IL78524A - Compositions containing perfluoropolyethers for carrying out tests in the electronic field - Google Patents

Compositions containing perfluoropolyethers for carrying out tests in the electronic field

Info

Publication number
IL78524A
IL78524A IL78524A IL7852486A IL78524A IL 78524 A IL78524 A IL 78524A IL 78524 A IL78524 A IL 78524A IL 7852486 A IL7852486 A IL 7852486A IL 78524 A IL78524 A IL 78524A
Authority
IL
Israel
Prior art keywords
temperatures
carrying
compositions containing
electronic field
out tests
Prior art date
Application number
IL78524A
Other languages
English (en)
Other versions
IL78524A0 (en
Original Assignee
Montedison Spa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Montedison Spa filed Critical Montedison Spa
Publication of IL78524A0 publication Critical patent/IL78524A0/xx
Publication of IL78524A publication Critical patent/IL78524A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00—Investigating fluid-tightness of structures
    • G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00—Investigating fluid-tightness of structures
    • G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/20—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material
    • G01M3/22—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators
    • G01M3/226—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using special tracer materials, e.g. dye, fluorescent material, radioactive material for pipes, cables or tubes; for pipe joints or seals; for valves; for welds; for containers, e.g. radiators for containers, e.g. radiators

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Lubricants (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Photovoltaic Devices (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Polyethers (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Sealing Material Composition (AREA)
  • Developing Agents For Electrophotography (AREA)
  • Detergent Compositions (AREA)
  • Solid-Sorbent Or Filter-Aiding Compositions (AREA)
IL78524A 1985-04-24 1986-04-16 Compositions containing perfluoropolyethers for carrying out tests in the electronic field IL78524A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT20477/85A IT1201416B (it) 1985-04-24 1985-04-24 Perfluoropolieteri impiegati come fluidi per il testing nell'elettronica

Publications (2)

Publication Number Publication Date
IL78524A0 IL78524A0 (en) 1986-08-31
IL78524A true IL78524A (en) 1990-03-19

Family

ID=11167529

Family Applications (1)

Application Number Title Priority Date Filing Date
IL78524A IL78524A (en) 1985-04-24 1986-04-16 Compositions containing perfluoropolyethers for carrying out tests in the electronic field

Country Status (13)

Country Link
US (2) US4955726A (it)
EP (1) EP0203348B1 (it)
JP (1) JPH0713236B2 (it)
KR (1) KR950007523B1 (it)
AT (1) ATE85117T1 (it)
AU (1) AU594049B2 (it)
CA (1) CA1272944A (it)
CS (1) CS273174B2 (it)
DE (1) DE3687593T2 (it)
ES (1) ES8900089A1 (it)
IL (1) IL78524A (it)
IT (1) IT1201416B (it)
ZA (1) ZA862863B (it)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6288561B1 (en) 1988-05-16 2001-09-11 Elm Technology Corporation Method and apparatus for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus
US5506309A (en) * 1988-09-28 1996-04-09 Exfluor Research Corporation Perfluorinates polyethers
US5539059A (en) * 1988-09-28 1996-07-23 Exfluor Research Corporation Perfluorinated polyethers
CA1340294C (en) * 1988-09-28 1998-12-29 Thomas R. Bierschenk Fluorination of acetals, ketals and orthoesters
US5362919A (en) * 1988-12-02 1994-11-08 Minnesota Mining And Manufacturing Company Direct fluorination process for making perfluorinated organic substances
US5039228A (en) * 1989-11-02 1991-08-13 The United States Of America As Represented By The Secretary Of The Navy Fixtureless environmental stress screening apparatus
IT1237887B (it) * 1989-12-12 1993-06-18 Ausimont Spa Lubrificanti perfluoropolieterei aventi proprieta' antiusura
DE4025348A1 (de) * 1990-08-10 1992-02-13 Hoechst Ag Verfahren und vorrichtung fuer die thermoschock-pruefung
EP0522357A1 (de) * 1991-06-28 1993-01-13 Hoechst Aktiengesellschaft Verfahren zur qualitativen und quantitativen Dichtheitsprüfung von Hohlkörpern
US5369983A (en) * 1992-04-17 1994-12-06 Minnesota Mining And Manufacturing Company Detection medium and method for use in hermetic seal testing
ES2109820T3 (es) * 1994-04-15 1998-01-16 Siemens Ag Liquido de prueba para control de la capacidad de funcionamiento electrica de componentes de centrales electricas
EP1021696B1 (en) * 1997-10-15 2002-01-23 Minnesota Mining And Manufacturing Company Use of hydrofluoroethers as test liquid in the testing of an electronic component
US20020151527A1 (en) * 2000-12-20 2002-10-17 Benjamin Wiegand Method for reducing acne or improving skin tone
DE602004029226D1 (de) * 2003-10-10 2010-11-04 Greatbatch Ltd Leck-Prüfung von hermetischen Gehäusen für implantierbare Energiespeichern-Vorrichtungen
JP4881051B2 (ja) * 2005-09-16 2012-02-22 株式会社アドバンテスト 導電性流体検出装置用のフィルタユニット及びそれを用いた導電性流体検出装置
US8999192B2 (en) * 2008-09-26 2015-04-07 Solvay Specialty Polymers Italy S.P.A. Method for transferring heat
JP5871931B2 (ja) 2010-09-10 2016-03-01 ソルヴェイ・スペシャルティ・ポリマーズ・イタリー・エッセ・ピ・ア 熱を伝達する方法
DE102020112333A1 (de) 2020-05-07 2021-11-11 Bayerische Motoren Werke Aktiengesellschaft Verfahren zur Alterung einer elektronischen Baugruppe, Bewertungsverfahren zur Bewertung der Dauerhaltbarkeit von elektronischen Baugruppen sowie elektronische Baugruppe

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3242218A (en) * 1961-03-29 1966-03-22 Du Pont Process for preparing fluorocarbon polyethers
DE1249247B (de) * 1961-04-25 1967-09-07 E. I. Du Pont De Nemours And Company, Wilmington, Del. (V. St. A.) Verfahren zur Herstellung von Perfluorolefinpolyäthern
GB1226566A (it) * 1967-04-04 1971-03-31
US3665041A (en) * 1967-04-04 1972-05-23 Montedison Spa Perfluorinated polyethers and process for their preparation
US3761808A (en) * 1970-07-08 1973-09-25 Aai Corp Testing arrangement
JPS4945719A (en) * 1972-09-04 1974-05-01 Fuji Photo Film Co Ltd Ichiganrefukamera no miraakaido nyoru shogekikanshosochi
JPS51132778A (en) * 1975-05-14 1976-11-18 Hitachi Ltd Inspection method of semiconductor apparatus
US4523039A (en) * 1980-04-11 1985-06-11 The University Of Texas Method for forming perfluorocarbon ethers
DE3485616D1 (de) * 1983-12-26 1992-05-07 Daikin Ind Ltd Verfahren zur herstellung von halogen enthaltenden polyathern

Also Published As

Publication number Publication date
JPS626184A (ja) 1987-01-13
IT1201416B (it) 1989-02-02
KR950007523B1 (ko) 1995-07-11
EP0203348B1 (en) 1993-01-27
CA1272944A (en) 1990-08-21
CS273174B2 (en) 1991-03-12
CS298986A2 (en) 1990-07-12
ES8900089A1 (es) 1988-12-01
EP0203348A3 (en) 1987-01-28
ZA862863B (en) 1986-12-30
US5083082A (en) 1992-01-21
KR860008457A (ko) 1986-11-15
US4955726A (en) 1990-09-11
DE3687593D1 (de) 1993-03-11
AU5632786A (en) 1986-10-30
IL78524A0 (en) 1986-08-31
DE3687593T2 (de) 1993-07-15
IT8520477A0 (it) 1985-04-24
AU594049B2 (en) 1990-03-01
EP0203348A2 (en) 1986-12-03
JPH0713236B2 (ja) 1995-02-15
ES554257A0 (es) 1988-12-01
ATE85117T1 (de) 1993-02-15

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