IT7923150A0 - Circuito integrato su larghissima scala. - Google Patents

Circuito integrato su larghissima scala.

Info

Publication number
IT7923150A0
IT7923150A0 IT7923150A IT2315079A IT7923150A0 IT 7923150 A0 IT7923150 A0 IT 7923150A0 IT 7923150 A IT7923150 A IT 7923150A IT 2315079 A IT2315079 A IT 2315079A IT 7923150 A0 IT7923150 A0 IT 7923150A0
Authority
IT
Italy
Prior art keywords
integrated circuit
large scale
scale integrated
circuit
scale
Prior art date
Application number
IT7923150A
Other languages
English (en)
Other versions
IT1192735B (it
Original Assignee
Itt
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19782824224 external-priority patent/DE2824224A1/de
Priority claimed from DE19792904874 external-priority patent/DE2904874A1/de
Application filed by Itt filed Critical Itt
Publication of IT7923150A0 publication Critical patent/IT7923150A0/it
Application granted granted Critical
Publication of IT1192735B publication Critical patent/IT1192735B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
IT23150/79A 1978-06-02 1979-05-31 Circuito integrato su larghissima scala IT1192735B (it)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19782824224 DE2824224A1 (de) 1978-06-02 1978-06-02 Monolithisch integrierte grosschaltung
DE19792904874 DE2904874A1 (de) 1979-02-09 1979-02-09 Monolithisch integrierte grosschaltung und deren betriebsschaltung

Publications (2)

Publication Number Publication Date
IT7923150A0 true IT7923150A0 (it) 1979-05-31
IT1192735B IT1192735B (it) 1988-05-04

Family

ID=25774615

Family Applications (1)

Application Number Title Priority Date Filing Date
IT23150/79A IT1192735B (it) 1978-06-02 1979-05-31 Circuito integrato su larghissima scala

Country Status (5)

Country Link
US (1) US4329640A (it)
AU (1) AU530415B2 (it)
FR (1) FR2427611A1 (it)
GB (1) GB2022319B (it)
IT (1) IT1192735B (it)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2905294A1 (de) * 1979-02-12 1980-08-21 Philips Patentverwaltung Integrierte schaltungsanordnung in mos-technik mit feldeffekttransistoren
DE2905271A1 (de) * 1979-02-12 1980-08-21 Philips Patentverwaltung Integrierte schaltungsanordnung in mos-technik mit feldeffekttransistoren
JPS561624A (en) * 1979-06-19 1981-01-09 Fujitsu Ltd Integrated circuit incorporating multistep dividing circuit
DE2943552A1 (de) * 1979-10-27 1981-05-21 Deutsche Itt Industries Gmbh, 7800 Freiburg Monolithisch integrierte schaltung
US4357703A (en) * 1980-10-09 1982-11-02 Control Data Corporation Test system for LSI circuits resident on LSI chips
US4479088A (en) * 1981-01-16 1984-10-23 Burroughs Corporation Wafer including test lead connected to ground for testing networks thereon
US4441075A (en) * 1981-07-02 1984-04-03 International Business Machines Corporation Circuit arrangement which permits the testing of each individual chip and interchip connection in a high density packaging structure having a plurality of interconnected chips, without any physical disconnection
US4495628A (en) * 1982-06-17 1985-01-22 Storage Technology Partners CMOS LSI and VLSI chips having internal delay testing capability
DE3235119A1 (de) * 1982-09-22 1984-03-22 Siemens AG, 1000 Berlin und 8000 München Anordnung fuer die pruefung von mikroverdrahtungen und verfahren zu ihrem betrieb
US4527115A (en) * 1982-12-22 1985-07-02 Raytheon Company Configurable logic gate array
DE3382183D1 (de) * 1982-12-23 1991-04-04 Sumitomo Electric Industries Monolithische integrierte mikrowellenschaltung und verfahren zum auswaehlen derselben.
EP0130974A1 (en) * 1982-12-27 1985-01-16 Storage Technology Partners Vlsi chip with integral testing circuit
JPH07119789B2 (ja) * 1983-02-04 1995-12-20 株式会社日立製作所 半導体集積回路装置及びその診断方法
US4598245B1 (en) * 1983-06-13 1993-11-16 Circuit tester having indirect counters
US4614883A (en) * 1983-12-01 1986-09-30 Motorola, Inc. Address transition pulse circuit
US5077056A (en) * 1984-08-08 1991-12-31 The Liposome Company, Inc. Encapsulation of antineoplastic agents in liposomes
US5736155A (en) * 1984-08-08 1998-04-07 The Liposome Company, Inc. Encapsulation of antineoplastic agents in liposomes
GB8432533D0 (en) * 1984-12-21 1985-02-06 Plessey Co Plc Integrated circuits
GB8432458D0 (en) * 1984-12-21 1985-02-06 Plessey Co Plc Integrated circuits
JPS61191973A (ja) * 1985-02-20 1986-08-26 Fujitsu Ltd 試験回路をそなえた半導体集積回路
US4754215A (en) * 1985-11-06 1988-06-28 Nec Corporation Self-diagnosable integrated circuit device capable of testing sequential circuit elements
MX9203808A (es) * 1987-03-05 1992-07-01 Liposome Co Inc Formulaciones de alto contenido de medicamento: lipido, de agentes liposomicos-antineoplasticos.
US4897842A (en) * 1987-11-05 1990-01-30 Ampex Corporation Integrated circuit signature analyzer for testing digital circuitry
US4875209A (en) * 1988-04-04 1989-10-17 Raytheon Company Transient and intermittent fault insertion
JP2609284B2 (ja) * 1988-05-10 1997-05-14 株式会社日立製作所 分散形タイミング信号発生装置
US5189675A (en) * 1988-06-22 1993-02-23 Kabushiki Kaisha Toshiba Self-diagnostic circuit for logic circuit block
JPH077345B2 (ja) * 1988-06-22 1995-01-30 株式会社東芝 論理回路ブロックの自己診断回路
DK0555229T3 (da) * 1990-07-31 1996-08-19 Liposome Co Inc Akkumulation af aminosyrer og peptider i liposomer
JP2731875B2 (ja) * 1991-07-31 1998-03-25 株式会社アドバンテスト 可変遅延回路
DE4132072A1 (de) * 1991-09-26 1993-04-08 Grundig Emv Pruefeinrichtung fuer integrierte schaltkreise
US5657253A (en) * 1992-05-15 1997-08-12 Intel Corporation Apparatus for monitoring the performance of a microprocessor
EP0642084A1 (de) * 1993-08-04 1995-03-08 Siemens Aktiengesellschaft Integrierte Logikschaltung mit Testmöglichkeit

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2330014A1 (fr) * 1973-05-11 1977-05-27 Ibm France Procede de test de bloc de circuits logiques integres et blocs en faisant application
US3961251A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
US3961252A (en) * 1974-12-20 1976-06-01 International Business Machines Corporation Testing embedded arrays
US4139818A (en) * 1977-09-30 1979-02-13 Burroughs Corporation Circuit means for collecting operational errors in IC chips and for identifying and storing the locations thereof

Also Published As

Publication number Publication date
FR2427611B1 (it) 1985-02-01
US4329640A (en) 1982-05-11
AU530415B2 (en) 1983-07-14
GB2022319B (en) 1983-01-19
FR2427611A1 (fr) 1979-12-28
GB2022319A (en) 1979-12-12
AU4732279A (en) 1979-12-06
IT1192735B (it) 1988-05-04

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