 2017-07-20 Stuart Lindsay Porous material functionalized nanopore for molecular sensing apparatus
US10073057B2 (en) * 2016-06-14 2018-09-11 Universidad De Santiago De Chile Micro magnetic trap and process for evaluating forces with pico Newton resolution
CN107193008A (zh) * 2017-07-25 2017-09-22 安徽大学 一种超声波测距装置及方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5224376A (en) * 1989-12-08 1993-07-06 Digital Instruments, Inc. Atomic force microscope
US5237859A (en) * 1989-12-08 1993-08-24 Digital Instruments, Inc. Atomic force microscope
US5266896A (en) * 1992-06-09 1993-11-30 International Business Machines Corporation Mechanical detection and imaging of magnetic resonance by magnetic moment modulation
JP2743761B2 (ja) * 1993-03-19 1998-04-22 松下電器産業株式会社 走査型プローブ顕微鏡および原子種同定方法
US5461907A (en) * 1993-03-23 1995-10-31 Regents Of The University Of California Imaging, cutting, and collecting instrument and method
US5406832A (en) * 1993-07-02 1995-04-18 Topometrix Corporation Synchronous sampling scanning force microscope
JP3076889B2 (ja) * 1993-09-02 2000-08-14 セイコーインスツルメンツ株式会社 磁気力顕微鏡
US5513518A (en) * 1994-05-19 1996-05-07 Molecular Imaging Corporation Magnetic modulation of force sensor for AC detection in an atomic force microscope
US5515719A (en) * 1994-05-19 1996-05-14 Molecular Imaging Corporation Controlled force microscope for operation in liquids

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