JP2001168398A - Light emitting diode and its manufacturing method - Google Patents

Light emitting diode and its manufacturing method

Info

Publication number
JP2001168398A
JP2001168398A JP35362999A JP35362999A JP2001168398A JP 2001168398 A JP2001168398 A JP 2001168398A JP 35362999 A JP35362999 A JP 35362999A JP 35362999 A JP35362999 A JP 35362999A JP 2001168398 A JP2001168398 A JP 2001168398A
Authority
JP
Japan
Prior art keywords
emitting diode
resin
light emitting
light
led chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP35362999A
Other languages
Japanese (ja)
Inventor
Keijiro Sudo
圭二郎 数藤
Michihide Miki
倫英 三木
Masashi Tomaru
昌司 東丸
Masafumi Kuramoto
雅史 蔵本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nichia Chemical Industries Ltd
Original Assignee
Nichia Chemical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nichia Chemical Industries Ltd filed Critical Nichia Chemical Industries Ltd
Priority to JP35362999A priority Critical patent/JP2001168398A/en
Publication of JP2001168398A publication Critical patent/JP2001168398A/en
Withdrawn legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144Gold (Au) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85909Post-treatment of the connector or wire bonding area
    • H01L2224/8592Applying permanent coating, e.g. protective coating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Landscapes

  • Led Device Packages (AREA)
  • Led Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a light emitting diode having excellent heat resistance by reducing a thermal stress applied to an LED chip in the diode using the LED chip usable for a writing light source, a light source for a back light or the like of various type indicators, displays or optical printers and a method for manufacturing it. SOLUTION: The light emitting diode comprises conductive wires for respectively electrically connecting at least one of a pair of lead electrodes to the electrodes of an LED chip, and a translucent sealing resin covering the chip and the wires. In this diode, the resin has a first site containing an inorganic filler covering the LED chip and operating as a buffer layer, and a higher translucent second site than that of the first site on the first site.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は各種インジケータ、
ディスプレイ、光プリンターの書き込み光源やバックラ
イト用光源などに利用可能なLEDチップを用いた発光
ダイオードに係わり、特にLEDチップにかかる熱応力
を低減させ、耐熱性に優れた発光ダイオード及びその製
造方法に関する。
The present invention relates to various indicators,
The present invention relates to a light emitting diode using an LED chip that can be used as a display, a light source for writing in an optical printer, a light source for a backlight, and the like, and in particular, relates to a light emitting diode excellent in heat resistance that reduces thermal stress applied to the LED chip and a method for manufacturing the same. .

【0002】[0002]

【従来技術】今日、表面実装型や砲弾型などの種々の発
光装置が様々な分野に利用されている。発光装置の一例
である発光ダイオードは、支持体となる基板上にLED
チップを樹脂によってダイボンディングされている。ま
た、LEDチップの各電極とワイヤーなどを用いて電気
的に接続させると共に所望に応じてLEDチップを保護
する透光性封止樹脂で被覆してある。
2. Description of the Related Art Today, various light emitting devices such as a surface mount type and a shell type are used in various fields. A light emitting diode, which is an example of a light emitting device, has an LED on a substrate serving as a support.
The chip is die-bonded with resin. In addition, each electrode of the LED chip is electrically connected to each other using a wire or the like, and is covered with a translucent sealing resin for protecting the LED chip as required.

【0003】LEDチップのダイボンディング・ワイヤ
ーボンディング後に基板の凹部内部に注入される封止樹
脂には、一般に絶縁性且つ透光性を有し室温で液状の樹
脂が使用される。具体例として、エポキシ樹脂やアクリ
レート樹脂、ウレタン樹脂、シリコーン樹脂、ポリイミ
ド樹脂等の熱硬化性樹脂、又はアクリル樹脂、ポリカー
ボネート樹脂、ポリノルボルネン樹脂等の熱可塑性樹脂
が使用される。熱硬化性樹脂を用いた場合、樹脂硬化の
ため加熱により透光性樹脂を形成させることができる。
また、熱可塑性樹脂を用いた場合、溶剤を揮発させるこ
とにより透光性樹脂を形成させることができる。
As the sealing resin injected into the concave portion of the substrate after die bonding and wire bonding of the LED chip, generally, a resin that is insulative and translucent and is liquid at room temperature is used. As a specific example, a thermosetting resin such as an epoxy resin, an acrylate resin, a urethane resin, a silicone resin, or a polyimide resin, or a thermoplastic resin such as an acrylic resin, a polycarbonate resin, or a polynorbornene resin is used. When a thermosetting resin is used, a light-transmitting resin can be formed by heating for curing the resin.
When a thermoplastic resin is used, a light-transmitting resin can be formed by evaporating the solvent.

【0004】熱硬化性樹脂の特徴としては、成形時に熱
硬化反応を伴い圧縮成形のような簡単な方法で成形可能
であり堅くて頑丈な樹脂が得られる。耐熱性について
は、全般的に熱可塑性樹脂よりも優れている。熱可塑性
樹脂の特徴としては、化学構造的には線状高分子を成し
ている。また、押出成形、射出成形によって効率よく加
工することができ、成形不良品については再製利用も可
能である。更に、熱硬化性樹脂よりも透明樹脂を成形し
やすく、透光性に優れている。
A characteristic of the thermosetting resin is that it can be molded by a simple method such as compression molding with a thermosetting reaction at the time of molding, and a hard and strong resin can be obtained. In terms of heat resistance, it is generally superior to thermoplastic resins. As a characteristic of the thermoplastic resin, it is a linear polymer in chemical structure. Further, it can be efficiently processed by extrusion molding and injection molding, and defective moldings can be recycled. Further, it is easier to mold a transparent resin than a thermosetting resin, and is excellent in light transmission.

【0005】次に、LEDチップは、GaAs、Ga
P、GaAlAs、GaN、InGaN、InGaAl
Nなどの半導体発光層からなる。これらの半導体発光層
からなるLED基板は、透光性封止樹脂を使用するため
半導体の中でもIC基板などに比べ特に熱に弱く熱応力
の発生が大きな問題とされていた。そのため、発熱放出
の役割を持つリード電極などを形成することにより改善
を行ってきた。
Next, the LED chips are made of GaAs, Ga
P, GaAlAs, GaN, InGaN, InGaAl
It is composed of a semiconductor light emitting layer such as N. Since the LED substrate made of these semiconductor light emitting layers uses a light-transmitting sealing resin, it is particularly vulnerable to heat compared to an IC substrate or the like among semiconductors, and the generation of thermal stress has been a serious problem. Therefore, improvement has been made by forming a lead electrode or the like which plays a role of heat release.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、本発明
などに用いるLEDチップにおいて量産性よく耐熱性の
高い発光ダイオードを形成させる場合は上記方法では十
分ではない場合があった。そのため、実装時のリフロー
熱により、LEDチップ・基板・リード電極と透光性封
止樹脂との熱膨張係数差による剥離に伴いワイヤーオー
プンが発生したり、ヒートサイクル性能が他の表面実装
部品に比べ劣ることが問題とされており、耐熱性を向上
させることを本発明の目的とした。
However, in the case of forming a light emitting diode having good mass productivity and high heat resistance in the LED chip used in the present invention and the like, the above method may not be sufficient. For this reason, reflow heat during mounting causes wire opening due to separation due to the difference in thermal expansion coefficient between the LED chip, substrate, and lead electrode and the translucent sealing resin, and the heat cycle performance of other surface-mounted components Inferiority is considered a problem, and an object of the present invention is to improve heat resistance.

【0007】[0007]

【課題を解決する手段】本発明は、発光ダイオードの信
頼性が熱伝導経路である基板上のLEDチップ・基板・
リード電極と透光性樹脂の界面に発生する熱応力にある
ことに着目し、透光性封止樹脂の構成成分を変化させた
ものである。
SUMMARY OF THE INVENTION The present invention provides an LED chip / substrate / substrate on which the reliability of the light emitting diode is a heat conduction path.
Focusing on the thermal stress generated at the interface between the lead electrode and the translucent resin, the components of the translucent sealing resin are changed.

【0008】本発明は、更に詳細に説明した下記構成
(1)〜(7)によって、上記本発明の目的を達成する
ことができる。 (1)透光性封止樹脂はLEDチップ及びワイヤーを被
覆する無機フィラーが含有され緩衝層として働く第一の
部位と、該第一の部位上に第一の部位よりも透光性の高
い第二の部位とを有することを特徴とする発光ダイオー
ド。 (2)前記緩衝層は線膨張係数が2×10-5(1/℃)
以上6×10-5(1/℃)以下でると共に、緩衝部の厚
みはLEDチップ上に20μm以上400μm以下であ
る(1)に記載の発光ダイオード。 (3)前記緩衝部には無機フィラーはシリカ、窒化ホウ
素、燐酸カルシウム、希土類化合物から選択される少な
くとも一種が含有されている(1)に記載の発光ダイオ
ード。 (4)前記LEDチップはリード電極を有する表面に凹
部を持った基板上に配置されると共に前記透光性封止樹
脂は前記凹部内に配置される(1)に記載の発光ダイオ
ード。 (5)前記透光性封止樹脂は、エポキシ樹脂、アクリレ
ート樹脂、ウレタン樹脂、ポリイミド樹脂、アクリル樹
脂、ポリカーボネート樹脂、ポリノルボルネン樹脂から
選択される少なくとも一種である(1)に記載の発光ダ
イオード。 (6)前記緩衝部には無機フィラーの密度勾配があり、
リード電極に近づくにつれ連続的に線膨張係数がリード
電極の線膨張係数に近づく(1)に記載の発光ダイオー
ド (7)リード電極とLEDチップ及び導電性ワイヤーに
よってワイヤボンドする工程と、前記LEDチップ及び
導電性ワイヤー上に無機フィラーを混合撹拌させた該無
機フィラーよりも比重の小さい熱硬化性或いは可塑性樹
脂中の無機フィラーをLEDチップ側に沈降させる工程
とを有する発光ダイオードの形成方法。
The object of the present invention can be achieved by the following structures (1) to (7) described in more detail. (1) The light-transmitting sealing resin contains an inorganic filler for covering the LED chip and the wire and serves as a buffer layer, and has a higher light-transmitting property on the first portion than on the first portion. A light emitting diode having a second portion. (2) The buffer layer has a linear expansion coefficient of 2 × 10 −5 (1 / ° C.).
The light-emitting diode according to (1), wherein the light-emitting diode is not less than 6 × 10 −5 (1 / ° C.) and the thickness of the buffer portion is not less than 20 μm and not more than 400 μm on the LED chip. (3) The light emitting diode according to (1), wherein the buffer portion contains at least one inorganic filler selected from silica, boron nitride, calcium phosphate, and a rare earth compound. (4) The light emitting diode according to (1), wherein the LED chip is disposed on a substrate having a concave portion on a surface having a lead electrode, and the translucent sealing resin is disposed in the concave portion. (5) The light emitting diode according to (1), wherein the translucent sealing resin is at least one selected from an epoxy resin, an acrylate resin, a urethane resin, a polyimide resin, an acrylic resin, a polycarbonate resin, and a polynorbornene resin. (6) The buffer has a density gradient of the inorganic filler,
The light emitting diode according to (1), wherein the coefficient of linear expansion continuously approaches the coefficient of linear expansion of the lead electrode as approaching the lead electrode. (7) wire bonding with the lead electrode, the LED chip, and the conductive wire, and the LED chip And a step of causing the inorganic filler in the thermosetting or plastic resin having a lower specific gravity than the inorganic filler obtained by mixing and stirring the inorganic filler on the conductive wire to settle on the LED chip side.

【0009】[0009]

【発明の実施の形態】本発明者は種々の実験の結果、凹
部を持った基板上にLEDチップが配置される発光ダイ
オードにおいて無機フィラーを含有する透光性封止樹脂
注入時に、無機フィラーをLEDチップ側に沈降させ緩
衝層を成形することによって、耐熱性が急激に良くなる
ことを見出し本発明を成すに至った。
BEST MODE FOR CARRYING OUT THE INVENTION As a result of various experiments, the present inventor has found that when a light-emitting diode in which an LED chip is arranged on a substrate having a concave portion is filled with a light-transmitting sealing resin containing an inorganic filler, the inorganic filler is injected. The present inventors have found that the heat resistance is rapidly improved by sedimentation on the LED chip side to form a buffer layer, and the present invention has been accomplished.

【0010】即ち、一実施の形態における発光ダイオー
ドでは、透光性封止樹脂の熱膨張率がLEDチップ・基
板・リード電極に比べ大きいため熱衝撃による膨張・収
縮挙動が発生し所望の信頼性が得られないことから、L
EDチップ・基板・リード電極と透光性樹脂との界面に
発生する熱応力を、緩衝部を有する透光性封止樹脂を成
形することにより抑制し、耐熱性を向上させたものであ
る。
That is, in the light emitting diode according to one embodiment, since the thermal expansion coefficient of the translucent sealing resin is larger than that of the LED chip, the substrate, and the lead electrode, expansion and contraction behavior due to thermal shock occurs, and desired reliability is obtained. Is not obtained, L
The thermal stress generated at the interface between the ED chip / substrate / lead electrode and the translucent resin is suppressed by molding a translucent sealing resin having a buffer portion to improve heat resistance.

【0011】以下、本発明の発光ダイオードの一例とし
て表面実装型LEDを簡単に説明する。図1に本発明の
模式的断面図を示す。インサート成形可能な耐熱性樹脂
を基板106に用い、LEDチップ103を被覆した発
光ダイオード100を構成する。支持体である基板10
6にはLEDチップ103と外部とを電気的に接続させ
るための内部電極105bがはめ込まれている。外部電
極105aは、光反射性を高めるために銀でメッキされ
ている。該LEDチップ103はダイボンディングによ
り固着係止されている。その後、LEDチップ103上
に設けられた電極と基板の電極とを金線104によりワ
イヤーボンディングさせ、基板凹部内に透光性樹脂を注
入し発光ダイオード100を形成させることができる。
Hereinafter, a surface mount type LED will be briefly described as an example of the light emitting diode of the present invention. FIG. 1 shows a schematic sectional view of the present invention. The light-emitting diode 100 in which the LED chip 103 is covered by using a heat-resistant resin that can be insert-molded is used for the substrate 106. Substrate 10 as support
6 is fitted with an internal electrode 105b for electrically connecting the LED chip 103 and the outside. The external electrode 105a is plated with silver to enhance light reflectivity. The LED chip 103 is fixedly locked by die bonding. After that, the electrode provided on the LED chip 103 and the electrode of the substrate are wire-bonded with the gold wire 104, and the light-transmitting resin is injected into the concave portion of the substrate to form the light emitting diode 100.

【0012】本発明に用いたLEDチップはダブルへテ
ロ構造を形成しているため、発光部からの光放出は多
い。また、窒化物半導体を利用したLEDチップは結晶
成長が難しいことから、窒化物半導体の物性から一般に
サファイア基板上に形成される。このため、サファイア
基板上に形成された半導体積層面側に正極及び負極の電
極を形成する。また、発光層上のほぼ前面を覆う全面電
極を形成する。このようなオーミック接触を取れる電極
材料は限られており、この金属電極層を介して光が取り
出される。なお、本発明に用いる表面実装型発光ダイオ
ードは、基板に側壁を有するタイプと基板上の側壁を取
り除いた指向特性の異なるタイプの発光ダイオードが使
用可能となる。以下、本発明の一実施形態を更に詳細に
示す。
Since the LED chip used in the present invention has a double hetero structure, a large amount of light is emitted from the light emitting portion. Further, since an LED chip using a nitride semiconductor is difficult to grow a crystal, it is generally formed on a sapphire substrate due to the properties of the nitride semiconductor. Therefore, a positive electrode and a negative electrode are formed on the semiconductor lamination surface side formed on the sapphire substrate. In addition, a full-surface electrode covering almost the front surface of the light emitting layer is formed. The electrode material that can make such ohmic contact is limited, and light is extracted through this metal electrode layer. As the surface-mounted light-emitting diode used in the present invention, a light-emitting diode having a side wall on a substrate and a light-emitting diode having different directivity characteristics by removing the side wall on the substrate can be used. Hereinafter, one embodiment of the present invention will be described in more detail.

【0013】本発明に用いる発光ダイオードの構成は、
先ず支持体である基板106が、インサート成形可能な
耐熱性樹脂から成り、導通部としてリード電極105を
設ける。該リード電極には、外部電極105aと内部電
極105bがある。該リード電極105は光取り出し効
率を損なわないためにAgメッキされた銅電極を使用し
てある。次に基板106の凹部内に発光素子としてAl
GaInPからなるLEDチップ103をダイボンド機
器を用いてAgペースト導電性接着剤でマウントする。
The structure of the light emitting diode used in the present invention is as follows.
First, a substrate 106 as a support is made of a heat-resistant resin that can be insert-molded, and a lead electrode 105 is provided as a conductive portion. The lead electrode includes an external electrode 105a and an internal electrode 105b. The lead electrode 105 uses an Ag-plated copper electrode so as not to impair the light extraction efficiency. Next, Al was used as a light emitting element in the concave portion of the substrate 106.
The LED chip 103 made of GaInP is mounted with an Ag paste conductive adhesive using a die bonding device.

【0014】次にマウントされたLEDチップ103の
発光面側の電極と基板106のリード電極105とをワ
イヤボンディング機器を用いてワイヤボンドさせる。使
用したワイヤーは金ワイヤー104である。
Next, the electrode on the light emitting surface side of the mounted LED chip 103 and the lead electrode 105 of the substrate 106 are wire-bonded using a wire bonding device. The wire used is a gold wire 104.

【0015】次に本発明における透光性封止樹脂には熱
硬化性或いは熱可塑性樹脂を用いており、次に沈降性無
機フィラーが含有された該透光性封止樹脂をLEDチッ
プを配置した基板106の凹部内に注入する。沈降性無
機フィラーは、濡れ性、粒径と比重、粘度の性質上沈降
して凹部底面を覆う。沈降性無機フィラーは、透光性封
止樹脂との濡れ性が悪いほど沈降しやすくなる。また粒
径又は比重は大きいほど、透光性樹脂の粘度が低いほ
ど、沈降性は大きくなる。更に透光性封止樹脂との屈折
率差の小さいものほど透過率が良好となる傾向にある。
透光性封止樹脂であるエポキシ樹脂の屈折率(nD
1.50)に対しシリカの屈折率(nD=1.46)、
アルミナの屈折率(nD=1.56)と近似を示すた
め、透光性を損なうことなく緩衝層を成形することがで
きる。また、他の透光性樹脂と沈降性無機フィラーとの
屈折率差も近似を示す。これによって、光取りだし効率
を大きく損なうことなく、耐熱性の高い発光ダイオード
を得ることができる。以下、本発明の構成部材について
詳述する。
Next, a thermosetting or thermoplastic resin is used as the light-transmitting sealing resin in the present invention, and then the light-transmitting sealing resin containing a sedimentable inorganic filler is disposed on an LED chip. Is implanted into the recessed portion of the substrate 106 thus formed. The sedimentable inorganic filler sediments due to the properties of wettability, particle size, specific gravity, and viscosity and covers the bottom surface of the recess. The sedimentable inorganic filler is more likely to sediment as the wettability with the translucent sealing resin is lower. Further, the sedimentation property increases as the particle size or specific gravity increases and the viscosity of the translucent resin decreases. Further, the smaller the difference in refractive index from the translucent sealing resin, the better the transmittance tends to be.
Refractive index (n D =
1.50), the refractive index of silica (n D = 1.46),
Since the refractive index is close to the refractive index of alumina (n D = 1.56), the buffer layer can be formed without impairing the light transmittance. Further, the difference in the refractive index between the other translucent resin and the sedimentable inorganic filler also shows an approximation. As a result, a light-emitting diode having high heat resistance can be obtained without significantly impairing the light extraction efficiency. Hereinafter, the constituent members of the present invention will be described in detail.

【0016】(緩衝層101)本発明の緩衝層101
は、沈降性無機フィラーを含有した透光性樹脂を基板凹
部内に注入することにより少なくともLEDチップ10
3を覆う状態にする。また、沈降性無機フィラーは、絶
縁性で比重が大きく低膨張、高熱伝導であるシリカ、窒
化ホウ素、燐酸カルシウム、希土類化合物から選択され
る少なくとも一種が含有されるものである。本発明にお
ける緩衝層101とはLEDチップ103における熱伝
導経路である基板106、リード電極105と透光性封
止樹脂の界面に発生する熱応力を低減させるものであ
る。また基板106、リード電極105間に絶縁性熱伝
導層である緩衝層101が設けられることによりチップ
実装側からのみ放熱されていた構造から、素子中の基
板、リード電極からの放熱が得られるため素子熱抵抗の
低減効果も持つ。
(Buffer layer 101) The buffer layer 101 of the present invention
By injecting a translucent resin containing a settling inorganic filler into the substrate recess, at least the LED chip 10
3 is covered. Further, the sedimentable inorganic filler contains at least one selected from silica, boron nitride, calcium phosphate, and a rare earth compound, which is insulating, has a large specific gravity, low expansion, and high thermal conductivity. The buffer layer 101 in the present invention reduces thermal stress generated at the interface between the substrate 106, the lead electrode 105, and the translucent sealing resin, which is a heat conduction path in the LED chip 103. Further, since the buffer layer 101, which is an insulating heat conductive layer, is provided between the substrate 106 and the lead electrode 105, heat is radiated only from the chip mounting side. It also has the effect of reducing the element thermal resistance.

【0017】本発明における緩衝層101は、LEDチ
ップ103からの光に対して透光性が高く、透光性封止
樹脂材及び基板106との密着性及び耐熱性が高いこと
が好ましい。該緩衝層101は、あらかじめLEDチッ
プ103が配置された基板106の凹部に流し込み硬化
させることで比較的簡単に形成できる。
It is preferable that the buffer layer 101 in the present invention has high translucency with respect to light from the LED chip 103, and has high adhesion and heat resistance with the translucent sealing resin material and the substrate 106. The buffer layer 101 can be formed relatively easily by pouring it into a concave portion of the substrate 106 on which the LED chips 103 are arranged in advance and curing it.

【0018】(透光性封止樹脂層102)透光性封止材
は、基板凹部内に設けるものであり、LEDチップ10
3からの光を効率よく外部に透過させると共に外力、塵
芥などからLEDチップ103や金ワイヤ104などを
保護するものである。このような透光性封止材としては
エポキシ樹脂、アクリレート樹脂、ウレタン樹脂、シリ
コーン樹脂、ポリイミド樹脂等の熱硬化性樹脂、あるい
アクリル樹脂、ポリカーボネット樹脂、ポリノルボルネ
ン樹脂等の熱可塑性樹脂が用いられる。
(Translucent Sealing Resin Layer 102) The translucent sealing material is provided in the concave portion of the substrate.
3 efficiently transmits the light to the outside and protects the LED chip 103, the gold wire 104, and the like from external force, dust, and the like. As such a translucent sealing material, a thermosetting resin such as an epoxy resin, an acrylate resin, a urethane resin, a silicone resin, and a polyimide resin, or a thermoplastic resin such as an acrylic resin, a polycarbonate resin, and a polynorbornene resin. Used.

【0019】(LEDチップ103)LEDチップ10
3はMOCVD法や液相成長法などにより、GaP、G
aAlAs、GaAlInP、InN、GaN、Al
N、InGaN、InGaAlNなどの半導体発光層を
基板上に積層させることにより形成することができる。
LEDチップの構造としてはMIS接合、PIN接合や
PN接合などを有するホモ構造、ヘテロ構造、ダブルへ
テロ構造のものが挙げられる。特に活性層を介してダブ
ルへテロ構造のものは、活性層で発生した光が活性層内
を導波管の如く伝搬し活性層の端面から放出されやす
い。
(LED chip 103) LED chip 10
Reference numeral 3 denotes GaP, G by MOCVD or liquid phase epitaxy.
aAlAs, GaAlInP, InN, GaN, Al
It can be formed by stacking a semiconductor light emitting layer of N, InGaN, InGaAlN, or the like on a substrate.
Examples of the structure of the LED chip include a homostructure having a MIS junction, a PIN junction and a PN junction, a heterostructure, and a double heterostructure. In particular, in the case of the double heterostructure through the active layer, light generated in the active layer is easily propagated in the active layer like a waveguide and emitted from the end face of the active layer.

【0020】窒化物半導体(InXGaYAl1-X-YN、
0≦X、0≦Y、0≦X+Y≦1)は、結晶成長が難し
く絶縁性のサファイア基板上に形成される。サファイア
基板上に形成された窒化物半導体に電力を供給するため
には正極及び負極を同一面側に形成せざるを得ず、オー
ミック接触かつ、効率的に電流を注入させるためには透
光性の電極として金薄膜などが用いられる。このような
電極は薄膜にして透光性を持たせているものの金属から
なるが故にLEDチップの活性層で生成した光は部分的
に反射される。
A nitride semiconductor (In X Ga Y Al 1 -XYN ,
(0 ≦ X, 0 ≦ Y, 0 ≦ X + Y ≦ 1) are formed on an insulating sapphire substrate that is difficult to grow. In order to supply power to the nitride semiconductor formed on the sapphire substrate, the positive electrode and the negative electrode must be formed on the same surface side. A gold thin film or the like is used as an electrode for the above. Although such an electrode is formed as a thin film and has translucency, it is made of metal, so that light generated in the active layer of the LED chip is partially reflected.

【0021】このようなLEDチップ103は基板上に
ダイボンド機器を用いてマウントすることができる。ま
た、LEDチップ103上に設けられた電極と、金線ワ
イヤ104を利用して電気的に接続させることができ
る。
Such an LED chip 103 can be mounted on a substrate by using a die bonding device. Further, the electrode provided on the LED chip 103 can be electrically connected to the electrode using the gold wire 104.

【0022】(基板106)基板106は、LEDチッ
プ103を配置させ外部からの電流をLEDチップ10
3に供給するリード電極105が設けられたものであ
る。そのため基板106は、耐熱性や絶縁性を有するも
のが好適に用いられる。このような基板106の具体的
材料としては、ガラスエポキシ、ビスマレイミドトリア
ジン(以下BTレジンとも呼ぶ)、セラミックス、液晶
ポリマーやポリブチレンテレフタレート樹脂(PBT樹
脂)が好適に挙げられる。本発明に係る発光ダイオード
100は、LEDチップ103からの光を効率よく取り
出すために基板側壁部106aを持った発光ダイオード
と、透光性封止樹脂注入後に基板側壁部106bを取り
除いたことにより光の指向特性の異なる発光ダイオード
とがある。またLEDチップからの光を効率よく反射さ
せるために基板を構成する樹脂に酸化チタンなどの白色
顔料などを混合させることができる。
(Substrate 106) On the substrate 106, the LED chip 103 is disposed, and an external current is supplied to the LED chip 10.
3 is provided with a lead electrode 105 to be supplied. Therefore, a substrate having heat resistance and insulating properties is preferably used as the substrate 106. Specific examples of such a material for the substrate 106 include glass epoxy, bismaleimide triazine (hereinafter also referred to as BT resin), ceramics, liquid crystal polymer, and polybutylene terephthalate resin (PBT resin). The light emitting diode 100 according to the present invention has a light emitting diode having a substrate side wall portion 106a for efficiently extracting light from the LED chip 103, and a light emitting device having the substrate side wall portion 106b removed after the light-transmitting sealing resin is injected. And light emitting diodes having different directivity characteristics. Further, in order to efficiently reflect the light from the LED chip, a white pigment such as titanium oxide can be mixed with the resin constituting the substrate.

【0023】樹脂により基板106をモールド成形させ
る場合は、内部に配置されるLEDチップ103に電力
を供給するリード電極105をインサート成形などで比
較的簡単に形成することができる。リード電極105は
銅及び銅合金等の電気良導体により形成することができ
る。本発明に係る発光ダイオードのリード電極105に
は発熱を効率よく放出させるものが好ましく銅電極を使
用している。LEDチップ103からの光の反射性を向
上させるために、リード電極105の表面に銀、アルミ
ニウム、金等の平滑な金属メッキを施すこともできる。
When the substrate 106 is molded with resin, the lead electrode 105 for supplying power to the LED chip 103 disposed inside can be formed relatively easily by insert molding or the like. The lead electrode 105 can be formed of a good electrical conductor such as copper and a copper alloy. The lead electrode 105 of the light emitting diode according to the present invention preferably emits heat efficiently, and a copper electrode is used. In order to improve the reflectivity of light from the LED chip 103, the surface of the lead electrode 105 may be plated with a smooth metal such as silver, aluminum, or gold.

【0024】ガラスエポキシ及びBTレジンにより基板
を構成させる場合は、銅張りガラスエポキシ及び銅箔を
圧着したBTレジンに所望のパターンを作るためにケミ
カルエッチングを行う。これにドリル加工、パンチング
プレス加工により側壁部となる穴を作ったガラスエポキ
シ及びBTレジンを接着剤で張り合わせ形成する。セラ
ミックにより基板を構成させる場合は、セラミック焼成
前の原料となるグリーンシート上に所望のパターンで高
融点金属を含有した導電性ペーストを印刷する。グリー
ンシートを複数重ね合わせ基板形状にさせた後に焼成し
てセラミック基板を形成する。導電性ペーストは焼成時
に樹脂成分が飛び外部との電気的接続が可能な電極層と
して残る。以下、本発明の具体的実施例について詳述す
るが、これのみに限定されるものではない。
When a substrate is made of glass epoxy and BT resin, chemical etching is performed on the BT resin to which copper-clad glass epoxy and copper foil are pressed to form a desired pattern. A glass epoxy and a BT resin having a hole serving as a side wall formed by drilling and punching press processing are bonded together with an adhesive. When the substrate is made of ceramic, a conductive paste containing a high melting point metal is printed in a desired pattern on a green sheet as a raw material before firing the ceramic. A plurality of green sheets are laminated to form a substrate shape and then fired to form a ceramic substrate. During firing, the conductive paste jumps out of the resin component and remains as an electrode layer that can be electrically connected to the outside. Hereinafter, specific examples of the present invention will be described in detail, but the present invention is not limited thereto.

【0025】[0025]

【実施例1】チップタイプLEDとして、青色(470
nm)が発光可能な窒化物半導体を発光層に持ったLE
Dチップをダイボンディングにより基板に配置させた。
LEDチップはサファイア基板上に窒化ガリウムからな
るバッファ層、GaNからなるn型コンタクト兼クラッ
ド層、GaAlNからなるp型クラッド層、GaNから
なるp型コンタクト層が積層されたものである。n型コ
ンタクト層及びp型クラッド層との間には単一量子井戸
構造となるInGaN層が形成されている。サファイア
基板上に形成された半導体層側から正極及び負極の電極
を形成させるために窒化物半導体の一部をエッチングさ
せてn型コンタクト層を露出させてある。p型コンタク
ト層上には金薄膜をオーミック電極として形成させてあ
る。
Embodiment 1 As a chip type LED, blue (470
LE with a nitride semiconductor capable of emitting light in the light emitting layer
The D chip was arranged on the substrate by die bonding.
The LED chip has a buffer layer made of gallium nitride, an n-type contact and clad layer made of GaN, a p-type clad layer made of GaAlN, and a p-type contact layer made of GaN laminated on a sapphire substrate. An InGaN layer having a single quantum well structure is formed between the n-type contact layer and the p-type cladding layer. In order to form positive and negative electrodes from the semiconductor layer side formed on the sapphire substrate, a part of the nitride semiconductor is etched to expose the n-type contact layer. A gold thin film is formed on the p-type contact layer as an ohmic electrode.

【0026】基板は予め形成させたリード電極を金型内
に配置させエポキシ樹脂を注入硬化させることにより成
形させた。成形された基板は開口部の底面にリード電極
の一部が露出しており平滑面としてある。なお、平滑な
基板底面とは、鏡面の如く一定方向から入射したLED
チップからの光の大部分を特定方向に反射可能な平面を
言う。このような平面上に配置されたLEDチップから
放出される縦方向の光は、効率よく前面に放出すること
ができる。そのため、リード電極の表面、基板底面及び
側面はLEDチップからの光を効率よく反射することが
可能となる。
The substrate was formed by placing a lead electrode formed in advance in a mold and injecting and curing an epoxy resin. The molded substrate has a smooth surface with a part of the lead electrode exposed at the bottom of the opening. In addition, the bottom surface of the smooth substrate is an LED that enters from a certain direction like a mirror surface.
A plane that can reflect most of the light from the chip in a specific direction. Vertical light emitted from the LED chips arranged on such a plane can be efficiently emitted to the front surface. Therefore, the surface of the lead electrode, the bottom surface and the side surface of the substrate can efficiently reflect light from the LED chip.

【0027】基板の開口部内に透光性エポキシ樹脂を用
いて上述のLEDチップをダイボンディング機器を用い
てマウントさせた。LEDチップの各電極と基板開口部
内のリード電極とを金線を用いてワイヤボンディングさ
せ電気的に導通を取ってある。
The above-described LED chip was mounted in the opening of the substrate using a translucent epoxy resin using a die bonding apparatus. Each electrode of the LED chip and a lead electrode in the opening of the substrate are wire-bonded using a gold wire to establish electrical continuity.

【0028】緩衝層になる部材の線膨張係数はリード電
極の線膨張係数に近づくほど好ましい。実施例1におけ
る線膨張係数の測定は、TMA(熱機械的分析装置)に
より行った。透光性樹脂であるエポキシ樹脂の線膨張係
数は6×10-5(1/℃)以上2×10-4(1/℃)以
下、リード電極の線膨張係数は1.3×10-5(1/
℃)以上2.0×10-5(1/℃)以下であるため緩衝
層になる部材の線膨張係数は2×10-5以上6×10-5
以下とするのが好ましい。さらに好ましくは緩衝層にな
る部材の線膨張係数は2×10-5(1/℃)以上5×1
-5以下とする。
It is preferable that the coefficient of linear expansion of the member serving as the buffer layer be closer to the coefficient of linear expansion of the lead electrode. The measurement of the linear expansion coefficient in Example 1 was performed by TMA (thermomechanical analyzer). The epoxy resin, which is a translucent resin, has a linear expansion coefficient of 6 × 10 −5 (1 / ° C.) or more and 2 × 10 −4 (1 / ° C.) or less, and a linear expansion coefficient of a lead electrode of 1.3 × 10 −5. (1 /
° C) or more and 2.0 × 10 −5 (1 / ° C.) or less, so that the coefficient of linear expansion of the member serving as the buffer layer is 2 × 10 −5 or more and 6 × 10 −5.
It is preferable to set the following. More preferably, the coefficient of linear expansion of the member to be the buffer layer is 2 × 10 −5 (1 / ° C.) or more and 5 × 1.
0 to -5.

【0029】緩衝層として液状エポキシ樹脂100重量
部中に対しシリカ5.4重量部を含有させた混合樹脂を
攪拌させながら基板開口部内に注入させた。注入後、8
5℃3時間+140℃4時間で硬化させることによりL
EDチップを被覆する無機フィラーが含有された緩衝層
となる第一の部位と、該第一の部位上に第一の部位より
も透光性の高い第二の部位とを成形させた。こうしてチ
ップタイプLEDを50個形成して耐熱特性を調べた。
A mixed resin containing 5.4 parts by weight of silica per 100 parts by weight of liquid epoxy resin as a buffer layer was injected into the opening of the substrate while stirring. After injection, 8
By curing at 5 ° C for 3 hours and 140 ° C for 4 hours, L
A first portion serving as a buffer layer containing an inorganic filler for covering the ED chip was formed, and a second portion having higher light transmission than the first portion was formed on the first portion. In this way, 50 chip type LEDs were formed and the heat resistance was examined.

【0030】図4には、比較のために無機フィラーを含
有せず、緩衝層を成形しない以外は本発明のチップタイ
プLEDと同様にして50個のチップタイプLEDを形
成させた。
In FIG. 4, for comparison, 50 chip-type LEDs were formed in the same manner as the chip-type LED of the present invention except that no inorganic filler was contained and the buffer layer was not formed.

【0031】形成された上記チップタイプLEDを各5
0個を用い耐環境性を調べるため低温側−40℃、高温
側100℃の液相熱衝撃試験を5000回実施したとこ
ろ緩衝層を設けたチップタイプLEDは不灯不良が見ら
れなかったのに対し、緩衝層を設けなかったチップタイ
プLEDには1500回より不灯不良が発生し、500
0回実施時には30個の不灯発生が見られた。更に、図
3に示す基板側壁部を取り除いたチップタイプLEDに
ついても、図1に示す側壁部を有する発光ダイオードと
同様の液相熱衝撃試験を実施したところ不灯不良は見ら
れず耐熱特性が大幅に向上しうることが分かった。ま
た、請求項4及び請求項6に記載の他の透光性封止樹脂
と沈降性無機フィラーを用いても同様の効果が得られ
た。
Each of the formed chip type LEDs is
A liquid-phase thermal shock test at -40 ° C on the low temperature side and 100 ° C on the high-temperature side was performed 5000 times in order to check the environmental resistance using 0 pieces. When the chip type LED provided with the buffer layer did not show any non-light failure. On the other hand, a chip type LED without a buffer layer has a non-light failure more than 1500 times.
At the time of 0 times, 30 non-lights occurred. Further, with respect to the chip type LED from which the substrate side wall shown in FIG. 3 was removed, the same liquid phase thermal shock test as the light emitting diode having the side wall shown in FIG. 1 was performed. It has been found that it can be greatly improved. The same effect was obtained by using another translucent sealing resin and a sedimentable inorganic filler according to claims 4 and 6.

【0032】[0032]

【実施例2】液状エポキシ樹脂に添加する沈降性無機フ
ィラーを5種の濃度で実施例1と同条件のもと液相熱衝
撃試験を行い、緩衝層の膜厚差による耐熱性を調べた。
沈降性無機フィラーにはシリカを用い、5種の濃度は液
状エポキシ樹脂100重量部に対して、それぞれ1重量
部、3重量部、5.4重量部、8重量部、11重量部の
割合で添加しボールミルで6時間分散させ、それぞれデ
ィスペンサーで基板凹部に注入した。85℃で3時間+
140℃で4時間の硬化を行い、外部電極成形後、チッ
プタイプLEDとした。この発光ダイオードの耐環境性
を調べたところ、沈降性無機フィラーの添加量が多い3
重量部から11重量部については、不灯発生は見られな
かった。しかし、添加量の最も少ない1重量部の発光ダ
イオードについては3500回目より不灯発生し、50
00回では24個の不良発生があった。また、各発光ダ
イオードの側面を切断し、緩衝層の膜厚測定の結果、緩
衝層の膜厚は添加量が1重量部、3重量部、5.4重量
部、8重量部、11重量部に対して、それぞれ20μ
m、66μm、150μm、250μm、400μmで
あった。次にフォトダイオードによる光度測定を行った
ところ上記の1重量部から8重量部の緩衝層に対する光
度は180mcdを保つのに対し11重量部となる膜厚
400μmでは光度が100mcdと著しく低下するこ
とがわかった。以上から、本発明に係る発光ダイオード
における緩衝層の膜厚は、耐熱性を有する20μm以上
及び光取り出し効率を損なわない400μm以下とす
る。
Example 2 A liquid phase thermal shock test was conducted under the same conditions as in Example 1 at five concentrations of the sedimentable inorganic filler added to the liquid epoxy resin, and the heat resistance due to the difference in the thickness of the buffer layer was examined. .
Silica was used as the sedimentable inorganic filler, and the five concentrations were 1 part by weight, 3 parts by weight, 5.4 parts by weight, 8 parts by weight, and 11 parts by weight with respect to 100 parts by weight of the liquid epoxy resin. The mixture was dispersed by a ball mill for 6 hours, and each was injected into a concave portion of the substrate by a dispenser. 3 hours at 85 ° C +
After curing at 140 ° C. for 4 hours, and forming an external electrode, a chip type LED was obtained. When the environmental resistance of the light emitting diode was examined, it was found that the amount of the precipitated inorganic filler added was large.
No lighting failure was observed from 11 parts by weight to 11 parts by weight. However, for the light-emitting diode of 1 part by weight with the smallest addition amount, no light was generated from the 3500th time, and
In the case of 00 times, 24 defects occurred. Also, the side surface of each light emitting diode was cut, and as a result of measuring the thickness of the buffer layer, the thickness of the buffer layer was determined to be 1 part by weight, 3 parts by weight, 5.4 parts by weight, 8 parts by weight, and 11 parts by weight. 20μ each
m, 66 μm, 150 μm, 250 μm, and 400 μm. Next, when the luminous intensity was measured using a photodiode, the luminous intensity for the buffer layer of 1 to 8 parts by weight was maintained at 180 mcd, while the luminous intensity was significantly reduced to 100 mcd at a film thickness of 400 μm, which was 11 parts by weight. all right. As described above, the thickness of the buffer layer in the light emitting diode according to the present invention is set to 20 μm or more having heat resistance and 400 μm or less without impairing the light extraction efficiency.

【0033】[0033]

【発明の効果】本発明の構成により、LEDチップ・基
板と透光性封止樹脂との界面に発生する熱応力を低減さ
せる。これにより実装時のリフロー熱による剥離に伴う
ワイヤーオープンを減少させるものである。またLED
チップ・基板間に絶縁性熱伝導層である緩衝層が設けら
れることによりチップ実装側からのみ放熱されていた構
造から、素子中の全てのLEDチップ・基板からの放熱
が得られるため素子熱抵抗も低減できる。
According to the structure of the present invention, the thermal stress generated at the interface between the LED chip / substrate and the translucent sealing resin is reduced. This reduces wire open due to peeling due to reflow heat during mounting. LED
Since the heat dissipation from only the chip mounting side is achieved by providing a buffer layer that is an insulating heat conductive layer between the chip and the board, the heat dissipation from all the LED chips and the board in the element can be obtained. Can also be reduced.

【0034】本発明の構成により、LEDチップからの
光取り出し効率を低下させることなく、発光層の端部よ
り放出される発光輝度を保つことができる。
According to the structure of the present invention, the luminance of light emitted from the end of the light emitting layer can be maintained without lowering the light extraction efficiency from the LED chip.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明の一実施例によるチップタイプLED
の模式的断面図を示す。
FIG. 1 shows a chip type LED according to an embodiment of the present invention.
1 shows a schematic sectional view of FIG.

【図2】 本発明の一実施例によるチップタイプLED
の模式的断面図を示す。
FIG. 2 shows a chip type LED according to an embodiment of the present invention.
1 shows a schematic sectional view of FIG.

【図3】 本発明の一実施例によるチップタイプLED
の模式的断面図を示す。
FIG. 3 shows a chip type LED according to an embodiment of the present invention.
1 shows a schematic sectional view of FIG.

【図4】 本発明と比較のために示すチップタイプLE
Dの模式的断面図を示す。
FIG. 4 shows a chip type LE shown for comparison with the present invention.
D shows a schematic sectional view.

【符号の説明】[Explanation of symbols]

100、200、300、400・・・発光ダイオード 101、201、301・・・緩衝層 102、202、302、402・・・透光性封止樹脂
層 103、203、303、403・・・LEDチップ 104、204、304、404・・・金線ワイヤ 105、205、305、405・・・リード電極 105a、405a・・・外部電極 105b、405b・・・内部電極 106、206、306、406・・・基板 206a・・・基板側壁部 206b、306b・・・基板支持体部 207、307・・・絶縁性樹脂
100, 200, 300, 400 ... light emitting diode 101, 201, 301 ... buffer layer 102, 202, 302, 402 ... translucent sealing resin layer 103, 203, 303, 403 ... LED Chips 104, 204, 304, 404: Gold wire 105, 205, 305, 405: Lead electrode 105a, 405a: External electrode 105b, 405b: Internal electrode 106, 206, 306, 406 ..Substrate 206a ... Substrate side wall 206b, 306b ... Substrate support 207, 307 ... Insulating resin

フロントページの続き (72)発明者 蔵本 雅史 徳島県阿南市上中町岡491番100 日亜化学 工業株式会社内 Fターム(参考) 5F041 AA25 AA33 AA40 AA43 CA05 CA34 CA36 CA37 CA40 CA46 DA02 DA07 DA20 DA44 DA46 DA58 Continued on the front page (72) Inventor Masafumi Kuramoto 491-1100, Kaminakamachioka, Anan-shi, Tokushima Nichia Chemical Industry Co., Ltd.F-term (reference) 5F041 AA25 AA33 AA40 AA43 CA05 CA34 CA36 CA37 CA40 CA46 DA02 DA07 DA20 DA44 DA46 DA58

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】 一対のリード電極の少なくとも一方とL
EDチップの電極とをそれぞれ電気的に接続させた導電
性ワイヤーと、前記LEDチップ及び導電性ワイヤーを
被覆する透光性封止樹脂とを有する発光ダイオードにお
いて、 前記透光性封止樹脂はLEDチップを被覆する無機フィ
ラーが含有され緩衝層として働く第一の部位と、該第一
の部位上に第一の部位よりも透光性の高い第二の部位と
を有することを特徴とする発光ダイオード。
A first lead electrode connected to at least one of a pair of lead electrodes;
In a light emitting diode having a conductive wire electrically connected to an electrode of an ED chip, respectively, and a light transmitting sealing resin covering the LED chip and the conductive wire, the light transmitting sealing resin is an LED. A light emission characterized by having a first portion containing an inorganic filler for covering the chip and serving as a buffer layer, and a second portion having a higher light transmitting property than the first portion on the first portion. diode.
【請求項2】 前記緩衝層は線膨張係数が2×10
-5(1/℃)以上6×10-5(1/℃)以下である請求
項1に記載の発光ダイオード。
2. The buffer layer has a linear expansion coefficient of 2 × 10.
The light emitting diode according to claim 1, wherein the light emitting diode has a temperature of not less than -5 (1 / ° C) and not more than 6 × 10 -5 (1 / ° C).
【請求項3】 前記緩衝層の厚みはLEDチップ上に2
0μm以上400μm以下である請求項1に記載の発光
ダイオード。
3. The thickness of the buffer layer is 2 mm on the LED chip.
The light emitting diode according to claim 1, wherein the light emitting diode has a thickness of 0 μm or more and 400 μm or less.
【請求項4】 前記緩衝部には無機フィラーはシリカ、
窒化ホウ素、燐酸カルシウム、希土類化合物から選択さ
れる少なくとも一種が含有されている請求項1に記載の
発光ダイオード。
4. The buffer section contains silica as an inorganic filler,
The light emitting diode according to claim 1, wherein the light emitting diode contains at least one selected from boron nitride, calcium phosphate, and a rare earth compound.
【請求項5】 前記LEDチップはリード電極を有する
表面に凹部を持った基板上に配置されると共に前記透光
性封止樹脂は前記凹部内に配置される請求項1に記載の
発光ダイオード。
5. The light emitting diode according to claim 1, wherein the LED chip is disposed on a substrate having a concave portion on a surface having a lead electrode, and the translucent sealing resin is disposed in the concave portion.
【請求項6】 前記透光性封止樹脂は、エポキシ樹脂、
アクリレート樹脂、ウレタン樹脂、シリコーン樹脂、ポ
リイミド樹脂、アクリル樹脂、ポリカーボネート樹脂、
ポリノルボルネン樹脂から選択される少なくとも一種で
ある請求項1に記載の発光ダイオード。
6. The translucent sealing resin is an epoxy resin,
Acrylate resin, urethane resin, silicone resin, polyimide resin, acrylic resin, polycarbonate resin,
The light emitting diode according to claim 1, wherein the light emitting diode is at least one selected from polynorbornene resins.
【請求項7】 前記緩衝部には無機フィラーの密度勾配
があり、リード電極に近づくにつれ連続的に線膨張係数
がリード電極の線膨張係数に近づく請求項1に記載の発
光ダイオード。
7. The light emitting diode according to claim 1, wherein the buffer portion has a density gradient of an inorganic filler, and the linear expansion coefficient continuously approaches the linear expansion coefficient of the lead electrode as approaching the lead electrode.
【請求項8】 一対のリード電極の少なくとも一方とL
EDチップの電極とをそれぞれ電気的に接続させた導電
性ワイヤーと、前記LEDチップ及び導電性ワイヤーを
被覆する透光性封止樹脂とを有する発光ダイオードの形
成方法であって、 リード電極とLEDチップの電極とを導電性ワイヤーに
よってワイヤボンドする工程と 前記LEDチップ及び
導電性ワイヤー上に無機フィラーを混合撹拌させた該無
機フィラーよりも比重の小さい熱硬化性或いは熱可塑性
樹脂を配置させる工程と、 前記熱硬化性或いは可塑性樹脂中の無機フィラーをLE
Dチップ側に沈降させる工程とを有する発光ダイオード
の形成方法。
8. At least one of a pair of lead electrodes and L
A method for forming a light emitting diode, comprising: a conductive wire electrically connected to an electrode of an ED chip; and a light-transmitting sealing resin covering the LED chip and the conductive wire. A step of wire bonding an electrode of the chip with a conductive wire; and a step of disposing a thermosetting or thermoplastic resin having a lower specific gravity than the inorganic filler obtained by mixing and stirring the inorganic filler on the LED chip and the conductive wire. The inorganic filler in the thermosetting or plastic resin is LE
Forming a light-emitting diode on the D-chip side.
JP35362999A 1999-12-13 1999-12-13 Light emitting diode and its manufacturing method Withdrawn JP2001168398A (en)

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