FR2849182B1 - Dispositif pour la mesure de l'epaisseur de couches minces - Google Patents

Dispositif pour la mesure de l'epaisseur de couches minces

Info

Publication number
FR2849182B1
FR2849182B1 FR0314170A FR0314170A FR2849182B1 FR 2849182 B1 FR2849182 B1 FR 2849182B1 FR 0314170 A FR0314170 A FR 0314170A FR 0314170 A FR0314170 A FR 0314170A FR 2849182 B1 FR2849182 B1 FR 2849182B1
Authority
FR
France
Prior art keywords
measuring
layer thickness
thick layer
thick
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0314170A
Other languages
English (en)
Other versions
FR2849182A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Immobiliengesellschaft Helmut Fischer GmbH and Co KG
Original Assignee
Immobiliengesellschaft Helmut Fischer GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Immobiliengesellschaft Helmut Fischer GmbH and Co KG filed Critical Immobiliengesellschaft Helmut Fischer GmbH and Co KG
Publication of FR2849182A1 publication Critical patent/FR2849182A1/fr
Application granted granted Critical
Publication of FR2849182B1 publication Critical patent/FR2849182B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Electromagnetism (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
FR0314170A 2002-12-18 2003-12-03 Dispositif pour la mesure de l'epaisseur de couches minces Expired - Fee Related FR2849182B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE10259696.4A DE10259696B4 (de) 2002-12-18 2002-12-18 Vorrichtung zum Messen der Dicke dünner Schichten

Publications (2)

Publication Number Publication Date
FR2849182A1 FR2849182A1 (fr) 2004-06-25
FR2849182B1 true FR2849182B1 (fr) 2007-07-13

Family

ID=30128898

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0314170A Expired - Fee Related FR2849182B1 (fr) 2002-12-18 2003-12-03 Dispositif pour la mesure de l'epaisseur de couches minces

Country Status (6)

Country Link
US (1) US7076021B2 (fr)
JP (1) JP2004198416A (fr)
CN (1) CN100346134C (fr)
DE (1) DE10259696B4 (fr)
FR (1) FR2849182B1 (fr)
GB (1) GB2398632B (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004020370B4 (de) * 2004-04-23 2006-11-16 Sirona Dental Systems Gmbh Röntgenstrahler und Verfahren zur Erzeugung und Darstellung von Röntgenbildern
US7310410B2 (en) 2004-07-28 2007-12-18 General Electric Co. Single-leaf X-ray collimator
DE102005005835A1 (de) * 2005-02-08 2006-08-10 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Verfahren zur Optimierung von Messzeiten einer Messvorrichtung
CN1316229C (zh) * 2005-09-30 2007-05-16 电子科技大学 无标样测量薄膜厚度和密度的方法
GB2495868B (en) * 2009-03-18 2013-10-23 Helmut Fischer Gmbh Inst Fur Elektronik Und Messtechnik Measurement stand and method of its electrical control
CN101587052B (zh) * 2009-06-15 2011-03-30 浙江大学 基于x射线的密度、浓度和厚度测试装置及方法
JP6429787B2 (ja) * 2013-10-11 2018-11-28 古河電気工業株式会社 被覆厚さ検査方法及び被覆厚さ検査装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3717768A (en) 1970-02-09 1973-02-20 Medinova Ab X-ray filter device in combination with a positioning light converging means
JPS54138656U (fr) 1978-03-20 1979-09-26
DE3144145C2 (de) * 1981-11-06 1986-06-19 Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen Blendenvorrichtung zum Messen dünner Schichten
JPS5897504U (ja) * 1981-12-24 1983-07-02 セイコーインスツルメンツ株式会社 螢光ｘ線膜厚計用コリメ−タ
DE3234410A1 (de) * 1982-09-16 1984-03-22 Siemens AG, 1000 Berlin und 8000 München Strahlenblende fuer ein roentgenuntersuchungsgeraet
DE3239379A1 (de) * 1982-10-23 1984-04-26 Helmut Fischer GmbH & Co Institut für Elektronik und Meßtechnik, 7032 Sindelfingen Vorrichtung zum messen der dicke duenner schichten
JPH0519839Y2 (fr) * 1986-06-09 1993-05-25
DE68907924T2 (de) 1988-01-20 1993-11-11 Horiba Ltd Röntgenstrahlvorrichtung, ausgestattet mit einem Strahlungsbereich-Monitor.
JPH0581700U (ja) 1992-04-07 1993-11-05 セイコー電子工業株式会社 蛍光ｘ線膜厚測定装置
DE4228082C1 (en) 1992-08-24 1993-09-09 Siemens Ag, 80333 Muenchen, De Aperture esp. for X=ray beam - has aperture plate elastically conformable to test object shape
DE4229320C2 (de) * 1992-09-02 1995-02-02 Siemens Ag Einblendvorrichtung für Strahlengeräte mit wenigstens einer Blendenlamelle
US5604353A (en) * 1995-06-12 1997-02-18 X-Ray Optical Systems, Inc. Multiple-channel, total-reflection optic with controllable divergence
JP3059402B2 (ja) 1997-07-09 2000-07-04 理学電機工業株式会社 円筒結晶型分光装置とその製造方法
US6345086B1 (en) * 1999-09-14 2002-02-05 Veeco Instruments Inc. X-ray fluorescence system and method

Also Published As

Publication number Publication date
DE10259696B4 (de) 2018-07-05
CN1508513A (zh) 2004-06-30
US20040131148A1 (en) 2004-07-08
US7076021B2 (en) 2006-07-11
GB2398632A (en) 2004-08-25
FR2849182A1 (fr) 2004-06-25
DE10259696A1 (de) 2004-07-08
GB2398632B (en) 2006-01-04
CN100346134C (zh) 2007-10-31
GB0328815D0 (en) 2004-01-14
JP2004198416A (ja) 2004-07-15

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