IL177293A0 - Methods and apparatus for data analysis - Google Patents

Methods and apparatus for data analysis

Info

Publication number
IL177293A0
IL177293A0 IL177293A IL17729306A IL177293A0 IL 177293 A0 IL177293 A0 IL 177293A0 IL 177293 A IL177293 A IL 177293A IL 17729306 A IL17729306 A IL 17729306A IL 177293 A0 IL177293 A0 IL 177293A0
Authority
IL
Israel
Prior art keywords
methods
data analysis
analysis
data
Prior art date
Application number
IL177293A
Other versions
IL177293A (en
Original Assignee
Test Advantage Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/817,750 external-priority patent/US7395170B2/en
Priority claimed from PCT/US2005/003923 external-priority patent/WO2005077024A2/en
Application filed by Test Advantage Inc filed Critical Test Advantage Inc
Publication of IL177293A0 publication Critical patent/IL177293A0/en
Publication of IL177293A publication Critical patent/IL177293A/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0229—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions knowledge based, e.g. expert systems; genetic algorithms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2894—Aspects of quality control [QC]
IL177293A 2004-02-06 2006-08-03 Methods and apparatus for data analysis IL177293A (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US54245904P 2004-02-06 2004-02-06
US54608804P 2004-02-19 2004-02-19
US10/817,750 US7395170B2 (en) 2001-05-24 2004-04-02 Methods and apparatus for data analysis
PCT/US2005/003923 WO2005077024A2 (en) 2004-02-06 2005-02-07 Methods and apparatus for data analysis

Publications (2)

Publication Number Publication Date
IL177293A0 true IL177293A0 (en) 2006-12-10
IL177293A IL177293A (en) 2013-03-24

Family

ID=40380629

Family Applications (1)

Application Number Title Priority Date Filing Date
IL177293A IL177293A (en) 2004-02-06 2006-08-03 Methods and apparatus for data analysis

Country Status (3)

Country Link
JP (1) JP4728968B2 (en)
IL (1) IL177293A (en)
SG (1) SG149899A1 (en)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8838408B2 (en) 2010-11-11 2014-09-16 Optimal Plus Ltd Misalignment indication decision system and method
US9069725B2 (en) 2011-08-19 2015-06-30 Hartford Steam Boiler Inspection & Insurance Company Dynamic outlier bias reduction system and method
US10557840B2 (en) 2011-08-19 2020-02-11 Hartford Steam Boiler Inspection And Insurance Company System and method for performing industrial processes across facilities
EP3514700A1 (en) * 2013-02-20 2019-07-24 Hartford Steam Boiler Inspection and Insurance Company Dynamic outlier bias reduction system and method
KR20230030044A (en) 2014-04-11 2023-03-03 하트포드 스팀 보일러 인스펙션 앤드 인슈어런스 컴퍼니 Improving Future Reliability Prediction based on System operational and performance Data Modelling
KR102529171B1 (en) * 2016-02-26 2023-05-04 삼성전자주식회사 Memory device diagnosis system
KR102620433B1 (en) * 2016-09-30 2024-01-03 세메스 주식회사 Method of forming a wafer map
US20180107450A1 (en) * 2016-10-17 2018-04-19 Tata Consultancy Services Limited System and method for data pre-processing
US11636292B2 (en) 2018-09-28 2023-04-25 Hartford Steam Boiler Inspection And Insurance Company Dynamic outlier bias reduction system and method
CN110135121B (en) * 2019-06-13 2023-04-18 中国人民解放军海军航空大学 Fault diagnosis method based on Lagrange-particle swarm update algorithm
KR20220066924A (en) 2019-09-18 2022-05-24 하트포드 스팀 보일러 인스펙션 앤드 인슈어런스 컴퍼니 Computer-based systems, computing components, and computing objects configured to implement dynamic outlier bias reduction in machine learning models.
US11328177B2 (en) 2019-09-18 2022-05-10 Hartford Steam Boiler Inspection And Insurance Company Computer-based systems, computing components and computing objects configured to implement dynamic outlier bias reduction in machine learning models
US11615348B2 (en) 2019-09-18 2023-03-28 Hartford Steam Boiler Inspection And Insurance Company Computer-based systems, computing components and computing objects configured to implement dynamic outlier bias reduction in machine learning models
TWI742865B (en) * 2020-09-28 2021-10-11 蔚華科技股份有限公司 Automatic testing machine with data processing function and its information processing method
CN112595912B (en) * 2020-12-09 2022-09-02 华域麦格纳电驱动系统有限公司 Test data analysis system of new energy electric drive system
CN115190140A (en) * 2022-06-12 2022-10-14 上海轩田工业设备有限公司 Microwave data software acquisition platform

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5130936A (en) * 1990-09-14 1992-07-14 Arinc Research Corporation Method and apparatus for diagnostic testing including a neural network for determining testing sufficiency
JP2000116003A (en) * 1998-09-29 2000-04-21 Kansai Electric Power Co Inc:The Method for controlling reactive voltage power
JP2004012422A (en) * 2002-06-11 2004-01-15 Dainippon Screen Mfg Co Ltd Pattern inspection device, pattern inspection method, and program

Also Published As

Publication number Publication date
JP4728968B2 (en) 2011-07-20
JP2007522658A (en) 2007-08-09
SG149899A1 (en) 2009-02-27
IL177293A (en) 2013-03-24

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