JP2000252512A - Pinフォトダイオード - Google Patents
PinフォトダイオードInfo
- Publication number
- JP2000252512A JP2000252512A JP11048920A JP4892099A JP2000252512A JP 2000252512 A JP2000252512 A JP 2000252512A JP 11048920 A JP11048920 A JP 11048920A JP 4892099 A JP4892099 A JP 4892099A JP 2000252512 A JP2000252512 A JP 2000252512A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor substrate
- type impurity
- impurity region
- resistance
- region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Electroluminescent Light Sources (AREA)
- Light Receiving Elements (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11048920A JP2000252512A (ja) | 1999-02-25 | 1999-02-25 | Pinフォトダイオード |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11048920A JP2000252512A (ja) | 1999-02-25 | 1999-02-25 | Pinフォトダイオード |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2000252512A true JP2000252512A (ja) | 2000-09-14 |
JP2000252512A5 JP2000252512A5 (enrdf_load_stackoverflow) | 2005-11-24 |
Family
ID=12816700
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11048920A Pending JP2000252512A (ja) | 1999-02-25 | 1999-02-25 | Pinフォトダイオード |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2000252512A (enrdf_load_stackoverflow) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006128592A (ja) * | 2004-10-28 | 2006-05-18 | Samsung Electro Mech Co Ltd | 多波長受光素子及びその製造方法 |
US20090195948A1 (en) * | 2006-02-01 | 2009-08-06 | Edvard Kalvesten | Methods for making a starting substrate wafer for semiconductor engineering having wafer through connections |
WO2010047058A1 (ja) * | 2008-10-22 | 2010-04-29 | パナソニック株式会社 | 光半導体装置 |
EP2013915A4 (en) * | 2006-04-19 | 2011-08-03 | Perkinelmer Canada Inc | AVALANCHE FOTODIODE WITH BONDED WAFER AND MANUFACTURING METHOD THEREFOR |
US8368159B2 (en) | 2011-07-08 | 2013-02-05 | Excelitas Canada, Inc. | Photon counting UV-APD |
JP2023552371A (ja) * | 2020-12-04 | 2023-12-15 | ヴィシャイ セミコンダクター ゲゼルシャフト ミット ベシュレンクテル ハフツング | フォトダイオードの製造方法 |
-
1999
- 1999-02-25 JP JP11048920A patent/JP2000252512A/ja active Pending
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006128592A (ja) * | 2004-10-28 | 2006-05-18 | Samsung Electro Mech Co Ltd | 多波長受光素子及びその製造方法 |
US20090195948A1 (en) * | 2006-02-01 | 2009-08-06 | Edvard Kalvesten | Methods for making a starting substrate wafer for semiconductor engineering having wafer through connections |
US9312217B2 (en) * | 2006-02-01 | 2016-04-12 | Silex Microsystems Ab | Methods for making a starting substrate wafer for semiconductor engineering having wafer through connections |
EP2013915A4 (en) * | 2006-04-19 | 2011-08-03 | Perkinelmer Canada Inc | AVALANCHE FOTODIODE WITH BONDED WAFER AND MANUFACTURING METHOD THEREFOR |
WO2010047058A1 (ja) * | 2008-10-22 | 2010-04-29 | パナソニック株式会社 | 光半導体装置 |
US8368159B2 (en) | 2011-07-08 | 2013-02-05 | Excelitas Canada, Inc. | Photon counting UV-APD |
JP2023552371A (ja) * | 2020-12-04 | 2023-12-15 | ヴィシャイ セミコンダクター ゲゼルシャフト ミット ベシュレンクテル ハフツング | フォトダイオードの製造方法 |
US20240105878A1 (en) * | 2020-12-04 | 2024-03-28 | Vishay Semiconductor Gmbh | Method for producing a photodiode |
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