HK1153848A1 - 在高度校準的包裝中具有多個激發能量帶的 系統 - Google Patents
在高度校準的包裝中具有多個激發能量帶的 系統Info
- Publication number
- HK1153848A1 HK1153848A1 HK11108104.3A HK11108104A HK1153848A1 HK 1153848 A1 HK1153848 A1 HK 1153848A1 HK 11108104 A HK11108104 A HK 11108104A HK 1153848 A1 HK1153848 A1 HK 1153848A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- xrf
- excitation energy
- energy bands
- multiple excitation
- highly aligned
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/02—Constructional details
- H05G1/04—Mounting the X-ray tube within a closed housing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/10—Different kinds of radiation or particles
- G01N2223/1003—Different kinds of radiation or particles monochromatic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/315—Accessories, mechanical or electrical features monochromators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/423—Imaging multispectral imaging-multiple energy imaging
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- High Energy & Nuclear Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US3389908P | 2008-03-05 | 2008-03-05 | |
| US3922008P | 2008-03-25 | 2008-03-25 | |
| US4297408P | 2008-04-07 | 2008-04-07 | |
| PCT/US2009/035847 WO2009111454A1 (en) | 2008-03-05 | 2009-03-03 | Xrf system having multiple excitation energy bands in highly aligned package |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| HK1153848A1 true HK1153848A1 (zh) | 2012-04-05 |
Family
ID=41056347
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| HK11108104.3A HK1153848A1 (zh) | 2008-03-05 | 2011-08-04 | 在高度校準的包裝中具有多個激發能量帶的 系統 |
Country Status (8)
| Country | Link |
|---|---|
| US (4) | US8559597B2 (zh) |
| EP (1) | EP2260501B1 (zh) |
| JP (1) | JP5539906B2 (zh) |
| CN (2) | CN101981651B (zh) |
| CA (1) | CA2753990C (zh) |
| HK (1) | HK1153848A1 (zh) |
| MX (1) | MX2010009713A (zh) |
| WO (1) | WO2009111454A1 (zh) |
Families Citing this family (54)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2009111454A1 (en) | 2008-03-05 | 2009-09-11 | X-Ray Optical Systems, Inc | Xrf system having multiple excitation energy bands in highly aligned package |
| JP2012524374A (ja) | 2009-04-16 | 2012-10-11 | エリック・エイチ・シルバー | 単色ｘ線の方法および装置 |
| JP6023187B2 (ja) * | 2011-06-20 | 2016-11-09 | エックス−レイ オプティカル システムズ インコーポレーテッド | 原油および重油内の汚染物質のオンライン監視およびその精製所応用例 |
| JP6084222B2 (ja) | 2011-08-15 | 2017-02-22 | エックス−レイ オプティカル システムズ インコーポレーテッド | 重質試料用の試料粘度／流量制御およびそのｘ線分析応用 |
| US9335280B2 (en) | 2011-10-06 | 2016-05-10 | X-Ray Optical Systems, Inc. | Mobile transport and shielding apparatus for removable x-ray analyzer |
| JP6139543B2 (ja) * | 2011-10-26 | 2017-05-31 | エックス−レイ オプティカル システムズ インコーポレーテッド | Ｘ線分析エンジンおよび分析器のために高度に位置合わせされた単色化ｘ線光学素子および支持構造体 |
| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| WO2013130525A1 (en) | 2012-02-28 | 2013-09-06 | X-Ray Optical Systems, Inc. | X-ray analyzer having multiple excitation energy bands produced using multi-material x-ray tube anodes and monochromating optics |
| GB2515468A (en) * | 2013-05-24 | 2014-12-31 | Torr Scient Ltd | X-ray source |
| US9883793B2 (en) | 2013-08-23 | 2018-02-06 | The Schepens Eye Research Institute, Inc. | Spatial modeling of visual fields |
| US9390881B2 (en) | 2013-09-19 | 2016-07-12 | Sigray, Inc. | X-ray sources using linear accumulation |
| US10269528B2 (en) | 2013-09-19 | 2019-04-23 | Sigray, Inc. | Diverging X-ray sources using linear accumulation |
| US10297359B2 (en) | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
| US9570265B1 (en) | 2013-12-05 | 2017-02-14 | Sigray, Inc. | X-ray fluorescence system with high flux and high flux density |
| US9449781B2 (en) | 2013-12-05 | 2016-09-20 | Sigray, Inc. | X-ray illuminators with high flux and high flux density |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| US9448190B2 (en) | 2014-06-06 | 2016-09-20 | Sigray, Inc. | High brightness X-ray absorption spectroscopy system |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
| US9823203B2 (en) | 2014-02-28 | 2017-11-21 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
| US9594036B2 (en) | 2014-02-28 | 2017-03-14 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
| US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
| US20150369758A1 (en) * | 2014-06-24 | 2015-12-24 | Eric H. Silver | Methods and apparatus for determining information regarding chemical composition using x-ray radiation |
| DE102014015974B4 (de) * | 2014-10-31 | 2021-11-11 | Baker Hughes Digital Solutions Gmbh | Anschlusskabel zur Verminderung von überschlagsbedingten transienten elektrischen Signalen zwischen der Beschleunigungsstrecke einer Röntgenröhre sowie einer Hochspannungsquelle |
| JP6069609B2 (ja) * | 2015-03-26 | 2017-02-01 | 株式会社リガク | 二重湾曲ｘ線集光素子およびその構成体、二重湾曲ｘ線分光素子およびその構成体の製造方法 |
| US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
| US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
| US9966161B2 (en) * | 2015-09-21 | 2018-05-08 | Uchicago Argonne, Llc | Mechanical design of thin-film diamond crystal mounting apparatus with optimized thermal contact and crystal strain for coherence preservation x-ray optics |
| US10677744B1 (en) * | 2016-06-03 | 2020-06-09 | U.S. Department Of Energy | Multi-cone x-ray imaging Bragg crystal spectrometer |
| US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
| EP3364421B1 (en) * | 2017-02-17 | 2019-04-03 | Rigaku Corporation | X-ray optical device |
| WO2018175570A1 (en) | 2017-03-22 | 2018-09-27 | Sigray, Inc. | Method of performing x-ray spectroscopy and x-ray absorption spectrometer system |
| KR20240055138A (ko) | 2017-05-19 | 2024-04-26 | 이매진 싸이언티픽, 인크. | 단색 엑스선 영상 시스템 및 방법 |
| US10818467B2 (en) | 2018-02-09 | 2020-10-27 | Imagine Scientific, Inc. | Monochromatic x-ray imaging systems and methods |
| AU2019218240B2 (en) | 2018-02-09 | 2024-09-19 | Imagine Scientific, Inc. | Monochromatic x-ray imaging systems and methods |
| US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
| US10845491B2 (en) | 2018-06-04 | 2020-11-24 | Sigray, Inc. | Energy-resolving x-ray detection system |
| GB2591630B (en) | 2018-07-26 | 2023-05-24 | Sigray Inc | High brightness x-ray reflection source |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| CN112638261A (zh) | 2018-09-04 | 2021-04-09 | 斯格瑞公司 | 利用滤波的x射线荧光的系统和方法 |
| US11056308B2 (en) | 2018-09-07 | 2021-07-06 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| WO2020056281A1 (en) | 2018-09-14 | 2020-03-19 | Imagine Scientific, Inc. | Monochromatic x-ray component systems and methods |
| CN114729907B (zh) | 2019-09-03 | 2023-05-23 | 斯格瑞公司 | 用于计算机层析x射线荧光成像的系统和方法 |
| WO2021118773A1 (en) | 2019-12-13 | 2021-06-17 | Schlumberger Technology Corporation | Measurement of metal or alloy coating |
| WO2021118966A1 (en) | 2019-12-13 | 2021-06-17 | Schlumberger Technology Corporation | Measurement of thickness of scale or corrosion |
| US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
| WO2021162947A1 (en) | 2020-02-10 | 2021-08-19 | Sigray, Inc. | X-ray mirror optics with multiple hyperboloidal / hyperbolic surface profiles |
| CN115667896B (zh) | 2020-05-18 | 2024-06-21 | 斯格瑞公司 | 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法 |
| JP2023542674A (ja) | 2020-09-17 | 2023-10-11 | シグレイ、インコーポレイテッド | Ｘ線を用いた深さ分解計測および分析のためのシステムおよび方法 |
| US11686692B2 (en) | 2020-12-07 | 2023-06-27 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| CA3166557A1 (en) * | 2021-07-01 | 2023-01-01 | Eclipse Orthopaedics, Llc | Surgical viewing system |
| US11992350B2 (en) | 2022-03-15 | 2024-05-28 | Sigray, Inc. | System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector |
| US11885755B2 (en) | 2022-05-02 | 2024-01-30 | Sigray, Inc. | X-ray sequential array wavelength dispersive spectrometer |
| CN118050387B (zh) * | 2024-04-16 | 2024-07-12 | 安徽吸收谱仪器设备有限公司 | 一种多波段同步扫描的x射线吸收谱装置及实验方法 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CH441200A (de) * | 1963-12-27 | 1967-08-15 | Schloemann Ag | Formgerüst zur Herstellung von Schraubennahtrohren |
| JPH0769477B2 (ja) * | 1990-09-05 | 1995-07-31 | 理学電機工業株式会社 | Ｘ線分光装置 |
| JP2699134B2 (ja) * | 1992-12-03 | 1998-01-19 | 花王株式会社 | 蛍光ｘ線分析方法及びその装置 |
| US6023496A (en) * | 1997-04-30 | 2000-02-08 | Shimadzu Corporation | X-ray fluorescence analyzing apparatus |
| JP3843601B2 (ja) * | 1997-04-30 | 2006-11-08 | 株式会社島津製作所 | 蛍光ｘ線分析装置 |
| JP3059402B2 (ja) * | 1997-07-09 | 2000-07-04 | 理学電機工業株式会社 | 円筒結晶型分光装置とその製造方法 |
| US6014423A (en) * | 1998-02-19 | 2000-01-11 | Osmic, Inc. | Multiple corner Kirkpatrick-Baez beam conditioning optic assembly |
| JP2001194325A (ja) * | 2000-01-06 | 2001-07-19 | Ours Tex Kk | Ｘ線分析装置および方法 |
| JP3498689B2 (ja) * | 2000-07-31 | 2004-02-16 | 株式会社島津製作所 | モノクロ線源励起用モノクロメータ及び蛍光ｘ線分析装置 |
| US6493421B2 (en) * | 2000-10-16 | 2002-12-10 | Advanced X-Ray Technology, Inc. | Apparatus and method for generating a high intensity X-ray beam with a selectable shape and wavelength |
| JP2002195963A (ja) * | 2000-12-25 | 2002-07-10 | Ours Tex Kk | Ｘ線分光装置およびｘ線分析装置 |
| EP1402541B1 (en) * | 2001-06-19 | 2006-08-16 | X-Ray Optical Systems, Inc. | Wavelength dispersive xrf system using focusing optic for excitation and a focusing monochromator for collection |
| CN101183083B (zh) * | 2001-12-04 | 2013-03-20 | X射线光学系统公司 | 用于冷却和电绝缘高压、生热部件的方法和设备 |
| JP2004184314A (ja) * | 2002-12-05 | 2004-07-02 | Mitsubishi Electric Corp | 蛍光ｘ線分析装置 |
| US7317784B2 (en) * | 2006-01-19 | 2008-01-08 | Broker Axs, Inc. | Multiple wavelength X-ray source |
| WO2009111454A1 (en) | 2008-03-05 | 2009-09-11 | X-Ray Optical Systems, Inc | Xrf system having multiple excitation energy bands in highly aligned package |
| US7738630B2 (en) * | 2008-03-05 | 2010-06-15 | X-Ray Optical Systems, Inc. | Highly aligned x-ray optic and source assembly for precision x-ray analysis applications |
-
2009
- 2009-03-03 WO PCT/US2009/035847 patent/WO2009111454A1/en active Application Filing
- 2009-03-03 US US12/920,641 patent/US8559597B2/en active Active
- 2009-03-03 MX MX2010009713A patent/MX2010009713A/es active IP Right Grant
- 2009-03-03 CA CA2753990A patent/CA2753990C/en active Active
- 2009-03-03 CN CN200980111618.2A patent/CN101981651B/zh active Active
- 2009-03-03 JP JP2010549809A patent/JP5539906B2/ja active Active
- 2009-03-03 CN CN201510303481.8A patent/CN105044139B/zh active Active
- 2009-03-03 EP EP09716373.7A patent/EP2260501B1/en active Active
-
2011
- 2011-08-04 HK HK11108104.3A patent/HK1153848A1/zh not_active IP Right Cessation
-
2013
- 2013-10-11 US US14/052,078 patent/US9048001B2/en active Active
-
2015
- 2015-06-01 US US14/727,027 patent/US9343193B2/en active Active
-
2016
- 2016-05-16 US US15/155,575 patent/US20160260514A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| CA2753990A1 (en) | 2009-09-11 |
| EP2260501A4 (en) | 2014-03-19 |
| US20140105363A1 (en) | 2014-04-17 |
| US20150262722A1 (en) | 2015-09-17 |
| CA2753990C (en) | 2017-11-21 |
| EP2260501B1 (en) | 2021-08-25 |
| WO2009111454A1 (en) | 2009-09-11 |
| US8559597B2 (en) | 2013-10-15 |
| CN101981651A (zh) | 2011-02-23 |
| JP5539906B2 (ja) | 2014-07-02 |
| JP2011513751A (ja) | 2011-04-28 |
| CN101981651B (zh) | 2015-07-08 |
| US9343193B2 (en) | 2016-05-17 |
| US20160260514A1 (en) | 2016-09-08 |
| CN105044139B (zh) | 2019-04-23 |
| US20110170666A1 (en) | 2011-07-14 |
| CN105044139A (zh) | 2015-11-11 |
| MX2010009713A (es) | 2011-03-29 |
| EP2260501A1 (en) | 2010-12-15 |
| US9048001B2 (en) | 2015-06-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20230306 |