JP2000079114A5 - - Google Patents

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Publication number
JP2000079114A5
JP2000079114A5 JP1999232228A JP23222899A JP2000079114A5 JP 2000079114 A5 JP2000079114 A5 JP 2000079114A5 JP 1999232228 A JP1999232228 A JP 1999232228A JP 23222899 A JP23222899 A JP 23222899A JP 2000079114 A5 JP2000079114 A5 JP 2000079114A5
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JP
Japan
Prior art keywords
detector
standard value
cell
cell data
normalizing
Prior art date
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Application number
JP1999232228A
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English (en)
Japanese (ja)
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JP4782905B2 (ja
JP2000079114A (ja
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Publication date
Priority claimed from US09/140,110 external-priority patent/US6327329B1/en
Application filed filed Critical
Publication of JP2000079114A publication Critical patent/JP2000079114A/ja
Publication of JP2000079114A5 publication Critical patent/JP2000079114A5/ja
Application granted granted Critical
Publication of JP4782905B2 publication Critical patent/JP4782905B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP23222899A 1998-08-25 1999-08-19 検出器のセル間ばらつきを監視する方法及び計算機式断層撮影システム Expired - Lifetime JP4782905B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/140,110 US6327329B1 (en) 1998-08-25 1998-08-25 Methods and apparatus for monitoring detector image quality
US09/140110 1998-08-25

Publications (3)

Publication Number Publication Date
JP2000079114A JP2000079114A (ja) 2000-03-21
JP2000079114A5 true JP2000079114A5 (enExample) 2008-11-27
JP4782905B2 JP4782905B2 (ja) 2011-09-28

Family

ID=22489804

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23222899A Expired - Lifetime JP4782905B2 (ja) 1998-08-25 1999-08-19 検出器のセル間ばらつきを監視する方法及び計算機式断層撮影システム

Country Status (4)

Country Link
US (1) US6327329B1 (enExample)
EP (1) EP0982683A3 (enExample)
JP (1) JP4782905B2 (enExample)
IL (1) IL131402A (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10025460B4 (de) * 2000-05-23 2004-03-18 Harman Audio Electronic Systems Gmbh Hochtonlautsprecher
US6652143B2 (en) * 2001-04-12 2003-11-25 Siemens Aktiengesellschaft Method and apparatus for measuring the position, shape, size and intensity distribution of the effective focal spot of an x-ray tube
US6535572B2 (en) * 2001-06-15 2003-03-18 Ge Medical Systems Global Technology Company, Llc Methods and apparatus for compensating computed tomographic channel ganging artifacts
KR100446638B1 (ko) * 2001-10-04 2004-09-04 주식회사 팬택앤큐리텔 다중 패킷 호 지원이 가능한 패킷 단말기 및 이 패킷단말기에서의 다중 패킷 호 지원 방법
DE10237546B4 (de) * 2002-08-16 2007-11-29 Siemens Ag Röntgen-Computertomographie-Gerät mit Filter
US7062011B1 (en) * 2002-12-10 2006-06-13 Analogic Corporation Cargo container tomography scanning system
JP2006513764A (ja) * 2003-02-20 2006-04-27 コーニンクレッカ　フィリップス　エレクトロニクス　エヌ　ヴィ 非対称コーンビーム
US6907101B2 (en) * 2003-03-03 2005-06-14 General Electric Company CT detector with integrated air gap
JP2005028114A (ja) * 2003-06-18 2005-02-03 Canon Inc 放射線撮影装置及び放射線撮影方法
US7020243B2 (en) * 2003-12-05 2006-03-28 Ge Medical Systems Global Technology Company Llc Method and system for target angle heel effect compensation
US7430282B2 (en) * 2004-03-29 2008-09-30 National Institute Of Radiological Sciences Heel effect compensation filter X-ray irradiator, X-ray CT scanner and method for X-ray CT imaging
US7086780B2 (en) * 2004-05-20 2006-08-08 General Electric Company Methods for spectrally calibrating CT imaging apparatus detectors
JP2006145431A (ja) * 2004-11-22 2006-06-08 Ge Medical Systems Global Technology Co Llc 放射線検出器、放射線撮像装置、放射線ｃｔ装置及び放射線検出器の製造方法
US7391844B2 (en) * 2005-01-14 2008-06-24 General Electric Company Method and apparatus for correcting for beam hardening in CT images
EP2029019A1 (en) * 2006-06-02 2009-03-04 Philips Intellectual Property & Standards GmbH X-ray image apparatus and device for and method of calibrating an x-ray image apparatus
JP5216680B2 (ja) * 2009-04-23 2013-06-19 株式会社日立メディコ Ｘ線ｃｔ装置およびこれを用いたデータ取得方法
JP5995491B2 (ja) * 2012-04-06 2016-09-21 株式会社日立製作所 Ｘ線ｃｔ装置
US12625090B2 (en) * 2021-08-16 2026-05-12 Carl Zeiss Smt Gmbh Imaging optical arrangement to image an object illuminated by X-rays

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0109205A3 (en) * 1982-11-15 1985-07-31 Picker International, Inc. Method and apparatus for computed tomography imaging
JPS6456036A (en) * 1987-08-26 1989-03-02 Hitachi Medical Corp X-ray ct apparatus
JP2882048B2 (ja) * 1990-11-29 1999-04-12 松下電器産業株式会社 検出素子の感度補正方法とｘ線検出装置
US5301108A (en) * 1993-02-01 1994-04-05 General Electric Company Computed tomography system with z-axis correction
US5521482A (en) * 1993-06-29 1996-05-28 Liberty Technologies, Inc. Method and apparatus for determining mechanical performance of polyphase electrical motor systems
US5931780A (en) * 1993-11-29 1999-08-03 Arch Development Corporation Method and system for the computerized radiographic analysis of bone
US5450461A (en) * 1993-12-30 1995-09-12 General Electric Company Self-calibrating computed tomography imaging system
US5430785A (en) * 1994-04-11 1995-07-04 General Electric Company Detector channel gain calibration using focal spot wobble
US5473663A (en) * 1994-09-12 1995-12-05 General Electric Company Method for evaluating the performance of detectors in a computed tomography system
US5533081A (en) * 1995-01-17 1996-07-02 General Electric Company Guided ringfix algorithm for image reconstruction
IL116738A0 (en) 1995-01-23 1996-05-14 Gen Electric Detector z-axis gain correction for a ct system
JP3549169B2 (ja) * 1995-03-10 2004-08-04 株式会社日立メディコ Ｘ線ｃｔ装置
JPH09248301A (ja) * 1996-03-15 1997-09-22 Ge Yokogawa Medical Syst Ltd Ｘ線検出器の特性改善方法及びｘ線ｃｔ装置
JP3763611B2 (ja) * 1996-07-12 2006-04-05 株式会社東芝 Ｘ線ｃｔスキャナ
US5734691A (en) * 1996-12-23 1998-03-31 General Electric Company Detector z-axis gain non-uniformity correction in a computed tomography system
US6115448A (en) 1997-11-26 2000-09-05 General Electric Company Photodiode array for a scalable multislice scanning computed tomography system
US6134292A (en) * 1998-07-13 2000-10-17 General Electric Company Methods and apparatus for reducing z-axis non-uniformity artifacts

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