JP2000502236A - 電子部品、特に弾性表面波により作動する部品―saw部品 - Google Patents
電子部品、特に弾性表面波により作動する部品―saw部品Info
- Publication number
- JP2000502236A JP2000502236A JP09523210A JP52321097A JP2000502236A JP 2000502236 A JP2000502236 A JP 2000502236A JP 09523210 A JP09523210 A JP 09523210A JP 52321097 A JP52321097 A JP 52321097A JP 2000502236 A JP2000502236 A JP 2000502236A
- Authority
- JP
- Japan
- Prior art keywords
- conductive structure
- protective layer
- component
- layer
- component according
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011241 protective layer Substances 0.000 claims abstract description 34
- 239000000758 substrate Substances 0.000 claims abstract description 15
- 238000009792 diffusion process Methods 0.000 claims abstract description 10
- 239000010410 layer Substances 0.000 claims description 11
- 238000000034 method Methods 0.000 claims description 9
- 229910052782 aluminium Inorganic materials 0.000 claims description 7
- 239000002775 capsule Substances 0.000 claims description 6
- 238000007789 sealing Methods 0.000 claims description 6
- 150000004767 nitrides Chemical class 0.000 claims description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- 229910044991 metal oxide Inorganic materials 0.000 claims description 4
- 150000004706 metal oxides Chemical class 0.000 claims description 4
- 238000010897 surface acoustic wave method Methods 0.000 claims description 4
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 3
- 150000002902 organometallic compounds Chemical class 0.000 claims description 3
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 2
- 150000001247 metal acetylides Chemical class 0.000 claims description 2
- -1 nitrided oxides Chemical class 0.000 claims description 2
- 229920000620 organic polymer Polymers 0.000 claims description 2
- 238000009832 plasma treatment Methods 0.000 claims description 2
- 229920006395 saturated elastomer Polymers 0.000 claims description 2
- 150000004771 selenides Chemical class 0.000 claims description 2
- 229910052710 silicon Inorganic materials 0.000 claims description 2
- 235000012239 silicon dioxide Nutrition 0.000 claims description 2
- 239000000377 silicon dioxide Substances 0.000 claims description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 2
- 150000004763 sulfides Chemical class 0.000 claims description 2
- 150000004772 tellurides Chemical class 0.000 claims description 2
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 claims description 2
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 claims 1
- 238000002513 implantation Methods 0.000 claims 1
- 238000005468 ion implantation Methods 0.000 claims 1
- 150000002500 ions Chemical class 0.000 claims 1
- 239000002184 metal Substances 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 claims 1
- 229910052711 selenium Inorganic materials 0.000 claims 1
- 239000011669 selenium Substances 0.000 claims 1
- 238000005538 encapsulation Methods 0.000 abstract 1
- 239000000126 substance Substances 0.000 description 8
- 239000007789 gas Substances 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- 238000010521 absorption reaction Methods 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders; Supports
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders; Supports
- H03H9/10—Mounting in enclosures
- H03H9/1064—Mounting in enclosures for surface acoustic wave [SAW] devices
- H03H9/1092—Mounting in enclosures for surface acoustic wave [SAW] devices the enclosure being defined by a cover cap mounted on an element forming part of the surface acoustic wave [SAW] device on the side of the IDT's
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02818—Means for compensation or elimination of undesirable effects
- H03H9/02929—Means for compensation or elimination of undesirable effects of ageing changes of characteristics, e.g. electro-acousto-migration
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02818—Means for compensation or elimination of undesirable effects
- H03H9/02937—Means for compensation or elimination of undesirable effects of chemical damage, e.g. corrosion
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/42—Piezoelectric device making
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1. 電子部品、特に基板(1)の表面に設けられた導電構造(2)及び基板( 1)上に設けられた導電構造(2)を封止するカプセル(4)を有する弾性表面 波により作動する部品(SAW部品)において、導電構造(2)が気体の拡散を 抑制する保護層(3)で覆われていることを特徴とする電子部品。 2. 電子部品、特に基板(1)の表面に設けられた導電構造(2)及び基板( 1)上に設けられた導電構造(2)を封止するカプセル(4)を有する弾性表面 波により作動する部品(SAW部品)において、少なくとも導電構造(2)が不 活性保護層(3)で覆われていることを特徴とする電子部品。 3. 保護層(3)として酸化物、窒化物、炭化物、窒化酸化物、硫化物、セレ ン化物又はテルル化物の群からの有機性の不活性材料から成る層が設けられてい ることを特徴とする請求項1又は2記載の部品。 4. 保護層(3)として導電構造(2)の金属の酸化物から成る層が設けられ ていることを特徴とする請求項1乃至3の1つに記載の部品。 5. 保護層(3)として導電構造(2)の金属の酸化物とは異なる酸化物から 成る層が設けられていることを特徴とする請求項乃至3の1つに記載の部品。 6. 保護層(3)として導電構造(2)の金属の酸化物とは異なる酸化物、二 酸化シリコンが設けられていることを特徴とする請求項5記載の部品。 7. 保護層(3)として窒化物層が設けられていることを特徴とする請求項1 乃至3の1つに記載の部品。 8. 窒化物として窒化シリコンが設けられていることを特徴とする請求項7記 載の部品。 9. 基板(1)及び保護層(3)で覆われている導電構造(2)が導電構造( 2)用の接続面(7)(パッド)を除いて補助保護層(5)で覆われていること を特徴とする請求項1乃至8の1つに記載の部品。 10. カプセル(4)上に周囲の影響に対して保護する層(6)が設けられて いることを特徴とする請求項1乃至9の1つに記載の部品。 11. カプセル(4)上の保護層(6)が請求項2乃至8の材料により形成さ れていることを特徴とする請求項10記載の部品。 12. 層(3、5、6)の少なくとも1つが有機性ポリマーにより形成されて いることを特徴とする請求項1、9及び10の1つに記載の部品。 13. 導電構造(2)がAl、Al+Si又はAl+Taを含んでいることを 特徴とする請求項1乃至12の1つに記載の部品。 14. 保護層(3、5、6)の少なくとも1つを電気化学的に形成することを 特徴とする請求項1乃至13の1つに記載の部品の製造方法。 15. 電気化学的に形成された酸化物をプラズマ処理及び/又はUV照射によ り安定化することを特徴とする請求項14記載の方法。 16. 保護層(3、5、6)の少なくとも1つをイオンの打込みにより形成す ることを特徴とする請求項1乃至13の1つに記載の部品の製造方法。 17. Al2O3又はAlNから成る保護層(3、5、6)の1つを形成するた めにO--又はN--イオンの打込みを行うことを特徴とする請求項16記載の方法 。 18. 有機金属化合物で反応基を飽和することを特徴とする請求項14乃至1 7の1つに記載の方法。 19. 有機金属化合物としてセレンを使用することを特徴とする請求項18記 載の方法。 20. 保護層(3、5、6)の厚さを微調整するために更に層を形成するか又 は層の切除を行うことを特徴とする請求項14乃至19の1つに記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19548051A DE19548051A1 (de) | 1995-12-21 | 1995-12-21 | Elektronisches Bauelement insbesondere mit akustischen Oberflächenwellen arbeitendes Bauelement - OFW-Bauelement - |
DE19548051.1 | 1995-12-21 | ||
PCT/DE1996/002410 WO1997023951A1 (de) | 1995-12-21 | 1996-12-16 | Elektronisches bauelement, insbesondere mit akustischen oberflächenwellen arbeitendes bauelement - ofw-bauelement |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2000502236A true JP2000502236A (ja) | 2000-02-22 |
Family
ID=7780960
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP09523210A Pending JP2000502236A (ja) | 1995-12-21 | 1996-12-16 | 電子部品、特に弾性表面波により作動する部品―saw部品 |
Country Status (8)
Country | Link |
---|---|
US (1) | US6136175A (ja) |
EP (1) | EP0868777B1 (ja) |
JP (1) | JP2000502236A (ja) |
KR (1) | KR100413895B1 (ja) |
CN (1) | CN1143430C (ja) |
CA (1) | CA2241083A1 (ja) |
DE (2) | DE19548051A1 (ja) |
WO (1) | WO1997023951A1 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002175081A (ja) * | 2000-09-26 | 2002-06-21 | Agere Systems Guardian Corp | 円柱構造を有する増加帯域幅薄膜共振器 |
JP2015056712A (ja) * | 2013-09-11 | 2015-03-23 | スカイワークス・パナソニック フィルターソリューションズ ジャパン株式会社 | 弾性波素子とこれを用いた電子機器 |
US10439585B2 (en) | 2013-02-15 | 2019-10-08 | Skyworks Filter Solutions Japan Co., Ltd. | Acoustic wave device including multiple dielectric films |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6242842B1 (en) * | 1996-12-16 | 2001-06-05 | Siemens Matsushita Components Gmbh & Co. Kg | Electrical component, in particular saw component operating with surface acoustic waves, and a method for its production |
DE19806550B4 (de) * | 1998-02-17 | 2004-07-22 | Epcos Ag | Elektronisches Bauelement, insbesondere mit akustischen Oberflächenwellen arbeitendes Bauelement - OFW-Bauelement |
DE19806818C1 (de) | 1998-02-18 | 1999-11-04 | Siemens Matsushita Components | Verfahren zur Herstellung eines elektronischen Bauelements, insbesondere eines mit akustischen Oberflächenwllen arbeitenden OFW-Bauelements |
DE19818824B4 (de) * | 1998-04-27 | 2008-07-31 | Epcos Ag | Elektronisches Bauelement und Verfahren zu dessen Herstellung |
US6625855B1 (en) * | 1999-10-06 | 2003-09-30 | Murata Manufacturing Co., Ltd. | Method for producing surface acoustic wave device |
DE10006446A1 (de) * | 2000-02-14 | 2001-08-23 | Epcos Ag | Verkapselung für ein elektrisches Bauelement und Verfahren zur Herstellung |
US6440230B1 (en) * | 2000-03-03 | 2002-08-27 | Micron Technology, Inc. | Nitride layer forming method |
US6668880B2 (en) * | 2001-05-18 | 2003-12-30 | C. Richard Nordstrom | Auxiliary powered forest clearing implement |
US6930364B2 (en) * | 2001-09-13 | 2005-08-16 | Silicon Light Machines Corporation | Microelectronic mechanical system and methods |
US6877209B1 (en) | 2002-08-28 | 2005-04-12 | Silicon Light Machines, Inc. | Method for sealing an active area of a surface acoustic wave device on a wafer |
US6846423B1 (en) | 2002-08-28 | 2005-01-25 | Silicon Light Machines Corporation | Wafer-level seal for non-silicon-based devices |
US7750420B2 (en) * | 2004-03-26 | 2010-07-06 | Cypress Semiconductor Corporation | Integrated circuit having one or more conductive devices formed over a SAW and/or MEMS device |
US7608789B2 (en) * | 2004-08-12 | 2009-10-27 | Epcos Ag | Component arrangement provided with a carrier substrate |
DE102005008512B4 (de) | 2005-02-24 | 2016-06-23 | Epcos Ag | Elektrisches Modul mit einem MEMS-Mikrofon |
DE102005008511B4 (de) | 2005-02-24 | 2019-09-12 | Tdk Corporation | MEMS-Mikrofon |
DE102005053765B4 (de) | 2005-11-10 | 2016-04-14 | Epcos Ag | MEMS-Package und Verfahren zur Herstellung |
DE102005053767B4 (de) | 2005-11-10 | 2014-10-30 | Epcos Ag | MEMS-Mikrofon, Verfahren zur Herstellung und Verfahren zum Einbau |
JP4570653B2 (ja) * | 2007-12-05 | 2010-10-27 | Okiセミコンダクタ株式会社 | 弾性表面波フィルタ |
US20140110838A1 (en) * | 2012-10-22 | 2014-04-24 | Infineon Technologies Ag | Semiconductor devices and processing methods |
DE102013106353B4 (de) * | 2013-06-18 | 2018-06-28 | Tdk Corporation | Verfahren zum Aufbringen einer strukturierten Beschichtung auf ein Bauelement |
US20220116014A1 (en) * | 2020-10-13 | 2022-04-14 | RF360 Europe GmbH | Surface acoustic wave (saw) device with high permittivity dielectric for intermodulation distortion improvement |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4270105A (en) * | 1979-05-14 | 1981-05-26 | Raytheon Company | Stabilized surface wave device |
GB2067009A (en) * | 1979-12-17 | 1981-07-15 | Ebauches Sa | Encapsulated piezo-electric resonator |
US4617487A (en) * | 1984-09-22 | 1986-10-14 | Alps Electric Co., Ltd. | Piezoelectric elastic surface wave element with film of tantalum pentoxide or silicon nitride |
JPS61102810A (ja) * | 1984-10-25 | 1986-05-21 | Nec Kansai Ltd | 弾性表面波素子の製造方法 |
EP0475139A3 (en) * | 1990-09-04 | 1992-03-25 | Motorola, Inc. | Method and apparatus for saw device passivation |
US5212115A (en) * | 1991-03-04 | 1993-05-18 | Motorola, Inc. | Method for microelectronic device packaging employing capacitively coupled connections |
DE4328794A1 (de) * | 1993-08-26 | 1995-03-02 | Siemens Ag | Gehäuse für OFW-Bauelemente |
US5815900A (en) * | 1995-03-06 | 1998-10-06 | Matsushita Electric Industrial Co., Ltd. | Method of manufacturing a surface acoustic wave module |
-
1995
- 1995-12-21 DE DE19548051A patent/DE19548051A1/de not_active Ceased
-
1996
- 1996-12-16 CA CA002241083A patent/CA2241083A1/en not_active Abandoned
- 1996-12-16 WO PCT/DE1996/002410 patent/WO1997023951A1/de active IP Right Grant
- 1996-12-16 DE DE59605452T patent/DE59605452D1/de not_active Expired - Lifetime
- 1996-12-16 EP EP96946081A patent/EP0868777B1/de not_active Expired - Lifetime
- 1996-12-16 JP JP09523210A patent/JP2000502236A/ja active Pending
- 1996-12-16 CN CNB961999403A patent/CN1143430C/zh not_active Expired - Lifetime
- 1996-12-16 KR KR10-1998-0704490A patent/KR100413895B1/ko not_active IP Right Cessation
-
1998
- 1998-06-22 US US09/103,160 patent/US6136175A/en not_active Expired - Lifetime
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002175081A (ja) * | 2000-09-26 | 2002-06-21 | Agere Systems Guardian Corp | 円柱構造を有する増加帯域幅薄膜共振器 |
US10439585B2 (en) | 2013-02-15 | 2019-10-08 | Skyworks Filter Solutions Japan Co., Ltd. | Acoustic wave device including multiple dielectric films |
US11863156B2 (en) | 2013-02-15 | 2024-01-02 | Skyworks Filter Solutions Japan Co., Ltd. | Acoustic wave device including multi-layer interdigital transducer electrodes |
JP2015056712A (ja) * | 2013-09-11 | 2015-03-23 | スカイワークス・パナソニック フィルターソリューションズ ジャパン株式会社 | 弾性波素子とこれを用いた電子機器 |
Also Published As
Publication number | Publication date |
---|---|
DE19548051A1 (de) | 1997-06-26 |
KR19990072151A (ko) | 1999-09-27 |
US6136175A (en) | 2000-10-24 |
DE59605452D1 (de) | 2000-07-20 |
KR100413895B1 (ko) | 2004-02-18 |
CN1209225A (zh) | 1999-02-24 |
EP0868777A1 (de) | 1998-10-07 |
CA2241083A1 (en) | 1997-07-03 |
EP0868777B1 (de) | 2000-06-14 |
WO1997023951A1 (de) | 1997-07-03 |
CN1143430C (zh) | 2004-03-24 |
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