HK106291A - A logic l.s.i.circuit - Google Patents

A logic l.s.i.circuit

Info

Publication number
HK106291A
HK106291A HK1062/91A HK106291A HK106291A HK 106291 A HK106291 A HK 106291A HK 1062/91 A HK1062/91 A HK 1062/91A HK 106291 A HK106291 A HK 106291A HK 106291 A HK106291 A HK 106291A
Authority
HK
Hong Kong
Prior art keywords
logic
circuit
Prior art date
Application number
HK1062/91A
Other languages
English (en)
Inventor
Masatoshi Kawashima
Makoto Takechi
Hiroshi Odani
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of HK106291A publication Critical patent/HK106291A/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
HK1062/91A 1986-07-23 1991-12-23 A logic l.s.i.circuit HK106291A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61171625A JPS6329276A (ja) 1986-07-23 1986-07-23 論理ｌｓｉ

Publications (1)

Publication Number Publication Date
HK106291A true HK106291A (en) 1992-01-03

Family

ID=15926646

Family Applications (1)

Application Number Title Priority Date Filing Date
HK1062/91A HK106291A (en) 1986-07-23 1991-12-23 A logic l.s.i.circuit

Country Status (5)

Country Link
US (1) US4862068A (xx)
JP (1) JPS6329276A (xx)
GB (1) GB2193330B (xx)
HK (1) HK106291A (xx)
SG (1) SG98091G (xx)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4975595A (en) * 1987-06-12 1990-12-04 National Semiconductor Corporation Scannable register/latch circuit
US5189675A (en) * 1988-06-22 1993-02-23 Kabushiki Kaisha Toshiba Self-diagnostic circuit for logic circuit block
GB2220272B (en) * 1988-06-29 1992-09-30 Texas Instruments Ltd Improvements in or relating to integrated circuits
JPH0654344B2 (ja) * 1988-09-07 1994-07-20 株式会社豊田中央研究所 スキャンパス回路
US5127008A (en) * 1990-01-25 1992-06-30 International Business Machines Corporation Integrated circuit driver inhibit control test method
DE69115338T2 (de) * 1990-04-20 1996-05-09 Texas Instruments Inc Abtasttestschaltung zur Verwendung mit Mehrfrequenzschaltungen
IT1246301B (it) * 1990-10-22 1994-11-17 St Microelectronics Srl Dispositivo di analisi operativa di tipo scan path a singolo clock di scansione e singola fase di uscita per circuito integrato.
USRE36292E (en) * 1990-10-22 1999-09-07 Stmicroelectronics, Inc. Operational analysis device of the scan path type having a single scanning clock and a single output phase for an integrated circuit
US5166604A (en) * 1990-11-13 1992-11-24 Altera Corporation Methods and apparatus for facilitating scan testing of asynchronous logic circuitry
JPH0599993A (ja) * 1991-04-15 1993-04-23 Internatl Business Mach Corp <Ibm> 試験可能な走査ストリングを有する論理回路
US5414714A (en) * 1992-03-26 1995-05-09 Motorola, Inc. Method and apparatus for scan testing an array in a data processing system
JP2748069B2 (ja) * 1992-05-19 1998-05-06 三菱電機株式会社 フリップフロップ回路
JP3247937B2 (ja) * 1992-09-24 2002-01-21 株式会社日立製作所 論理集積回路
DE4318422A1 (de) * 1993-06-03 1994-12-08 Philips Patentverwaltung Integrierte Schaltung mit Registerstufen
US6157210A (en) 1997-10-16 2000-12-05 Altera Corporation Programmable logic device with circuitry for observing programmable logic circuit signals and for preloading programmable logic circuits
US6320387B1 (en) 1998-11-16 2001-11-20 Xerox Corporation Charge measuring instrument for flexible materials
US6519724B1 (en) * 1999-03-22 2003-02-11 Koninklijke Philips Electronics N.V. Communication systems, circuits, circuit systems and methods of operating a circuit
US6275081B1 (en) * 1999-06-02 2001-08-14 Adaptec, Inc. Gated clock flip-flops
JP2001195899A (ja) * 2000-01-06 2001-07-19 Mitsubishi Electric Corp 半導体記憶装置
US6944784B2 (en) * 2001-06-29 2005-09-13 Intel Corporation Flip-flop having multiple clock sources and method therefore
DE10209078A1 (de) * 2002-03-01 2003-09-18 Philips Intellectual Property Integrierter Schaltkreis mit Testschaltung
US7941716B2 (en) * 2005-03-23 2011-05-10 Freescale Semiconductor, Inc. Method for race prevention and a device having race prevention capabilities
US7793180B1 (en) 2006-09-19 2010-09-07 Marvell International Ltd. Scan architecture for full custom blocks
US7975195B1 (en) 2008-08-28 2011-07-05 Marvell International Ltd. Scan architecture for full custom blocks with improved scan latch

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3783254A (en) * 1972-10-16 1974-01-01 Ibm Level sensitive logic system
DE2842750A1 (de) * 1978-09-30 1980-04-10 Ibm Deutschland Verfahren und anordnung zur pruefung von durch monolithisch integrierten halbleiterschaltungen dargestellten sequentiellen schaltungen
DE3029883A1 (de) * 1980-08-07 1982-03-11 Ibm Deutschland Gmbh, 7000 Stuttgart Schieberegister fuer pruef- und test-zwecke
US4357703A (en) * 1980-10-09 1982-11-02 Control Data Corporation Test system for LSI circuits resident on LSI chips
US4493077A (en) * 1982-09-09 1985-01-08 At&T Laboratories Scan testable integrated circuit
US4553236A (en) * 1983-01-25 1985-11-12 Storage Technology Partners System for detecting and correcting errors in a CMOS computer system
JPH07119789B2 (ja) * 1983-02-04 1995-12-20 株式会社日立製作所 半導体集積回路装置及びその診断方法
JPH0772744B2 (ja) * 1984-09-04 1995-08-02 株式会社日立製作所 半導体集積回路装置
EP0228156A3 (en) * 1985-11-07 1989-06-07 Control Data Corporation Test system for vlsi circuits

Also Published As

Publication number Publication date
JPS6329276A (ja) 1988-02-06
US4862068A (en) 1989-08-29
GB2193330B (en) 1990-09-12
GB8716215D0 (en) 1987-08-12
GB2193330A (en) 1988-02-03
SG98091G (en) 1992-01-17

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)