JP2000137057A - Ic testing device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To eliminate the need for preparing a system timing correcting file at the time of pin electronic card replacement, and to recognize automatically a replaced pin electronic card. SOLUTION: This device has a pin electronic card containing a measuring means 100 for determining the quality of a measured device, and containing a system timing correcting means 102 for correcting system timing of the measuring means 100 based on a given correction data. A storing means 104 stored with an inherent correction data for correcting the system timing used for the correcting means 100 is provided inside the pin electronic card 10, and the system timing of the measuring means 100 is corrected, based on the correction data stored in the storing means 104.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an IC test apparatus, and more particularly, to a system timing correction of an IC test apparatus.

[0002]

2. Description of the Related Art The configuration of a conventional IC test apparatus is shown in FIG. In FIG. 3, a device under test 16 is mounted on a device board 14, and the device board 14 is connected via a connector 12 to a pin electronics card 10 constituting an IC test apparatus. The pin electronics card 10 is connected to a processing device 20 via an interface (I / F) 18. Further processing device 20
Are connected to the hard disk 22.

In the pin electronics card 10, the waveform of a test signal used for measurement in the measurement circuit 100 is shaped, and the shaped test signal is input to the device under test 16 via the device board 14. At the same time, an IC test is performed by comparing output signals from the device under test 16 with expected data and determining the quality of the device under test 16. At this time, a skew occurs due to variations in the characteristics of the wiring and each element in the measurement circuit 100, so that the system timing and the DC accuracy need to be corrected.

[0004] These corrections are performed by adjusting the skew by executing a system cal capture program by the system cal correction circuit 102 in the pin electronics card 10, rewriting the correction data file of the system timing created by the processor 20, and correcting the correction data. This is performed by transferring the file to the system cal correction circuit 102. The correction data file finally loaded into the processing device 20 is stored as a correction file 220 in the hard disk 22.

FIG. 4 shows the contents of a system timing correction process in a conventional IC test apparatus. In FIG. 5, when the power of the IC test apparatus is turned on at the start of the correction processing (step 400), the correction file 220 (correction data) stored in the hard disk 22 is transferred to the system cal correction circuit 102 (step 400). 40
2), measurement circuit 1 in pin electronics card 10
The skew of 00 is corrected (step 416). This is a state in which the pin electronics card 10 previously attached to the connector 12 has been corrected.

When the pin electronics card 10 is not replaced, the correction of the system timing is completed by transferring the correction file. However, when the pin electronics card 10 is replaced, the system timing correction program is sent from the hard disk 22. Processing unit 2
0 is loaded into the memory 202 (FIG. 3) (step 4).
04, 406). Next, the data for specifying the replaced pin electronics card 10 and the setting of the system cal capture program are instructed from the keyboard (step 4).
08).

Next, a system call is taken in (step 410), and the result is written to a file in the memory 202 of the processing device 20 (step 412). This file is transferred to the hard disk 22 and stored as the correction file 220 (Step 414). The contents of the correction file 220 are stored in the system cal correction circuit 10.
2 and the system cal correction circuit 102 corrects the skew of the measurement circuit 100 in the pin electronics card 10 (step 416).

As described above, conventionally, at the time of starting up the system of the IC test apparatus and exchanging the pin electronics card, the operator has to execute the system timing correction program on the mounted and exchanged pin electronics card every time. And the system timing was corrected.

[0009]

In the conventional correction data processing method of the IC test apparatus, it is necessary to execute a system timing correction program every time the pin electronics card is replaced and to create a correction file for the system timing. Each electronic card required about 15 minutes of work time. It also recognizes the pin electronics card replaced by the operator,
Since it is necessary to input data for specifying the replaced pin electronics card and the setting of the system timing correction program using input means such as a keyboard, there is a problem that an operator may make a mistake in recognition or an erroneous operation due to an input error. .

[0010] The present invention has been made in view of such circumstances, and it is not necessary to create a system timing correction file when replacing a pin electronics card, and it is possible to automatically recognize the replaced pin electronics card. It is an object of the present invention to provide an IC test apparatus that can perform the test.

[0011]

SUMMARY OF THE INVENTION In order to achieve the above object, according to the first aspect of the present invention, a test signal is supplied to a device under test, and the output signal from the device under test is compared with expected data. An IC test apparatus having a pin electronics card including: a measuring means for judging the quality of a device to be measured based on the above, and a system timing correcting means for correcting the system timing of the measuring means based on the given correction data In the pin electronics card, storage means for storing unique correction data for correcting the system timing used for the system timing correction means of the pin electronics card is provided, and when the pin electronics card is replaced, A measuring method based on the correction data stored in the storage means. And performing the system timing correction.

According to the first aspect of the present invention, a measuring means for supplying a test signal to a device under test and comparing the output signal from the device under test with expected data to determine the quality of the device under test. And a system timing correction means for correcting the system timing of the measuring means based on the given correction data, wherein the pin electronics card comprises: There is provided storage means for storing unique correction data for correcting system timing used for the system timing correction means of the card, and based on the correction data stored in the storage means when the pin electronics card is replaced. To correct the system timing of the measuring means Therefore, it is not necessary to obtain correction data for correcting the system timing every time the pin electronics card is replaced, and the time required for the system timing correction can be reduced.

According to a second aspect of the present invention, there is provided a measuring means for supplying a test signal to a device under test, and comparing the output signal from the device under test with expected data to determine pass / fail of the device under test. A pin electronics card having system timing correction means for correcting the system timing of the measuring means based on the given correction data; and a first storage means for storing correction data for correcting the system timing. Processing means for reading correction data from the first storage means when the pin electronics card is replaced and transferring the correction data to the system timing correction means, wherein the pin electronics card is installed in the pin electronics card. System used for system timing correction means A second storage unit for storing unique correction data for correcting timing and identification data for specifying the pin electronics card, wherein the processing unit stores the identification data stored in the second storage unit; And determining whether or not the pin electronics card has been replaced based on the above, and transferring the unique correction data from the second storage means to the first storage means only when the pin electronics card has been replaced.

According to the second aspect of the present invention, there is provided a measuring means for judging the quality of a device to be measured, and a system timing correcting means for correcting the system timing of the measuring means based on the given correction data. A pin memory card, first storage means for storing correction data for correcting the system timing, and reading the correction data from the first storage means when replacing the pin electronics card, the system timing correction means And a processing means for transferring the pin electronics card to the pin electronics card, wherein the pin electronics card stores the unique correction data for correcting the system timing used by the system timing correction means of the pin electronics card and the pin electronics card. Identification data to identify Has been stored, the processing means determines whether or not the pin electronics card has been replaced based on the identification data stored in the second storage means. Only the unique correction data is transferred from the second storage means to the first storage means, so that the IC test apparatus itself can recognize the replaced pin electronics card, and the replaced new pin electronics card can be recognized. Since the correction data for correcting the system timing of the card can be automatically transferred, the data input operation accompanying the system timing correction at the time of replacing the pin electronics card as in the related art is unnecessary, and the erroneous operation can be prevented. The time required for correcting the system timing is further reduced as compared with the first aspect. Can.

[0015]

Embodiments of the present invention will be described below in detail with reference to the drawings. FIG. 1 shows a configuration of an IC test apparatus according to an embodiment of the present invention. The IC test apparatus according to the embodiment of the present invention differs from the conventional IC test apparatus in the configuration in that the pin electronic card 10 has correction data unique to the pin electronic card and identification for specifying the pin electronic card. The memory 104 in which data is stored, the memory 104 and the processing device 20
And a read-back circuit 24 serving as a data reading unit for reading data from the memory 104, and the function of the processing device. Other configurations are the same.

An IC test apparatus according to an embodiment of the present invention supplies a test signal to a device under test 16 and compares the output signal from the device under test 16 with expected data to determine the quality of the device under test 16. Measurement circuit 1 to judge
00, a system electronics correction circuit 102 for correcting the system timing of the measurement circuit 100 based on the given correction data, a pin electronics card 10 having a memory 104, and correction data for correcting the system timing are stored. Hard disk 22
And a read-back circuit 24 that reads correction data from the hard disk 22 when the pin electronics card 10 is replaced and transfers the correction data to the system cal correction circuit 102. The pin electronics card 10 is connected to a device board 14 via a connector 12, and a device to be measured is mounted on the device board 14.

The processing unit 20 includes a CPU 200 and a memory 202, and reads data from and to the system cal correction circuit 102 via the interface 18.
Perform a transfer. The memory 104 includes, as correction data for correcting the system timing unique to the system timing of the pin electronics card provided with the memory 104 and identification data for specifying the pin electronics card, the present invention. In the form, for example, a serial number such as a manufacturing number is stored.

The processing unit 20 determines whether or not the pin electronics card has been replaced based on the identification data stored in the memory 104, and only when the pin electronics card has been replaced, the unique correction data is stored in the hard disk 22 by the memory 104.
Transfer to The measuring circuit 100 is the measuring means of the present invention, the system cal correction circuit 102 is the system timing correcting means of the present invention, the hard disk 22 is the first storage means of the present invention, and the processing device 20 is the processing means of the present invention. In addition, the memory 104 corresponds to the storage unit of the present invention or the second storage unit.

FIG. 2 shows the contents of the system timing correction process executed by the CPU 200 of the processing device 20. In the figure, when the power of the IC test apparatus is turned on at the start of the correction process (step 300), the serial number which is the identification data of the pin electronics card 10 is read from the memory 104 provided in the pin electronics card 10 (step 300). 302), the serial number and the correction file 2 in the hard disk 22.
Compare with the serial number of 20 and if they match,
It is determined that the pin electronics card 10 has not been replaced (step 304), the system timing correction data stored in the hard disk 22 is transferred as it is, and the system timing correction circuit 102 corrects the system timing (step 314). ).

On the other hand, if the serial number read from the memory 104 in step 304 is different from the serial number in the correction file 220 of the hard disk 22, it is determined that the pin electronics card 10 has been replaced (step 304) and stored in the memory 104. The correction data for correcting the system timing is read via the readback circuit 24 and written to a file in the memory 202 in the processing device 20 (step 30).
6,308,310). Next, the file is transferred to the hard disk 22 and stored (step 312). The correction data stored in the hard disk 22 is transferred to the system cal correction circuit 102 to correct the system timing (step 314).

As described above, according to the IC test apparatus according to the embodiment of the present invention, the memory for storing the correction data for correcting the system timing is provided in the pin electronics card. It is not necessary to reacquire the correction data every time the card is replaced, so that the time required for correcting the system timing can be reduced. Also, by storing a serial number as identification data for identifying the pin electronics card in a memory in which the correction data for correcting the system timing is stored, the system itself can recognize the replaced card and replace the new pin electronics card. Since the correction data can be automatically transferred, the erroneous operation can be prevented and the time can be further reduced.
The identification data for specifying the pin electronics card is not limited to the serial number, but may be other data.

[0022]

As described above, according to the first aspect of the present invention, a test signal is supplied to a device under test,
A measuring unit for determining whether the device under test is good or not by comparing the output signal from the device under test with expected data; and a system timing correcting unit for correcting the system timing of the measuring unit based on the given correction data. In the IC test apparatus having the pin electronics card configured to include the following, unique correction data for correcting the system timing used for the system timing correction means of the pin electronics card is stored in the pin electronics card. Storage means is provided, and when the pin electronics card is replaced, the system timing of the measuring means is corrected based on the correction data stored in the storage means. Correct It is not necessary to obtain the correction data, it is possible to shorten the time required for system timing correction. According to the second aspect of the present invention, a pin electronics card having a measuring means for judging the quality of a device under test and a system timing correcting means for correcting the system timing of the measuring means based on the given correction data. And first storage means for storing correction data for correcting the system timing, and reading the correction data from the first storage means when the pin electronics card is replaced, and transferring the data to the system timing correction means. And a unique correction data for correcting the system timing used for the system timing correction means of the pin electronics card, and an identification for specifying the pin electronics card. Data is stored A second storage unit, wherein the processing unit determines whether or not the pin electronics card has been replaced based on the identification data stored in the second storage unit, and only when the pin electronics card has been replaced, The correction data is stored in the first storage unit from the second storage unit.
The IC test apparatus itself can recognize the replaced pin electronics card, and automatically transfer the correction data for correcting the system timing of the replaced new pin electronics card. This eliminates the need for a data input operation associated with the system timing correction at the time of replacing the pin electronics card as in the related art, thereby preventing erroneous operations and requiring the system timing correction as compared with the first aspect of the present invention. The time can be further reduced.

[Brief description of the drawings]

FIG. 1 is a block diagram showing a configuration of an IC test apparatus according to an embodiment of the present invention.

FIG. 2 is an IC test apparatus according to an embodiment of the present invention.

FIG. 3 is a block diagram showing a configuration of a conventional IC test apparatus.

FIG. 4 is a flowchart showing the contents of a system timing correction process in a conventional IC test apparatus.

[Explanation of symbols]

10 Pin Electronics Card 14 Device Board 16 Device Under Test 18 Interface (I / F (Control Circuit)) 20 Processing Unit 22 Hard Disk 24 Readback Circuit 100 Measurement Circuit (Measurement Unit) 102 System Cal Correction Circuit (System Timing Correction Unit) 104 Memory (storage means) 200 CPU 202 Memory 220 Correction file

Claims (2)

[Claims] 1. A test signal is supplied to a device under test,
A measuring unit for determining whether the device under test is good or not by comparing the output signal from the device under test with expected data; and a system timing correcting unit for correcting the system timing of the measuring unit based on the given correction data. In an IC test apparatus having a pin electronics card configured to include the pin electronics card, unique correction data for correcting a system timing used for a system timing correction unit of the pin electronics card is stored. An IC test apparatus comprising a storage unit, wherein the system timing of the measuring unit is corrected based on the correction data stored in the storage unit when the pin electronics card is replaced. 2. A measuring means for supplying a test signal to a device under test, and judging pass / fail of the device under test by comparing an output signal from the device under test with expected data;
A pin electronics card having system timing correction means for correcting the system timing of the measurement means based on the given correction data; a first storage means for storing correction data for correcting the system timing; Processing means for reading correction data from the first storage means when the pin electronics card is replaced and transferring the correction data to the system timing correction means, wherein the pin electronics card contains A second storage unit storing unique correction data for correcting the system timing used for the system timing correction unit and identification data for specifying the pin electronics card, wherein the processing unit includes the second storage unit; Stored in storage means Determining whether the pin electronics card has been replaced based on the identification data, and transferring the unique correction data from the second storage means to the first storage means only when the pin electronics card has been replaced. IC test equipment.