ITMI992429A0 - Apparato e metodo per misurare la grammatura o lo spessore di material i in film nastri e simili per la contemporanea ispezione superficiale - Google Patents

Apparato e metodo per misurare la grammatura o lo spessore di material i in film nastri e simili per la contemporanea ispezione superficiale

Info

Publication number
ITMI992429A0
ITMI992429A0 IT99MI002429A ITMI992429A ITMI992429A0 IT MI992429 A0 ITMI992429 A0 IT MI992429A0 IT 99MI002429 A IT99MI002429 A IT 99MI002429A IT MI992429 A ITMI992429 A IT MI992429A IT MI992429 A0 ITMI992429 A0 IT MI992429A0
Authority
IT
Italy
Prior art keywords
measuring
thickness
materials
similar
weight
Prior art date
Application number
IT99MI002429A
Other languages
English (en)
Inventor
Francesco Traficante
Sergio Chiodini
Original Assignee
Electronic Systems Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electronic Systems Spa filed Critical Electronic Systems Spa
Priority to IT1999MI002429A priority Critical patent/IT1314075B1/it
Publication of ITMI992429A0 publication Critical patent/ITMI992429A0/it
Priority to DE60004000T priority patent/DE60004000T2/de
Priority to EP00124723A priority patent/EP1103783B1/en
Publication of ITMI992429A1 publication Critical patent/ITMI992429A1/it
Application granted granted Critical
Publication of IT1314075B1 publication Critical patent/IT1314075B1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G17/00—Apparatus for or methods of weighing material of special form or property
    • G01G17/02—Apparatus for or methods of weighing material of special form or property for weighing material of filamentary or sheet form
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01G—WEIGHING
    • G01G9/00—Methods of, or apparatus for, the determination of weight, not provided for in groups G01G1/00 - G01G7/00
    • G01G9/005—Methods of, or apparatus for, the determination of weight, not provided for in groups G01G1/00 - G01G7/00 using radiations, e.g. radioactive

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Treatment Of Fiber Materials (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
IT1999MI002429A 1999-11-19 1999-11-19 Apparato e metodo per misurare la grammatura o lo spessore dimateriali in film,nastri e simili per la contemporanea ispezione IT1314075B1 (it)

Priority Applications (3)

Application Number Priority Date Filing Date Title
IT1999MI002429A IT1314075B1 (it) 1999-11-19 1999-11-19 Apparato e metodo per misurare la grammatura o lo spessore dimateriali in film,nastri e simili per la contemporanea ispezione
DE60004000T DE60004000T2 (de) 1999-11-19 2000-11-13 Vorrichtung und Verfahren zur Messung des Flächengewichts und der Dicke von Materialien in Filmen, Bändern oder ähnlichem, unter gleichzeitiger Inspektion von deren Oberfläche
EP00124723A EP1103783B1 (en) 1999-11-19 2000-11-13 Equipment and method for measuring the basic weight and thickness of the materials in films, ribbons and the like, while simultaneously inspecting their surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT1999MI002429A IT1314075B1 (it) 1999-11-19 1999-11-19 Apparato e metodo per misurare la grammatura o lo spessore dimateriali in film,nastri e simili per la contemporanea ispezione

Publications (3)

Publication Number Publication Date
ITMI992429A0 true ITMI992429A0 (it) 1999-11-19
ITMI992429A1 ITMI992429A1 (it) 2001-05-19
IT1314075B1 IT1314075B1 (it) 2002-12-04

Family

ID=11383993

Family Applications (1)

Application Number Title Priority Date Filing Date
IT1999MI002429A IT1314075B1 (it) 1999-11-19 1999-11-19 Apparato e metodo per misurare la grammatura o lo spessore dimateriali in film,nastri e simili per la contemporanea ispezione

Country Status (3)

Country Link
EP (1) EP1103783B1 (it)
DE (1) DE60004000T2 (it)
IT (1) IT1314075B1 (it)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10214584B4 (de) * 2002-03-01 2004-07-08 Mahlo Gmbh & Co Kg Verfahren zur Kompensation des Einflusses physikalisch-chemischer, das Resultat einer Flächengewichtsmessung verfälschender Änderungen des Absorptionsvermögens einer Umgebungsatmosphäre in der Nähe geförderter Materialien
JP6592281B2 (ja) * 2015-06-11 2019-10-16 住友化学株式会社 目付量測定方法、積層フィルム製造方法、及び目付量測定装置
CN105510360B (zh) * 2015-12-31 2019-04-09 安徽元琛环保科技股份有限公司 一种非织造材料在线检测装置及其检测方法
CN113008170B (zh) * 2021-03-19 2022-08-19 长江存储科技有限责任公司 一种厚度测量方法和系统
CN117490812B (zh) * 2023-12-29 2024-04-02 常州宏大智慧科技有限公司 一种织物幅向克重偏差在线检测方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4720808A (en) * 1985-05-15 1988-01-19 Josef Repsch Method and apparatus for measuring sheet products
GB8601176D0 (en) * 1986-01-17 1986-02-19 Infrared Eng Ltd Sensing
US5118940A (en) * 1991-02-25 1992-06-02 Jefferson Smurfit Corporation Paper basis weight detector
DE4325590A1 (de) * 1993-07-30 1995-02-02 Bodenseewerk Geraetetech Verfahren und Vorrichtung zur Qualitätskontrolle von mit einer dünnen Schicht versehenen Trägerfolien
IT1283347B1 (it) * 1996-07-29 1998-04-17 Electronic Systems Spa Metodo ed apperecchiatura per misurare con precisione un film che avanza,su tutta la sua superficie
US5715051A (en) * 1996-10-21 1998-02-03 Medar, Inc. Method and system for detecting defects in optically transmissive coatings formed on optical media substrates
ATE225497T1 (de) * 1997-07-07 2002-10-15 Siemens Ag Verfahren und vorrichtung zur ermittlung der dicke von papier oder pappe durch messung an einer laufenden materialbahn

Also Published As

Publication number Publication date
DE60004000D1 (de) 2003-08-28
EP1103783B1 (en) 2003-07-23
IT1314075B1 (it) 2002-12-04
DE60004000T2 (de) 2004-05-27
EP1103783A1 (en) 2001-05-30
ITMI992429A1 (it) 2001-05-19

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