IT1314075B1 - Apparato e metodo per misurare la grammatura o lo spessore dimateriali in film,nastri e simili per la contemporanea ispezione - Google Patents
Apparato e metodo per misurare la grammatura o lo spessore dimateriali in film,nastri e simili per la contemporanea ispezioneInfo
- Publication number
- IT1314075B1 IT1314075B1 IT1999MI002429A ITMI992429A IT1314075B1 IT 1314075 B1 IT1314075 B1 IT 1314075B1 IT 1999MI002429 A IT1999MI002429 A IT 1999MI002429A IT MI992429 A ITMI992429 A IT MI992429A IT 1314075 B1 IT1314075 B1 IT 1314075B1
- Authority
- IT
- Italy
- Prior art keywords
- dimaterial
- tapes
- measuring
- film
- thickness
- Prior art date
Links
- 238000007689 inspection Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01G—WEIGHING
- G01G17/00—Apparatus for or methods of weighing material of special form or property
- G01G17/02—Apparatus for or methods of weighing material of special form or property for weighing material of filamentary or sheet form
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
- G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01G—WEIGHING
- G01G9/00—Methods of, or apparatus for, the determination of weight, not provided for in groups G01G1/00 - G01G7/00
- G01G9/005—Methods of, or apparatus for, the determination of weight, not provided for in groups G01G1/00 - G01G7/00 using radiations, e.g. radioactive
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Treatment Of Fiber Materials (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT1999MI002429A IT1314075B1 (it) | 1999-11-19 | 1999-11-19 | Apparato e metodo per misurare la grammatura o lo spessore dimateriali in film,nastri e simili per la contemporanea ispezione |
EP00124723A EP1103783B1 (en) | 1999-11-19 | 2000-11-13 | Equipment and method for measuring the basic weight and thickness of the materials in films, ribbons and the like, while simultaneously inspecting their surface |
DE60004000T DE60004000T2 (de) | 1999-11-19 | 2000-11-13 | Vorrichtung und Verfahren zur Messung des Flächengewichts und der Dicke von Materialien in Filmen, Bändern oder ähnlichem, unter gleichzeitiger Inspektion von deren Oberfläche |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT1999MI002429A IT1314075B1 (it) | 1999-11-19 | 1999-11-19 | Apparato e metodo per misurare la grammatura o lo spessore dimateriali in film,nastri e simili per la contemporanea ispezione |
Publications (3)
Publication Number | Publication Date |
---|---|
ITMI992429A0 ITMI992429A0 (it) | 1999-11-19 |
ITMI992429A1 ITMI992429A1 (it) | 2001-05-19 |
IT1314075B1 true IT1314075B1 (it) | 2002-12-04 |
Family
ID=11383993
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT1999MI002429A IT1314075B1 (it) | 1999-11-19 | 1999-11-19 | Apparato e metodo per misurare la grammatura o lo spessore dimateriali in film,nastri e simili per la contemporanea ispezione |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP1103783B1 (it) |
DE (1) | DE60004000T2 (it) |
IT (1) | IT1314075B1 (it) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10214584B4 (de) * | 2002-03-01 | 2004-07-08 | Mahlo Gmbh & Co Kg | Verfahren zur Kompensation des Einflusses physikalisch-chemischer, das Resultat einer Flächengewichtsmessung verfälschender Änderungen des Absorptionsvermögens einer Umgebungsatmosphäre in der Nähe geförderter Materialien |
JP6592281B2 (ja) * | 2015-06-11 | 2019-10-16 | 住友化学株式会社 | 目付量測定方法、積層フィルム製造方法、及び目付量測定装置 |
CN105510360B (zh) * | 2015-12-31 | 2019-04-09 | 安徽元琛环保科技股份有限公司 | 一种非织造材料在线检测装置及其检测方法 |
CN113008170B (zh) * | 2021-03-19 | 2022-08-19 | 长江存储科技有限责任公司 | 一种厚度测量方法和系统 |
CN117490812B (zh) * | 2023-12-29 | 2024-04-02 | 常州宏大智慧科技有限公司 | 一种织物幅向克重偏差在线检测方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4720808A (en) * | 1985-05-15 | 1988-01-19 | Josef Repsch | Method and apparatus for measuring sheet products |
GB8601176D0 (en) * | 1986-01-17 | 1986-02-19 | Infrared Eng Ltd | Sensing |
US5118940A (en) * | 1991-02-25 | 1992-06-02 | Jefferson Smurfit Corporation | Paper basis weight detector |
DE4325590A1 (de) * | 1993-07-30 | 1995-02-02 | Bodenseewerk Geraetetech | Verfahren und Vorrichtung zur Qualitätskontrolle von mit einer dünnen Schicht versehenen Trägerfolien |
IT1283347B1 (it) * | 1996-07-29 | 1998-04-17 | Electronic Systems Spa | Metodo ed apperecchiatura per misurare con precisione un film che avanza,su tutta la sua superficie |
US5715051A (en) * | 1996-10-21 | 1998-02-03 | Medar, Inc. | Method and system for detecting defects in optically transmissive coatings formed on optical media substrates |
PT995076E (pt) * | 1997-07-07 | 2003-02-28 | Siemens Ag | Metodo e dispositivo para dterminar a espessura de papel ou de cartao, por meio da medicao numa faixa continua de material |
-
1999
- 1999-11-19 IT IT1999MI002429A patent/IT1314075B1/it active
-
2000
- 2000-11-13 EP EP00124723A patent/EP1103783B1/en not_active Expired - Lifetime
- 2000-11-13 DE DE60004000T patent/DE60004000T2/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1103783B1 (en) | 2003-07-23 |
DE60004000T2 (de) | 2004-05-27 |
DE60004000D1 (de) | 2003-08-28 |
ITMI992429A0 (it) | 1999-11-19 |
ITMI992429A1 (it) | 2001-05-19 |
EP1103783A1 (en) | 2001-05-30 |
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