JPH06186281A - Reliability evaluating board and burn-in device - Google Patents

Abstract

PURPOSE:To execute a burn-in test in which data of high reliability is obtained. CONSTITUTION:When an evaluating board 100 is initially used, testing conditions (temperature, frequency of a stress signal, a power source voltage, etc.) to be stored are input from an external apparatus to a memory module 101. From next time, pieces of information stored in the module 101 are read and sent to a controller of a burn-in device, thereby setting suitable testing conditions without hands. Further, if a historical time is written each time the board 100 is used, its life can be grasped to prevent an erroneous use of a deteriorated evaluating board 100.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a reliability evaluation board and a burn-in device used in a burn-in test carried out to evaluate the reliability of a semiconductor integrated circuit.

[0002]

2. Description of the Related Art First, a burn-in test will be briefly described. The burn-in test is a test for operating an LSI chip at high temperature, and has two main purposes. One purpose is to screen and remove unreliable samples in a short time of about 24 hours at the time of shipping, and another purpose is to evaluate the original life of the product by a test of 1000 hours or more. That is. In either case,
It gives the chip severe conditions.

In this test, a plurality of LSI chip evaluation samples are used as a reliability evaluation board (also called a burn-in board).
It is placed in a burn-in device in a state of being lined up on the above, and a signal produced by the burn-in device is input to the LSI chip to operate.

[0004]

However, the LSI chip naturally deteriorates, but not only the evaluation board also deteriorates. Originally, the evaluation board should not be deteriorated, but naturally it is deteriorated such as a contact failure because it is exposed to high temperature and high voltage. However, conventionally, an evaluation board used for a burn-in test has an LSI chip mounted,
The burn-in device has only the function of applying an electrical stress signal, and the burn-in device is not managed at all regarding the evaluation board, such as the usage history. If this happens, it will be difficult for the burn-in device side to determine whether the LSI chip is defective or the evaluation board is defective, and erroneous data will be taken.

In view of the above problems, an object of the present invention is to provide a reliability evaluation board and a burn-in device which enable a burn-in test to be performed in which highly reliable data can be obtained.

[0006]

A reliability evaluation board according to claim 1 is provided with an integrated circuit for storing test information and an information input / output unit for inputting / outputting test information to / from the integrated circuit. Characterize. The burn-in device according to claim 2,
A mechanism for connecting to the information input / output unit of the reliability evaluation board according to claim 1 for reading test information of the integrated circuit of the reliability evaluation board, a mechanism for writing the test information to the integrated circuit, and a mechanism for judging the test information. Is provided.

[0007]

The reliability evaluation board of the present invention is provided with an integrated circuit for storing test information and an information input / output section for inputting / outputting test information to / from the integrated circuit. The burn-in device is connected to the integrated circuit of the reliability evaluation board to read and write the test information and judge the test information. If the history of the test time is stored in the integrated circuit of the reliability evaluation board as the test information, the reliability evaluation board has a long life time and has a long history time when the reliability evaluation board is mounted on the burn-in device. The board is determined to be unable to start or continue testing. Therefore, it is possible to prevent the use of the deteriorated reliability evaluation board and obtain highly reliable data. Also, as test information, if suitable test conditions such as temperature, frequency of stress signal, and power supply voltage are stored in the integrated circuit of the reliability evaluation board once, the test conditions suitable when mounted on the burn-in device are stored. Is read, and there is no error in the setting of test conditions, and an efficient and accurate test can be performed.

[0008]

Embodiments of the present invention will be described below. [First Embodiment] FIG. 1 shows a reliability evaluation board according to an embodiment of the present invention. In FIG. 1, 100 is a reliability evaluation board (hereinafter simply referred to as “evaluation board”), 101 is a memory module containing an integrated circuit having a nonvolatile memory element and input / output electrodes to the integrated circuit, and 102 is a memory. A memory module connector (information input / output unit) connected to the input / output electrodes of the module 101, and 103 is a connector for inputting a stress signal to the evaluation sample 104.

The operation of the evaluation board configured as described above will be described below with reference to FIG. First, when the evaluation board 100 is used for the first time, a test condition to be stored in the memory module 101 is input from an external device. The test conditions to be stored are temperature, frequency of stress signal, power supply voltage and the like.

From the next time onward, the information stored in the memory module 101 is read out and sent to the control section of the burn-in device, so that appropriate test conditions can be set without human intervention. Further, by writing the history time each time the evaluation board 100 is used, the life can be grasped and the deteriorated evaluation board 100 can be prevented from being used by mistake.

As described above, it is possible to carry out the burn-in test in which the error of the setting condition and the error of the data due to the use of the defective board are suppressed and the highly reliable data can be obtained efficiently. Furthermore, memory module 1
By incorporating not only a storage element but also a microprocessor in 01, not only information can be stored, but also a higher degree of correspondence can be achieved. For example, it is possible to calculate the stress signal according to the number of the evaluation samples 104 mounted on the evaluation board 100 and the power consumption.

At least one of the memory module 101 and the memory module connector 102 is detachable from the evaluation board 100. By making it removable, the evaluation board 100 is exposed to high temperature and high voltage and deteriorates.
Since the memory module connector 102 does not deteriorate, the detached portion can be reused even if the evaluation board 100 is discarded. Also, the evaluation board 10
It is also convenient when processing to reproduce 0.

[Second Embodiment] Next, a second embodiment will be described with reference to the drawings. FIG. 2 is a configuration diagram of a burn-in system according to an embodiment of the present invention.
In FIG. 2, 200 is the memory module connector 102 (see FIG. 1) of the evaluation board 100 shown in the first embodiment.
(Refer to FIG. 4), a memory circuit information input / output mechanism, 201 is a central control unit composed of a microcomputer that controls each part of the burn-in device, 203 is a data input keyboard to the central control unit 201, and 204 is a central part. CR which is the standard output display of the control unit 201
T, 202 is an interface circuit for controlling input / output of information between the central controller 202 and each of the other control systems, 205 is a time control system for managing time, 206 is a temperature control system, 20
Reference numeral 7 is a stress signal control system, and 208 is a power supply voltage control system.

The required hardware is connected to each of the control systems 205 to 208 and the storage circuit information input / output mechanism 200 to form a burn-in device. The evaluation board 100 shown in the first embodiment is installed in this burn-in device. The evaluation board 100 and the central controller 201 are electrically connected by the memory circuit information input / output mechanism 200.
Memory module 1 provided on the evaluation board 100
The information stored in the integrated circuit 01 (see FIG. 1) is read and stored in the central controller 201. Central controller 20
1 transfers each information to each control system. Especially, the usage history time of the evaluation board 100 is strictly managed,
The evaluation board 100, which has reached the end of its life, is controlled so that the test cannot be started or continued.

As described above, by using the evaluation board 100 of the first embodiment and storing the history of the test time as the test information in the integrated circuit of the evaluation board 100, the evaluation board 100 is burned in. When installed in the device,
It is determined that the evaluation board 100 having a long life time and having a long history time cannot start or continue the test. Therefore, the deteriorated evaluation board 100 can be prevented from being used, and highly reliable data can be obtained. Further, as the test information, if suitable test conditions such as temperature, frequency of stress signal, and power supply voltage are stored in the integrated circuit of the evaluation board 100 once, the test conditions suitable at the time of being attached to the burn-in device will be obtained. It is possible to carry out accurate and efficient reading without any error in the setting of the test conditions without being read.

[0016]

The reliability evaluation board of the present invention is provided with an integrated circuit for storing test information and an information input / output section for inputting / outputting test information to / from this integrated circuit. By connecting the burn-in device of the present invention, the test information is read and written and the test information is judged in the integrated circuit of the reliability evaluation board. If the history of the test time is stored in the integrated circuit of the reliability evaluation board as the test information, the reliability evaluation board has a long life time and has a long history time when the reliability evaluation board is mounted on the burn-in device. The board is determined to be unable to start or continue testing. Therefore, it is possible to prevent the use of the deteriorated reliability evaluation board and obtain highly reliable data. In addition, if appropriate test conditions such as temperature, frequency of stress signal, and power supply voltage are stored in the integrated circuit of the reliability evaluation board as test information once, the test conditions that are suitable at the time of being mounted on the burn-in device can be obtained. Is read, and there is no error in the setting of test conditions, and an efficient and accurate test can be performed.

[Brief description of drawings]

FIG. 1 is a configuration diagram of a reliability evaluation board according to a first embodiment of the present invention.

FIG. 2 is a configuration diagram of a burn-in device according to a second embodiment of the present invention.

[Explanation of symbols]

100 Evaluation Board 101 Memory Module 102 Memory Module Connector (Information Input / Output Section) 103 Signal Input Connector 104 Evaluation Sample 200 Storage Circuit Information Input / Output Mechanism 201 Central Control Unit 202 Interface Circuit 203 Keyboard 204 CRT 205 Time Control System 206 Temperature Control System 207 Stress signal control system 208 Power supply voltage control system

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Claims (2)

[Claims] 1. A reliability evaluation board used in a burn-in test, comprising: an integrated circuit for storing test information; and an information input / output unit for inputting / outputting test information to / from the integrated circuit. Reliability evaluation board. 2. A mechanism for connecting to the information input / output unit of the reliability evaluation board according to claim 1, for reading test information of an integrated circuit of the reliability evaluation board, and a mechanism for writing test information to the integrated circuit. A burn-in device having a mechanism for judging test information.