HK133996A - Adapter for a device for electronic testing of printed circuit boards - Google Patents
Adapter for a device for electronic testing of printed circuit boardsInfo
- Publication number
- HK133996A HK133996A HK133996A HK133996A HK133996A HK 133996 A HK133996 A HK 133996A HK 133996 A HK133996 A HK 133996A HK 133996 A HK133996 A HK 133996A HK 133996 A HK133996 A HK 133996A
- Authority
- HK
- Hong Kong
- Prior art keywords
- circuit boards
- circuit board
- printed circuit
- testing
- adapter
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2805—Bare printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Measuring Leads Or Probes (AREA)
- Monitoring And Testing Of Exchanges (AREA)
- Mounting Of Printed Circuit Boards And The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP87116528A EP0315707B1 (de) | 1987-11-09 | 1987-11-09 | Adapter für eine Vorrichtung zur elektronischen Prüfung von Leiterplatten |
Publications (1)
Publication Number | Publication Date |
---|---|
HK133996A true HK133996A (en) | 1996-08-02 |
Family
ID=8197434
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK133996A HK133996A (en) | 1987-11-09 | 1996-07-25 | Adapter for a device for electronic testing of printed circuit boards |
Country Status (8)
Country | Link |
---|---|
US (1) | US4834659A (ja) |
EP (1) | EP0315707B1 (ja) |
JP (1) | JPH087249B2 (ja) |
AT (1) | ATE75319T1 (ja) |
CA (1) | CA1271565A (ja) |
DE (2) | DE3778548D1 (ja) |
ES (1) | ES2030694T3 (ja) |
HK (1) | HK133996A (ja) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4035978A1 (de) * | 1990-02-16 | 1991-08-22 | Luther Erich | Verfahren und vorrichtung zum laden eines adapters fuer ein leiterplattenpruefgeraet |
EP0508561B1 (en) * | 1991-04-11 | 1996-07-17 | METHODE ELECTRONICS, Inc. | Apparatus for electronically testing printed circuit boards or the like |
DE69109869T2 (de) * | 1991-12-06 | 1995-09-21 | Sigmatech Co Ltd | Apparat zur Inspektion der inneren Schaltung eines Halbleiters. |
DE9401114U1 (de) * | 1994-01-24 | 1995-02-16 | Siemens AG, 80333 München | Anschlußmodul |
US5575076A (en) * | 1994-07-13 | 1996-11-19 | Methode Electronics, Inc. | Circuit board testing fixture with registration plate |
US5898314A (en) * | 1996-02-26 | 1999-04-27 | Delaware Capital Formation, Inc. | Translator fixture with force applying blind pins |
US5939892A (en) * | 1996-04-12 | 1999-08-17 | Methode Electronics, Inc. | Circuit board testing fixture |
DE29616272U1 (de) * | 1996-09-18 | 1998-01-29 | atg test systems GmbH, 97877 Wertheim | Adapter zum Prüfen von elektrischen Leiterplatten |
DE10004974A1 (de) * | 2000-02-04 | 2001-08-09 | Atg Test Systems Gmbh | Adapter zum Prüfen von Leiterplatten und Nadel für einen solchen Adapter |
US9113845B2 (en) * | 2009-01-08 | 2015-08-25 | Given Imaging Ltd. | Device and method for assembling in vivo sensing devices |
DE102009016181A1 (de) | 2009-04-03 | 2010-10-14 | Atg Luther & Maelzer Gmbh | Kontaktierungseinheit für eine Testvorrichtung zum Testen von Leiterplatten |
KR101845652B1 (ko) * | 2017-01-17 | 2018-04-04 | 주식회사 텝스 | 부품 실장된 웨이퍼 테스트를 위한 하이브리드 프로브 카드 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3330522A (en) * | 1965-12-10 | 1967-07-11 | Clevite Corp | Vibration isolating mount |
US3676776A (en) * | 1970-01-19 | 1972-07-11 | Siemens Ag | Testing probe construction |
US3970934A (en) * | 1974-08-12 | 1976-07-20 | Akin Aksu | Printed circuit board testing means |
US4099120A (en) * | 1976-04-19 | 1978-07-04 | Akin Aksu | Probe head for testing printed circuit boards |
DE2933862A1 (de) * | 1979-08-21 | 1981-03-12 | Paul Mang | Vorrichtung zur elektronischen pruefung von leiterplatten. |
US4626776A (en) * | 1984-06-07 | 1986-12-02 | O. B. Test Group, Inc. | Programmable test fixture |
DE3524229A1 (de) * | 1984-07-10 | 1986-01-16 | Ingun Prüfmittelbau GmbH & Co KG Elektronik, 7750 Konstanz | Vorrichtung zum pruefen von pruefpunkten einer elektronischen leiterplatte od. dgl. als pruefling mittels kontaktstiften |
DE3564158D1 (en) * | 1985-09-16 | 1988-09-08 | Mania Gmbh | Device for electronic testing of printed boards or similar devices |
JPS6267469A (ja) * | 1985-09-20 | 1987-03-27 | Kyoei Sangyo Kk | プリント配線板検査機用アダプタ |
DE3539720A1 (de) * | 1985-11-08 | 1987-05-14 | Martin Maelzer | Adapter fuer ein leiterplattenpruefgeraet |
JPS62144078A (ja) * | 1985-12-19 | 1987-06-27 | Hitachi Electronics Eng Co Ltd | 格子変換器 |
JPS62162388A (ja) * | 1986-01-13 | 1987-07-18 | 松下電器産業株式会社 | プリント配線板用検査装置 |
EP0233511A1 (de) * | 1986-01-27 | 1987-08-26 | Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung | Prüfeinrichtung zur Wafer-Prüfung |
-
1987
- 1987-11-09 DE DE8787116528T patent/DE3778548D1/de not_active Expired - Lifetime
- 1987-11-09 EP EP87116528A patent/EP0315707B1/de not_active Expired - Lifetime
- 1987-11-09 ES ES198787116528T patent/ES2030694T3/es not_active Expired - Lifetime
- 1987-11-09 AT AT87116528T patent/ATE75319T1/de not_active IP Right Cessation
-
1988
- 1988-06-16 DE DE8807847U patent/DE8807847U1/de not_active Expired
- 1988-06-30 CA CA000570805A patent/CA1271565A/en not_active Expired - Fee Related
- 1988-06-30 US US07/213,621 patent/US4834659A/en not_active Expired - Lifetime
- 1988-07-06 JP JP63167015A patent/JPH087249B2/ja not_active Expired - Lifetime
-
1996
- 1996-07-25 HK HK133996A patent/HK133996A/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JPH01143977A (ja) | 1989-06-06 |
CA1271565A (en) | 1990-07-10 |
DE3778548D1 (de) | 1992-05-27 |
JPH087249B2 (ja) | 1996-01-29 |
ES2030694T3 (es) | 1992-11-16 |
DE8807847U1 (de) | 1988-08-04 |
US4834659A (en) | 1989-05-30 |
ATE75319T1 (de) | 1992-05-15 |
EP0315707B1 (de) | 1992-04-22 |
EP0315707A1 (de) | 1989-05-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |