IT1297357B1 - Dispositivo di misura di spostamento ottico e sistema di misura di spostamento ottico. - Google Patents

Dispositivo di misura di spostamento ottico e sistema di misura di spostamento ottico.

Info

Publication number
IT1297357B1
IT1297357B1 IT97TO001140A ITTO971140A IT1297357B1 IT 1297357 B1 IT1297357 B1 IT 1297357B1 IT 97TO001140 A IT97TO001140 A IT 97TO001140A IT TO971140 A ITTO971140 A IT TO971140A IT 1297357 B1 IT1297357 B1 IT 1297357B1
Authority
IT
Italy
Prior art keywords
optical shift
shift measuring
measuring device
measuring system
optical
Prior art date
Application number
IT97TO001140A
Other languages
English (en)
Inventor
Yuji Takada
Hiroshi Matsuda
Takayuki Nishikawa
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Publication of ITTO971140A1 publication Critical patent/ITTO971140A1/it
Application granted granted Critical
Publication of IT1297357B1 publication Critical patent/IT1297357B1/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/02—Details
    • G01C3/06—Use of electric means to obtain final indication

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Measurement Of Optical Distance (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IT97TO001140A 1996-12-24 1997-12-24 Dispositivo di misura di spostamento ottico e sistema di misura di spostamento ottico. IT1297357B1 (it)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP35737496 1996-12-24
JP01439897A JP3799708B2 (ja) 1996-12-24 1997-01-28 光学式変位測定システム

Publications (2)

Publication Number Publication Date
ITTO971140A1 ITTO971140A1 (it) 1998-06-24
IT1297357B1 true IT1297357B1 (it) 1999-09-01

Family

ID=26350338

Family Applications (1)

Application Number Title Priority Date Filing Date
IT97TO001140A IT1297357B1 (it) 1996-12-24 1997-12-24 Dispositivo di misura di spostamento ottico e sistema di misura di spostamento ottico.

Country Status (5)

Country Link
US (1) US5905576A (it)
JP (1) JP3799708B2 (it)
KR (1) KR100234914B1 (it)
DE (1) DE19757716B4 (it)
IT (1) IT1297357B1 (it)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2780163B1 (fr) * 1998-06-18 2000-08-11 Agence Spatiale Europeenne Systeme de telescopie laser doppler incoherente
JP2000234912A (ja) * 1999-02-15 2000-08-29 Hitachi Electronics Eng Co Ltd ウエハ厚さ測定装置
JP2001289614A (ja) * 2000-01-31 2001-10-19 Omron Corp 変位センサ
US6570646B2 (en) 2001-03-06 2003-05-27 The Regents Of The University Of California Optical distance measurement device and method thereof
JP3565178B2 (ja) * 2001-03-23 2004-09-15 オムロン株式会社 変位センサ
JP2004325389A (ja) * 2003-04-28 2004-11-18 Renesas Technology Corp 端部検査装置
US7345772B2 (en) * 2004-08-06 2008-03-18 Voith Paper Patent Gmbh Optical triangulation device and method of measuring a variable of a web using the device
JP4200328B2 (ja) * 2005-04-18 2008-12-24 パナソニック電工株式会社 空間情報検出システム
DE102006059415A1 (de) * 2006-12-15 2008-06-26 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und Vorrichtung zur Dickenmessung
CA2672679C (en) 2006-12-15 2013-10-01 Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. Method and apparatus for thickness measurement
KR100862061B1 (ko) * 2008-06-02 2008-10-09 (주)원지리정보 지표에 설치된 기준좌표점의 측지정보를 확인한도로시설물의 측량시스템
JP5765698B2 (ja) * 2010-03-31 2015-08-19 北陽電機株式会社 マルチ信号処理装置、測距装置、及びマルチ測距システム
DE102010015689B4 (de) * 2010-04-21 2019-05-23 Aktiebolaget Skf Verfahren und Vorrichtung zur Vermessung eines Lagerbauteils
JP5420793B1 (ja) * 2013-09-10 2014-02-19 テレパシー インク 画像の視認距離を調整できるヘッドマウントディスプレイ
JP6218261B2 (ja) 2015-10-23 2017-10-25 株式会社カツラ・オプト・システムズ 光学素子特性測定装置
WO2017202913A1 (en) * 2016-05-24 2017-11-30 Koninklijke Philips N.V. Methods and systems for optical sensing of forces in a toothbrush
CN111610783A (zh) * 2020-04-29 2020-09-01 尚科宁家(中国)科技有限公司 自主机器人的行进控制方法、自主机器人及存储介质

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4855585A (en) * 1986-11-21 1989-08-08 Olympus Optical Co., Ltd. Distance measuring apparatus
JP2507370B2 (ja) * 1986-12-02 1996-06-12 株式会社東芝 試料面位置測定装置
JP2624997B2 (ja) * 1988-06-06 1997-06-25 オリンパス光学工業株式会社 多点測距機能を有するカメラ
US5137350A (en) * 1989-04-14 1992-08-11 Asahi Kogaku Kogyo Kabushiki Kaisha Distance measuring device
JPH0346508A (ja) * 1989-07-13 1991-02-27 Mitsubishi Electric Corp 光学式位置測定装置
US5351126A (en) * 1991-10-31 1994-09-27 Matsushita Electric Works, Ltd. Optical measurement system for determination of an object's profile or thickness
JPH05322559A (ja) * 1992-05-26 1993-12-07 Matsushita Electric Works Ltd 光学式変位センサ
JP3208503B2 (ja) * 1992-08-20 2001-09-17 セイコープレシジョン株式会社 測距装置
JPH0894351A (ja) * 1994-09-29 1996-04-12 Olympus Optical Co Ltd 多点測距装置
JPH08178647A (ja) * 1994-12-22 1996-07-12 Matsushita Electric Works Ltd 光電センサ
EP0760460B1 (en) * 1995-08-28 2002-07-03 Matsushita Electric Works, Ltd. Optical displacement measuring system using a triangulation

Also Published As

Publication number Publication date
ITTO971140A1 (it) 1998-06-24
DE19757716A1 (de) 1998-07-02
KR100234914B1 (ko) 1999-12-15
US5905576A (en) 1999-05-18
KR19980064594A (ko) 1998-10-07
DE19757716B4 (de) 2005-12-08
JPH10239046A (ja) 1998-09-11
JP3799708B2 (ja) 2006-07-19

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Legal Events

Date Code Title Description
0001 Granted