IN2014DN03134A - - Google Patents

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Publication number
IN2014DN03134A
IN2014DN03134A IN3134DEN2014A IN2014DN03134A IN 2014DN03134 A IN2014DN03134 A IN 2014DN03134A IN 3134DEN2014 A IN3134DEN2014 A IN 3134DEN2014A IN 2014DN03134 A IN2014DN03134 A IN 2014DN03134A
Authority
IN
India
Prior art keywords
scan
detector array
focus
specimen
maintain
Prior art date
Application number
Other languages
English (en)
Inventor
Savvas Nmi Damaskinos
Arthur Edward Dixon
Original Assignee
Huron Technologies Internat Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Huron Technologies Internat Inc filed Critical Huron Technologies Internat Inc
Publication of IN2014DN03134A publication Critical patent/IN2014DN03134A/en

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/34—Microscope slides, e.g. mounting specimens on microscope slides
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Multimedia (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)
IN3134DEN2014 2011-09-21 2012-09-21 IN2014DN03134A (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161537460P 2011-09-21 2011-09-21
PCT/CA2012/000868 WO2013040686A1 (fr) 2011-09-21 2012-09-21 Scanner de diapositives ayant un plan image incliné

Publications (1)

Publication Number Publication Date
IN2014DN03134A true IN2014DN03134A (fr) 2015-05-22

Family

ID=47913706

Family Applications (1)

Application Number Title Priority Date Filing Date
IN3134DEN2014 IN2014DN03134A (fr) 2011-09-21 2012-09-21

Country Status (5)

Country Link
US (1) US9632301B2 (fr)
EP (1) EP2758825B1 (fr)
CA (1) CA2849330C (fr)
IN (1) IN2014DN03134A (fr)
WO (1) WO2013040686A1 (fr)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013138911A1 (fr) * 2012-03-23 2013-09-26 Huron Technologies International Inc. Scanneur coulissant avec foyer dynamique et basculement d'échantillon, et procédé de fonctionnement
US9841590B2 (en) 2012-05-02 2017-12-12 Leica Biosystems Imaging, Inc. Real-time focusing in line scan imaging
JP6027875B2 (ja) * 2012-12-07 2016-11-16 オリンパス株式会社 撮像装置及び顕微鏡システム
JP6509818B2 (ja) * 2013-04-30 2019-05-08 モレキュラー デバイシーズ， エルエルシー 顕微鏡システムにおいて平行撮像を用いて焦点の合った画像を生成するための装置および方法
CN105814883B (zh) * 2013-12-16 2019-06-18 皇家飞利浦有限公司 具有带有用于电子电路的间隙的新型成像传感器的扫描成像系统
US10877255B2 (en) * 2015-04-02 2020-12-29 Huron Technologies International Inc. High resolution pathology scanner with improved signal to noise ratio
US10244149B2 (en) 2015-06-09 2019-03-26 Lockheed Martin Corporation Imaging system with scan line titled off focal plane
EP3353601A4 (fr) 2015-09-24 2019-10-02 Leica Biosystems Imaging, Inc. Mise au point en temps réel en imagerie à balayage de lignes
CN108369337B (zh) * 2015-12-09 2021-03-30 文塔纳医疗系统公司 图像扫描设备和操作图像扫描设备的方法
WO2017144482A1 (fr) 2016-02-22 2017-08-31 Koninklijke Philips N.V. Système pour générer une image 2d synthétique à profondeur de champ améliorée d'un échantillon biologique
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees
DE102017107348B4 (de) 2017-04-05 2019-03-14 Olympus Soft Imaging Solutions Gmbh Verfahren zur zytometrischen Analyse von Zellproben
US11106026B2 (en) * 2017-04-24 2021-08-31 Huron Technologies International Inc. Scanning microscope for 3D imaging using MSIA
WO2018232521A1 (fr) * 2017-06-22 2018-12-27 Arthur Edward Dixon Instrument de balayage msia à plage dynamique accrue
US10502941B2 (en) * 2017-09-29 2019-12-10 Leica Biosystmes Imaging, Inc. Two-dimensional and three-dimensional fixed Z scanning
EP3798711A1 (fr) * 2019-09-27 2021-03-31 Leica Microsystems CMS GmbH Dispositif d'imagerie et procédé d'imagerie d'un objet à l'aide d'un microscope

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0843059A (ja) * 1994-07-27 1996-02-16 Nikon Corp 近接場走査型顕微鏡
US7095032B2 (en) * 1998-03-20 2006-08-22 Montagu Jean I Focusing of microscopes and reading of microarrays
US7518652B2 (en) * 2000-05-03 2009-04-14 Aperio Technologies, Inc. Method and apparatus for pre-focus in a linear array based slide scanner
US6583865B2 (en) * 2000-08-25 2003-06-24 Amnis Corporation Alternative detector configuration and mode of operation of a time delay integration particle analyzer
DE10234756B3 (de) * 2002-07-30 2004-02-12 Leica Microsystems Semiconductor Gmbh Autofokusmodul für mikroskopbasierte Systeme
US20050089208A1 (en) * 2003-07-22 2005-04-28 Rui-Tao Dong System and method for generating digital images of a microscope slide
JP4759277B2 (ja) * 2005-01-21 2011-08-31 オリンパス株式会社 観察方法および観察補助具
WO2008137746A1 (fr) * 2007-05-04 2008-11-13 Aperio Technologies, Inc. Dispositif de balayage de microscope rapide pour une acquisition d'image de volume
BR112012015931A2 (pt) * 2009-12-30 2021-03-02 Koninklijke Philips Eletronics N.V. método para formar imagem microscopicamente de uma amostra com um escaner, microscópio de escaneamento para formação de imagem de uma amostra, uso de um sensor de disposição bidimensional e disposição para formação de imagem de um corte trasnversal oblíquio de uma amostra

Also Published As

Publication number Publication date
CA2849330C (fr) 2020-11-03
CA2849330A1 (fr) 2013-03-28
US9632301B2 (en) 2017-04-25
EP2758825A4 (fr) 2015-04-15
WO2013040686A1 (fr) 2013-03-28
EP2758825A1 (fr) 2014-07-30
US20140231638A1 (en) 2014-08-21
EP2758825B1 (fr) 2016-05-18

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