IT9022437A0 - Circuito di generazione di un clock di scansione in un dispositivo di analisi operativa di tipo seriale per circuito integrato - Google Patents

Circuito di generazione di un clock di scansione in un dispositivo di analisi operativa di tipo seriale per circuito integrato

Info

Publication number
IT9022437A0
IT9022437A0 IT22437A IT2243790A IT9022437A0 IT 9022437 A0 IT9022437 A0 IT 9022437A0 IT 22437 A IT22437 A IT 22437A IT 2243790 A IT2243790 A IT 2243790A IT 9022437 A0 IT9022437 A0 IT 9022437A0
Authority
IT
Italy
Prior art keywords
analysis device
clock generation
scan clock
serial type
integrated circuit
Prior art date
Application number
IT22437A
Other languages
English (en)
Other versions
IT1244205B (it
IT9022437A1 (it
Inventor
Flavio Scarra
Original Assignee
Sgs Thomson Microelectronics
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sgs Thomson Microelectronics filed Critical Sgs Thomson Microelectronics
Priority to IT02243790A priority Critical patent/IT1244205B/it
Publication of IT9022437A0 publication Critical patent/IT9022437A0/it
Priority to DE69125256T priority patent/DE69125256T2/de
Priority to EP91203231A priority patent/EP0491425B1/en
Priority to US07/812,135 priority patent/US5220217A/en
Priority to KR1019910023404A priority patent/KR920013908A/ko
Priority to JP33699391A priority patent/JP3188297B2/ja
Publication of IT9022437A1 publication Critical patent/IT9022437A1/it
Application granted granted Critical
Publication of IT1244205B publication Critical patent/IT1244205B/it
Priority to US08/492,462 priority patent/USRE36123E/en

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318552—Clock circuits details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31727—Clock circuits aspects, e.g. test clock circuit details, timing aspects for signal generation, circuits for testing clocks
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
    • H03K5/135—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals by the use of time reference signals, e.g. clock signals

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
IT02243790A 1990-12-19 1990-12-19 Circuito di generazione di un clock di scansione in un dispositivo di analisi operativa di tipo seriale per circuito integrato IT1244205B (it)

Priority Applications (7)

Application Number Priority Date Filing Date Title
IT02243790A IT1244205B (it) 1990-12-19 1990-12-19 Circuito di generazione di un clock di scansione in un dispositivo di analisi operativa di tipo seriale per circuito integrato
DE69125256T DE69125256T2 (de) 1990-12-19 1991-12-11 Schaltung zur Erzeugung des Abtasttaktes in einer Vorrichtung zur seriellen Untersuchung der Arbeitsweise einer integrierten Schaltung
EP91203231A EP0491425B1 (en) 1990-12-19 1991-12-11 Circuit for the generation of a scanning clock in an operational analysis device of the serial type for an integrated circuit
US07/812,135 US5220217A (en) 1990-12-19 1991-12-18 Circuit for the generation of a scanning clock in an operational anaylsis device of the serial type for an integrated circuit
KR1019910023404A KR920013908A (ko) 1990-12-19 1991-12-19 집적회로용 순차형 조작분석 장치에서 주사클럭 발생을 위한 회로
JP33699391A JP3188297B2 (ja) 1990-12-19 1991-12-19 集積回路のための直列型の動作分析装置に走査クロックを発生させるための回路
US08/492,462 USRE36123E (en) 1990-12-19 1995-06-15 Circuit for the generation of a scanning clock in an operational analysis device of the serial type for an integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT02243790A IT1244205B (it) 1990-12-19 1990-12-19 Circuito di generazione di un clock di scansione in un dispositivo di analisi operativa di tipo seriale per circuito integrato

Publications (3)

Publication Number Publication Date
IT9022437A0 true IT9022437A0 (it) 1990-12-19
IT9022437A1 IT9022437A1 (it) 1992-06-19
IT1244205B IT1244205B (it) 1994-07-08

Family

ID=11196301

Family Applications (1)

Application Number Title Priority Date Filing Date
IT02243790A IT1244205B (it) 1990-12-19 1990-12-19 Circuito di generazione di un clock di scansione in un dispositivo di analisi operativa di tipo seriale per circuito integrato

Country Status (6)

Country Link
US (2) US5220217A (it)
EP (1) EP0491425B1 (it)
JP (1) JP3188297B2 (it)
KR (1) KR920013908A (it)
DE (1) DE69125256T2 (it)
IT (1) IT1244205B (it)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE36292E (en) * 1990-10-22 1999-09-07 Stmicroelectronics, Inc. Operational analysis device of the scan path type having a single scanning clock and a single output phase for an integrated circuit
US5336939A (en) * 1992-05-08 1994-08-09 Cyrix Corporation Stable internal clock generation for an integrated circuit
US5341048A (en) * 1992-11-25 1994-08-23 Altera Corporation Clock invert and select circuit
JPH06242188A (ja) * 1993-02-16 1994-09-02 Mitsubishi Electric Corp 半導体集積回路及びそのテスト方法
DE4321315C1 (de) * 1993-06-26 1995-01-05 Itt Ind Gmbh Deutsche Takterzeugungsschaltung für taktgesteuerte Logikschaltungen
US5491441A (en) * 1994-06-30 1996-02-13 International Business Machines Corporation Method and apparatus for generating a clock signal from a continuous oscillator signal including a translator circuit
TW418329B (en) * 1994-08-24 2001-01-11 Ibm Integrated circuit clocking technique and circuit therefor
US5850150A (en) * 1996-05-01 1998-12-15 Sun Microsystems, Inc. Final stage clock buffer in a clock distribution network
JPH1091270A (ja) * 1996-09-13 1998-04-10 Sanyo Electric Co Ltd クロック制御方法およびその方法を用いた集積回路素子
KR100272672B1 (ko) * 1997-12-31 2000-11-15 윤종용 다이나믹 씨모오스 회로
US7992062B2 (en) * 2006-06-22 2011-08-02 Qualcomm Incorporated Logic device and method supporting scan test

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4245349A (en) * 1977-12-29 1981-01-13 Nippon Gakki Seizo Kabushiki Kaisha Automatic frequency scanning radio receiver
US4308472A (en) * 1979-12-03 1981-12-29 Gte Automatic Electric Labs Inc. Clock check circuit
DE3106183A1 (de) * 1981-02-19 1982-09-02 Siemens AG, 1000 Berlin und 8000 München Verfahren und anordnung zur fehlerfreien synchronisation asynchroner impulse
US4441182A (en) * 1981-05-15 1984-04-03 Rockwell International Corporation Repetitious logic state signal generation apparatus
US4413077A (en) * 1981-06-22 1983-11-01 Borg-Warner Chemicals, Inc. Oligomeric aromatic polyphosphites
US4493077A (en) * 1982-09-09 1985-01-08 At&T Laboratories Scan testable integrated circuit
JPS59151537A (ja) * 1983-01-29 1984-08-30 Toshiba Corp 相補ｍｏｓ形回路
US4627085A (en) * 1984-06-29 1986-12-02 Applied Micro Circuits Corporation Flip-flop control circuit
US4710933A (en) * 1985-10-23 1987-12-01 Texas Instruments Incorporated Parallel/serial scan system for testing logic circuits
US4649539A (en) * 1985-11-04 1987-03-10 Honeywell Information Systems Inc. Apparatus providing improved diagnosability
US4701920A (en) * 1985-11-08 1987-10-20 Eta Systems, Inc. Built-in self-test system for VLSI circuit chips
GB2188504B (en) * 1986-03-27 1989-11-22 Intel Corp Cmos single clock logic arrangement
JPS62272722A (ja) * 1986-05-21 1987-11-26 Clarion Co Ltd Ｔｔｌ論理レベルｃｍｏｓ入力バツフア
US4922138A (en) * 1987-05-25 1990-05-01 Canon Kabushiki Kaisha Scan circuit using a plural bootstrap effect for forming scan pulses
GB8728359D0 (en) * 1987-12-04 1988-01-13 Brown Boveri Plc Improvements in metering apparatus
IT1246301B (it) * 1990-10-22 1994-11-17 St Microelectronics Srl Dispositivo di analisi operativa di tipo scan path a singolo clock di scansione e singola fase di uscita per circuito integrato.

Also Published As

Publication number Publication date
EP0491425B1 (en) 1997-03-19
IT1244205B (it) 1994-07-08
JPH04335172A (ja) 1992-11-24
USRE36123E (en) 1999-03-02
US5220217A (en) 1993-06-15
EP0491425A3 (en) 1993-11-10
DE69125256D1 (de) 1997-04-24
IT9022437A1 (it) 1992-06-19
DE69125256T2 (de) 1997-07-17
EP0491425A2 (en) 1992-06-24
JP3188297B2 (ja) 2001-07-16
KR920013908A (ko) 1992-07-30

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Legal Events

Date Code Title Description
0001 Granted
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19961227