JP2001221950A5 - - Google Patents

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Publication number
JP2001221950A5
JP2001221950A5 JP2000402836A JP2000402836A JP2001221950A5 JP 2001221950 A5 JP2001221950 A5 JP 2001221950A5 JP 2000402836 A JP2000402836 A JP 2000402836A JP 2000402836 A JP2000402836 A JP 2000402836A JP 2001221950 A5 JP2001221950 A5 JP 2001221950A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000402836A
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Japanese (ja)
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JP2001221950A (ja
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Publication date
Application filed filed Critical
Publication of JP2001221950A publication Critical patent/JP2001221950A/ja
Publication of JP2001221950A5 publication Critical patent/JP2001221950A5/ja
Pending legal-status Critical Current

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JP2000402836A 1999-12-29 2000-12-28 非球面要素を有する投射露光レンズ Pending JP2001221950A (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US17352399P 1999-12-29 1999-12-29
US22279800P 2000-08-02 2000-08-02
US173.523 2000-08-02
US222.798 2000-08-02

Publications (2)

Publication Number Publication Date
JP2001221950A JP2001221950A (ja) 2001-08-17
JP2001221950A5 true JP2001221950A5 (US20040097461A1-20040520-C00002.png) 2008-02-14

Family

ID=26869245

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000402836A Pending JP2001221950A (ja) 1999-12-29 2000-12-28 非球面要素を有する投射露光レンズ

Country Status (5)

Country Link
US (1) US6665126B2 (US20040097461A1-20040520-C00002.png)
EP (1) EP1115019A3 (US20040097461A1-20040520-C00002.png)
JP (1) JP2001221950A (US20040097461A1-20040520-C00002.png)
KR (1) KR100876153B1 (US20040097461A1-20040520-C00002.png)
TW (1) TW528880B (US20040097461A1-20040520-C00002.png)

Families Citing this family (51)

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US7130129B2 (en) 1996-12-21 2006-10-31 Carl Zeiss Smt Ag Reticle-masking objective with aspherical lenses
US6680803B2 (en) * 1996-12-21 2004-01-20 Carl-Zeiss Smt Ag Partial objective in an illuminating systems
EP1293830A1 (en) 1998-06-08 2003-03-19 Nikon Corporation Projection exposure apparatus and method
US6995930B2 (en) 1999-12-29 2006-02-07 Carl Zeiss Smt Ag Catadioptric projection objective with geometric beam splitting
JP2002350774A (ja) * 2001-05-29 2002-12-04 Minolta Co Ltd 投影光学系とその光学調整方法
US6683710B2 (en) 2001-06-01 2004-01-27 Optical Research Associates Correction of birefringence in cubic crystalline optical systems
US20040218271A1 (en) * 2001-07-18 2004-11-04 Carl Zeiss Smt Ag Retardation element made from cubic crystal and an optical system therewith
TW559885B (en) * 2001-10-19 2003-11-01 Nikon Corp Projection optical system and exposure device having the projection optical system
US6970232B2 (en) 2001-10-30 2005-11-29 Asml Netherlands B.V. Structures and methods for reducing aberration in integrated circuit fabrication systems
US6844972B2 (en) 2001-10-30 2005-01-18 Mcguire, Jr. James P. Reducing aberration in optical systems comprising cubic crystalline optical elements
US6995908B2 (en) 2001-10-30 2006-02-07 Asml Netherlands B.V. Methods for reducing aberration in optical systems
US7453641B2 (en) 2001-10-30 2008-11-18 Asml Netherlands B.V. Structures and methods for reducing aberration in optical systems
JP4292497B2 (ja) * 2002-04-17 2009-07-08 株式会社ニコン 投影光学系、露光装置および露光方法
US6898025B2 (en) * 2002-06-04 2005-05-24 Pentax Corporation Projection aligner and optical system therefor
US7289277B2 (en) 2002-07-09 2007-10-30 Asml Holding N.V. Relay lens used in an illumination system of a lithography system
EP1523692A2 (en) * 2002-07-18 2005-04-20 Carl Zeiss SMT AG Catadioptric projection objective
US6958864B2 (en) 2002-08-22 2005-10-25 Asml Netherlands B.V. Structures and methods for reducing polarization aberration in integrated circuit fabrication systems
US7362508B2 (en) 2002-08-23 2008-04-22 Nikon Corporation Projection optical system and method for photolithography and exposure apparatus and method using same
US7869121B2 (en) * 2003-02-21 2011-01-11 Kla-Tencor Technologies Corporation Small ultra-high NA catadioptric objective using aspheric surfaces
US7348575B2 (en) 2003-05-06 2008-03-25 Nikon Corporation Projection optical system, exposure apparatus, and exposure method
EP2672307A3 (en) 2003-05-06 2014-07-23 Nikon Corporation Projection optical system, exposure apparatus, and exposure method
WO2005006026A2 (en) * 2003-07-01 2005-01-20 Nikon Corporation Using isotopically specified fluids as optical elements
US7551361B2 (en) * 2003-09-09 2009-06-23 Carl Zeiss Smt Ag Lithography lens system and projection exposure system provided with at least one lithography lens system of this type
US8208198B2 (en) 2004-01-14 2012-06-26 Carl Zeiss Smt Gmbh Catadioptric projection objective
US6906866B2 (en) * 2003-10-15 2005-06-14 Carl Zeiss Smt Ag Compact 1½-waist system for sub 100 nm ArF lithography
US7023524B2 (en) * 2003-12-18 2006-04-04 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US20080151365A1 (en) 2004-01-14 2008-06-26 Carl Zeiss Smt Ag Catadioptric projection objective
KR20160085375A (ko) 2004-05-17 2016-07-15 칼 짜이스 에스엠티 게엠베하 중간이미지를 갖는 카타디옵트릭 투사 대물렌즈
US7511798B2 (en) * 2004-07-30 2009-03-31 Asml Holding N.V. Off-axis catadioptric projection optical system for lithography
WO2006030684A1 (ja) * 2004-09-13 2006-03-23 Nikon Corporation 投影光学系、投影光学系の製造方法、露光装置及び露光方法
US7184124B2 (en) * 2004-10-28 2007-02-27 Asml Holding N.V. Lithographic apparatus having an adjustable projection system and device manufacturing method
TWI305107B (en) 2005-09-29 2009-01-01 Young Optics Inc Optical projection apparatus
US20090314929A1 (en) * 2006-01-19 2009-12-24 The Regents Of The University Of California Biomimetic Microfabricated Compound Eyes
KR20080106505A (ko) * 2006-04-03 2008-12-08 가부시키가이샤 니콘 투영 광학계, 노광 장치, 및 디바이스 제조 방법
DE102006022958A1 (de) * 2006-05-11 2007-11-22 Carl Zeiss Smt Ag Projektionsbelichtungsanlage, Projektionsbelichtungsverfahren und Verwendung eines Projektionsobjektivs
US7929114B2 (en) * 2007-01-17 2011-04-19 Carl Zeiss Smt Gmbh Projection optics for microlithography
DE102008023765A1 (de) 2007-05-15 2008-11-20 Carl Zeiss Smt Ag Verfahren zum Korrigieren von einwelligen Abbildungsfehlern eines Projektionsobjektivs einer mikrolithographischen Projektionsbelichtungsanlage, Projektionsobjektiv einer solchen Belichtungsanlage sowie Herstellungsverfahren für mikrostrukturierte Bauelemente
DE102008041144A1 (de) 2007-08-21 2009-03-05 Carl Zeiss Smt Ag Optische Anordnung und optisches Abbildungssystem damit, Verfahren zu deren Optimierung und Verfahren zum Herstellen eines optischen Elements
US7760425B2 (en) * 2007-09-05 2010-07-20 Carl Zeiss Smt Ag Chromatically corrected catadioptric objective and projection exposure apparatus including the same
DE102007054731A1 (de) 2007-11-14 2009-05-20 Carl Zeiss Smt Ag Optisches Element zur Reflexion von UV-Strahlung, Herstellungsverfahren dafür und Projektionsbelichtungsanlage damit
DE102007055567A1 (de) 2007-11-20 2009-05-28 Carl Zeiss Smt Ag Optisches System
US20090316256A1 (en) * 2008-06-20 2009-12-24 Carl Zeiss Smt Ag Chromatically corrected objective and projection exposure apparatus including the same
US8345350B2 (en) 2008-06-20 2013-01-01 Carl Zeiss Smt Gmbh Chromatically corrected objective with specifically structured and arranged dioptric optical elements and projection exposure apparatus including the same
WO2011116792A1 (en) 2010-03-26 2011-09-29 Carl Zeiss Smt Gmbh Optical system, exposure apparatus, and waverfront correction method
WO2015032418A1 (en) 2013-09-09 2015-03-12 Carl Zeiss Smt Gmbh Microlithographic projection exposure apparatus and method of correcting optical wavefront deformations in such an apparatus
DE102014204171A1 (de) 2014-03-06 2015-09-24 Carl Zeiss Smt Gmbh Optisches Element und optische Anordnung damit
DE102015218328B4 (de) 2015-09-24 2019-01-17 Carl Zeiss Smt Gmbh Optisches System zur Feldabbildung und/oder Pupillenabbildung
DE102016224400A1 (de) 2016-12-07 2018-06-07 Carl Zeiss Smt Gmbh Katadioptrisches Projektionsobjektiv und Verfahren zu seiner Herstellung
DE102017207582A1 (de) * 2017-05-05 2018-11-08 Carl Zeiss Smt Gmbh Projektionsobjektiv, Projektionsbelichtungsanlage und Projektionsbelichtungsverfahren
CN112269256B (zh) * 2020-10-21 2022-07-05 麦克奥迪实业集团有限公司 一种显微镜物镜

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US4953960A (en) * 1988-07-15 1990-09-04 Williamson David M Optical reduction system
US5220454A (en) * 1990-03-30 1993-06-15 Nikon Corporation Cata-dioptric reduction projection optical system
USRE36740E (en) * 1990-03-30 2000-06-20 Nikon Corporation Cata-dioptric reduction projection optical system
JP2847883B2 (ja) * 1990-03-30 1999-01-20 株式会社ニコン 反射屈折縮小投影光学系
JP3085481B2 (ja) * 1991-09-28 2000-09-11 株式会社ニコン 反射屈折縮小投影光学系、及び該光学系を備えた露光装置
JP3635684B2 (ja) * 1994-08-23 2005-04-06 株式会社ニコン 反射屈折縮小投影光学系、反射屈折光学系、並びに投影露光方法及び装置
JPH08203812A (ja) * 1995-01-30 1996-08-09 Nikon Corp 反射屈折縮小投影光学系及び露光装置
US5969882A (en) * 1997-04-01 1999-10-19 Nikon Corporation Catadioptric optical system
JPH10284365A (ja) * 1997-04-01 1998-10-23 Nikon Corp 反射屈折光学系
WO1999052004A1 (fr) * 1998-04-07 1999-10-14 Nikon Corporation Appareil et procede d'exposition a projection, et systeme optique reflechissant a refraction
JPH11326767A (ja) * 1998-05-07 1999-11-26 Nikon Corp 反射屈折縮小光学系
EP1293830A1 (en) * 1998-06-08 2003-03-19 Nikon Corporation Projection exposure apparatus and method
EP0989434B1 (en) * 1998-07-29 2006-11-15 Carl Zeiss SMT AG Catadioptric optical system and exposure apparatus having the same

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