FR2790170B1 - Appareil de controle video - Google Patents

Appareil de controle video

Info

Publication number
FR2790170B1
FR2790170B1 FR9912498A FR9912498A FR2790170B1 FR 2790170 B1 FR2790170 B1 FR 2790170B1 FR 9912498 A FR9912498 A FR 9912498A FR 9912498 A FR9912498 A FR 9912498A FR 2790170 B1 FR2790170 B1 FR 2790170B1
Authority
FR
France
Prior art keywords
control apparatus
video control
video
control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
FR9912498A
Other languages
English (en)
Other versions
FR2790170A1 (fr
Inventor
Edward T Polidor
Albert G Choate
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Optical Gaging Products Inc
Original Assignee
Optical Gaging Products Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Optical Gaging Products Inc filed Critical Optical Gaging Products Inc
Publication of FR2790170A1 publication Critical patent/FR2790170A1/fr
Application granted granted Critical
Publication of FR2790170B1 publication Critical patent/FR2790170B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G—PHYSICS
    • G12—INSTRUMENT DETAILS
    • G12B—CONSTRUCTIONAL DETAILS OF INSTRUMENTS, OR COMPARABLE DETAILS OF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G12B5/00—Adjusting position or attitude, e.g. level, of instruments or other apparatus, or of parts thereof; Compensating for the effects of tilting or acceleration, e.g. for optical apparatus

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Alarm Systems (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Details Of Measuring And Other Instruments (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
FR9912498A 1999-02-22 1999-10-07 Appareil de controle video Expired - Lifetime FR2790170B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/256,343 US6518996B1 (en) 1999-02-22 1999-02-22 Compact video inspection apparatus with Y, Z, X compounded measurement axes

Publications (2)

Publication Number Publication Date
FR2790170A1 FR2790170A1 (fr) 2000-08-25
FR2790170B1 true FR2790170B1 (fr) 2005-05-06

Family

ID=22971895

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9912498A Expired - Lifetime FR2790170B1 (fr) 1999-02-22 1999-10-07 Appareil de controle video

Country Status (5)

Country Link
US (1) US6518996B1 (fr)
JP (1) JP2000310597A (fr)
DE (1) DE19952553B4 (fr)
FR (1) FR2790170B1 (fr)
IT (1) IT1316766B1 (fr)

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US6859286B2 (en) * 2001-03-28 2005-02-22 Bipin Mukherji Precision video gauging machine for vertically oriented workpieces
DE20116124U1 (de) * 2001-10-01 2002-02-21 Werth Messtechnik GmbH, 35394 Gießen Koordinatenmessgerät
US6951392B2 (en) * 2003-07-09 2005-10-04 3M Innovative Properties Company Lens having at least one lens centration mark and methods of making and using same
US7526118B2 (en) * 2003-08-06 2009-04-28 Quality Vision International, Inc Digital video optical inspection apparatus and method for vertically sectioning an object's surface
US20070193012A1 (en) * 2006-02-22 2007-08-23 Robert Bergman Metal forming process
CN100410623C (zh) * 2006-09-30 2008-08-13 赵政康 移动龙门式光学坐标测量仪
US7808617B2 (en) * 2007-09-17 2010-10-05 Quality Vision International, Inc. Dual resolution, dual range sensor system and method
US7916398B2 (en) * 2007-10-12 2011-03-29 Quality Vision International, Inc. High performance front objective for video metrological system
US7791731B2 (en) * 2007-12-18 2010-09-07 Quality Vision International, Inc. Partial coherence interferometer with measurement ambiguity resolution
US9930297B2 (en) 2010-04-30 2018-03-27 Becton, Dickinson And Company System and method for acquiring images of medication preparations
CN102980514B (zh) * 2012-11-13 2015-09-09 苏州富强科技有限公司 一种i/o孔检测机台
DE102013107948B4 (de) * 2013-07-25 2016-09-15 Carl Zeiss Industrielle Messtechnik Gmbh Koordinatenmessgerät sowie Verfahren zum Vermessen von Werkstücken
US9784564B2 (en) 2014-12-19 2017-10-10 Quality Vision International, Inc. Deployment mechanism for optical measurement system
WO2017100296A1 (fr) * 2015-12-08 2017-06-15 Electro Scientific Industries, Inc. Système d'inspection de coordonnées de capteur mobile
DE102016210236B4 (de) * 2016-06-09 2019-04-18 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und Koordinatenmessgerät zur metrologischen Vermessung von Werkstücken mit Hilfe eines Leuchttischs
CN107202556B (zh) * 2017-06-16 2019-09-06 东莞市奥铭测控智能科技有限公司 一种基于影像调整z轴运动垂直度误差的方法
CN109297412B (zh) * 2018-11-19 2020-07-03 合肥工业大学 一种花键轴的花键端面的图像采集装置及花键检测方法
CN110530865A (zh) * 2019-09-10 2019-12-03 苏州莱锦机电自动化有限公司 一种机械配件加工质量检测设备
TWI792386B (zh) * 2021-07-05 2023-02-11 榮晶生物科技股份有限公司 影像檢測裝置、系統及影像檢測方法
CN114441147B (zh) * 2022-04-02 2022-06-28 北京主线科技有限公司 平行光管组件、车载摄像头解析力测量装置及测量方法
CN115265359B (zh) * 2022-06-23 2024-07-30 宿州捷创模具有限公司 汽车钣金验收检具

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US3750295A (en) * 1971-07-22 1973-08-07 Werkzeugmasch Veb Measuring machine
US4328713A (en) * 1980-03-03 1982-05-11 Eikonix Corporation Controlling translation
US4884878A (en) * 1986-11-17 1989-12-05 Ram Optical Instrumentation, Inc. Zoom optical unit
JPS63152293A (ja) * 1986-12-09 1988-06-24 マイクロワ−ルド　オブ　インナ−　スペ−ス　リミテイド 表示装置
US4866629A (en) * 1987-11-13 1989-09-12 Industrial Technology Research Institute Machine vision process and apparatus for reading a plurality of separated figures
DE3806686A1 (de) * 1988-03-02 1989-09-14 Wegu Messtechnik Mehrkoordinatenmess- und -pruefeinrichtung
CH677082A5 (fr) * 1988-06-01 1991-04-15 Bobst Sa
US4972311A (en) * 1988-08-15 1990-11-20 Kulicke And Soffa Industries Inc. X-Y table error mapping apparatus and method
JP2727361B2 (ja) * 1989-07-22 1998-03-11 株式会社新川 マーキング装置における版監視方法及び装置
KR920003740B1 (ko) * 1989-10-24 1992-05-09 한국과학기술연구원 3차원 직교좌표형 고속정밀측정기
US5184217A (en) * 1990-08-02 1993-02-02 Doering John W System for automatically inspecting a flat sheet part
US5130523A (en) * 1991-04-22 1992-07-14 Raleigh Freddie L Coordinate measuring machine with improved flexure and clamp for fiber optic connection
US5320250A (en) * 1991-12-02 1994-06-14 Asymptotic Technologies, Inc. Method for rapid dispensing of minute quantities of viscous material
DE4140211C2 (de) * 1991-12-06 1999-12-09 Meurer Nonfood Product Gmbh Verfahren und Vorrichtung zum Einrichten von Stanzformen sowie zum Ausrichten von Prägeklischees zu einer Prägevorlage
US5657075A (en) * 1993-02-05 1997-08-12 Teradyne, Inc. Method and apparatus for locating and facilitating the repair of defects on a printed circuit board
US5479252A (en) * 1993-06-17 1995-12-26 Ultrapointe Corporation Laser imaging system for inspection and analysis of sub-micron particles
US6435808B1 (en) * 1993-10-06 2002-08-20 Tdk Corporation Chip-type circuit element mounting apparatus
US5677709A (en) * 1994-02-15 1997-10-14 Shimadzu Corporation Micromanipulator system with multi-direction control joy stick and precision control means
KR100283851B1 (ko) * 1994-07-11 2001-04-02 기리야마 겐지 모니터 장치 및 모니터 방법
US5671086A (en) * 1995-04-18 1997-09-23 The Regents, University Of California Method and apparatus for accurately manipulating an object during microelectrophoresis
US5621530A (en) * 1995-04-26 1997-04-15 Texas Instruments Incorporated Apparatus and method for verifying the coplanarity of a ball grid array
DE69631475T2 (de) * 1996-07-16 2005-01-13 Perkin-Elmer Ltd., Beaconsfield Kontrolle einer Mikroskopblende
US5943551A (en) * 1997-09-04 1999-08-24 Texas Instruments Incorporated Apparatus and method for detecting defects on silicon dies on a silicon wafer
WO1999021042A2 (fr) * 1997-10-17 1999-04-29 Accumed International, Inc. Systeme de microscope assiste par ordinateur de haute precision

Also Published As

Publication number Publication date
FR2790170A1 (fr) 2000-08-25
US6518996B1 (en) 2003-02-11
ITMI20000284A0 (it) 2000-02-18
JP2000310597A (ja) 2000-11-07
DE19952553A1 (de) 2000-08-31
IT1316766B1 (it) 2003-05-12
ITMI20000284A1 (it) 2001-08-18
DE19952553B4 (de) 2015-02-05

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