HK1059646A1 - Module for a testing device for testing printed circuit boards. - Google Patents

Module for a testing device for testing printed circuit boards.

Info

Publication number
HK1059646A1
HK1059646A1 HK03109204A HK03109204A HK1059646A1 HK 1059646 A1 HK1059646 A1 HK 1059646A1 HK 03109204 A HK03109204 A HK 03109204A HK 03109204 A HK03109204 A HK 03109204A HK 1059646 A1 HK1059646 A1 HK 1059646A1
Authority
HK
Hong Kong
Prior art keywords
contact points
testing
module
printed circuit
circuit boards
Prior art date
Application number
HK03109204A
Other languages
English (en)
Inventor
Peter Brandt
Volker Goldschmitt
Uwe Rothaug
Eckart Schuhmacher
Original Assignee
Atg Test Systems Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atg Test Systems Gmbh filed Critical Atg Test Systems Gmbh
Publication of HK1059646A1 publication Critical patent/HK1059646A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Mounting Of Printed Circuit Boards And The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
HK03109204A 2000-10-04 2003-12-17 Module for a testing device for testing printed circuit boards. HK1059646A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10049301A DE10049301A1 (de) 2000-10-04 2000-10-04 Modul für eine Prüfvorrichtung zum Testen von Leiterplatten
PCT/EP2001/011265 WO2002031516A1 (de) 2000-10-04 2001-09-28 Modul für eine prüfvorrichtung zum testen von leiterplatten

Publications (1)

Publication Number Publication Date
HK1059646A1 true HK1059646A1 (en) 2004-07-09

Family

ID=7658766

Family Applications (1)

Application Number Title Priority Date Filing Date
HK03109204A HK1059646A1 (en) 2000-10-04 2003-12-17 Module for a testing device for testing printed circuit boards.

Country Status (10)

Country Link
EP (1) EP1322967B1 (ko)
JP (1) JP3924724B2 (ko)
KR (1) KR100523300B1 (ko)
CN (1) CN1241024C (ko)
AT (1) ATE295964T1 (ko)
AU (1) AU2002215000A1 (ko)
DE (2) DE10049301A1 (ko)
HK (1) HK1059646A1 (ko)
TW (1) TWI263059B (ko)
WO (1) WO2002031516A1 (ko)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006059429A1 (de) * 2006-12-15 2008-06-26 Atg Luther & Maelzer Gmbh Modul für eine Prüfvorrichtung zum Testen von Leiterplatten
DE102008006130A1 (de) 2008-01-25 2009-07-30 Atg Luther & Maelzer Gmbh Modul für einen Paralleltester zum Prüfen von Leiterplatten
JP2010112789A (ja) * 2008-11-05 2010-05-20 Yamaha Fine Technologies Co Ltd 電気検査装置
DE102009004555A1 (de) 2009-01-14 2010-09-30 Atg Luther & Maelzer Gmbh Verfahren zum Prüfen von Leiterplatten
DE102009016181A1 (de) * 2009-04-03 2010-10-14 Atg Luther & Maelzer Gmbh Kontaktierungseinheit für eine Testvorrichtung zum Testen von Leiterplatten
DE102011051607A1 (de) 2011-07-06 2013-01-10 Dtg International Gmbh Adapter für eine Prüfvorrichtung und Prüfvorrichtung zum Testen von Leiterplatten
CN102818982B (zh) * 2012-03-20 2014-07-16 昆山鼎鑫电子有限公司 一种分组测试防呆方法
CN103018591A (zh) * 2012-11-27 2013-04-03 胜宏科技（惠州）股份有限公司 一种高精密度线路板电性测试的方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3564408A (en) 1968-08-12 1971-02-16 Bendix Corp Test device for an electrical circuit card
DE3013215A1 (de) 1980-04-03 1981-10-15 Luther & Maelzer Gmbh, 3050 Wunstorf Adapter fuer ein selbstprogrammierbares leiterplattenpruefgeraet
DE3240916C2 (de) 1982-11-05 1985-10-31 Luther, Erich, Ing.(Grad.), 3003 Ronnenberg Vorrichtung zum Prüfen von elektrischen Leiterplatten
DE3340180C1 (de) 1983-11-07 1985-05-15 MANIA Elektronik Automatisation Entwicklung und Gerätebau GmbH Kontaktfeldanordnung fuer ein rechnergesteuertes Leiterplattenpruefgeraet
ATE40603T1 (de) 1985-11-12 1989-02-15 Mania Gmbh Leiterplattenpruefgeraet mit einem kontaktpunktraster erhoehter kontaktpunktdichte.
DE8806064U1 (ko) * 1988-05-06 1989-09-07 Atg Electronic Gmbh, 6980 Wertheim, De
DE19627801C1 (de) * 1996-07-10 1998-03-26 Atg Test Systems Gmbh Vorrichtung zum Prüfen von elektrischen Leiterplatten
DE19718637A1 (de) * 1997-05-02 1998-11-05 Atg Test Systems Gmbh Vorrichtung und Verfahren zum Prüfen von Leiterplatten
CN1219217C (zh) * 1998-11-02 2005-09-14 Atg试验体系两合公司 印刷电路板测试器

Also Published As

Publication number Publication date
JP2004511781A (ja) 2004-04-15
DE50106269D1 (de) 2005-06-23
WO2002031516A1 (de) 2002-04-18
TWI263059B (en) 2006-10-01
CN1241024C (zh) 2006-02-08
AU2002215000A1 (en) 2002-04-22
ATE295964T1 (de) 2005-06-15
KR20030048418A (ko) 2003-06-19
DE10049301A1 (de) 2002-05-02
EP1322967A1 (de) 2003-07-02
CN1461412A (zh) 2003-12-10
JP3924724B2 (ja) 2007-06-06
EP1322967B1 (de) 2005-05-18
KR100523300B1 (ko) 2005-10-24

Similar Documents

Publication Publication Date Title
CA2148106A1 (en) Printed Circuit Board Testing Device with Foil Adapter
DK0920714T4 (da) Elektrisk eller elektronisk apparat
KR20000012090A (en) Assembly having module type jack and radiation diode
MY111967A (en) Apparatus for interconnecting electrical contacts
CA2208477A1 (en) Electrical connector with shielding
ATE380394T1 (de) Parallelgestapelte computermodule hoher dichte
DE69017582D1 (de) Zwischenverbindungsvorrichtung für Leiterplatten.
KR900012516A (ko) 인쇄배선회로장치
SE8903228L (sv) Funktionsenhet
KR950016461A (ko) 기판의 전 에지를 따라 연장한 단자 어레이를 갖는 가요성 배선판 및 가요성 배선판과 회로판간 접속 구조물
HK1059646A1 (en) Module for a testing device for testing printed circuit boards.
DE3479341D1 (en) Adapter for a printed-circuit board testing device
TW200616295A (en) Interface module
TW358885B (en) Apparatus and method for testing non-componented printed circuit boards
MY122960A (en) Method and apparatus for testing electronic devices
DE8807847U1 (ko)
SE9602564L (sv) Kretskortstest
ATE375702T1 (de) Träger für integrierte schaltungen
DK0787992T3 (da) Hus til elektricitetsmåler
ATE399373T1 (de) Kontaktadapter für die kontaktierung einer antennenstruktur eines fahrzeuges
WO2003096777A3 (en) Adapter for surface mount devices to through hole applications
WO2000004585A3 (de) Chipträgeranordnung sowie verfahren zur herstellung einer chipträgeranordnung mit elektrischem test
DE3568085D1 (en) Device for testing printed circuit boards with a grid of contact points of elevated density
TW200625490A (en) Probe card
ATE467250T1 (de) Vorrichtung zum verbinden von übertragungswegen

Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20160928