JP2001108603A5 - - Google Patents

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Publication number
JP2001108603A5
JP2001108603A5 JP1999291938A JP29193899A JP2001108603A5 JP 2001108603 A5 JP2001108603 A5 JP 2001108603A5 JP 1999291938 A JP1999291938 A JP 1999291938A JP 29193899 A JP29193899 A JP 29193899A JP 2001108603 A5 JP2001108603 A5 JP 2001108603A5
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JP
Japan
Prior art keywords
light
sample holder
detection device
interference light
diffraction grating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1999291938A
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English (en)
Japanese (ja)
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JP2001108603A (ja
JP3933823B2 (ja
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Priority to JP29193899A priority Critical patent/JP3933823B2/ja
Priority claimed from JP29193899A external-priority patent/JP3933823B2/ja
Publication of JP2001108603A publication Critical patent/JP2001108603A/ja
Publication of JP2001108603A5 publication Critical patent/JP2001108603A5/ja
Application granted granted Critical
Publication of JP3933823B2 publication Critical patent/JP3933823B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP29193899A 1999-10-14 1999-10-14 表面力測定装置及びその方法 Expired - Lifetime JP3933823B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29193899A JP3933823B2 (ja) 1999-10-14 1999-10-14 表面力測定装置及びその方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29193899A JP3933823B2 (ja) 1999-10-14 1999-10-14 表面力測定装置及びその方法

Publications (3)

Publication Number Publication Date
JP2001108603A JP2001108603A (ja) 2001-04-20
JP2001108603A5 true JP2001108603A5 (https=) 2005-08-04
JP3933823B2 JP3933823B2 (ja) 2007-06-20

Family

ID=17775410

Family Applications (1)

Application Number Title Priority Date Filing Date
JP29193899A Expired - Lifetime JP3933823B2 (ja) 1999-10-14 1999-10-14 表面力測定装置及びその方法

Country Status (1)

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JP (1) JP3933823B2 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102374967B (zh) * 2005-09-28 2014-11-05 独立行政法人科学技术振兴机构 双路型切变应力测定方法及装置
JP4601000B2 (ja) * 2006-02-03 2010-12-22 セイコーインスツル株式会社 特定物質観察装置及び特定物質観察方法
JP5546651B1 (ja) 2013-01-28 2014-07-09 株式会社エリオニクス 表面力測定方法および表面力測定装置

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