IL138103A0 - Shaped beam electron beam exposure strategy using a two dimensional multipixel flash field - Google Patents

Shaped beam electron beam exposure strategy using a two dimensional multipixel flash field

Info

Publication number
IL138103A0
IL138103A0 IL13810399A IL13810399A IL138103A0 IL 138103 A0 IL138103 A0 IL 138103A0 IL 13810399 A IL13810399 A IL 13810399A IL 13810399 A IL13810399 A IL 13810399A IL 138103 A0 IL138103 A0 IL 138103A0
Authority
IL
Israel
Prior art keywords
multipixel
dimensional
electron beam
exposure strategy
flash field
Prior art date
Application number
IL13810399A
Other languages
English (en)
Original Assignee
Etec Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Etec Systems Inc filed Critical Etec Systems Inc
Publication of IL138103A0 publication Critical patent/IL138103A0/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/302—Controlling tubes by external information, e.g. programme control
    • H01J37/3023—Programme control
    • H01J37/3026—Patterning strategy
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00—Manufacture or treatment of nanostructures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
    • H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H01J2237/304—Controlling tubes
    • H01J2237/30472—Controlling the beam
    • H01J2237/30483—Scanning
    • H01J2237/30488—Raster scan
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/30—Electron or ion beam tubes for processing objects
    • H01J2237/317—Processing objects on a microscale
    • H01J2237/3175—Lithography
    • H01J2237/31776—Shaped beam

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Electron Beam Exposure (AREA)
IL13810399A 1999-01-06 1999-02-21 Shaped beam electron beam exposure strategy using a two dimensional multipixel flash field IL138103A0 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/226,361 US6262429B1 (en) 1999-01-06 1999-01-06 Raster shaped beam, electron beam exposure strategy using a two dimensional multipixel flash field
PCT/US1999/021994 WO2000041209A1 (fr) 1999-01-06 1999-09-21 Faisceau a balayage trame, strategie d'exposition a un faisceau electronique dans laquelle un champ de flash multipixel bidimensionnel est utilise

Publications (1)

Publication Number Publication Date
IL138103A0 true IL138103A0 (en) 2001-10-31

Family

ID=22848631

Family Applications (1)

Application Number Title Priority Date Filing Date
IL13810399A IL138103A0 (en) 1999-01-06 1999-02-21 Shaped beam electron beam exposure strategy using a two dimensional multipixel flash field

Country Status (8)

Country Link
US (1) US6262429B1 (fr)
EP (1) EP1070335B1 (fr)
JP (1) JP2002534794A (fr)
KR (1) KR100416131B1 (fr)
CA (1) CA2322966A1 (fr)
DE (1) DE69937824T2 (fr)
IL (1) IL138103A0 (fr)
WO (1) WO2000041209A1 (fr)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020104970A1 (en) * 1999-01-06 2002-08-08 Winter Stacey J. Raster shaped beam, electron beam exposure strategy using a two dimensional multipixel flash field
US6576914B2 (en) * 1999-07-30 2003-06-10 International Business Machines Corporation Redundant printing in e-beam lithography
US6570155B1 (en) * 2000-04-11 2003-05-27 Applied Materials, Inc. Bi-directional electron beam scanning apparatus
DE10034412A1 (de) * 2000-07-14 2002-01-24 Leo Elektronenmikroskopie Gmbh Verfahren zur Elektronenstrahl-Lithographie und elektronen-optisches Lithographiesystem
US7098468B2 (en) * 2002-11-07 2006-08-29 Applied Materials, Inc. Raster frame beam system for electron beam lithography
JP2004200351A (ja) * 2002-12-18 2004-07-15 Hitachi Ltd 露光装置及び露光方法
US6979831B2 (en) * 2004-02-19 2005-12-27 Seagate Technology Llc Method and apparatus for a formatter following electron beam substrate processing system
JP2005300807A (ja) * 2004-04-09 2005-10-27 Pentax Corp 描画装置
JP2005300812A (ja) * 2004-04-09 2005-10-27 Pentax Corp 描画装置
US7038225B2 (en) * 2004-06-23 2006-05-02 Seagate Technology Llc Method and apparatus for electron beam processing of substrates
US7407252B2 (en) * 2004-07-01 2008-08-05 Applied Materials, Inc. Area based optical proximity correction in raster scan printing
US7529421B2 (en) * 2004-07-01 2009-05-05 Applied Materials, Inc. Optical proximity correction in raster scan printing based on corner matching templates
US7105844B2 (en) * 2004-11-22 2006-09-12 Applied Materials, Inc. Method for eliminating low frequency error sources to critical dimension uniformity in shaped beam writing systems
US7427765B2 (en) * 2005-10-03 2008-09-23 Jeol, Ltd. Electron beam column for writing shaped electron beams
US7244953B2 (en) * 2005-10-03 2007-07-17 Applied Materials, Inc. Beam exposure writing strategy system and method
US7476880B2 (en) * 2005-10-03 2009-01-13 Applied Materials, Inc. Writing a circuit design pattern with shaped particle beam flashes
US7209055B1 (en) * 2005-10-03 2007-04-24 Applied Materials, Inc. Electrostatic particle beam deflector
JP4843425B2 (ja) * 2006-09-06 2011-12-21 エルピーダメモリ株式会社 可変成形型電子ビーム描画装置
JP2008244194A (ja) * 2007-03-28 2008-10-09 Nuflare Technology Inc 電子ビーム描画装置及び電子ビーム描画方法
US8244066B2 (en) * 2008-03-24 2012-08-14 The Aerospace Corporation Adaptive membrane shape deformation system
CN102138201B (zh) * 2008-09-01 2014-12-31 D2S公司 用可变形束光刻的光学邻近校正、设计和制造光刻板方法
US20110301520A1 (en) 2008-11-09 2011-12-08 Bespoke Innovations, Inc. Adjustable brace
JP6057672B2 (ja) * 2012-11-05 2017-01-11 株式会社ニューフレアテクノロジー 荷電粒子ビーム描画装置及び荷電粒子ビーム描画方法
JP6087154B2 (ja) * 2013-01-18 2017-03-01 株式会社ニューフレアテクノロジー 荷電粒子ビーム描画装置、試料面へのビーム入射角調整方法、および荷電粒子ビーム描画方法
JP2014175573A (ja) * 2013-03-12 2014-09-22 Nuflare Technology Inc 荷電粒子ビーム描画装置、アパーチャユニット及び荷電粒子ビーム描画方法
CN116500711B (zh) * 2023-04-14 2024-04-26 同济大学 一种具备自溯源角度的二维光栅标准物质及其制备方法

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US3573849A (en) 1969-02-04 1971-04-06 Bell Telephone Labor Inc Pattern generating apparatus
US3900737A (en) 1974-04-18 1975-08-19 Bell Telephone Labor Inc Electron beam exposure system
US4213053A (en) 1978-11-13 1980-07-15 International Business Machines Corporation Electron beam system with character projection capability
US4243866A (en) 1979-01-11 1981-01-06 International Business Machines Corporation Method and apparatus for forming a variable size electron beam
US4469950A (en) 1982-03-04 1984-09-04 Varian Associates, Inc. Charged particle beam exposure system utilizing variable line scan
EP0166549A2 (fr) 1984-06-21 1986-01-02 Varian Associates, Inc. Méthode de correction des effets de proximité dans les systèmes de lithographie par faisceau d'électrons
US4698509A (en) 1985-02-14 1987-10-06 Varian Associates, Inc. High speed pattern generator for electron beam lithography
US4806921A (en) 1985-10-04 1989-02-21 Ateq Corporation Rasterizer for pattern generator
JPS6489433A (en) * 1987-09-30 1989-04-03 Toshiba Corp Resist-pattern forming method
US4879605A (en) 1988-02-29 1989-11-07 Ateq Corporation Rasterization system utilizing an overlay of bit-mapped low address resolution databases
JPH03216942A (ja) * 1990-01-23 1991-09-24 Anelva Corp 荷電ビーム装置とその軸合せ方法
US5455427A (en) 1993-04-28 1995-10-03 Lepton, Inc. Lithographic electron-beam exposure apparatus and methods
US5393987A (en) 1993-05-28 1995-02-28 Etec Systems, Inc. Dose modulation and pixel deflection for raster scan lithography
JPH0714537A (ja) * 1993-06-22 1995-01-17 Hitachi Ltd 走査型電子顕微鏡による計測方法
JPH0915833A (ja) * 1995-06-30 1997-01-17 Sony Corp 露光用マスク作製装置における走査用データ作成装置及び走査用データの作成方法
GB2308916B (en) * 1996-01-05 2000-11-22 Leica Lithography Systems Ltd Electron beam pattern-writing column
JPH1074690A (ja) * 1996-08-30 1998-03-17 Sony Corp 電子ビーム描画方法
US5847959A (en) 1997-01-28 1998-12-08 Etec Systems, Inc. Method and apparatus for run-time correction of proximity effects in pattern generation
US5876902A (en) 1997-01-28 1999-03-02 Etec Systems, Inc. Raster shaped beam writing strategy system and method for pattern generation
US5920073A (en) * 1997-04-22 1999-07-06 Schlumberger Technologies, Inc. Optical system
JP4208283B2 (ja) * 1998-03-23 2009-01-14 株式会社東芝 荷電ビーム描画装置

Also Published As

Publication number Publication date
JP2002534794A (ja) 2002-10-15
DE69937824D1 (de) 2008-02-07
EP1070335A1 (fr) 2001-01-24
WO2000041209A1 (fr) 2000-07-13
CA2322966A1 (fr) 2000-07-13
DE69937824T2 (de) 2008-12-11
KR20010052200A (ko) 2001-06-25
KR100416131B1 (ko) 2004-01-31
US6262429B1 (en) 2001-07-17
EP1070335B1 (fr) 2007-12-26

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