JP2001349787A - 赤外線検出素子および測温計 - Google Patents

赤外線検出素子および測温計

Info

Publication number
JP2001349787A
JP2001349787A JP2000169693A JP2000169693A JP2001349787A JP 2001349787 A JP2001349787 A JP 2001349787A JP 2000169693 A JP2000169693 A JP 2000169693A JP 2000169693 A JP2000169693 A JP 2000169693A JP 2001349787 A JP2001349787 A JP 2001349787A
Authority
JP
Japan
Prior art keywords
temperature
infrared
thermopile
detecting element
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000169693A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001349787A5 (https=
Inventor
Shigemi Sato
茂美 佐藤
Osamu Iwamoto
修 岩本
Yasuhiro Shiobara
康弘 塩原
Yuji Oda
裕二 織田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP2000169693A priority Critical patent/JP2001349787A/ja
Priority to TW090112952A priority patent/TWI242075B/zh
Priority to DE60117929T priority patent/DE60117929T2/de
Priority to CN01120877A priority patent/CN1328251A/zh
Priority to EP01304921A priority patent/EP1162440B1/en
Priority to US09/875,343 priority patent/US6565254B2/en
Publication of JP2001349787A publication Critical patent/JP2001349787A/ja
Publication of JP2001349787A5 publication Critical patent/JP2001349787A5/ja
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/04Casings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/021Probe covers for thermometers, e.g. tympanic thermometers; Containers for probe covers; Disposable probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/0225Shape of the cavity itself or of elements contained in or suspended over the cavity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/04Casings
    • G01J5/041Mountings in enclosures or in a particular environment
    • G01J5/045Sealings; Vacuum enclosures; Encapsulated packages; Wafer bonding structures; Getter arrangements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/04Casings
    • G01J5/048Protective parts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/04Casings
    • G01J5/049Casings for tympanic thermometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/05Means for preventing contamination of the components of the optical system; Means for preventing obstruction of the radiation path
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0801Means for wavelength selection or discrimination
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0806Focusing or collimating elements, e.g. lenses or concave mirrors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0818Waveguides
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/12Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/12Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
    • G01J5/14Electrical features thereof
    • G01J5/16Arrangements with respect to the cold junction; Compensating influence of ambient temperature or other variables
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/70Passive compensation of pyrometer measurements, e.g. using ambient temperature sensing or sensing of temperature within housing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Measuring And Recording Apparatus For Diagnosis (AREA)
JP2000169693A 2000-06-06 2000-06-06 赤外線検出素子および測温計 Pending JP2001349787A (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2000169693A JP2001349787A (ja) 2000-06-06 2000-06-06 赤外線検出素子および測温計
TW090112952A TWI242075B (en) 2000-06-06 2001-05-29 Infrared detecting element and temperature detecting means
DE60117929T DE60117929T2 (de) 2000-06-06 2001-06-05 Infrarotdetektorelement und Temperaturmessgerät
CN01120877A CN1328251A (zh) 2000-06-06 2001-06-05 红外线检测元件及温度测定装置
EP01304921A EP1162440B1 (en) 2000-06-06 2001-06-05 Infrared sensing element and temperature measuring device
US09/875,343 US6565254B2 (en) 2000-06-06 2001-06-06 Infrared sensing element and temperature measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000169693A JP2001349787A (ja) 2000-06-06 2000-06-06 赤外線検出素子および測温計

Publications (2)

Publication Number Publication Date
JP2001349787A true JP2001349787A (ja) 2001-12-21
JP2001349787A5 JP2001349787A5 (https=) 2005-02-24

Family

ID=18672516

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000169693A Pending JP2001349787A (ja) 2000-06-06 2000-06-06 赤外線検出素子および測温計

Country Status (6)

Country Link
US (1) US6565254B2 (https=)
EP (1) EP1162440B1 (https=)
JP (1) JP2001349787A (https=)
CN (1) CN1328251A (https=)
DE (1) DE60117929T2 (https=)
TW (1) TWI242075B (https=)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003344156A (ja) * 2002-05-31 2003-12-03 Murata Mfg Co Ltd 赤外線センサおよびそれを用いた電子装置
JP2008528987A (ja) * 2005-01-26 2008-07-31 アナログ・デバイシズ・インコーポレーテッド センサ
JP2009189784A (ja) * 2008-02-18 2009-08-27 Fortune Semiconductor Corp 温度センサーモジュール
KR101137090B1 (ko) * 2003-09-09 2012-04-19 브라운 게엠베하 가열 가능한 적외선 센서와 이 적외선 센서를 구비하는 적외선 온도계
JP2015190833A (ja) * 2014-03-28 2015-11-02 セイコーエプソン株式会社 回路装置、温度検出装置、電子機器及び温度検出方法

Families Citing this family (78)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7456750B2 (en) * 2000-04-19 2008-11-25 Federal Express Corporation Fire suppression and indicator system and fire detection device
EP1302761B1 (en) * 2000-06-13 2014-08-06 Omron Healthcare Co., Ltd. Pyrometer
US6713669B2 (en) * 2000-10-19 2004-03-30 Murata Manufacturing Co., Ltd. Thermoelectric conversion component
DE10321649A1 (de) * 2003-05-13 2004-12-02 Heimann Sensor Gmbh Infrarotsensor mit Signalverarbeitung
US7131766B2 (en) * 2003-07-16 2006-11-07 Delphi Technologies, Inc. Temperature sensor apparatus and method
US7351974B2 (en) * 2003-09-05 2008-04-01 Authentec, Inc. Integrated circuit infrared sensor and associated methods
JP2005208009A (ja) * 2004-01-26 2005-08-04 Denso Corp 赤外線検知式ガスセンサ
DE102004030418A1 (de) * 2004-06-24 2006-01-19 Robert Bosch Gmbh Mikrostrukturierter Infrarot-Sensor und ein Verfahren zu seiner Herstellung
JP2006105651A (ja) * 2004-10-01 2006-04-20 Ishizuka Electronics Corp サーモパイル素子及びそれを用いた赤外線センサ
US20060262829A1 (en) * 2005-05-17 2006-11-23 Manlove Gregory J Infrared temperature sensing device
DE102005039764B4 (de) * 2005-08-23 2018-10-25 Robert Bosch Gmbh Verfahren zur Herstellung einer thermischen Kopplung
US7810577B2 (en) * 2005-08-30 2010-10-12 Federal Express Corporation Fire sensor, fire detection system, fire suppression system, and combinations thereof
DE102005041050B4 (de) * 2005-08-30 2007-09-06 Perkinelmer Optoelectronics Gmbh & Co.Kg Verfahren und Vorrichtung zur Korrektur des Ausgangssignals eines Strahlungssensors und zur Messung von Strahlung
US8476591B2 (en) 2005-09-21 2013-07-02 Analog Devices, Inc. Radiation sensor device and method
US7897920B2 (en) * 2005-09-21 2011-03-01 Analog Devices, Inc. Radiation sensor device and method
DE602007006448D1 (de) 2006-03-22 2010-06-24 Federal Express Corp Feuerlöschvorrichtung und verfahren mit blähmittel
JP5053674B2 (ja) * 2007-03-26 2012-10-17 テルモ株式会社 耳式体温計
TWI355484B (en) * 2007-12-14 2012-01-01 Ind Tech Res Inst Apparatus and method for measuring character and c
KR20090085368A (ko) * 2008-02-04 2009-08-07 엘지전자 주식회사 공기조화기 및 그 제어방법
KR20090085895A (ko) * 2008-02-05 2009-08-10 엘지전자 주식회사 공기조화기 및 그 제어방법
CA2717860C (en) 2008-03-07 2016-11-08 Milwaukee Electric Tool Corporation Battery pack for use with a power tool and a non-motorized sensing tool
US20090257469A1 (en) * 2008-04-09 2009-10-15 Jones Mike N Infrared thermometer
WO2009129198A1 (en) * 2008-04-15 2009-10-22 Analog Devices, Inc. Wafer level csp sensor
JP5321595B2 (ja) * 2008-10-15 2013-10-23 株式会社村田製作所 熱センサ、非接触温度計装置、及び非接触温度測定方法
IL201915A0 (en) * 2009-11-04 2010-11-30 Lior Segal Warm body presence portable detection device and method
WO2011117716A2 (en) * 2010-03-22 2011-09-29 Scannanotek Oy Mems solar cell device and array
US8304851B2 (en) 2010-03-30 2012-11-06 Texas Instruments Incorporated Semiconductor thermocouple and sensor
DE102010013661A1 (de) * 2010-04-01 2011-10-06 Perkinelmer Technologies Gmbh & Co. Kg Strahlungssensor
US8436304B2 (en) * 2010-09-09 2013-05-07 Texas Instruments Incorporated Infrared light transmissivity for a membrane sensor
US9494471B2 (en) 2010-11-29 2016-11-15 Ophir Optronics Solutions Ltd. Fast response thermopile power sensor
CN102564601A (zh) * 2010-12-22 2012-07-11 精工爱普生株式会社 热式光检测装置、电子设备、热式光检测器及其制造方法
US9170158B2 (en) * 2010-12-30 2015-10-27 Exergen Corporation Infrared sensor and method for electrical monitoring
US8441093B2 (en) * 2011-04-15 2013-05-14 Excelitas Technologies Singapore Pte. Ltd. Shared membrane thermopile sensor array
US8899828B2 (en) * 2012-03-22 2014-12-02 Texas Instruments Incorporated Heat sensor correction
GB2523016B (en) * 2012-12-06 2016-12-28 Halliburton Energy Services Inc Method and apparatus for improving temperature measurement in a density sensor
JP6137536B2 (ja) * 2013-04-26 2017-05-31 日本電産リード株式会社 基板検査装置、及び基板検査方法
CZ306835B6 (cs) * 2013-06-17 2017-08-02 VladimĂ­r Burlak Vícesměrné snímání světla různé vlnové délky
US9207120B2 (en) * 2013-07-15 2015-12-08 The Boeing Company Systems and methods for detecting multiple infrared bands
US20150021465A1 (en) 2013-07-16 2015-01-22 Leeo, Inc. Electronic device with environmental monitoring
US9116137B1 (en) 2014-07-15 2015-08-25 Leeo, Inc. Selective electrical coupling based on environmental conditions
GB2521474A (en) * 2013-12-22 2015-06-24 Melexis Technologies Nv Infrared thermal sensor with beams having different widths
JP6256690B2 (ja) * 2014-02-26 2018-01-10 三菱マテリアル株式会社 非接触温度センサ
GB2527348A (en) * 2014-06-19 2015-12-23 Melexis Technologies Nv Infrared sensor with sensor temperature compensation
US9372477B2 (en) 2014-07-15 2016-06-21 Leeo, Inc. Selective electrical coupling based on environmental conditions
US8967855B1 (en) 2014-08-20 2015-03-03 Leeo, Inc. Electronic device for determining external temperature
WO2016028295A1 (en) * 2014-08-20 2016-02-25 Leeo, Inc. Electronic device for determining external temperature
US9092060B1 (en) 2014-08-27 2015-07-28 Leeo, Inc. Intuitive thermal user interface
US10043211B2 (en) 2014-09-08 2018-08-07 Leeo, Inc. Identifying fault conditions in combinations of components
US10026304B2 (en) 2014-10-20 2018-07-17 Leeo, Inc. Calibrating an environmental monitoring device
US9445451B2 (en) 2014-10-20 2016-09-13 Leeo, Inc. Communicating arbitrary attributes using a predefined characteristic
FR3030889B1 (fr) * 2014-12-19 2017-01-27 Commissariat Energie Atomique Capteur differentiel de temperature.
US10139285B2 (en) 2014-12-23 2018-11-27 Advanced Energy Industries, Inc. Fully-differential amplification for pyrometry
CN106137150B (zh) * 2015-03-26 2019-12-10 原相科技股份有限公司 具有复合感测功能的穿戴式装置
US9801013B2 (en) 2015-11-06 2017-10-24 Leeo, Inc. Electronic-device association based on location duration
US10805775B2 (en) 2015-11-06 2020-10-13 Jon Castor Electronic-device detection and activity association
TWI642915B (zh) * 2015-12-24 2018-12-01 美商先驅能源工業公司 高溫計系統、用於在一高溫計中放大一光學信號之全差分放大電路和操作一全差分雙放大電路之方法
CN106959165B (zh) * 2016-01-08 2019-07-16 上海新微技术研发中心有限公司 一种单芯片温度分布探测传感器
GB2551397B (en) 2016-06-17 2020-03-25 X Fab Semiconductor Foundries Gmbh Thermopile Test Structure And Methods Employing Same
US10439092B2 (en) * 2016-07-12 2019-10-08 Mitsubishi Electric Corporation Infrared ray detection element and method for manufacturing infrared ray detection element
US10351521B2 (en) 2016-09-01 2019-07-16 Exxonmobil Chemical Patents Inc. Alkylaromatic sulfonate compositions from mixed hydrocarbons
US10435359B2 (en) 2016-09-01 2019-10-08 Exxonmobil Chemical Patents Inc. Alkylaromatic sulfonate compositions from mixed hydrocarbons
US10351520B2 (en) 2016-09-01 2019-07-16 Exxonmobil Chemical Patents Inc. Alkylaromatic sulfonate compositions from mixed hydrocarbons
US10132861B2 (en) * 2016-09-16 2018-11-20 Qualcomm Incorporated Visible laser circuit fault isolation
JP6681594B2 (ja) * 2016-11-30 2020-04-15 パナソニックIpマネジメント株式会社 赤外線検出装置
US10203252B2 (en) 2016-12-29 2019-02-12 Industrial Technology Research Institute Microelectromechanical apparatus having a measuring range selector
DE102017113259A1 (de) * 2017-06-16 2018-12-20 Healy International Ag Vorrichtung zur Erzeugung von elektrischen, magnetischen und/oder elektromagnetischen Signalen zur Behandlung des menschlichen Körpers sowie Verfahren zum Betreiben einer solchen Vorrichtung
CN107389226B (zh) * 2017-07-19 2023-07-25 中国科学院西北生态环境资源研究院 一种基于热流密度的冻土地区热管工况数据检测装置
CN109060060B (zh) * 2018-09-04 2020-05-08 宁夏隆基宁光仪表股份有限公司 一种基于温度补偿的燃气计量方法及装置
CN112113664A (zh) * 2019-06-19 2020-12-22 孙春元 红外温度传感器及包括其的探头、红外体温计
CN211435072U (zh) * 2019-07-19 2020-09-08 陈国平 红外体温测试公仔
DE102019119917B4 (de) * 2019-07-23 2025-02-06 Elmos Semiconductor Se Silizidierte Testvorrichtung und Testverfahren für metalllagenfreies Thermopaar in einer Ebene eines CMOS-Stapels
US10849538B1 (en) * 2020-04-24 2020-12-01 Covidien Lp Sensor verification through forward voltage measurements
DE112021005274T5 (de) 2020-10-07 2023-10-12 Ophir Optronics Solutions Ltd. Thermosäulen-Lasersensor mit Reaktionszeitbeschleunigung und Verfahren zur Verwendung und Herstellung
CN112729567A (zh) * 2020-12-15 2021-04-30 上海格斐特传感技术有限公司 一种新型红外热电堆传感器芯片及制备方法
CN114910183B (zh) * 2022-03-28 2023-06-23 电子科技大学 原子层热电堆热流传感器及制备方法
CN114759062B (zh) * 2022-04-01 2024-06-21 中国电子科技集团公司第四十一研究所 一种热偶式高灵敏度微波功率传感芯片及传感器
TW202509439A (zh) 2022-11-18 2025-03-01 薩摩亞商悅迅投資有限公司 感測晶片、量測晶片、量測系統及其相關方法與電腦程式產品
DE102023134153B3 (de) * 2023-12-06 2025-02-06 Tdk Electronics Ag Sensorelement und Verfahren zur Herstellung eines Sensorelements

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4111717A (en) * 1977-06-29 1978-09-05 Leeds & Northrup Company Small-size high-performance radiation thermopile
JPS57113332A (en) * 1980-12-30 1982-07-14 Horiba Ltd Compensating thermopile detector
US4722612A (en) * 1985-09-04 1988-02-02 Wahl Instruments, Inc. Infrared thermometers for minimizing errors associated with ambient temperature transients
US6219573B1 (en) * 1989-04-14 2001-04-17 Exergen Corporation Radiation detector probe
DE4102524C2 (de) * 1990-01-30 2000-05-25 Citizen Watch Co Ltd Infrarotsensor
US5150969A (en) * 1990-03-12 1992-09-29 Ivac Corporation System and method for temperature determination and calibration in a biomedical probe
JP3184659B2 (ja) * 1993-04-01 2001-07-09 テルモ株式会社 体温計
JPH0743215A (ja) * 1993-05-24 1995-02-14 Mitsubishi Electric Corp 赤外線検知素子
CN1168623A (zh) * 1994-02-28 1997-12-24 伊康诺梅逊公司 红外鼓膜温度计
US5695283A (en) * 1994-07-01 1997-12-09 Wahl Instruments, Inc. Compensating infrared thermopile detector
KR100205384B1 (ko) * 1997-03-14 1999-07-01 구자홍 적외선 센서 및 그의 온도 보상방법
DE19710946A1 (de) * 1997-03-15 1998-09-24 Braun Ag Thermopile-Sensor und Strahlungsthermometer mit einem Thermopile-Sensor
JP3580126B2 (ja) * 1998-03-12 2004-10-20 オムロン株式会社 赤外線センサ
EP0999437A1 (en) * 1998-11-06 2000-05-10 Opto Tech Corporation Apparatus for measuring internal body temperature utilizing infrared emissions
US6348650B1 (en) * 1999-03-24 2002-02-19 Ishizuka Electronics Corporation Thermopile infrared sensor and process for producing the same

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003344156A (ja) * 2002-05-31 2003-12-03 Murata Mfg Co Ltd 赤外線センサおよびそれを用いた電子装置
US7005642B2 (en) 2002-05-31 2006-02-28 Murata Manufacturing Co., Ltd. Infrared sensor and electronic device using the same
KR101137090B1 (ko) * 2003-09-09 2012-04-19 브라운 게엠베하 가열 가능한 적외선 센서와 이 적외선 센서를 구비하는 적외선 온도계
JP2008528987A (ja) * 2005-01-26 2008-07-31 アナログ・デバイシズ・インコーポレーテッド センサ
JP2009189784A (ja) * 2008-02-18 2009-08-27 Fortune Semiconductor Corp 温度センサーモジュール
JP2015190833A (ja) * 2014-03-28 2015-11-02 セイコーエプソン株式会社 回路装置、温度検出装置、電子機器及び温度検出方法

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EP1162440B1 (en) 2006-03-15
DE60117929T2 (de) 2006-10-26
TWI242075B (en) 2005-10-21
DE60117929D1 (de) 2006-05-11
US20020037026A1 (en) 2002-03-28
CN1328251A (zh) 2001-12-26
EP1162440A1 (en) 2001-12-12

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