JP2001297730A5 - - Google Patents

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Publication number
JP2001297730A5
JP2001297730A5 JP2000118489A JP2000118489A JP2001297730A5 JP 2001297730 A5 JP2001297730 A5 JP 2001297730A5 JP 2000118489 A JP2000118489 A JP 2000118489A JP 2000118489 A JP2000118489 A JP 2000118489A JP 2001297730 A5 JP2001297730 A5 JP 2001297730A5
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JP
Japan
Prior art keywords
ions
ring electrode
ion trap
accelerating
flight
Prior art date
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Application number
JP2000118489A
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English (en)
Japanese (ja)
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JP2001297730A (ja
JP3855593B2 (ja
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Priority to JP2000118489A priority Critical patent/JP3855593B2/ja
Priority claimed from JP2000118489A external-priority patent/JP3855593B2/ja
Publication of JP2001297730A publication Critical patent/JP2001297730A/ja
Publication of JP2001297730A5 publication Critical patent/JP2001297730A5/ja
Application granted granted Critical
Publication of JP3855593B2 publication Critical patent/JP3855593B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2000118489A 2000-04-14 2000-04-14 質量分析装置 Expired - Fee Related JP3855593B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000118489A JP3855593B2 (ja) 2000-04-14 2000-04-14 質量分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000118489A JP3855593B2 (ja) 2000-04-14 2000-04-14 質量分析装置

Publications (3)

Publication Number Publication Date
JP2001297730A JP2001297730A (ja) 2001-10-26
JP2001297730A5 true JP2001297730A5 (de) 2005-07-14
JP3855593B2 JP3855593B2 (ja) 2006-12-13

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ID=18629616

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000118489A Expired - Fee Related JP3855593B2 (ja) 2000-04-14 2000-04-14 質量分析装置

Country Status (1)

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JP (1) JP3855593B2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2412656C (en) 2001-11-22 2011-04-19 Micromass Limited Mass spectrometer
JP3752470B2 (ja) * 2002-05-30 2006-03-08 株式会社日立ハイテクノロジーズ 質量分析装置
JP2004259452A (ja) * 2003-02-24 2004-09-16 Hitachi High-Technologies Corp 質量分析装置及び質量分析方法
US7064319B2 (en) 2003-03-31 2006-06-20 Hitachi High-Technologies Corporation Mass spectrometer
JP4653972B2 (ja) 2004-06-11 2011-03-16 株式会社日立ハイテクノロジーズ イオントラップ／飛行時間型質量分析装置および質量分析方法
JP4649234B2 (ja) * 2004-07-07 2011-03-09 日本電子株式会社 垂直加速型飛行時間型質量分析計
JP4802032B2 (ja) * 2006-04-14 2011-10-26 日本電子株式会社 タンデム型質量分析装置
GB2439107B (en) * 2006-06-16 2011-12-14 Kratos Analytical Ltd Method and apparatus for thermalization of ions
GB201118270D0 (en) * 2011-10-21 2011-12-07 Shimadzu Corp TOF mass analyser with improved resolving power
EP2850644B1 (de) 2012-05-18 2018-10-31 DH Technologies Development Pte. Ltd. Von der komplexität einer früheren abtastung abhängige instrumentenauflösungsmodulation
GB2563571B (en) * 2017-05-26 2023-05-24 Micromass Ltd Time of flight mass analyser with spatial focussing
US11817303B2 (en) 2017-08-06 2023-11-14 Micromass Uk Limited Accelerator for multi-pass mass spectrometers
EP3662501A1 (de) 2017-08-06 2020-06-10 Micromass UK Limited Ionenspiegel für multireflektierendes massenspektrometer
GB201808530D0 (en) 2018-05-24 2018-07-11 Verenchikov Anatoly TOF MS detection system with improved dynamic range
GB2576745B (en) * 2018-08-30 2022-11-02 Brian Hoyes John Pulsed accelerator for time of flight mass spectrometers
US11496091B2 (en) 2019-08-27 2022-11-08 Manufacturing Resources International, Inc. Electronic display assemblies with solar panels

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