Classifications

• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
  • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
  • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
  • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
  • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
  • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
  • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
  • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
  • G11C11/409—Read-write [R-W] circuits 
  • G11C11/4094—Bit-line management or control circuits
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
  • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
  • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
  • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
  • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
  • G11C29/30—Accessing single arrays
  • G11C29/34—Accessing multiple bits simultaneously
• • G—PHYSICS
  • G11—INFORMATION STORAGE
  • G11C—STATIC STORES
  • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
  • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
  • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
  • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
  • G11C29/36—Data generation devices, e.g. data inverters

Landscapes

• Engineering & Computer Science (AREA)
• Microelectronics & Electronic Packaging (AREA)
• Computer Hardware Design (AREA)
• For Increasing The Reliability Of Semiconductor Memories (AREA)
• Dram (AREA)
• Techniques For Improving Reliability Of Storages (AREA)

Applications Claiming Priority (1)

Publications (3)

Family

ID=19286971

Family Applications (1)

Country Status (10)

Families Citing this family (3)

Family Cites Families (6)

• 1989
  • 1989-06-10 KR KR1019890008002A patent/KR920001080B1/ko not_active Expired
• 1990
  • 1990-02-01 FR FR9001203A patent/FR2648266B1/fr not_active Expired - Lifetime
  • 1990-02-02 JP JP02022322A patent/JP3101953B2/ja not_active Expired - Fee Related
  • 1990-02-02 GB GB9002396A patent/GB2232496B/en not_active Expired - Lifetime
  • 1990-02-02 NL NL9000261A patent/NL194812C/nl not_active IP Right Cessation
  • 1990-02-02 DE DE4003132A patent/DE4003132A1/de active Granted
  • 1990-06-06 SE SE9002030A patent/SE512452C2/sv unknown
  • 1990-06-07 IT IT02056690A patent/IT1248750B/it active IP Right Grant
  • 1990-06-08 RU SU904830256A patent/RU2084972C1/ru not_active IP Right Cessation
  • 1990-06-09 CN CN90104915A patent/CN1019243B/zh not_active Expired

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