IT1253683B - Dispositivo a bassa corrente di perdita per la protezione di un circuito integrato da scariche elettrostatiche. - Google Patents

Dispositivo a bassa corrente di perdita per la protezione di un circuito integrato da scariche elettrostatiche.

Info

Publication number
IT1253683B
IT1253683B ITVA910030A ITVA910030A IT1253683B IT 1253683 B IT1253683 B IT 1253683B IT VA910030 A ITVA910030 A IT VA910030A IT VA910030 A ITVA910030 A IT VA910030A IT 1253683 B IT1253683 B IT 1253683B
Authority
IT
Italy
Prior art keywords
emitter
base
protection
zener
protection structure
Prior art date
Application number
ITVA910030A
Other languages
English (en)
Original Assignee
Sgs Thomson Microelectronics
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sgs Thomson Microelectronics filed Critical Sgs Thomson Microelectronics
Priority to ITVA910030A priority Critical patent/IT1253683B/it
Publication of ITVA910030A0 publication Critical patent/ITVA910030A0/it
Priority to EP92830502A priority patent/EP0533640B1/en
Priority to DE69219975T priority patent/DE69219975T2/de
Priority to JP4273713A priority patent/JPH06216321A/ja
Publication of ITVA910030A1 publication Critical patent/ITVA910030A1/it
Priority to US08/367,747 priority patent/US5510947A/en
Application granted granted Critical
Publication of IT1253683B publication Critical patent/IT1253683B/it

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection

Landscapes

  • Power Engineering (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Bipolar Integrated Circuits (AREA)
  • Bipolar Transistors (AREA)
  • Logic Circuits (AREA)
  • Electronic Switches (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)

Abstract

In una struttura integrata di protezione anti ESD per piedini destinati ad assumere tensioni sottomassa o sopralimentazione comprendente almeno una coppia di diodi Zener o NPN laterali con connessione resistiva tra base ed emettitore connessi in opposizione tra loro tra il piedino ed il substrato connesso a massa del circuito integrato, l'azione amplificante della corrente di perdita assorbita/iniettata attraverso il piedino della struttura di protezione da parte dell'intrinseco transistore parassita che viene a crearsi può essere efficacemente eliminata collegando un elemento di polarizzazione, quale ad esempio un diodo, un diodo Zener o un NPN laterale con connessione resistiva tra base ed emettitore, polarizzato direttamente, tra il nodo di collegamento in comune dei due Zener o NPN laterale con connessione resistiva tra base ed emettitore di protezione ed un nodo ad una tensione sufficientemente elevata così da assicurare in tutte le condizioni una polarizzazione inversa della giunzione base-emettitore del transistore parassita, impedendone l'azione amplificante sulla corrente di perdita della struttura di protezione.
ITVA910030A 1991-09-12 1991-09-12 Dispositivo a bassa corrente di perdita per la protezione di un circuito integrato da scariche elettrostatiche. IT1253683B (it)

Priority Applications (5)

Application Number Priority Date Filing Date Title
ITVA910030A IT1253683B (it) 1991-09-12 1991-09-12 Dispositivo a bassa corrente di perdita per la protezione di un circuito integrato da scariche elettrostatiche.
EP92830502A EP0533640B1 (en) 1991-09-12 1992-09-17 Electrostatic discharge protective device having a reduced current leakage
DE69219975T DE69219975T2 (de) 1991-09-12 1992-09-17 Schutzvorrichtung gegen elektrostatische Entladungen mit reduziertem Leckstrom
JP4273713A JPH06216321A (ja) 1991-09-12 1992-09-17 電流漏洩の少ない静電的放電保護デバイス
US08/367,747 US5510947A (en) 1991-09-12 1995-01-03 Electrostatic discharge protective device having a reduced current leakage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
ITVA910030A IT1253683B (it) 1991-09-12 1991-09-12 Dispositivo a bassa corrente di perdita per la protezione di un circuito integrato da scariche elettrostatiche.

Publications (3)

Publication Number Publication Date
ITVA910030A0 ITVA910030A0 (it) 1991-09-12
ITVA910030A1 ITVA910030A1 (it) 1993-03-12
IT1253683B true IT1253683B (it) 1995-08-22

Family

ID=11423150

Family Applications (1)

Application Number Title Priority Date Filing Date
ITVA910030A IT1253683B (it) 1991-09-12 1991-09-12 Dispositivo a bassa corrente di perdita per la protezione di un circuito integrato da scariche elettrostatiche.

Country Status (5)

Country Link
US (1) US5510947A (it)
EP (1) EP0533640B1 (it)
JP (1) JPH06216321A (it)
DE (1) DE69219975T2 (it)
IT (1) IT1253683B (it)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6111734A (en) * 1996-03-07 2000-08-29 Dallas Semiconductor Corporation Electrostatic discharge protection circuits and application
US6060752A (en) * 1997-12-31 2000-05-09 Siliconix, Incorporated Electrostatic discharge protection circuit
EP0944151B1 (fr) * 1998-03-18 2003-12-03 EM Microelectronic-Marin SA Structure de protection d'un circuit contre des décharges électrostatiques
US6549114B2 (en) 1998-08-20 2003-04-15 Littelfuse, Inc. Protection of electrical devices with voltage variable materials
DE19917155C1 (de) * 1999-04-16 2000-06-21 Bosch Gmbh Robert Schutzvorrichtung gegen elektrostatische Entladungen
GB2357633A (en) 1999-12-21 2001-06-27 Nokia Mobile Phones Ltd Electrostatic discharge protection for integrated circuits
US6772025B1 (en) * 2000-09-28 2004-08-03 Intel Corporation Device “ID” encoding with use of protection devices
DE10297040T5 (de) * 2001-07-10 2004-08-05 Littelfuse, Inc., Des Plaines Elektrostatische Entladungsgerät für Netzwerksysteme
US7034652B2 (en) * 2001-07-10 2006-04-25 Littlefuse, Inc. Electrostatic discharge multifunction resistor
US7183891B2 (en) * 2002-04-08 2007-02-27 Littelfuse, Inc. Direct application voltage variable material, devices employing same and methods of manufacturing such devices
WO2003088356A1 (en) * 2002-04-08 2003-10-23 Littelfuse, Inc. Voltage variable material for direct application and devices employing same
US7132922B2 (en) * 2002-04-08 2006-11-07 Littelfuse, Inc. Direct application voltage variable material, components thereof and devices employing same
US7075763B2 (en) * 2002-10-31 2006-07-11 Micron Technology, Inc. Methods, circuits, and applications using a resistor and a Schottky diode
JP3998583B2 (ja) 2003-01-31 2007-10-31 株式会社東芝 光半導体装置
JP3739365B2 (ja) * 2003-04-30 2006-01-25 ローム株式会社 半導体装置
US7491584B2 (en) * 2005-07-22 2009-02-17 Mediatek Inc. ESD protection device in high voltage and manufacturing method for the same
US8199447B2 (en) * 2010-01-04 2012-06-12 Semiconductor Components Industries, Llc Monolithic multi-channel ESD protection device
WO2011148590A1 (ja) * 2010-05-26 2011-12-01 パナソニック株式会社 Ｌｅｄの点灯回路、ランプおよび照明装置
CN104201174A (zh) * 2011-05-17 2014-12-10 旺宏电子股份有限公司 一种半导体电路
US8576526B2 (en) 2012-02-16 2013-11-05 International Business Machines Corporation Reduced current leakage in RC ESD clamps
US8643987B2 (en) 2012-05-04 2014-02-04 International Business Machines Corporation Current leakage in RC ESD clamps
US9240751B2 (en) * 2013-09-24 2016-01-19 Regal Beloit America, Inc. Phase current detection system

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4158863A (en) * 1978-03-07 1979-06-19 American Optical Corporation Input overload protection circuit
US4302792A (en) * 1980-06-26 1981-11-24 Rca Corporation Transistor protection circuit
IT1217298B (it) * 1985-05-30 1990-03-22 Sgs Thomson Microelectronics Dispositivo di protezione da scariche elettrostatiche,in particolare per circuiti integrati bipolari
IT1186338B (it) * 1985-10-29 1987-11-26 Sgs Microelettronica Spa Dispositivo elettronico a semiconduttore per la protezione di circuiti integrati da scariche elettrostatiche e procedimento per la sua fabbricazione
IT1186110B (it) * 1985-11-27 1987-11-18 Sgs Microelettronica Spa Dispositivo di protezione contro l'effetto filotante di transitori parassiti in circuiti integrati monolitici
US4922371A (en) * 1988-11-01 1990-05-01 Teledyne Semiconductor ESD protection circuit for MOS integrated circuits

Also Published As

Publication number Publication date
JPH06216321A (ja) 1994-08-05
DE69219975T2 (de) 1997-10-16
EP0533640A1 (en) 1993-03-24
US5510947A (en) 1996-04-23
ITVA910030A1 (it) 1993-03-12
DE69219975D1 (de) 1997-07-03
ITVA910030A0 (it) 1991-09-12
EP0533640B1 (en) 1997-05-28

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Legal Events

Date Code Title Description
0001 Granted
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19970929