IL193447A - Methods and system for data analysis - Google Patents

Methods and system for data analysis

Info

Publication number
IL193447A
IL193447A IL193447A IL19344708A IL193447A IL 193447 A IL193447 A IL 193447A IL 193447 A IL193447 A IL 193447A IL 19344708 A IL19344708 A IL 19344708A IL 193447 A IL193447 A IL 193447A
Authority
IL
Israel
Prior art keywords
data analysis
analysis
data
Prior art date
Application number
IL193447A
Other languages
English (en)
Hebrew (he)
Other versions
IL193447A0 (en
Original Assignee
In Depth Test Llc
Test Acuity Solutions Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by In Depth Test Llc, Test Acuity Solutions Inc filed Critical In Depth Test Llc
Publication of IL193447A0 publication Critical patent/IL193447A0/en
Publication of IL193447A publication Critical patent/IL193447A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2894—Aspects of quality control [QC]

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Complex Calculations (AREA)
IL193447A 2006-02-17 2008-08-14 Methods and system for data analysis IL193447A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US77468206P 2006-02-17 2006-02-17
PCT/US2007/062366 WO2007098426A2 (fr) 2006-02-17 2007-02-17 Procedes et appareils pour l'analyse de donnees

Publications (2)

Publication Number Publication Date
IL193447A0 IL193447A0 (en) 2009-05-04
IL193447A true IL193447A (en) 2015-05-31

Family

ID=38438077

Family Applications (1)

Application Number Title Priority Date Filing Date
IL193447A IL193447A (en) 2006-02-17 2008-08-14 Methods and system for data analysis

Country Status (4)

Country Link
EP (1) EP1989561A2 (fr)
JP (3) JP2009527903A (fr)
IL (1) IL193447A (fr)
WO (1) WO2007098426A2 (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5537346B2 (ja) * 2010-09-06 2014-07-02 株式会社日立メディコ 画像診断支援装置、画像診断支援方法
JP5767963B2 (ja) * 2011-12-28 2015-08-26 株式会社キーエンス 外観検査装置、外観検査方法及びコンピュータプログラム
JP6532373B2 (ja) * 2015-10-16 2019-06-19 株式会社Ｎｔｔファシリティーズ 蓄電池劣化推定システム、蓄電池劣化推定方法および蓄電池劣化推定プログラム
JP6752661B2 (ja) * 2016-09-05 2020-09-09 日置電機株式会社 処理装置、検査システムおよび処理プログラム
EP3451219A1 (fr) * 2017-08-31 2019-03-06 KBC Groep NV Détection d'anomalies améliorée
US20200004619A1 (en) * 2018-06-28 2020-01-02 Honeywell International Inc. System and method for detecting a shift in real data trend using the configurable adaptive threshold
US11157346B2 (en) * 2018-09-26 2021-10-26 Palo Alto Rsearch Center Incorporated System and method for binned inter-quartile range analysis in anomaly detection of a data series
CN113486003B (zh) * 2021-06-02 2024-03-19 广州数说故事信息科技有限公司 数据可视化时考虑异常值的企业数据集处理方法及系统
US11907088B2 (en) * 2021-12-15 2024-02-20 Synopsys, Inc. Testing of hardware queue systems using on device test generation

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0352247A (ja) * 1989-07-20 1991-03-06 Seiko Instr Inc 半導体試験装置
JPH04283046A (ja) * 1991-03-12 1992-10-08 Nec Corp 作業順序制御方式
JP2002016118A (ja) * 2000-06-29 2002-01-18 Agilent Technologies Japan Ltd 半導体パラメトリック試験装置
US8417477B2 (en) * 2001-05-24 2013-04-09 Test Acuity Solutions, Inc. Methods and apparatus for local outlier detection
EP1479025B1 (fr) * 2001-05-24 2010-09-29 Test Advantage, Inc. Procedes et testeur de semi-conducteurs
EP1723571A4 (fr) * 2004-02-06 2007-05-09 Test Advantage Inc Procedes et dispositifs d'analyse de donnees
JP2006146459A (ja) * 2004-11-18 2006-06-08 Renesas Technology Corp 半導体デバイスの製造方法および製造システム
JP5116307B2 (ja) * 2007-01-04 2013-01-09 ルネサスエレクトロニクス株式会社 集積回路装置異常検出装置、方法およびプログラム

Also Published As

Publication number Publication date
EP1989561A2 (fr) 2008-11-12
JP2009188418A (ja) 2009-08-20
JP5080526B2 (ja) 2012-11-21
JP2009527903A (ja) 2009-07-30
JP2010197385A (ja) 2010-09-09
IL193447A0 (en) 2009-05-04
WO2007098426A2 (fr) 2007-08-30
JP5907649B2 (ja) 2016-04-26
WO2007098426A3 (fr) 2008-11-13

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