ITTO930036A0 - Circuito integrato a semiconduttore e relativo procedimento di collau-do. - Google Patents
Circuito integrato a semiconduttore e relativo procedimento di collau-do.Info
- Publication number
- ITTO930036A0 ITTO930036A0 IT93TO36A ITTO930036A ITTO930036A0 IT TO930036 A0 ITTO930036 A0 IT TO930036A0 IT 93TO36 A IT93TO36 A IT 93TO36A IT TO930036 A ITTO930036 A IT TO930036A IT TO930036 A0 ITTO930036 A0 IT TO930036A0
- Authority
- IT
- Italy
- Prior art keywords
- integrated circuit
- semiconductor integrated
- testing procedure
- related testing
- procedure
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 1
- 238000012956 testing procedure Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/26—Accessing multiple arrays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4009860A JPH05198637A (ja) | 1992-01-23 | 1992-01-23 | 半導体集積回路及びそのテスト方法 |
Publications (3)
Publication Number | Publication Date |
---|---|
ITTO930036A0 true ITTO930036A0 (it) | 1993-01-22 |
ITTO930036A1 ITTO930036A1 (it) | 1994-07-22 |
IT1260860B IT1260860B (it) | 1996-04-29 |
Family
ID=11731893
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ITTO930036A IT1260860B (it) | 1992-01-23 | 1993-01-22 | Circuito integrato a semiconduttore e relativo procedimento di collaudo |
Country Status (3)
Country | Link |
---|---|
US (1) | US5367263A (it) |
JP (1) | JPH05198637A (it) |
IT (1) | IT1260860B (it) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5787096A (en) * | 1996-04-23 | 1998-07-28 | Micron Technology, Inc. | Circuit and method for testing an integrated circuit |
SG89232A1 (en) * | 1996-05-14 | 2002-06-18 | Texas Instr Singapore Pte Ltd | A process of testing memory parts and equipment for conducting the testing |
SG85066A1 (en) * | 1996-05-14 | 2001-12-19 | Texas Instr Singapore Pte Ltd | Test board and process of testing wide word memoryparts |
US5727001A (en) | 1996-08-14 | 1998-03-10 | Micron Technology, Inc. | Circuit and method for testing an integrated circuit |
US5754559A (en) * | 1996-08-26 | 1998-05-19 | Micron Technology, Inc. | Method and apparatus for testing integrated circuits |
TW442945B (en) * | 1998-11-20 | 2001-06-23 | Sony Computer Entertainment Inc | Integrated circuit chip, integrated circuit device, printed circuit board and electronic machine |
US20040051550A1 (en) * | 2002-09-12 | 2004-03-18 | Ma David Suitwai | Semiconductor die isolation system |
EP1695103A1 (en) * | 2003-11-19 | 2006-08-30 | Honeywell International Inc. | Pseudo random verification of a device under test in the presence of byzantine faults |
JP2006106132A (ja) * | 2004-09-30 | 2006-04-20 | Sharp Corp | 表示駆動回路および表示装置 |
US7475318B2 (en) * | 2005-01-28 | 2009-01-06 | Honeywell International Inc. | Method for testing the sensitive input range of Byzantine filters |
FR3035750B1 (fr) * | 2015-04-30 | 2018-06-15 | Schneider Electric Industries Sas | Dispositif de protection d'un reseau electrique |
KR102388044B1 (ko) * | 2015-10-19 | 2022-04-19 | 삼성전자주식회사 | 테스트 장치 및 이를 포함하는 테스트 시스템 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4038648A (en) * | 1974-06-03 | 1977-07-26 | Chesley Gilman D | Self-configurable circuit structure for achieving wafer scale integration |
US4479088A (en) * | 1981-01-16 | 1984-10-23 | Burroughs Corporation | Wafer including test lead connected to ground for testing networks thereon |
DE3526485A1 (de) * | 1985-07-24 | 1987-02-05 | Heinz Krug | Schaltungsanordnung zum pruefen integrierter schaltungseinheiten |
US4956602A (en) * | 1989-02-14 | 1990-09-11 | Amber Engineering, Inc. | Wafer scale testing of redundant integrated circuit dies |
US5059899A (en) * | 1990-08-16 | 1991-10-22 | Micron Technology, Inc. | Semiconductor dies and wafers and methods for making |
-
1992
- 1992-01-23 JP JP4009860A patent/JPH05198637A/ja active Pending
- 1992-12-29 US US07/997,920 patent/US5367263A/en not_active Expired - Fee Related
-
1993
- 1993-01-22 IT ITTO930036A patent/IT1260860B/it active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
US5367263A (en) | 1994-11-22 |
IT1260860B (it) | 1996-04-29 |
ITTO930036A1 (it) | 1994-07-22 |
JPH05198637A (ja) | 1993-08-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
0001 | Granted |