JP2001297730A5 - - Google Patents

Download PDF

Info

Publication number
JP2001297730A5
JP2001297730A5 JP2000118489A JP2000118489A JP2001297730A5 JP 2001297730 A5 JP2001297730 A5 JP 2001297730A5 JP 2000118489 A JP2000118489 A JP 2000118489A JP 2000118489 A JP2000118489 A JP 2000118489A JP 2001297730 A5 JP2001297730 A5 JP 2001297730A5
Authority
JP
Japan
Prior art keywords
ions
ring electrode
ion trap
accelerating
flight
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000118489A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001297730A (ja
JP3855593B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2000118489A priority Critical patent/JP3855593B2/ja
Priority claimed from JP2000118489A external-priority patent/JP3855593B2/ja
Publication of JP2001297730A publication Critical patent/JP2001297730A/ja
Publication of JP2001297730A5 publication Critical patent/JP2001297730A5/ja
Application granted granted Critical
Publication of JP3855593B2 publication Critical patent/JP3855593B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2000118489A 2000-04-14 2000-04-14 質量分析装置 Expired - Fee Related JP3855593B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000118489A JP3855593B2 (ja) 2000-04-14 2000-04-14 質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000118489A JP3855593B2 (ja) 2000-04-14 2000-04-14 質量分析装置

Publications (3)

Publication Number Publication Date
JP2001297730A JP2001297730A (ja) 2001-10-26
JP2001297730A5 true JP2001297730A5 (de) 2005-07-14
JP3855593B2 JP3855593B2 (ja) 2006-12-13

Family

ID=18629616

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000118489A Expired - Fee Related JP3855593B2 (ja) 2000-04-14 2000-04-14 質量分析装置

Country Status (1)

Country Link
JP (1) JP3855593B2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE60217458T2 (de) * 2001-11-22 2007-04-19 Micromass Uk Ltd. Massenspektrometer und Verfahren
JP3752470B2 (ja) * 2002-05-30 2006-03-08 株式会社日立ハイテクノロジーズ 質量分析装置
JP2004259452A (ja) * 2003-02-24 2004-09-16 Hitachi High-Technologies Corp 質量分析装置及び質量分析方法
US7064319B2 (en) 2003-03-31 2006-06-20 Hitachi High-Technologies Corporation Mass spectrometer
JP4653972B2 (ja) 2004-06-11 2011-03-16 株式会社日立ハイテクノロジーズ イオントラップ／飛行時間型質量分析装置および質量分析方法
JP4649234B2 (ja) * 2004-07-07 2011-03-09 日本電子株式会社 垂直加速型飛行時間型質量分析計
JP4802032B2 (ja) * 2006-04-14 2011-10-26 日本電子株式会社 タンデム型質量分析装置
GB2439107B (en) * 2006-06-16 2011-12-14 Kratos Analytical Ltd Method and apparatus for thermalization of ions
GB201118270D0 (en) 2011-10-21 2011-12-07 Shimadzu Corp TOF mass analyser with improved resolving power
US9236231B2 (en) 2012-05-18 2016-01-12 Dh Technologies Development Pte. Ltd. Modulation of instrument resolution dependant upon the complexity of a previous scan
GB2563571B (en) * 2017-05-26 2023-05-24 Micromass Ltd Time of flight mass analyser with spatial focussing
WO2019030477A1 (en) 2017-08-06 2019-02-14 Anatoly Verenchikov ACCELERATOR FOR MASS SPECTROMETERS WITH MULTIPASSES
US11239067B2 (en) 2017-08-06 2022-02-01 Micromass Uk Limited Ion mirror for multi-reflecting mass spectrometers
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB2576745B (en) * 2018-08-30 2022-11-02 Brian Hoyes John Pulsed accelerator for time of flight mass spectrometers
US11496091B2 (en) 2019-08-27 2022-11-08 Manufacturing Resources International, Inc. Electronic display assemblies with solar panels

Similar Documents

Publication Publication Date Title
JP2001297730A5 (de)
JP4649234B2 (ja) 垂直加速型飛行時間型質量分析計
JP5862791B2 (ja) 飛行時間型質量分析装置
JP4877327B2 (ja) 質量分析装置
CA2293483A1 (en) Hybrid ion mobility and mass spectrometer
WO2012024468A3 (en) Time-of-flight mass spectrometer with accumulating electron impact ion source
JP5637299B2 (ja) 飛行時間型質量分析装置
EP1467398A3 (de) Massenspektrometer.
US8791408B2 (en) Methods and apparatuses for producing mass spectrum data
WO2006120428A3 (en) Reflectron
WO2006086585A3 (en) Ion sources for mass spectrometry
CA2227806A1 (en) Spectrometer provided with pulsed ion source and transmission device to damp ion motion and method of use
JP3855593B2 (ja) 質量分析装置
US8354635B2 (en) Mass spectrometer
CN108538700A (zh) 一种质子转移反应离子源、质谱仪及其检测方法
WO2004108257A3 (en) Mass spectrometer and related ionizer and methods
WO2016103339A1 (ja) 飛行時間型質量分析装置
WO2006098230A1 (ja) 質量分析装置
JP5299476B2 (ja) 質量分析装置及びイオンガイド
JP2007005307A (ja) 直交パルスイオンを検出する飛行時間質量分析計
CN105702558A (zh) 一种消除飞行时间质谱仪离子初始位置分散的方法
JP2001143655A (ja) 周回軌道を有する飛行時間型質量分析装置
Laiko Orthogonal extraction ion mobility spectrometry
KR102088824B1 (ko) 비행시간 질량분석기 및 그의 구동 방법
JP5243977B2 (ja) 垂直加速型飛行時間型質量分析計