ITMI20000284A0 - Dispositivo di videocontrollo compatto can assi di misura composti y z x - Google Patents
Dispositivo di videocontrollo compatto can assi di misura composti y z xInfo
- Publication number
- ITMI20000284A0 ITMI20000284A0 IT2000MI000284A ITMI20000284A ITMI20000284A0 IT MI20000284 A0 ITMI20000284 A0 IT MI20000284A0 IT 2000MI000284 A IT2000MI000284 A IT 2000MI000284A IT MI20000284 A ITMI20000284 A IT MI20000284A IT MI20000284 A0 ITMI20000284 A0 IT MI20000284A0
- Authority
- IT
- Italy
- Prior art keywords
- control device
- video control
- measurement axes
- compact video
- compound measurement
- Prior art date
Links
- 150000001875 compounds Chemical class 0.000 title 1
- 238000005259 measurement Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
-
- G—PHYSICS
- G12—INSTRUMENT DETAILS
- G12B—CONSTRUCTIONAL DETAILS OF INSTRUMENTS, OR COMPARABLE DETAILS OF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR
- G12B5/00—Adjusting position or attitude, e.g. level, of instruments or other apparatus, or of parts thereof; Compensating for the effects of tilting or acceleration, e.g. for optical apparatus
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Geophysics And Detection Of Objects (AREA)
- Alarm Systems (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Mounting And Adjusting Of Optical Elements (AREA)
- Details Of Measuring And Other Instruments (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/256,343 US6518996B1 (en) | 1999-02-22 | 1999-02-22 | Compact video inspection apparatus with Y, Z, X compounded measurement axes |
Publications (3)
Publication Number | Publication Date |
---|---|
ITMI20000284A0 true ITMI20000284A0 (it) | 2000-02-18 |
ITMI20000284A1 ITMI20000284A1 (it) | 2001-08-18 |
IT1316766B1 IT1316766B1 (it) | 2003-05-12 |
Family
ID=22971895
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT2000MI000284A IT1316766B1 (it) | 1999-02-22 | 2000-02-18 | Dispositivo di videocontrollo compatto can assi di misura composti y,z,x. |
Country Status (5)
Country | Link |
---|---|
US (1) | US6518996B1 (it) |
JP (1) | JP2000310597A (it) |
DE (1) | DE19952553B4 (it) |
FR (1) | FR2790170B1 (it) |
IT (1) | IT1316766B1 (it) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6859286B2 (en) * | 2001-03-28 | 2005-02-22 | Bipin Mukherji | Precision video gauging machine for vertically oriented workpieces |
DE20116124U1 (de) * | 2001-10-01 | 2002-02-21 | Werth Messtechnik Gmbh | Koordinatenmessgerät |
US6951392B2 (en) * | 2003-07-09 | 2005-10-04 | 3M Innovative Properties Company | Lens having at least one lens centration mark and methods of making and using same |
US7526118B2 (en) * | 2003-08-06 | 2009-04-28 | Quality Vision International, Inc | Digital video optical inspection apparatus and method for vertically sectioning an object's surface |
US20070193012A1 (en) * | 2006-02-22 | 2007-08-23 | Robert Bergman | Metal forming process |
CN100410623C (zh) * | 2006-09-30 | 2008-08-13 | 赵政康 | 移动龙门式光学坐标测量仪 |
US7808617B2 (en) * | 2007-09-17 | 2010-10-05 | Quality Vision International, Inc. | Dual resolution, dual range sensor system and method |
US7916398B2 (en) * | 2007-10-12 | 2011-03-29 | Quality Vision International, Inc. | High performance front objective for video metrological system |
US7791731B2 (en) * | 2007-12-18 | 2010-09-07 | Quality Vision International, Inc. | Partial coherence interferometer with measurement ambiguity resolution |
US9930297B2 (en) | 2010-04-30 | 2018-03-27 | Becton, Dickinson And Company | System and method for acquiring images of medication preparations |
CN102980514B (zh) * | 2012-11-13 | 2015-09-09 | 苏州富强科技有限公司 | 一种i/o孔检测机台 |
DE102013107948B4 (de) * | 2013-07-25 | 2016-09-15 | Carl Zeiss Industrielle Messtechnik Gmbh | Koordinatenmessgerät sowie Verfahren zum Vermessen von Werkstücken |
US9784564B2 (en) | 2014-12-19 | 2017-10-10 | Quality Vision International, Inc. | Deployment mechanism for optical measurement system |
CN108369193A (zh) * | 2015-12-08 | 2018-08-03 | 伊雷克托科学工业股份有限公司 | 移动传感器坐标检测系统 |
DE102016210236B4 (de) * | 2016-06-09 | 2019-04-18 | Carl Zeiss Industrielle Messtechnik Gmbh | Verfahren und Koordinatenmessgerät zur metrologischen Vermessung von Werkstücken mit Hilfe eines Leuchttischs |
CN107202556B (zh) * | 2017-06-16 | 2019-09-06 | 东莞市奥铭测控智能科技有限公司 | 一种基于影像调整z轴运动垂直度误差的方法 |
CN109297412B (zh) * | 2018-11-19 | 2020-07-03 | 合肥工业大学 | 一种花键轴的花键端面的图像采集装置及花键检测方法 |
CN110530865A (zh) * | 2019-09-10 | 2019-12-03 | 苏州莱锦机电自动化有限公司 | 一种机械配件加工质量检测设备 |
TWI792386B (zh) * | 2021-07-05 | 2023-02-11 | 榮晶生物科技股份有限公司 | 影像檢測裝置、系統及影像檢測方法 |
CN114441147B (zh) * | 2022-04-02 | 2022-06-28 | 北京主线科技有限公司 | 平行光管组件、车载摄像头解析力测量装置及测量方法 |
CN115265359A (zh) * | 2022-06-23 | 2022-11-01 | 宿州捷创模具有限公司 | 汽车钣金验收检具 |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3750295A (en) * | 1971-07-22 | 1973-08-07 | Werkzeugmasch Veb | Measuring machine |
US4328713A (en) * | 1980-03-03 | 1982-05-11 | Eikonix Corporation | Controlling translation |
US4884878A (en) * | 1986-11-17 | 1989-12-05 | Ram Optical Instrumentation, Inc. | Zoom optical unit |
JPS63152293A (ja) * | 1986-12-09 | 1988-06-24 | マイクロワ−ルド オブ インナ− スペ−ス リミテイド | 表示装置 |
US4866629A (en) * | 1987-11-13 | 1989-09-12 | Industrial Technology Research Institute | Machine vision process and apparatus for reading a plurality of separated figures |
DE3806686A1 (de) * | 1988-03-02 | 1989-09-14 | Wegu Messtechnik | Mehrkoordinatenmess- und -pruefeinrichtung |
CH677082A5 (it) * | 1988-06-01 | 1991-04-15 | Bobst Sa | |
US4972311A (en) * | 1988-08-15 | 1990-11-20 | Kulicke And Soffa Industries Inc. | X-Y table error mapping apparatus and method |
JP2727361B2 (ja) * | 1989-07-22 | 1998-03-11 | 株式会社新川 | マーキング装置における版監視方法及び装置 |
KR920003740B1 (ko) * | 1989-10-24 | 1992-05-09 | 한국과학기술연구원 | 3차원 직교좌표형 고속정밀측정기 |
US5184217A (en) * | 1990-08-02 | 1993-02-02 | Doering John W | System for automatically inspecting a flat sheet part |
US5130523A (en) * | 1991-04-22 | 1992-07-14 | Raleigh Freddie L | Coordinate measuring machine with improved flexure and clamp for fiber optic connection |
US5320250A (en) * | 1991-12-02 | 1994-06-14 | Asymptotic Technologies, Inc. | Method for rapid dispensing of minute quantities of viscous material |
DE4140211C2 (de) * | 1991-12-06 | 1999-12-09 | Meurer Nonfood Product Gmbh | Verfahren und Vorrichtung zum Einrichten von Stanzformen sowie zum Ausrichten von Prägeklischees zu einer Prägevorlage |
US5657075A (en) * | 1993-02-05 | 1997-08-12 | Teradyne, Inc. | Method and apparatus for locating and facilitating the repair of defects on a printed circuit board |
US5479252A (en) * | 1993-06-17 | 1995-12-26 | Ultrapointe Corporation | Laser imaging system for inspection and analysis of sub-micron particles |
US6435808B1 (en) * | 1993-10-06 | 2002-08-20 | Tdk Corporation | Chip-type circuit element mounting apparatus |
US5677709A (en) * | 1994-02-15 | 1997-10-14 | Shimadzu Corporation | Micromanipulator system with multi-direction control joy stick and precision control means |
KR100283851B1 (ko) * | 1994-07-11 | 2001-04-02 | 기리야마 겐지 | 모니터 장치 및 모니터 방법 |
US5671086A (en) * | 1995-04-18 | 1997-09-23 | The Regents, University Of California | Method and apparatus for accurately manipulating an object during microelectrophoresis |
US5621530A (en) * | 1995-04-26 | 1997-04-15 | Texas Instruments Incorporated | Apparatus and method for verifying the coplanarity of a ball grid array |
DE69631475T2 (de) * | 1996-07-16 | 2005-01-13 | Perkin-Elmer Ltd., Beaconsfield | Kontrolle einer Mikroskopblende |
US5943551A (en) * | 1997-09-04 | 1999-08-24 | Texas Instruments Incorporated | Apparatus and method for detecting defects on silicon dies on a silicon wafer |
AU1097299A (en) * | 1997-10-17 | 1999-05-10 | Accumed International, Inc. | High-precision computer-aided microscope system |
-
1999
- 1999-02-22 US US09/256,343 patent/US6518996B1/en not_active Expired - Lifetime
- 1999-10-07 FR FR9912498A patent/FR2790170B1/fr not_active Expired - Lifetime
- 1999-10-30 DE DE19952553.6A patent/DE19952553B4/de not_active Expired - Lifetime
-
2000
- 2000-01-28 JP JP2000020335A patent/JP2000310597A/ja active Pending
- 2000-02-18 IT IT2000MI000284A patent/IT1316766B1/it active
Also Published As
Publication number | Publication date |
---|---|
FR2790170A1 (fr) | 2000-08-25 |
US6518996B1 (en) | 2003-02-11 |
IT1316766B1 (it) | 2003-05-12 |
ITMI20000284A1 (it) | 2001-08-18 |
JP2000310597A (ja) | 2000-11-07 |
DE19952553B4 (de) | 2015-02-05 |
FR2790170B1 (fr) | 2005-05-06 |
DE19952553A1 (de) | 2000-08-31 |
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