JP2000162188A - 溶液中のサンプルを分析する質量分析法及び装置 - Google Patents

溶液中のサンプルを分析する質量分析法及び装置

Info

Publication number
JP2000162188A
JP2000162188A JP11332669A JP33266999A JP2000162188A JP 2000162188 A JP2000162188 A JP 2000162188A JP 11332669 A JP11332669 A JP 11332669A JP 33266999 A JP33266999 A JP 33266999A JP 2000162188 A JP2000162188 A JP 2000162188A
Authority
JP
Japan
Prior art keywords
sample
ultrasonic nozzle
ultrasonic
nozzle
solvent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11332669A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000162188A5 (https=
Inventor
Aviv Amirav
アミラブ アビブ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of JP2000162188A publication Critical patent/JP2000162188A/ja
Publication of JP2000162188A5 publication Critical patent/JP2000162188A5/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/72Mass spectrometers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/0068Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with a surface, e.g. surface induced dissociation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H01J49/045Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol with means for using a nebulising gas, i.e. pneumatically assisted
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/72Mass spectrometers
    • G01N30/7233Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/724Nebulising, aerosol formation or ionisation
    • G01N30/7246Nebulising, aerosol formation or ionisation by pneumatic means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/72Mass spectrometers
    • G01N30/7233Mass spectrometers interfaced to liquid or supercritical fluid chromatograph
    • G01N30/7273Desolvation chambers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Health & Medical Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP11332669A 1998-11-23 1999-11-24 溶液中のサンプルを分析する質量分析法及び装置 Pending JP2000162188A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IL12721798A IL127217A (en) 1998-11-23 1998-11-23 Mass spectrometer method and apparatus for analyzing a sample in a solution
IL127217 1998-11-23

Publications (2)

Publication Number Publication Date
JP2000162188A true JP2000162188A (ja) 2000-06-16
JP2000162188A5 JP2000162188A5 (https=) 2007-01-11

Family

ID=11072177

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11332669A Pending JP2000162188A (ja) 1998-11-23 1999-11-24 溶液中のサンプルを分析する質量分析法及び装置

Country Status (3)

Country Link
EP (1) EP1004878A1 (https=)
JP (1) JP2000162188A (https=)
IL (1) IL127217A (https=)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100434546B1 (ko) * 2002-04-22 2004-06-05 삼성전자주식회사 진공 용기
JP2004257949A (ja) * 2003-02-27 2004-09-16 Teikoku Hormone Mfg Co Ltd ステロイド性生体内微量物質の測定方法
KR100459900B1 (ko) * 2002-04-26 2004-12-03 삼성전자주식회사 원자층 적층 분석기
JP2009098150A (ja) * 2007-10-18 2009-05-07 Aviv Amirav 毛管で分離した蒸発チェンバーおよびノズル装置および方法
JP2014209066A (ja) * 2013-04-16 2014-11-06 株式会社 資生堂 質量分析方法、イオン生成装置及び質量分析システム
JP2015031650A (ja) * 2013-08-06 2015-02-16 株式会社 資生堂 質量分析方法、イオン生成装置及び質量分析システム

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101975818B (zh) * 2010-04-29 2012-12-26 中国计量科学研究院 特征物质的检测系统及方法
GB2512640A (en) * 2013-04-04 2014-10-08 Fasmatech Science And Technology Sa Improvements in and relating to the production and control of ions
CN105403613B (zh) * 2015-10-23 2018-12-14 中国科学技术大学 真空分步加热-元素-同位素富集分析装置
CN106540824B (zh) * 2016-09-28 2018-11-20 西安航天动力研究所 一种高频高幅值反压振荡雾化实验装置
CN107290452B (zh) * 2017-06-23 2022-04-15 江南大学 一种检测结合态杂环胺含量的方法
CN111650270B (zh) * 2020-06-18 2023-08-08 哈尔滨工业大学(威海) 环境水体中多环芳烃类化合物的高灵敏度检测装置及方法
CN113092567B (zh) * 2021-04-26 2024-11-01 中国科学技术大学 一种烟草化学成分的自动、快速测量装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4977785A (en) * 1988-02-19 1990-12-18 Extrel Corporation Method and apparatus for introduction of fluid streams into mass spectrometers and other gas phase detectors
IL90970A (en) * 1989-07-13 1993-07-08 Univ Ramot Mass spectrometer method and apparatus for analyzing materials
US5742050A (en) * 1996-09-30 1998-04-21 Aviv Amirav Method and apparatus for sample introduction into a mass spectrometer for improving a sample analysis

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100434546B1 (ko) * 2002-04-22 2004-06-05 삼성전자주식회사 진공 용기
KR100459900B1 (ko) * 2002-04-26 2004-12-03 삼성전자주식회사 원자층 적층 분석기
JP2004257949A (ja) * 2003-02-27 2004-09-16 Teikoku Hormone Mfg Co Ltd ステロイド性生体内微量物質の測定方法
JP2009098150A (ja) * 2007-10-18 2009-05-07 Aviv Amirav 毛管で分離した蒸発チェンバーおよびノズル装置および方法
JP2014209066A (ja) * 2013-04-16 2014-11-06 株式会社 資生堂 質量分析方法、イオン生成装置及び質量分析システム
JP2015031650A (ja) * 2013-08-06 2015-02-16 株式会社 資生堂 質量分析方法、イオン生成装置及び質量分析システム

Also Published As

Publication number Publication date
EP1004878A1 (en) 2000-05-31
IL127217A0 (en) 1999-09-22
IL127217A (en) 2004-01-04

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