IN2014DN05780A - - Google Patents
Info
- Publication number
- IN2014DN05780A IN2014DN05780A IN5780DEN2014A IN2014DN05780A IN 2014DN05780 A IN2014DN05780 A IN 2014DN05780A IN 5780DEN2014 A IN5780DEN2014 A IN 5780DEN2014A IN 2014DN05780 A IN2014DN05780 A IN 2014DN05780A
- Authority
- IN
- India
- Prior art keywords
- insulation film
- membrane
- wiring
- sensitive element
- heat sensitive
- Prior art date
Links
- 239000012528 membrane Substances 0.000 abstract 9
- 238000009413 insulation Methods 0.000 abstract 7
- 238000009529 body temperature measurement Methods 0.000 abstract 1
- 230000017525 heat dissipation Effects 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/0022—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiation of moving bodies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0803—Arrangements for time-dependent attenuation of radiation signals
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G15/00—Apparatus for electrographic processes using a charge pattern
- G03G15/20—Apparatus for electrographic processes using a charge pattern for fixing, e.g. by using heat
- G03G15/2098—Apparatus for electrographic processes using a charge pattern for fixing, e.g. by using heat using light, e.g. UV photohardening
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0271—Arrangements for reducing stress or warp in rigid printed circuit boards, e.g. caused by loads, vibrations or differences in thermal expansion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J2005/103—Absorbing heated plate or film and temperature detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
- G01J2005/206—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices on foils
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G15/00—Apparatus for electrographic processes using a charge pattern
- G03G15/20—Apparatus for electrographic processes using a charge pattern for fixing, e.g. by using heat
- G03G15/2003—Apparatus for electrographic processes using a charge pattern for fixing, e.g. by using heat using heat
- G03G15/2014—Apparatus for electrographic processes using a charge pattern for fixing, e.g. by using heat using heat using contact heat
- G03G15/2039—Apparatus for electrographic processes using a charge pattern for fixing, e.g. by using heat using heat using contact heat with means for controlling the fixing temperature
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03G—ELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
- G03G2215/00—Apparatus for electrophotographic processes
- G03G2215/00362—Apparatus for electrophotographic processes relating to the copy medium handling
- G03G2215/00535—Stable handling of copy medium
- G03G2215/00717—Detection of physical properties
- G03G2215/00772—Detection of physical properties of temperature influencing copy sheet handling
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/189—Printed circuits structurally associated with non-printed electric components characterised by the use of a flexible or folded printed circuit
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/06—Thermal details
- H05K2201/068—Thermal details wherein the coefficient of thermal expansion is important
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09009—Substrate related
- H05K2201/09136—Means for correcting warpage
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/09654—Shape and layout details of conductors covering at least two types of conductors provided for in H05K2201/09218 - H05K2201/095
- H05K2201/09781—Dummy conductors, i.e. not used for normal transport of current; Dummy electrodes of components
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N15/00—Thermoelectric devices without a junction of dissimilar materials; Thermomagnetic devices, e.g. using the Nernst-Ettingshausen effect
- H10N15/10—Thermoelectric devices using thermal change of the dielectric constant, e.g. working above and below the Curie point
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Radiation Pyrometers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012019431A JP5892368B2 (ja) | 2012-02-01 | 2012-02-01 | 赤外線センサ |
PCT/JP2013/000467 WO2013114861A1 (ja) | 2012-02-01 | 2013-01-29 | 赤外線センサ |
Publications (1)
Publication Number | Publication Date |
---|---|
IN2014DN05780A true IN2014DN05780A (de) | 2015-04-10 |
Family
ID=48904908
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IN5780DEN2014 IN2014DN05780A (de) | 2012-02-01 | 2013-01-29 |
Country Status (8)
Country | Link |
---|---|
US (1) | US9568371B2 (de) |
EP (1) | EP2811271B1 (de) |
JP (1) | JP5892368B2 (de) |
KR (1) | KR101972196B1 (de) |
CN (1) | CN104011519B (de) |
IN (1) | IN2014DN05780A (de) |
TW (1) | TWI568997B (de) |
WO (1) | WO2013114861A1 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5488751B1 (ja) * | 2013-08-30 | 2014-05-14 | 富士ゼロックス株式会社 | 温度センサ、定着装置、および画像形成装置 |
JP6860812B2 (ja) * | 2017-01-05 | 2021-04-21 | 三菱マテリアル株式会社 | 赤外線センサ |
EP3410083A4 (de) * | 2016-01-29 | 2019-09-04 | Mitsubishi Materials Corporation | Infrarotsensor |
JP6677925B2 (ja) * | 2016-01-29 | 2020-04-08 | 三菱マテリアル株式会社 | 赤外線センサ |
CN106556470A (zh) * | 2016-11-22 | 2017-04-05 | 合肥舒实工贸有限公司 | 温度传感器 |
CN106525270A (zh) * | 2016-11-22 | 2017-03-22 | 合肥舒实工贸有限公司 | 温度传感器 |
JP6743737B2 (ja) * | 2017-03-24 | 2020-08-19 | 三菱マテリアル株式会社 | 赤外線センサ |
JP6743741B2 (ja) * | 2017-03-29 | 2020-08-19 | 三菱マテリアル株式会社 | 赤外線センサ |
JP7030420B2 (ja) * | 2017-04-10 | 2022-03-07 | 日本特殊陶業株式会社 | 保持装置 |
EP3734241A4 (de) * | 2017-12-28 | 2021-10-13 | Murata Manufacturing Co., Ltd. | Photodetektor |
JP6726771B2 (ja) * | 2018-02-08 | 2020-07-22 | 株式会社芝浦電子 | 赤外線温度センサ |
CN111886483B (zh) | 2018-03-07 | 2023-05-16 | Tdk株式会社 | 电磁波传感器 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0763585A (ja) * | 1993-08-26 | 1995-03-10 | Hokuriku Electric Ind Co Ltd | 環境センサ |
JP3327668B2 (ja) * | 1994-03-24 | 2002-09-24 | 石塚電子株式会社 | 赤外線検出器 |
JP3494747B2 (ja) * | 1995-03-31 | 2004-02-09 | 石塚電子株式会社 | 薄膜温度センサ及びその製造方法 |
JPH08278192A (ja) * | 1995-04-07 | 1996-10-22 | Ishizuka Denshi Kk | 赤外線検出器 |
US5962854A (en) | 1996-06-12 | 1999-10-05 | Ishizuka Electronics Corporation | Infrared sensor and infrared detector |
JP2002071451A (ja) * | 2000-08-29 | 2002-03-08 | Sharp Corp | 熱型赤外線検出素子及びそれを用いた赤外線撮像素子 |
JP4628540B2 (ja) | 2000-11-20 | 2011-02-09 | 石塚電子株式会社 | 赤外線温度センサ |
JP2003194630A (ja) * | 2001-12-27 | 2003-07-09 | Ishizuka Electronics Corp | 非接触温度センサおよび非接触温度センサ用検出回路 |
JP5079211B2 (ja) * | 2004-10-13 | 2012-11-21 | 浜松ホトニクス株式会社 | 赤外線検出装置及びその製造方法 |
JP4483521B2 (ja) | 2004-10-21 | 2010-06-16 | Tdk株式会社 | 非接触温度センサ |
JP2009180682A (ja) * | 2008-01-31 | 2009-08-13 | Ritsumeikan | 赤外線センサ |
JP2011013213A (ja) * | 2009-06-02 | 2011-01-20 | Mitsubishi Materials Corp | 赤外線センサ |
JP5640529B2 (ja) * | 2009-10-17 | 2014-12-17 | 三菱マテリアル株式会社 | 赤外線センサ及びこれを備えた回路基板 |
JP5832007B2 (ja) * | 2009-12-25 | 2015-12-16 | 三菱マテリアル株式会社 | 赤外線センサ及びその製造方法 |
JP2011220939A (ja) * | 2010-04-13 | 2011-11-04 | Panasonic Electric Works Co Ltd | 赤外線センサの製造方法 |
-
2012
- 2012-02-01 JP JP2012019431A patent/JP5892368B2/ja not_active Expired - Fee Related
-
2013
- 2013-01-29 CN CN201380004514.8A patent/CN104011519B/zh not_active Expired - Fee Related
- 2013-01-29 EP EP13743471.8A patent/EP2811271B1/de active Active
- 2013-01-29 US US14/375,065 patent/US9568371B2/en active Active
- 2013-01-29 KR KR1020147021179A patent/KR101972196B1/ko active IP Right Grant
- 2013-01-29 WO PCT/JP2013/000467 patent/WO2013114861A1/ja active Application Filing
- 2013-01-29 IN IN5780DEN2014 patent/IN2014DN05780A/en unknown
- 2013-01-30 TW TW102103482A patent/TWI568997B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
WO2013114861A1 (ja) | 2013-08-08 |
JP2013156235A (ja) | 2013-08-15 |
TWI568997B (zh) | 2017-02-01 |
CN104011519A (zh) | 2014-08-27 |
TW201344166A (zh) | 2013-11-01 |
US9568371B2 (en) | 2017-02-14 |
KR20140128973A (ko) | 2014-11-06 |
EP2811271A1 (de) | 2014-12-10 |
KR101972196B1 (ko) | 2019-04-24 |
EP2811271B1 (de) | 2019-04-24 |
CN104011519B (zh) | 2016-03-23 |
US20140374596A1 (en) | 2014-12-25 |
EP2811271A4 (de) | 2015-09-30 |
JP5892368B2 (ja) | 2016-03-23 |
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