JP2000509826A - 光走査装置 - Google Patents
光走査装置Info
- Publication number
- JP2000509826A JP2000509826A JP10537203A JP53720398A JP2000509826A JP 2000509826 A JP2000509826 A JP 2000509826A JP 10537203 A JP10537203 A JP 10537203A JP 53720398 A JP53720398 A JP 53720398A JP 2000509826 A JP2000509826 A JP 2000509826A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- light
- excitation
- secondary light
- focusing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 55
- 230000005284 excitation Effects 0.000 claims abstract description 42
- 238000001514 detection method Methods 0.000 claims abstract description 35
- 239000013307 optical fiber Substances 0.000 claims description 5
- 230000000903 blocking effect Effects 0.000 claims description 2
- 230000004907 flux Effects 0.000 abstract 1
- 239000000523 sample Substances 0.000 description 51
- 239000000126 substance Substances 0.000 description 6
- 238000000034 method Methods 0.000 description 4
- 239000000700 radioactive tracer Substances 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- 238000011161 development Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 3
- 230000033001 locomotion Effects 0.000 description 3
- 239000003973 paint Substances 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000010353 genetic engineering Methods 0.000 description 2
- 238000012937 correction Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000005096 rolling process Methods 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6452—Individual samples arranged in a regular 2D-array, e.g. multiwell plates
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.試料(22)の二次光を励起および検出するための光走査装置であって、 前記試料(22)の表面または内部で二次光を励起するための適当な波長の励 起光(11)を放出するための光放出素子(10)と、 前記試料(22)の副領域に励起光の焦点を合わせるための集束光学系(34 、44)と、 前記試料(22)を脱着可能に保持するための試料保持装置(20、21)と 、 励起に応答して試料により放出された二次光のための検出光学系(32、42 )および検出されてイメージされた二次光を電気信号に変換するための検出素子 (31、41)を有する検出ユニットとを有する光走査装置において、 試料保持装置は励起光に対して試料を相対的に回転させるべく回転可能に適合 化されており、それによって前記試料の異なる副領域が励起光により励起されて 、二次光を放出できるように構成されていることを特徴とする、光走査装置。 2.試料(22)の二次光を励起および検出するための光走査装置であって、 前記試料(22)の表面または内部で二次光を励起するための適当な波長の励 起光(11)を放出するた めの光放出素子(10)と、 前記試料(22)の副領域に励起光の焦点を合わせるための集束光学系(34 、44)と、 前記試料(22)を脱着可能に保持するための試料保持装置(20、21)と 、 励起に応答して試料により放出された二次光のための検出光学系(32、42 )および検出されてイメージされた二次光を電気信号に変換するための検出素子 (31、41)を有する検出ユニットとを有する光走査装置において、 集束光学系(34、44)は回転可能に支持され、励起光を試料表面に円弧に 沿って導くように構成されていることを特徴とする、光走査装置。 3.集束光学系は試料保持装置の回転軸に対して半径方向に移動できる、請求 項1記載の装置。 4.試料ホルダは集束光学系の回転軸に対して半径方向に移動できる、請求項 2記載の装置。 5.検出ユニットおよび集束光学系(34、44)は互いに連結され、少なく とも一部は共通の光路を有する、請求項1〜4いずれか1項記載の装置。 6.集束光学系(34、44)および検出ユニットは共通のビームスプリッタ (33、43)を有し、励起光および二次光の光路をまとめたり分けたりする、 請求項4記載の装置。 7.ビームスプリッタ(33、43)はダイクロイ ックビームスプリッタであり、励起光または二次光のいずれか一方は反射し、他 方の光は本質的に透過させる、請求項6記載の装置。 8.ビームスプリッタはそこに入射する光を50:50の比で反射するように 構成された、請求項6記載の装置。 9.少なくとも2対の互いに関連した前記集束光学系および前記検出ユニット の対が設けられている、請求項5〜8いずれか1項記載の装置。 10.前記集束光学系および検出ユニットの対は機械的に連結されている、請求 項9記載の装置。 11.ピンホールダイアフラムが検出素子の前に、二次光のための検出光学系の 結像面の所に配置された、請求項1〜10いずれか1項記載の装置。 12.励起光を抑えるためのブロッキングフィルタは検出素子の前に配置された 、請求項1〜11いずれか1項記載の装置。 13.検出素子(31、41)および/または光放出素子(10)は固定されて いる、請求項1〜12いずれか1項記載の装置。 14.検出素子および/または光放出素子は検出光学系および集束光学系にそれ ぞれ連結されて、光を光学ファイバを通して透過させる、請求項13記載の装置 。 15.カラーフィルタは検出素子の前に設けられて いて、二次光の特定の波長だけを透過させる、請求項1〜14いずれか1項記載 の装置。 16.光放出素子は、それぞれ異なる出力波長を有する複数のレーザーダイオー ドを有するように構成された、請求項1〜15いずれか1項記載の装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19707226A DE19707226A1 (de) | 1997-02-24 | 1997-02-24 | Lichtabtastvorrichtung |
DE19707226.7 | 1997-02-24 | ||
PCT/EP1997/006793 WO1998038495A1 (de) | 1997-02-24 | 1997-12-04 | Lichtabtastvorrichtung |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005015926A Division JP2005140796A (ja) | 1997-02-24 | 2005-01-24 | 光走査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2000509826A true JP2000509826A (ja) | 2000-08-02 |
JP3660691B2 JP3660691B2 (ja) | 2005-06-15 |
Family
ID=7821242
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP53720398A Expired - Fee Related JP3660691B2 (ja) | 1997-02-24 | 1997-12-04 | 光走査装置 |
JP2005015926A Pending JP2005140796A (ja) | 1997-02-24 | 2005-01-24 | 光走査装置 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005015926A Pending JP2005140796A (ja) | 1997-02-24 | 2005-01-24 | 光走査装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US6211989B1 (ja) |
EP (2) | EP1610117A3 (ja) |
JP (2) | JP3660691B2 (ja) |
AU (1) | AU5753998A (ja) |
DE (2) | DE19707226A1 (ja) |
WO (1) | WO1998038495A1 (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2007091530A1 (ja) * | 2006-02-07 | 2007-08-16 | The Furukawa Electric Co., Ltd. | 光検出装置及び測定対象読取装置 |
JP2008512666A (ja) * | 2004-09-10 | 2008-04-24 | ワラック オサケ ユキチュア | 増幅発光近接均質解析(AmplifiedLuminescentProximityHomogeneousAssay)の光学的測定に適合する器具類および方法 |
JP2008534966A (ja) * | 2005-04-01 | 2008-08-28 | スリーエム イノベイティブ プロパティズ カンパニー | 複数の光学モジュールを共通の検出器に結合するファイバ束を有する多重蛍光検出装置 |
JP2008537594A (ja) * | 2005-04-01 | 2008-09-18 | スリーエム イノベイティブ プロパティズ カンパニー | 取り外し可能な光学モジュールを有する多重蛍光検出装置 |
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- 1997-02-24 DE DE19707226A patent/DE19707226A1/de not_active Withdrawn
- 1997-12-04 DE DE59712623T patent/DE59712623D1/de not_active Expired - Lifetime
- 1997-12-04 AU AU57539/98A patent/AU5753998A/en not_active Abandoned
- 1997-12-04 EP EP05020027A patent/EP1610117A3/de not_active Withdrawn
- 1997-12-04 EP EP97953740A patent/EP0961929B1/de not_active Expired - Lifetime
- 1997-12-04 WO PCT/EP1997/006793 patent/WO1998038495A1/de active IP Right Grant
- 1997-12-04 JP JP53720398A patent/JP3660691B2/ja not_active Expired - Fee Related
- 1997-12-04 US US09/367,949 patent/US6211989B1/en not_active Expired - Lifetime
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2005
- 2005-01-24 JP JP2005015926A patent/JP2005140796A/ja active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008512666A (ja) * | 2004-09-10 | 2008-04-24 | ワラック オサケ ユキチュア | 増幅発光近接均質解析(AmplifiedLuminescentProximityHomogeneousAssay)の光学的測定に適合する器具類および方法 |
JP2008534966A (ja) * | 2005-04-01 | 2008-08-28 | スリーエム イノベイティブ プロパティズ カンパニー | 複数の光学モジュールを共通の検出器に結合するファイバ束を有する多重蛍光検出装置 |
JP2008537594A (ja) * | 2005-04-01 | 2008-09-18 | スリーエム イノベイティブ プロパティズ カンパニー | 取り外し可能な光学モジュールを有する多重蛍光検出装置 |
WO2007091530A1 (ja) * | 2006-02-07 | 2007-08-16 | The Furukawa Electric Co., Ltd. | 光検出装置及び測定対象読取装置 |
JP5006215B2 (ja) * | 2006-02-07 | 2012-08-22 | 古河電気工業株式会社 | 光検出装置及び測定対象読取装置 |
US8685710B2 (en) | 2006-02-07 | 2014-04-01 | The Furukawa Electric Co., Ltd. | Photodetector and measurement object reader |
Also Published As
Publication number | Publication date |
---|---|
EP1610117A2 (de) | 2005-12-28 |
DE59712623D1 (de) | 2006-05-24 |
AU5753998A (en) | 1998-09-18 |
DE19707226A1 (de) | 1998-08-27 |
WO1998038495A1 (de) | 1998-09-03 |
EP1610117A3 (de) | 2006-05-10 |
JP3660691B2 (ja) | 2005-06-15 |
EP0961929A1 (de) | 1999-12-08 |
US6211989B1 (en) | 2001-04-03 |
JP2005140796A (ja) | 2005-06-02 |
EP0961929B1 (de) | 2006-04-19 |
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