HU192083B - Testing probe for testing printed wiring and printed circuit panels - Google Patents
Testing probe for testing printed wiring and printed circuit panels Download PDFInfo
- Publication number
- HU192083B HU192083B HU844408A HU440884A HU192083B HU 192083 B HU192083 B HU 192083B HU 844408 A HU844408 A HU 844408A HU 440884 A HU440884 A HU 440884A HU 192083 B HU192083 B HU 192083B
- Authority
- HU
- Hungary
- Prior art keywords
- needle
- spring
- stem
- probe
- test probe
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/50—Fixed connections
- H01R12/51—Fixed connections for rigid printed circuits or like structures
- H01R12/55—Fixed connections for rigid printed circuits or like structures characterised by the terminals
- H01R12/58—Fixed connections for rigid printed circuits or like structures characterised by the terminals terminals for insertion into holes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
HU844408A HU192083B (en) | 1984-11-29 | 1984-11-29 | Testing probe for testing printed wiring and printed circuit panels |
DE19853518626 DE3518626A1 (de) | 1984-11-29 | 1985-05-23 | Pruefsonde zur kontrolle von leiterplatten |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
HU844408A HU192083B (en) | 1984-11-29 | 1984-11-29 | Testing probe for testing printed wiring and printed circuit panels |
Publications (2)
Publication Number | Publication Date |
---|---|
HUT38731A HUT38731A (en) | 1986-06-30 |
HU192083B true HU192083B (en) | 1987-05-28 |
Family
ID=10967886
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HU844408A HU192083B (en) | 1984-11-29 | 1984-11-29 | Testing probe for testing printed wiring and printed circuit panels |
Country Status (2)
Country | Link |
---|---|
DE (1) | DE3518626A1 (fr) |
HU (1) | HU192083B (fr) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3832410C2 (de) * | 1987-10-09 | 1994-07-28 | Feinmetall Gmbh | Kontaktvorrichtung |
DE69212195T2 (de) * | 1991-04-11 | 1996-12-19 | Methode Electronics Inc | Gerät zum elektronischen Testen von gedruckten Leiterplatten oder ähnlichem |
DE19511565A1 (de) * | 1995-03-29 | 1996-10-02 | Atg Test Systems Gmbh | Prüfadapter |
CN106645830B (zh) * | 2016-11-30 | 2023-07-14 | 元启工业技术有限公司 | 一种偏心头定位探针针板装置 |
CN109188033A (zh) * | 2018-10-15 | 2019-01-11 | 东莞市盈之宝电子科技有限公司 | 一种新式探针 |
DE102020213296A1 (de) * | 2020-10-21 | 2022-04-21 | Leoni Bordnetz-Systeme Gmbh | Elektroverbindung, Isoliergehäuse für eine solche, Verfahren und Werkzeug für ein solches |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3434095A (en) * | 1967-04-17 | 1969-03-18 | Itt | Programming switch |
US3753103A (en) * | 1971-11-17 | 1973-08-14 | Crystal Protronics Ass | Electrical circuit test probe having spring biased probe assembly |
US3805006A (en) * | 1972-10-13 | 1974-04-16 | Gen Motors Corp | Resilient electrical contact assembly |
US4463310A (en) * | 1980-07-11 | 1984-07-31 | Rca Corporation | Apparatus for detecting the presence of components on a printed circuit board |
DE3136896A1 (de) * | 1981-09-17 | 1983-04-14 | Ingun Prüfmittelbau GmbH & Co KG Elektronik, 7750 Konstanz | Vorrichtung zum pruefen einer elektronischen leiterplatte |
-
1984
- 1984-11-29 HU HU844408A patent/HU192083B/hu not_active IP Right Cessation
-
1985
- 1985-05-23 DE DE19853518626 patent/DE3518626A1/de active Granted
Also Published As
Publication number | Publication date |
---|---|
HUT38731A (en) | 1986-06-30 |
DE3518626C2 (fr) | 1991-07-18 |
DE3518626A1 (de) | 1986-05-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
HU90 | Patent valid on 900628 | ||
HMM4 | Cancellation of final prot. due to non-payment of fee |