IN163306B - - Google Patents

Info

Publication number
IN163306B
IN163306B IN742/CAL/85A IN742CA1985A IN163306B IN 163306 B IN163306 B IN 163306B IN 742CA1985 A IN742CA1985 A IN 742CA1985A IN 163306 B IN163306 B IN 163306B
Authority
IN
India
Prior art keywords
current
points
pulsation
omega
measured
Prior art date
Application number
IN742/CAL/85A
Other languages
English (en)
Inventor
Pierre Victor Andre Lahitte
Michel Joseph Raymond
Jean-Paul Kayser
Original Assignee
Aerospatiale
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aerospatiale filed Critical Aerospatiale
Publication of IN163306B publication Critical patent/IN163306B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/20—Investigating the presence of flaws

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Sorting Of Articles (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
IN742/CAL/85A 1984-10-22 1985-10-17 IN163306B (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8416138A FR2572183B1 (fr) 1984-10-22 1984-10-22 Procede et appareil pour la verification par mesure d'impedance de la continuite electrique d'un dispositif de matiere electriquement conductrice

Publications (1)

Publication Number Publication Date
IN163306B true IN163306B (ja) 1988-09-03

Family

ID=9308877

Family Applications (1)

Application Number Title Priority Date Filing Date
IN742/CAL/85A IN163306B (ja) 1984-10-22 1985-10-17

Country Status (9)

Country Link
US (1) US5115200A (ja)
EP (1) EP0179705B1 (ja)
JP (1) JPS61107149A (ja)
AT (1) ATE40751T1 (ja)
CA (1) CA1257904A (ja)
DE (1) DE3568220D1 (ja)
ES (1) ES8701987A1 (ja)
FR (1) FR2572183B1 (ja)
IN (1) IN163306B (ja)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2710413B1 (fr) * 1993-09-21 1995-11-03 Asulab Sa Dispositif de mesure pour capteurs amovibles.
US5644242A (en) * 1995-06-21 1997-07-01 Fisher; James Allan Armature winding and winding connection test methods
JP4582869B2 (ja) * 2000-06-29 2010-11-17 日置電機株式会社 回路基板検査装置
US6822463B1 (en) 2001-12-21 2004-11-23 Lecroy Corporation Active differential test probe with a transmission line input structure
US6828768B2 (en) * 2002-04-16 2004-12-07 Agilent Technologies, Inc. Systems and methods for wideband differential probing of variably spaced probe points
GB2417091A (en) * 2004-08-03 2006-02-15 Advanced Analysis And Integrat Aircraft test and measuring instruments
US7811728B2 (en) * 2006-12-01 2010-10-12 Xerox Corporation Imaging members and process for preparing same
KR101188288B1 (ko) * 2007-09-18 2012-10-05 삼성전자주식회사 반도체 소자 검사 장치
DE102008043103A1 (de) * 2008-10-22 2010-04-29 Alstrom Technology Ltd. Vorrichtung und Verfahren zur Überwachung und/oder Analyse von Rotoren von elektrischen Maschinen im Betrieb
US9151818B2 (en) * 2011-11-08 2015-10-06 Analog Devices Global Voltage measurement
EP2756318A2 (en) 2011-09-12 2014-07-23 Metroic Limited Current measurement
GB201120295D0 (en) 2011-11-24 2012-01-04 Metroic Ltd Current measurement apparatus
KR102090578B1 (ko) * 2013-05-06 2020-03-19 삼성디스플레이 주식회사 전자 장치의 기판, 이를 포함하는 전자 장치 및 접속부의 저항 측정 방법
US11549797B2 (en) * 2018-10-26 2023-01-10 Deere & Company Device for detecting wear of replaceable components

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE285536C (ja) *
FR771305A (fr) * 1934-06-27 1934-10-04 Procédé pour la vérification de la qualité des soudures et appareils pour la mise en ceuvre de ce procédé
US2401917A (en) * 1944-03-14 1946-06-11 Sperry Prod Inc Shell banding tester
GB1169711A (en) * 1966-05-12 1969-11-05 South London Electric Equipmen Improvements relating to the Measurement of Resistivity
US3466539A (en) * 1966-10-31 1969-09-09 Collins Radio Co Four-point probe for microminaturized circuitry having individual biasing means for each point
US3699436A (en) * 1970-02-24 1972-10-17 Mitsubishi Heavy Ind Ltd Remotely controllable defect detector of electric resistance type
HU162604B (ja) * 1970-11-14 1973-03-28
DE2557658A1 (de) * 1975-12-20 1977-06-30 Motoren Turbinen Union Verfahren zur pruefung von bauteilen auf anrisse oder fehlstellen
US4266185A (en) * 1979-02-16 1981-05-05 Dover & Partners Limited Probes and apparatus for and methods of measuring crack depths
JPS59197846A (ja) * 1983-04-25 1984-11-09 Akai Bussan Kk 構造用圧延鋼材鋼種の非破壊識別方法

Also Published As

Publication number Publication date
US5115200A (en) 1992-05-19
ES8701987A1 (es) 1986-12-01
FR2572183B1 (fr) 1987-01-09
CA1257904A (fr) 1989-07-25
ES548604A0 (es) 1986-12-01
EP0179705A2 (fr) 1986-04-30
EP0179705B1 (fr) 1989-02-08
ATE40751T1 (de) 1989-02-15
JPS61107149A (ja) 1986-05-26
DE3568220D1 (en) 1989-03-16
EP0179705A3 (en) 1986-11-26
FR2572183A1 (fr) 1986-04-25

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