SG149899A1 - Methods and apparatus for data analysis - Google Patents

Methods and apparatus for data analysis

Info

Publication number
SG149899A1
SG149899A1 SG200900904-4A SG2009009044A SG149899A1 SG 149899 A1 SG149899 A1 SG 149899A1 SG 2009009044 A SG2009009044 A SG 2009009044A SG 149899 A1 SG149899 A1 SG 149899A1
Authority
SG
Singapore
Prior art keywords
data analysis
methods
data
characteristic
various aspects
Prior art date
Application number
SG200900904-4A
Inventor
Emilio Miguelanez
Michael Scott
Jacky Gorin
Paul Buxton
Eric Paul Tabor
Original Assignee
Test Advantage Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US10/817,750 external-priority patent/US7395170B2/en
Application filed by Test Advantage Inc filed Critical Test Advantage Inc
Publication of SG149899A1 publication Critical patent/SG149899A1/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0229—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions knowledge based, e.g. expert systems; genetic algorithms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2894—Aspects of quality control [QC]

Landscapes

  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Evolutionary Biology (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

METHODS AND APPARATUS FOR DATA ANALYSIS A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically identify a characteristic of a component fabrication process guided by characteristics of the test data for the components.
SG200900904-4A 2004-02-06 2005-02-07 Methods and apparatus for data analysis SG149899A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US54245904P 2004-02-06 2004-02-06
US54608804P 2004-02-19 2004-02-19
US10/817,750 US7395170B2 (en) 2001-05-24 2004-04-02 Methods and apparatus for data analysis

Publications (1)

Publication Number Publication Date
SG149899A1 true SG149899A1 (en) 2009-02-27

Family

ID=40380629

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200900904-4A SG149899A1 (en) 2004-02-06 2005-02-07 Methods and apparatus for data analysis

Country Status (3)

Country Link
JP (1) JP4728968B2 (en)
IL (1) IL177293A (en)
SG (1) SG149899A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8838408B2 (en) 2010-11-11 2014-09-16 Optimal Plus Ltd Misalignment indication decision system and method

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9069725B2 (en) 2011-08-19 2015-06-30 Hartford Steam Boiler Inspection & Insurance Company Dynamic outlier bias reduction system and method
US10557840B2 (en) 2011-08-19 2020-02-11 Hartford Steam Boiler Inspection And Insurance Company System and method for performing industrial processes across facilities
EP3514700A1 (en) * 2013-02-20 2019-07-24 Hartford Steam Boiler Inspection and Insurance Company Dynamic outlier bias reduction system and method
US10409891B2 (en) 2014-04-11 2019-09-10 Hartford Steam Boiler Inspection And Insurance Company Future reliability prediction based on system operational and performance data modelling
KR102529171B1 (en) * 2016-02-26 2023-05-04 삼성전자주식회사 Memory device diagnosis system
KR102620433B1 (en) * 2016-09-30 2024-01-03 세메스 주식회사 Method of forming a wafer map
EP3309690A1 (en) * 2016-10-17 2018-04-18 Tata Consultancy Services Limited System and method for data pre-processing
US11636292B2 (en) 2018-09-28 2023-04-25 Hartford Steam Boiler Inspection And Insurance Company Dynamic outlier bias reduction system and method
CN110135121B (en) * 2019-06-13 2023-04-18 中国人民解放军海军航空大学 Fault diagnosis method based on Lagrange-particle swarm update algorithm
US11328177B2 (en) 2019-09-18 2022-05-10 Hartford Steam Boiler Inspection And Insurance Company Computer-based systems, computing components and computing objects configured to implement dynamic outlier bias reduction in machine learning models
US11288602B2 (en) 2019-09-18 2022-03-29 Hartford Steam Boiler Inspection And Insurance Company Computer-based systems, computing components and computing objects configured to implement dynamic outlier bias reduction in machine learning models
US11615348B2 (en) 2019-09-18 2023-03-28 Hartford Steam Boiler Inspection And Insurance Company Computer-based systems, computing components and computing objects configured to implement dynamic outlier bias reduction in machine learning models
TWI742865B (en) * 2020-09-28 2021-10-11 蔚華科技股份有限公司 Automatic testing machine with data processing function and its information processing method
CN112595912B (en) * 2020-12-09 2022-09-02 华域麦格纳电驱动系统有限公司 Test data analysis system of new energy electric drive system
CN115190140A (en) * 2022-06-12 2022-10-14 上海轩田工业设备有限公司 Microwave data software acquisition platform

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5130936A (en) * 1990-09-14 1992-07-14 Arinc Research Corporation Method and apparatus for diagnostic testing including a neural network for determining testing sufficiency
JP2000116003A (en) * 1998-09-29 2000-04-21 Kansai Electric Power Co Inc:The Method for controlling reactive voltage power
JP2004012422A (en) * 2002-06-11 2004-01-15 Dainippon Screen Mfg Co Ltd Pattern inspection device, pattern inspection method, and program

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8838408B2 (en) 2010-11-11 2014-09-16 Optimal Plus Ltd Misalignment indication decision system and method

Also Published As

Publication number Publication date
IL177293A (en) 2013-03-24
JP4728968B2 (en) 2011-07-20
IL177293A0 (en) 2006-12-10
JP2007522658A (en) 2007-08-09

Similar Documents

Publication Publication Date Title
SG149899A1 (en) Methods and apparatus for data analysis
WO2005077024A3 (en) Methods and apparatus for data analysis
WO2005001667A3 (en) Methods and apparatus for data analysis
ATE456271T1 (en) APPARATUS AND METHOD FOR TESTING PRODUCT ACCEPTANCE ON A WIRELESS DEVICE
ATE475171T1 (en) METHOD AND DEVICE FOR DETECTING TONAL COMPONENTS OF AUDIO SIGNALS
ATE339001T1 (en) APPARATUS AND METHOD FOR ANALYZING AN AUDIO INFORMATION SIGNAL
HK1162898A1 (en) Method of inputting data into an analyte testing device
ATE381706T1 (en) DEVICE AND METHOD FOR MEASURING COMPONENTS
WO2012094156A3 (en) Methods and apparatus for data analysis
EP2092304A4 (en) Apparatus and method for rapid and accurate quantification of an unknown, complex mixture
CY1108694T1 (en) METHOD FOR DATA STATION ACCESS TO ELECTRONIC DEVICE
DE602006009160D1 (en) Apparatus and method for speech enhancement
DE602004018002D1 (en) SAMPLING APPARATUS AND METHOD FOR AN ANALYSIS AUTOMAT
TW200617369A (en) Method to inspect a wafer
ATE469469T1 (en) METHOD AND DEVICE FOR IDENTIFYING CROSSTALK SOURCES
DE50305912D1 (en) PROCESS FOR THE NON-DESTRUCTIVE TESTING OF A COMPONENT
DE60227190D1 (en) METHOD OF SEQUENTIAL MULTILULAR EDUCATION FOR IDENTIFYING AN INTERFERING MOBILE DEVICE
ATE554534T1 (en) METHOD AND DEVICE FOR INTERFERENCE SUPPRESSION IN A WIRELESS COMMUNICATIONS RECEIVER
DE602004009329D1 (en) METHOD AND SYSTEM FOR SELECTIVELY MASKING TEST RESPONSES
DE50304832D1 (en) Device and method for positioning an optical component
TWI346212B (en) Electrical test apparatus for the testing of an electrical test specimen and corresponding method
EP1592056A4 (en) Method for inspection, process for making analytic piece, method for analysis, analyzer, process for producing soi wafer, and soi wafer
ATE523969T1 (en) METHOD AND DEVICE FOR ELIMINating NARROW-BAND INTERFERENCE USING WINDOW PROCESSING IN A SPREAD SPECTRUM SYSTEM
DE602006002633D1 (en) Method and device for coding audio signals
ATE410677T1 (en) BIOEQUIVALENCE TEST FOR IRON-CONTAINING FORMULATIONS