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Application filed by Mjc Probe IncfiledCriticalMjc Probe Inc
Priority to TW94100577ApriorityCriticalpatent/TWI255521B/en
Application grantedgrantedCritical
Publication of TWI255521BpublicationCriticalpatent/TWI255521B/en
Publication of TW200625490ApublicationCriticalpatent/TW200625490A/en
A probe card is disclosed, which comprises a circuit board, a spacer, at least one jumper board and a pin set. The circuit board has a wiring forbidden zone and a positioning hole. The spacer is disposed at the positioning hole while every jumper board has many electrically connecting points and is connected between the walls of the positioning hole and the spacer. Every electrically connecting point can be used to electrically connect to the circuit board. The pin set has many probes in which the pin set is disposed on the spacer to enable one end of each probe to be electrically connected with the to-be-tested device, while the other end electrically connected with one of the electrical connecting point of the jumper board.