IN2014CN01546A - - Google Patents

Info

Publication number
IN2014CN01546A
IN2014CN01546A IN1546CHN2014A IN2014CN01546A IN 2014CN01546 A IN2014CN01546 A IN 2014CN01546A IN 1546CHN2014 A IN1546CHN2014 A IN 1546CHN2014A IN 2014CN01546 A IN2014CN01546 A IN 2014CN01546A
Authority
IN
India
Prior art keywords
pixel
phase gradient
image data
phase
energy
Prior art date
Application number
Other languages
English (en)
Inventor
Thomas Koehler
Jens Peter Schlomka
Original Assignee
Koninkl Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Nv filed Critical Koninkl Philips Nv
Publication of IN2014CN01546A publication Critical patent/IN2014CN01546A/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0012—Biomedical image inspection
    • G06T7/0014—Biomedical image inspection using an image reference approach
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/50—Image enhancement or restoration using two or more images, e.g. averaging or subtraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G06T12/10—
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2211/00—Image generation
    • G06T2211/40—Computed tomography
    • G06T2211/408—Dual energy

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Pulmonology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Medical Informatics (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
IN1546CHN2014 2011-08-31 2012-08-08 IN2014CN01546A (Direct)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161529450P 2011-08-31 2011-08-31
PCT/IB2012/054032 WO2013030698A1 (en) 2011-08-31 2012-08-08 Differential phase contrast imaging with energy sensitive detection

Publications (1)

Publication Number Publication Date
IN2014CN01546A true IN2014CN01546A (Direct) 2015-05-08

Family

ID=47089091

Family Applications (1)

Application Number Title Priority Date Filing Date
IN1546CHN2014 IN2014CN01546A (Direct) 2011-08-31 2012-08-08

Country Status (7)

Country Link
US (1) US9430832B2 (Direct)
EP (1) EP2761586B1 (Direct)
JP (1) JP6105586B2 (Direct)
CN (1) CN103918005B (Direct)
IN (1) IN2014CN01546A (Direct)
RU (1) RU2598310C2 (Direct)
WO (1) WO2013030698A1 (Direct)

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CN106462984A (zh) * 2014-06-02 2017-02-22 皇家飞利浦有限公司 用于差分相位对比成像中的谱相位展开的无偏置正则化
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CN107847145B (zh) * 2015-07-20 2020-08-14 徐敏 光子结构和化学计量学病理系统
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
JP6683118B2 (ja) * 2016-12-20 2020-04-15 株式会社島津製作所 Ｘ線位相撮影装置
WO2018175570A1 (en) 2017-03-22 2018-09-27 Sigray, Inc. Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
DE112019002822T5 (de) 2018-06-04 2021-02-18 Sigray, Inc. Wellenlängendispersives röntgenspektrometer
US11113851B2 (en) * 2018-07-20 2021-09-07 The Board Of Trustees Of The Leland Stanford Junior University Correction of sharp-edge artifacts in differential phase contrast CT images and its improvement in automatic material identification
GB2591630B (en) 2018-07-26 2023-05-24 Sigray Inc High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
DE112019004433B4 (de) 2018-09-04 2024-09-12 Sigray, Inc. System und verfahren für röntgenstrahlfluoreszenz mit filterung
CN112823280B (zh) 2018-09-07 2024-11-05 斯格瑞公司 用于深度可选x射线分析的系统和方法
DE112020004169T5 (de) 2019-09-03 2022-05-25 Sigray, Inc. System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
DE112021002841T5 (de) 2020-05-18 2023-03-23 Sigray, Inc. System und Verfahren für Röntgenabsorptionsspektroskopie unter Verwendung eines Kristallanalysators und mehrerer Detektorelemente
DE112021004828T5 (de) 2020-09-17 2023-08-03 Sigray, Inc. System und verfahren unter verwendung von röntgenstrahlen für tiefenauflösende messtechnik und analyse
DE112021006348T5 (de) 2020-12-07 2023-09-21 Sigray, Inc. 3d-röntgenbildgebungssystem mit hohem durchsatz, das eine transmissionsröntgenquelle verwendet
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
US11992350B2 (en) 2022-03-15 2024-05-28 Sigray, Inc. System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
CN119173759A (zh) 2022-05-02 2024-12-20 斯格瑞公司 X射线顺序阵列波长色散光谱仪
CN121013975A (zh) 2023-02-16 2025-11-25 斯格瑞公司 具有至少两个堆叠的平面布拉格衍射器的x射线探测器系统
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
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CN117475172B (zh) * 2023-12-28 2024-03-26 湖北工业大学 一种基于深度学习的高噪声环境相位图解包裹方法和系统
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Also Published As

Publication number Publication date
JP6105586B2 (ja) 2017-03-29
US20140205057A1 (en) 2014-07-24
US9430832B2 (en) 2016-08-30
CN103918005A (zh) 2014-07-09
EP2761586A1 (en) 2014-08-06
WO2013030698A1 (en) 2013-03-07
EP2761586B1 (en) 2022-10-12
CN103918005B (zh) 2017-06-09
RU2598310C2 (ru) 2016-09-20
JP2014525304A (ja) 2014-09-29
RU2014111826A (ru) 2015-10-10

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