JP2001150477A - Molding die for molding lead frame assembly resin - Google Patents

Molding die for molding lead frame assembly resin

Info

Publication number
JP2001150477A
JP2001150477A JP33665399A JP33665399A JP2001150477A JP 2001150477 A JP2001150477 A JP 2001150477A JP 33665399 A JP33665399 A JP 33665399A JP 33665399 A JP33665399 A JP 33665399A JP 2001150477 A JP2001150477 A JP 2001150477A
Authority
JP
Japan
Prior art keywords
resin
runner
mold
frame assembly
lead frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP33665399A
Other languages
Japanese (ja)
Inventor
Toshitate Tone
利建 刀祢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanken Electric Co Ltd
Original Assignee
Sanken Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanken Electric Co Ltd filed Critical Sanken Electric Co Ltd
Priority to JP33665399A priority Critical patent/JP2001150477A/en
Publication of JP2001150477A publication Critical patent/JP2001150477A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/93Batch processes
    • H01L24/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H01L24/97Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Abstract

PROBLEM TO BE SOLVED: To prevent the gate breaking of a sealing resin formed by a molding die for molding a lead frame assembly resin by holding a resin-sealed body, a runner resin, and a gate resin only by the first die or the second die when the molding die is opened. SOLUTION: A semiconductor element 7 and a support plate 6 are resin-sealed by holding a lead frame assembly 1 provided with the molding die 2 having the first and second dies 3, 4 for forming a cavity 5 and the support plate 6 to which the semiconductor element 7 adheres between the first and second dies 3, 4 and injecting a fluidized resin into the cavity 5 through a runner 13 formed on the main surface of the second mold 4 and a gate 14 connected to the runner 13. A groove part 11 is formed on the main surface of the first mold 3 to face the runner 13, the resin is packed in the groove part 11 when the fluidized resin is injected into the cavity 5, and the runner resin 13a in the runner 13 is fitted separably from the runner 13 to the groove part 11 when the molding die 2 is released.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、成形型への樹脂の
付着を防止して半導体装置の生産性を向上するリードフ
レーム組立体樹脂モールド用成形型に属する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a lead frame assembly resin mold for preventing resin from adhering to the mold and improving the productivity of semiconductor devices.

【0002】[0002]

【従来の技術】樹脂封止型半導体装置は、支持板及び半
導体素子(半導体チップ)を備え、支持板及び半導体素
子は、周知のトランスファモールド法により形成される
外囲体となる樹脂封止体により封止される。樹脂封止型
半導体装置を形成するトランスファモールド金型(22)を
図9に示す。トランスファモールド金型(22)は、キャビ
ティ(成形空所)(5)を形成する下型(23)及び上型(24)
と、複数配置されたキャビティ(5)に沿って上型(24)の
主面に形成され且つ流動化した樹脂を搬送するランナ(1
3)と、ランナ(13)及びキャビティ(5)を接続して樹脂を
キャビティ(5)内に注入するゲート(14)と、上型(24)を
可動させる駆動装置(20)とを備える。トランスファモー
ルド法で樹脂封止型半導体装置を形成する際、最初に、
リードフレーム組立体(半導体装置組立体)(1)を形成
する。リードフレーム組立体(1)は、支持板(6)上に半導
体素子(7)が固着され、半導体素子(7)とリード端子(10)
とがリード細線(ワイヤ)(8)で電気的に接続される。
リードフレーム組立体(1)を図9及び図10に示すよう
に、トランスファモールド金型(22)の下型(23)に配置
し、駆動装置(20)で上型(24)を可動させてトランスファ
モールド金型(22)を閉じると、下型(23)と上型(24)との
間には、形成すべき樹脂封止体の外形に合致するキャビ
ティ(5)が形成される。次に、キャビティ(5)内にランナ
(13)及びゲート(14)を介して樹脂を注入する。キャビテ
ィ(5)内に注入された流動化した熱硬化性樹脂は、所定
時間、所定温度の熱処理が施されて硬化し、図9に示す
ように、キャビティ(5)内で樹脂封止体を形成する。そ
の後、上型(24)を下型(23)から離型して、樹脂封止体が
形成されたリードフレーム組立体(1)をトランスファモ
ールド金型(22)から取り外し、リードフレーム組立体
(1)は半田ディップ等の後工程に搬送される。
2. Description of the Related Art A resin-encapsulated semiconductor device includes a support plate and a semiconductor element (semiconductor chip), and the support plate and the semiconductor element are formed by a well-known transfer molding method. Sealed. FIG. 9 shows a transfer mold (22) for forming a resin-sealed semiconductor device. The transfer mold (22) includes a lower mold (23) and an upper mold (24) for forming a cavity (molding space) (5).
And runners (1) formed on the main surface of the upper mold (24) along the plurality of cavities (5) and transporting the fluidized resin.
3), a gate (14) for connecting the runner (13) and the cavity (5) to inject the resin into the cavity (5), and a driving device (20) for moving the upper mold (24). When forming a resin-encapsulated semiconductor device by the transfer molding method, first,
A lead frame assembly (semiconductor device assembly) (1) is formed. In the lead frame assembly (1), the semiconductor element (7) is fixed on the support plate (6), and the semiconductor element (7) and the lead terminal (10)
Are electrically connected by a thin lead wire (8).
As shown in FIGS. 9 and 10, the lead frame assembly (1) is arranged on the lower mold (23) of the transfer mold (22), and the upper mold (24) is moved by the driving device (20). When the transfer mold (22) is closed, a cavity (5) is formed between the lower mold (23) and the upper mold (24) to match the outer shape of the resin sealing body to be formed. Next, the runner is inserted into the cavity (5).
The resin is injected through (13) and the gate (14). The fluidized thermosetting resin injected into the cavity (5) is subjected to a heat treatment at a predetermined temperature for a predetermined time to be cured, and as shown in FIG. 9, the resin sealing body is sealed in the cavity (5). Form. Thereafter, the upper mold (24) is released from the lower mold (23), the lead frame assembly (1) on which the resin sealing body is formed is removed from the transfer mold (22), and the lead frame assembly is removed.
(1) is transferred to a post-process such as a solder dip.

【0003】[0003]

【発明が解決しようとする課題】ランナ(13)及びゲート
(14)内で硬化したランナ樹脂(13a)及びゲート樹脂(14a)
は、リードフレーム組立体(1)を封止する封止樹脂(5a)
に一体に形成されるが、製品には不要であり且つ除去が
容易であるため、樹脂封止体をトランスファモールド金
型(22)から取り外した後、切断除去される。ところが、
図9より、ランナ樹脂(13a)及びゲート樹脂(14a)は、下
型(23)に比べて上型(24)に接触する面積が大きくランナ
(13)及びゲート(14)内に密着するため、上型(23)から容
易に剥離する封止樹脂(5a)と一体に剥離しないことがあ
る。これにより、ゲート樹脂(14a)と封止樹脂(5a)との
接続部分が断裂するゲート欠けが生じ、外観不良の原因
となる。また、上型(23)に密着したランナ樹脂(13a)及
びゲート樹脂(14a)は、クリーニングによって容易に除
去することができず、物理的な強制除去工程が他に必要
となり、生産性低下を招来する。そこで、本発明は、型
開きの際に第1及び第2の型の一方にのみ樹脂封止体、
ランナ樹脂及びゲート樹脂を保持して封止樹脂のゲート
欠けを防げるリードフレーム組立体樹脂モールド用成形
型を提供することを目的とする。
A runner (13) and a gate
(14) Runner resin (13a) and gate resin (14a) cured in
Is a sealing resin (5a) for sealing the lead frame assembly (1)
However, since it is unnecessary and easy to remove from the product, it is cut and removed after removing the resin sealing body from the transfer mold (22). However,
From FIG. 9, the runner resin (13a) and the gate resin (14a) have a larger contact area with the upper mold (24) than the lower mold (23).
(13) and the inside of the gate (14), it may not be peeled off integrally with the sealing resin (5a) which easily peels off from the upper mold (23). As a result, a chipped portion of the gate where the connection portion between the gate resin (14a) and the sealing resin (5a) is torn is generated, which causes poor appearance. In addition, the runner resin (13a) and the gate resin (14a) adhered to the upper mold (23) cannot be easily removed by cleaning, and a physical forcible removal step is required, which reduces productivity. Invite you. Therefore, the present invention provides a resin sealing body for only one of the first and second molds when the mold is opened,
It is an object of the present invention to provide a lead frame assembly resin mold capable of holding a runner resin and a gate resin and preventing chipping of a sealing resin from a gate.

【0004】[0004]

【課題を解決するための手段】本発明によるリードフレ
ーム組立体樹脂モールド用成形型は、キャビティ(5)を
形成する第1及び第2の型(3, 4)を有する成形型(2)を
備え、半導体素子(7)が固着された支持板(6)を有するリ
ードフレーム組立体(1)を第1及び第2の型(3,4)間に挟
持して、第2の型(4)の主面に形成されたランナ(13)及
びランナ(13)に接続されたゲート(14)を介して流動化し
た樹脂をキャビティ(5)内に注入して、半導体素子(7)及
び支持板(6)を樹脂封止する。キャビティ(5)内に流動化
した樹脂を注入する際に、ランナ(13)に対向して第1の
型(3)の主面に形成された溝部(11)内に樹脂が充填さ
れ、成形型(2)を離型する際にランナ(13)内のランナ樹
脂(13a)がランナ(13)から分離可能に溝部(11)に係止さ
れる。ランナ(13)に対向して第1の型(3)の主面に形成
された溝部(11)、特にランナ(13)の底面に対して直角な
溝部(11)の壁面(11a)によって、第1の型(3)に対するラ
ンナ樹脂(13a)の接触面積及び摩擦力が増加し、ランナ
樹脂(13a)の第1の型(3)への付着力を適度に向上でき
る。
According to the present invention, there is provided a resin mold for a lead frame assembly according to the present invention, comprising a mold having a first mold and a second mold for forming a cavity. A lead frame assembly (1) having a support plate (6) to which a semiconductor element (7) is fixed is sandwiched between first and second molds (3, 4), and a second mold (4 The fluidized resin is injected into the cavity (5) through the runner (13) formed on the main surface of the () and the gate (14) connected to the runner (13), and the semiconductor element (7) and the support are supported. The plate (6) is sealed with resin. When the fluidized resin is injected into the cavity (5), the resin is filled into the groove (11) formed on the main surface of the first mold (3) facing the runner (13) and molded. When the mold (2) is released, the runner resin (13a) in the runner (13) is locked in the groove (11) so as to be separable from the runner (13). By the groove (11) formed on the main surface of the first mold (3) facing the runner (13), in particular, the wall surface (11a) of the groove (11) perpendicular to the bottom surface of the runner (13), The contact area and frictional force of the runner resin (13a) with respect to the first mold (3) are increased, and the adhesion of the runner resin (13a) to the first mold (3) can be appropriately improved.

【0005】第1及び第2の型(3, 4)間にリードフレー
ム組立体(1)を挟持し、ランナ(13)及びゲート(14)を介
し流動化した樹脂をキャビティ(5)内に注入して硬化さ
せると、支持板(6)を封止する樹脂封止体がキャビティ
(5)内に形成される。ランナ(13)内のランナ樹脂(13a)は
溝部(11)内に係止して、成形型(2)の離型時にランナ樹
脂(13a)が第1の型(3)に保持されるので、ランナ樹脂(1
3a)、ゲート(14)内に形成されたゲート樹脂(14a)及びキ
ャビティ(5)内に形成された封止樹脂(5a)が第1の型(3)
に保持され、第2の型(4)から完全に剥離される。その
後、リードフレーム組立体(1)を第1の型(3)から除去す
ると、ランナ樹脂(13a)は溝部(11)から容易に外れて、
ランナ樹脂(13a)、ゲート樹脂(14a)及び封止樹脂(5a)を
一体に第1の型(3)から除去することができる。
A lead frame assembly (1) is sandwiched between the first and second molds (3, 4), and the fluidized resin is passed through a runner (13) and a gate (14) into a cavity (5). When injected and cured, the resin sealing body that seals the support plate (6)
Formed in (5). The runner resin (13a) in the runner (13) is locked in the groove (11), and the runner resin (13a) is held by the first mold (3) when the mold (2) is released. , Runner resin (1
3a), the gate resin (14a) formed in the gate (14) and the sealing resin (5a) formed in the cavity (5) are the first mold (3).
And completely separated from the second mold (4). Thereafter, when the lead frame assembly (1) is removed from the first mold (3), the runner resin (13a) is easily detached from the groove (11),
The runner resin (13a), the gate resin (14a) and the sealing resin (5a) can be integrally removed from the first mold (3).

【0006】本発明の実施の形態では、ランナ(13)内に
突出させてランナ樹脂(13a)を第1の型(3)に押し付ける
複数のエジェクタピン(15)を備え、複数のキャビティ
(5)に沿って形成されるランナ(13)と平行に形成される
複数の溝部(11)は、隣り合うエジェクタピン(15)間に配
置される。溝部(11)の深さは0.3〜30mmに形成さ
れ、溝部(11)の底部の長さは入口の長さより大きくても
よい。
In an embodiment of the present invention, a plurality of ejector pins (15) for projecting into the runner (13) to press the runner resin (13a) against the first mold (3) are provided, and a plurality of cavities are provided.
The plurality of grooves (11) formed parallel to the runner (13) formed along (5) are arranged between the adjacent ejector pins (15). The depth of the groove (11) may be formed to be 0.3 to 30 mm, and the length of the bottom of the groove (11) may be larger than the length of the inlet.

【0007】[0007]

【発明の実施の形態】以下、本発明によるリードフレー
ム組立体樹脂モールド用成形型の実施の形態を図1〜図
8により説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of a resin mold for a lead frame assembly according to the present invention will be described below with reference to FIGS.

【0008】図1に示す本発明による成形型であるトラ
ンスファモールド金型(2)は、キャビティ(5)を形成する
第1及び第2の型(3, 4)を有する成形型(2)と、第2の
型(4)の主面に形成されたランナ(13)と、ランナ(13)に
接続されたゲート(14)とを備える。固定された下型(3)
は第1の型を形成し、駆動装置(20)により可動される上
型(4)は第2の型を形成する。図2に示すように、ラン
ナ(13)は、複数配置されたキャビティ(5)に沿って上型
(4)の主面に形成され、流動化した樹脂を搬送する。ゲ
ート(14)は、ランナ(13)とキャビティ(5)とを接続して
流動化した樹脂をキャビティ(5)内に注入し、キャビテ
ィ(5)内に配置された半導体素子(7)及び支持板(6)を樹
脂封止する。
A transfer mold (2), which is a molding die according to the present invention shown in FIG. 1, comprises a molding die (2) having first and second dies (3, 4) forming a cavity (5). , A runner (13) formed on the main surface of the second mold (4), and a gate (14) connected to the runner (13). Fixed lower mold (3)
Forms the first mold, and the upper mold (4), which is moved by the driving device (20), forms the second mold. As shown in FIG. 2, the runner (13) is moved along the plurality of cavities (5) into the upper mold.
The fluidized resin formed on the main surface of (4) is transported. The gate (14) connects the runner (13) and the cavity (5), injects fluidized resin into the cavity (5), and supports the semiconductor element (7) disposed in the cavity (5) and the support. The plate (6) is sealed with resin.

【0009】本発明では、ランナ(13)に対向して下型
(3)の主面に溝部(11)を形成する。溝部(11)を形成する
と、樹脂封止する際に溝部(11)内に樹脂が充填され、ト
ランスファモールド金型(2)を離型するとき、ランナ(1
3)内のランナ樹脂(13a)が上型(4)から分離可能に溝部(1
1)に係止する。ランナ(13)は上型(4)に形成されるの
で、本来、ランナ樹脂(13a)は、離型時に下型(3)より接
触面積の大きい上型(4)に保持されがちであるが、本発
明では下型(3)に形成された溝部(11)によってランナ樹
脂(13a)に対する下型(3)の保持力を上型(4)より大きく
することができる。従って、ランナ樹脂(13a)、ゲート
樹脂(14a)及び封止樹脂(5a)を上型(4)から完全に剥離で
きる。溝部(11)の深さは0.3〜30mmである。溝部(1
1)の深さが0.3mm未満であると、ランナ樹脂(13a)と下
型(3)との接触面積が小さく、確実にランナ樹脂(13a)が
下型(3)に保持されない。溝部(11)の深さが30mmを超
えると、ランナ樹脂(13a)と溝部(11)の壁面(11a)との摩
擦力が増加しすぎて、ランナ樹脂(13a)、ゲート樹脂(14
a)及び封止樹脂(5a)を離型後に下型(3)から取り外すこ
とが困難となる。
In the present invention, the lower mold is opposed to the runner (13).
A groove (11) is formed in the main surface of (3). When the groove (11) is formed, the resin is filled in the groove (11) during resin sealing, and the runner (1) is released when the transfer mold (2) is released.
The groove (1) allows the runner resin (13a) in the 3) to be separated from the upper mold (4).
Lock in 1). Since the runner (13) is formed on the upper mold (4), the runner resin (13a) originally tends to be held by the upper mold (4) having a larger contact area than the lower mold (3) when releasing the mold. According to the present invention, the holding force of the lower mold (3) on the runner resin (13a) can be made larger than that of the upper mold (4) by the grooves (11) formed in the lower mold (3). Therefore, the runner resin (13a), the gate resin (14a) and the sealing resin (5a) can be completely removed from the upper mold (4). The depth of the groove (11) is 0.3 to 30 mm. Groove (1
If the depth of (1) is less than 0.3 mm, the contact area between the runner resin (13a) and the lower mold (3) is small, and the runner resin (13a) is not reliably held by the lower mold (3). If the depth of the groove (11) exceeds 30 mm, the frictional force between the runner resin (13a) and the wall surface (11a) of the groove (11) increases too much, and the runner resin (13a) and the gate resin (14
a) and the sealing resin (5a) become difficult to remove from the lower mold (3) after releasing.

【0010】また、ランナ(13)内に突出させてランナ樹
脂(13a)を下型(3)に押し付ける複数のエジェクタピン(1
5)を備える。エジェクタピン(15)は、離型する際にエジ
ェクタピン駆動装置(30)により、先端部(15a)をランナ
(13)内に突出させてランナ樹脂(13a)及びランナ樹脂(13
a)に一体化したゲート樹脂(14a)を上型(4)から剥離させ
る。離型時以外、先端部(15a)は、ランナ(13)内に突出
せず、上型(4)に収納された状態を維持する。また、複
数のキャビティ(5)に沿って形成されるランナ(13)と平
行に形成される複数の溝部(11)は、図1のA−A線断面
図である図5に示すように、隣り合うエジェクタピン(1
5)間に配置される。エジェクタピン(15)は、下型(3)へ
の保持が不十分な溝部(11)間のランナ樹脂(13a)及びゲ
ート樹脂(14a)を上型(4)から完全に剥離させる。
A plurality of ejector pins (1) projecting into the runner (13) to press the runner resin (13a) against the lower mold (3).
5). When the ejector pin (15) is released from the mold, the tip (15a) of the ejector pin is driven by the ejector pin driving device (30).
(13) to project into the runner resin (13a) and the runner resin (13
The gate resin (14a) integrated in a) is peeled off from the upper mold (4). Except at the time of release, the tip (15a) does not protrude into the runner (13) and maintains the state of being housed in the upper mold (4). A plurality of grooves (11) formed parallel to the runner (13) formed along the plurality of cavities (5), as shown in FIG. Ejector pins (1
5) placed between. The ejector pins (15) completely separate the runner resin (13a) and the gate resin (14a) between the grooves (11) that are not sufficiently held in the lower mold (3) from the upper mold (4).

【0011】トランスファモールド金型(2)を用いて樹
脂封止型半導体装置を製造する際、最初に、図3に示す
リードフレーム組立体(1)を準備して、図4に示すよう
に、トランスファモールド金型(2)の下型(3)に配置す
る。リードフレーム組立体(1)は、支持板(6)上に半導体
素子(7)が固着され、リード端子連結条(10a)で相互に接
続されたリード端子(10)と半導体素子(7)とがリード細
線(8)で電気的に接続される。支持板(6)を挟んでリード
端子(10)と反対側には、リードフレーム組立体(1)をキ
ャビティ(5)内で位置決めするガイドリード(9)と、ガイ
ドリード(9)を相互に接続するガイドリード連結条(9a)
とを備えるが、これらの無い構造とすることもできる。
When manufacturing a resin-encapsulated semiconductor device using a transfer mold (2), first, a lead frame assembly (1) shown in FIG. 3 is prepared, and as shown in FIG. It is placed on the lower mold (3) of the transfer mold (2). In the lead frame assembly (1), the semiconductor element (7) is fixed on the support plate (6), and the lead terminal (10) and the semiconductor element (7) are interconnected by the lead terminal connecting strip (10a). Are electrically connected by the thin lead wires (8). On the opposite side of the support plate (6) from the lead terminals (10), the guide lead (9) for positioning the lead frame assembly (1) in the cavity (5) and the guide lead (9) are mutually connected. Guide lead connecting line to be connected (9a)
However, it is also possible to adopt a structure without these.

【0012】リードフレーム組立体(1)を下型(3)に配置
した後、上型(4)を駆動装置(20)で下方に可動させてト
ランスファモールド金型(2)を閉じると、図1に示すよ
うに、リードフレーム組立体(1)の支持板(6)部分を収容
したキャビティ(5)が形成される。支持板(6)の主面(6a)
が下型(3)の主面と略並行に形成される。
After placing the lead frame assembly (1) on the lower mold (3), the upper mold (4) is moved downward by the driving device (20) to close the transfer mold (2). As shown in FIG. 1, a cavity (5) accommodating the support plate (6) of the lead frame assembly (1) is formed. Main surface (6a) of support plate (6)
Are formed substantially parallel to the main surface of the lower mold (3).

【0013】次に、ランナ(13)及びゲート(14)を介して
キャビティ(5)内に樹脂を注入する。ランナ(13)に連結
された図示しないポット(成形用樹脂投入孔)に熱硬化
性樹脂を投入し、図示しないプランジャで押圧して流動
化させる。流動化した樹脂は、図6に示すように、キャ
ビティ(5)内を充填して支持板(6)及び半導体素子(7)を
被覆すると共に、ランナ(13)、ゲート(14)及び溝部(11)
を充填し、トランスファモールド金型(2)を所定の温度
に加熱することにより硬化する。下型(3)の主面に形成
された溝部(11)によりランナ(13)内のランナ樹脂(13a)
は、溝部(11)内の樹脂と一体に硬化し、更に、支持板
(6)及び半導体素子(7)を被覆した封止樹脂(5a)とゲート
樹脂(14a)を介して一体に硬化する。
Next, resin is injected into the cavity (5) through the runner (13) and the gate (14). A thermosetting resin is charged into a pot (molding resin charging hole) (not shown) connected to the runner (13), and is fluidized by pressing with a plunger (not shown). As shown in FIG. 6, the fluidized resin fills the cavity (5) to cover the support plate (6) and the semiconductor element (7), as well as the runner (13), the gate (14), and the groove ( 11)
And cured by heating the transfer mold (2) to a predetermined temperature. The runner resin (13a) in the runner (13) is formed by the groove (11) formed on the main surface of the lower mold (3).
Is hardened integrally with the resin in the groove (11),
(6) and the sealing resin (5a) covering the semiconductor element (7) and the gate resin (14a) are integrally cured.

【0014】その後、図7に示すように、駆動装置(20)
により上型(4)を上方に可動させて、下型(3)と上型(4)
とを離型させる。このとき、溝部(11)内の樹脂と一体化
しているランナ樹脂(13a)は、溝部(11)の壁面(11a)に対
する密着力及び摩擦力が増加するので、溝部(11)に確実
に係止する。また、離型する際、溝部(11)間のランナ樹
脂(13a)は、上型(4)から剥離し難いので、エジェクタピ
ン(15)の先端部(15a)をランナ(13)内に突出させ、ラン
ナ樹脂(13a)を下型(3)の主面に押し付ける。従って、図
7及び図7のB−B線断面図である図8に示すように、
ランナ樹脂(13a)及びゲート樹脂(14a)は上型(3)に密着
せずに完全に下型(3)に保持する。
Thereafter, as shown in FIG. 7, the driving device (20)
The upper die (4) is moved upward by the lower die (3) and the upper die (4).
And mold release. At this time, the runner resin (13a) integrated with the resin in the groove (11) increases the adhesion force and frictional force to the wall surface (11a) of the groove (11), so that the runner resin (13a) is surely engaged with the groove (11). Stop. Also, when releasing, the runner resin (13a) between the grooves (11) is difficult to peel off from the upper mold (4), so the tip (15a) of the ejector pin (15) projects into the runner (13). Then, the runner resin (13a) is pressed against the main surface of the lower mold (3). Therefore, as shown in FIG. 7 and FIG. 8 which is a cross-sectional view taken along the line BB of FIG.
The runner resin (13a) and the gate resin (14a) are completely held in the lower mold (3) without being in close contact with the upper mold (3).

【0015】下型(3)に保持されたランナ樹脂(13a)は、
引張力により溝部(11)から外され、ゲート樹脂(14a)及
び封止樹脂(5a)と共に下型(3)から取り出される。その
後、ランナ樹脂(13a)及びゲート樹脂(14a)を樹脂封止体
から切除する等の後工程を経て樹脂封止型半導体装置が
形成される。
The runner resin (13a) held in the lower mold (3) is
It is removed from the groove (11) by the tensile force, and is taken out from the lower mold (3) together with the gate resin (14a) and the sealing resin (5a). Thereafter, a resin-sealed semiconductor device is formed through a post-process such as cutting off the runner resin (13a) and the gate resin (14a) from the resin-sealed body.

【0016】本発明の前記実施の形態は変更が可能であ
る。前記実施の形態では、図4に示すように四角形に形
成した溝部(11)を示したが、溝部(11)は他の多角形又は
円形に形成してもよい。また、前記実施の形態では、図
5に示すように溝部(11)の壁面(11a)を垂直に形成した
が、壁面(11a)に傾斜又は段差を付けて、溝部(11)の底
部の長さを入口の長さより大きくしてもよい。いずれも
前記実施の形態と同様の作用効果が得られる。
The above embodiment of the present invention can be modified. In the above embodiment, the groove (11) formed in a quadrangle as shown in FIG. 4 is shown, but the groove (11) may be formed in another polygon or a circle. Further, in the above embodiment, the wall surface (11a) of the groove (11) is formed vertically as shown in FIG. 5, but the wall surface (11a) is inclined or provided with a step to extend the bottom of the groove (11). The length may be greater than the length of the inlet. In each case, the same operation and effect as those of the above embodiment can be obtained.

【0017】本実施の形態では、下記の作用効果が得ら
れる。 [1] ランナ樹脂(13a)が確実に下型(3)に保持され、上
型(4)からランナ樹脂(13a)及びゲート樹脂(14a)を除去
する必要がないので、生産性を向上することができる。 [2] 封止樹脂(5a)のゲート欠けを防ぎ、樹脂封止型半
導体装置の外観不良を回避し、歩留まり低下を抑制する
ことができる。 [3] 溝部(11)に係合するランナ樹脂(13a)を下型(3)か
ら容易に除去することができる。 [4] 溝部(11)の大きさ又は形状及び壁面(11a)の大き
さを変更することにより下型(3)に対するランナ樹脂(13
a)の接触面積及び摩擦力を調整することができる。 [5] 溝部(11)を形成すれば従来の成形型を本発明の実
施に直接使用することができる。
In this embodiment, the following operation and effect can be obtained. [1] The productivity is improved because the runner resin (13a) is securely held in the lower mold (3) and there is no need to remove the runner resin (13a) and the gate resin (14a) from the upper mold (4). be able to. [2] The chipping of the gate of the sealing resin (5a) can be prevented, the appearance defect of the resin-encapsulated semiconductor device can be avoided, and the decrease in yield can be suppressed. [3] The runner resin (13a) engaged with the groove (11) can be easily removed from the lower mold (3). [4] The runner resin (13) for the lower mold (3) is changed by changing the size or shape of the groove (11) and the size of the wall surface (11a).
a) The contact area and frictional force can be adjusted. [5] If the groove (11) is formed, the conventional mold can be directly used in the practice of the present invention.

【0018】[0018]

【発明の効果】前記のように本発明では、樹脂封止型半
導体装置の生産性を向上すると共に、信頼性のある樹脂
封止型半導体装置を生産することができる。
As described above, according to the present invention, the productivity of a resin-encapsulated semiconductor device can be improved and a highly reliable resin-encapsulated semiconductor device can be produced.

【図面の簡単な説明】[Brief description of the drawings]

【図1】 本発明によるリードフレーム組立体樹脂モー
ルド用成形型の断面図
FIG. 1 is a cross-sectional view of a molding die for resin molding of a lead frame assembly according to the present invention.

【図2】 第2の型を示す平面図FIG. 2 is a plan view showing a second mold.

【図3】 リードフレーム組立体を示す平面図FIG. 3 is a plan view showing a lead frame assembly.

【図4】 第1の型にリードフレーム組立体を配置した
状態を示す平面図
FIG. 4 is a plan view showing a state where the lead frame assembly is arranged on the first mold.

【図5】 図1のA−A線に沿う断面図FIG. 5 is a sectional view taken along the line AA in FIG. 1;

【図6】 成形型に樹脂を充填した状態を示す断面図FIG. 6 is a cross-sectional view showing a state where a molding die is filled with resin.

【図7】 成形型を離型する状態を示す断面図FIG. 7 is a sectional view showing a state in which a mold is released.

【図8】 図7のB−B線に沿う断面図FIG. 8 is a sectional view taken along the line BB of FIG. 7;

【図9】 従来のリードフレーム組立体樹脂モールド用
成形型の断面図
FIG. 9 is a cross-sectional view of a conventional mold for resin molding of a lead frame assembly.

【図10】 従来の成形型の第1の型にリードフレーム
組立体を配置した状態を示す平面図
FIG. 10 is a plan view showing a state in which a lead frame assembly is arranged on a first mold of a conventional molding die.

【符号の説明】[Explanation of symbols]

(1)・・リードフレーム組立体、 (2)・・成形型(トラ
ンスファモールド金型)、 (3)・・第1の型(下
型)、 (4)・・第2の型(上型)、 (5)・・キャビテ
ィ、 (5a)・・封止樹脂、 (6)・・支持板、 (6a)・
・主面、 (7)・・半導体素子、 (8)・・リード細線、
(9)・・ガイドリード、 (9a)・・ガイドリード連結
条、 (10)・・リード端子、 (10a)・・リード端子連
結条 (11)・・溝部、 (11a)・・壁面、 (13)・・ラ
ンナ、 (13a)・・ランナ樹脂、 (14)・・ゲート、
(14a)・・ゲート樹脂、 (15)・・エジェクタピン、
(15a)・・先端部、 (20)・・駆動装置、 (30)・・エ
ジェクタピン駆動装置、
(1) Lead frame assembly, (2) Mold (transfer mold), (3) First mold (lower mold), (4) Second mold (upper mold) ), (5) · · · cavity, (5a) · · · sealing resin, (6) · · · support plate, (6a) ·
・ Main surface, (7) ・ ・ Semiconductor element, (8) ・ ・ Thin wire,
(9) Guide lead, (9a) Guide lead connecting strip, (10) Lead terminal, (10a) Lead terminal connecting strip (11) Groove, (11a) Wall surface, 13) · runner, (13a) · · runner resin, (14) · gate,
(14a) ・ ・ Gate resin, (15) ・ ・ Ejector pin,
(15a) ・ ・ Tip, (20) ・ ・ Drive device, (30) ・ ・ Ejector pin drive device,

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 キャビティを形成する第1及び第2の型
を有する成形型を備え、半導体素子が固着された支持板
を有するリードフレーム組立体を前記第1及び第2の型
間に挟持して、前記第2の型の主面に形成されたランナ
及び該ランナに接続されたゲートを介して流動化した樹
脂を前記キャビティ内に注入して、前記半導体素子及び
支持板を樹脂封止するリードフレーム組立体樹脂モール
ド用成形型において、 前記キャビティ内に流動化した樹脂を注入する際に、前
記ランナに対向して前記第1の型の主面に形成された溝
部内に樹脂が充填され、前記成形型を離型する際に前記
ランナ内のランナ樹脂が前記ランナから分離可能に前記
溝部に係止されることを特徴とするリードフレーム組立
体樹脂モールド用成形型。
1. A lead frame assembly having a mold having first and second molds for forming a cavity and having a support plate to which a semiconductor element is fixed is sandwiched between the first and second molds. Then, a fluidized resin is injected into the cavity through a runner formed on the main surface of the second mold and a gate connected to the runner, and the semiconductor element and the support plate are resin-sealed. In a molding die for a lead frame assembly resin mold, when a fluidized resin is injected into the cavity, the resin is filled in a groove formed in a main surface of the first mold facing the runner. A mold for resin molding a lead frame assembly, wherein the runner resin in the runner is locked in the groove so as to be separable from the runner when the mold is released.
【請求項2】 前記ランナ内に突出させて前記ランナ樹
脂を第1の型に押し付ける複数のエジェクタピンを備
え、複数の前記キャビティに沿って形成される前記ラン
ナと平行に形成される複数の前記溝部は、隣り合う前記
エジェクタピン間に配置される請求項1に記載のリード
フレーム組立体樹脂モールド用成形型。
2. A plurality of ejector pins protruding into the runner and pressing the runner resin against a first mold, wherein a plurality of ejector pins are formed parallel to the runner formed along a plurality of cavities. The mold according to claim 1, wherein the groove is disposed between the adjacent ejector pins.
【請求項3】 前記溝部の深さは0.3〜30mmに形成
される請求項1又は2に記載のリードフレーム組立体樹
脂モールド用成形型。
3. The molding die according to claim 1, wherein the depth of the groove is 0.3 to 30 mm.
【請求項4】 前記溝部の底部の長さは入口の長さより
大きい請求項1〜3のいずれか1項に記載のリードフレ
ーム組立体樹脂モールド用成形型。
4. The mold for resin molding of a lead frame assembly according to claim 1, wherein the length of the bottom of the groove is longer than the length of the inlet.
JP33665399A 1999-11-26 1999-11-26 Molding die for molding lead frame assembly resin Pending JP2001150477A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33665399A JP2001150477A (en) 1999-11-26 1999-11-26 Molding die for molding lead frame assembly resin

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33665399A JP2001150477A (en) 1999-11-26 1999-11-26 Molding die for molding lead frame assembly resin

Publications (1)

Publication Number Publication Date
JP2001150477A true JP2001150477A (en) 2001-06-05

Family

ID=18301404

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33665399A Pending JP2001150477A (en) 1999-11-26 1999-11-26 Molding die for molding lead frame assembly resin

Country Status (1)

Country Link
JP (1) JP2001150477A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20150126825A (en) * 2013-03-01 2015-11-13 베시 네덜란드 비.브이. Mould, carrier with encapsulated electronic components, separated encapsulated electronic component and method for encapsulating electronic components

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20150126825A (en) * 2013-03-01 2015-11-13 베시 네덜란드 비.브이. Mould, carrier with encapsulated electronic components, separated encapsulated electronic component and method for encapsulating electronic components
KR102204573B1 (en) * 2013-03-01 2021-01-20 베시 네덜란드 비.브이. Mould, carrier with encapsulated electronic components, separated encapsulated electronic component and method for encapsulating electronic components

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