AT389175B - Pruefvorrichtung zum pruefen einer an einer druckplatte der vorrichtung auswechselbar angeordneten elektronischen leiterplatte - Google Patents
Pruefvorrichtung zum pruefen einer an einer druckplatte der vorrichtung auswechselbar angeordneten elektronischen leiterplatteInfo
- Publication number
- AT389175B AT389175B AT0198085A AT198085A AT389175B AT 389175 B AT389175 B AT 389175B AT 0198085 A AT0198085 A AT 0198085A AT 198085 A AT198085 A AT 198085A AT 389175 B AT389175 B AT 389175B
- Authority
- AT
- Austria
- Prior art keywords
- replacably
- testing
- circuit board
- electronic circuit
- print plate
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/082—Integration of non-optical monitoring devices, i.e. using non-optical inspection means, e.g. electrical means, mechanical means or X-rays
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
Landscapes
- Engineering & Computer Science (AREA)
- Operations Research (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE8421022 | 1984-07-10 |
Publications (2)
Publication Number | Publication Date |
---|---|
ATA198085A ATA198085A (de) | 1989-03-15 |
AT389175B true AT389175B (de) | 1989-10-25 |
Family
ID=6768839
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT0198085A AT389175B (de) | 1984-07-10 | 1985-07-04 | Pruefvorrichtung zum pruefen einer an einer druckplatte der vorrichtung auswechselbar angeordneten elektronischen leiterplatte |
Country Status (2)
Country | Link |
---|---|
AT (1) | AT389175B (de) |
CH (1) | CH669270A5 (de) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3430834A1 (de) * | 1983-08-23 | 1985-03-07 | Fairchild Camera and Instrument Corp., Mountain View, Calif. | Mehrstufenanschlusssystem unter verwendung auslenkbarer schaltbarer sondenbaugruppen |
-
1985
- 1985-07-02 CH CH2822/85A patent/CH669270A5/de not_active IP Right Cessation
- 1985-07-04 AT AT0198085A patent/AT389175B/de active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3430834A1 (de) * | 1983-08-23 | 1985-03-07 | Fairchild Camera and Instrument Corp., Mountain View, Calif. | Mehrstufenanschlusssystem unter verwendung auslenkbarer schaltbarer sondenbaugruppen |
Also Published As
Publication number | Publication date |
---|---|
ATA198085A (de) | 1989-03-15 |
CH669270A5 (de) | 1989-02-28 |
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