HK1055352A1 - Charge carrier extracting transistor - Google Patents
Charge carrier extracting transistorInfo
- Publication number
- HK1055352A1 HK1055352A1 HK03107593A HK03107593A HK1055352A1 HK 1055352 A1 HK1055352 A1 HK 1055352A1 HK 03107593 A HK03107593 A HK 03107593A HK 03107593 A HK03107593 A HK 03107593A HK 1055352 A1 HK1055352 A1 HK 1055352A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- quantum well
- layer
- source
- inalsb
- substrate
- Prior art date
Links
- 239000002800 charge carrier Substances 0.000 title abstract 2
- 239000000758 substrate Substances 0.000 abstract 3
- 230000004888 barrier function Effects 0.000 abstract 1
- 238000000605 extraction Methods 0.000 abstract 1
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 abstract 1
- 229920006395 saturated elastomer Polymers 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/1025—Channel region of field-effect devices
- H01L29/1029—Channel region of field-effect devices of field-effect transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/778—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface
- H01L29/7782—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface with confinement of carriers by at least two heterojunctions, e.g. DHHEMT, quantum well HEMT, DHMODFET
- H01L29/7783—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface with confinement of carriers by at least two heterojunctions, e.g. DHHEMT, quantum well HEMT, DHMODFET using III-V semiconductor material
- H01L29/7784—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface with confinement of carriers by at least two heterojunctions, e.g. DHHEMT, quantum well HEMT, DHMODFET using III-V semiconductor material with delta or planar doped donor layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/80—Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier
- H01L29/812—Field effect transistors with field effect produced by a PN or other rectifying junction gate, i.e. potential-jump barrier with a Schottky gate
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0012017A GB2362506A (en) | 2000-05-19 | 2000-05-19 | Field effect transistor with an InSb quantum well and minority carrier extraction |
PCT/GB2001/001919 WO2001088995A1 (en) | 2000-05-19 | 2001-05-02 | Charge carrier extracting transistor |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1055352A1 true HK1055352A1 (en) | 2004-01-02 |
Family
ID=9891857
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK03107593A HK1055352A1 (en) | 2000-05-19 | 2003-10-20 | Charge carrier extracting transistor |
Country Status (11)
Country | Link |
---|---|
US (1) | US6770902B2 (de) |
EP (1) | EP1282918B1 (de) |
JP (1) | JP4972267B2 (de) |
KR (1) | KR100801955B1 (de) |
CN (1) | CN1220272C (de) |
AT (1) | ATE515801T1 (de) |
AU (1) | AU5238601A (de) |
CA (1) | CA2406642C (de) |
GB (1) | GB2362506A (de) |
HK (1) | HK1055352A1 (de) |
WO (1) | WO2001088995A1 (de) |
Families Citing this family (32)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB0206572D0 (en) * | 2002-03-20 | 2002-05-01 | Qinetiq Ltd | Field effect transistors |
US6825506B2 (en) * | 2002-11-27 | 2004-11-30 | Intel Corporation | Field effect transistor and method of fabrication |
CN100403549C (zh) * | 2002-12-19 | 2008-07-16 | 松下电器产业株式会社 | 半导体器件及保持电路 |
JP4469139B2 (ja) * | 2003-04-28 | 2010-05-26 | シャープ株式会社 | 化合物半導体fet |
GB0326993D0 (en) | 2003-11-20 | 2003-12-24 | Qinetiq Ltd | Strained semiconductor devices |
US20060086977A1 (en) | 2004-10-25 | 2006-04-27 | Uday Shah | Nonplanar device with thinned lower body portion and method of fabrication |
US20060148182A1 (en) * | 2005-01-03 | 2006-07-06 | Suman Datta | Quantum well transistor using high dielectric constant dielectric layer |
CN101361189B (zh) * | 2005-01-25 | 2011-02-16 | 莫克斯托尼克斯股份有限公司 | 高性能fet器件和方法 |
US7518196B2 (en) | 2005-02-23 | 2009-04-14 | Intel Corporation | Field effect transistor with narrow bandgap source and drain regions and method of fabrication |
AU2006252590A1 (en) * | 2005-05-31 | 2006-12-07 | Mears Technologies, Inc. | Microelectromechanical systems (MEMS) device including a superlattice and associated methods |
US7547637B2 (en) | 2005-06-21 | 2009-06-16 | Intel Corporation | Methods for patterning a semiconductor film |
US9024298B2 (en) * | 2005-07-26 | 2015-05-05 | Xerox Corporation | Encapsulation layer for electronic devices |
US20070090416A1 (en) | 2005-09-28 | 2007-04-26 | Doyle Brian S | CMOS devices with a single work function gate electrode and method of fabrication |
US7485503B2 (en) * | 2005-11-30 | 2009-02-03 | Intel Corporation | Dielectric interface for group III-V semiconductor device |
US8183556B2 (en) | 2005-12-15 | 2012-05-22 | Intel Corporation | Extreme high mobility CMOS logic |
US7534710B2 (en) * | 2005-12-22 | 2009-05-19 | International Business Machines Corporation | Coupled quantum well devices (CQWD) containing two or more direct selective contacts and methods of making same |
US8143646B2 (en) * | 2006-08-02 | 2012-03-27 | Intel Corporation | Stacking fault and twin blocking barrier for integrating III-V on Si |
US7429747B2 (en) * | 2006-11-16 | 2008-09-30 | Intel Corporation | Sb-based CMOS devices |
US8030664B2 (en) * | 2006-12-15 | 2011-10-04 | Samsung Led Co., Ltd. | Light emitting device |
US7713803B2 (en) * | 2007-03-29 | 2010-05-11 | Intel Corporation | Mechanism for forming a remote delta doping layer of a quantum well structure |
US20090218563A1 (en) * | 2008-02-28 | 2009-09-03 | Bruce Alvin Gurney | Novel fabrication of semiconductor quantum well heterostructure devices |
US8362566B2 (en) | 2008-06-23 | 2013-01-29 | Intel Corporation | Stress in trigate devices using complimentary gate fill materials |
WO2010074964A2 (en) * | 2008-12-23 | 2010-07-01 | Intel Corporation | Group iii-v mosfet having metal diffusion regions |
US8093584B2 (en) * | 2008-12-23 | 2012-01-10 | Intel Corporation | Self-aligned replacement metal gate process for QWFET devices |
GB2469448A (en) * | 2009-04-14 | 2010-10-20 | Qinetiq Ltd | Strain Control in Semiconductor Devices |
CN102484077A (zh) * | 2009-09-07 | 2012-05-30 | 住友化学株式会社 | 场效应晶体管、半导体基板、场效应晶体管的制造方法及半导体基板的制造方法 |
US8324661B2 (en) * | 2009-12-23 | 2012-12-04 | Intel Corporation | Quantum well transistors with remote counter doping |
CN102194859B (zh) * | 2010-03-05 | 2013-05-01 | 中国科学院微电子研究所 | 高迁移率ⅲ-ⅴ族半导体mos界面结构 |
CN101982731B (zh) * | 2010-10-21 | 2012-05-23 | 天津大学 | 一种柔性薄膜微波应变传感器 |
CN101995235B (zh) * | 2010-10-21 | 2012-07-18 | 天津大学 | 一种基于微波二极管的动态应变测量装置 |
US8891573B2 (en) | 2012-05-14 | 2014-11-18 | Arizona Board Of Regents | 6.1 angstrom III-V and II-VI semiconductor platform |
CN107968679B (zh) * | 2017-11-20 | 2021-11-05 | 南京艾凯特光电科技有限公司 | 可见光通信装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB8417303D0 (en) * | 1984-07-06 | 1984-08-08 | Secr Defence | Infra-red detector |
US4860064A (en) * | 1987-10-21 | 1989-08-22 | American Telephone And Telegraph Company At&T Bell Laboratories | Transistor comprising a 2-dimensional carrier gas collector situated between emitter and gate |
US5111255A (en) * | 1990-06-05 | 1992-05-05 | At&T Bell Laboratories | Buried channel heterojunction field effect transistor |
JP3298637B2 (ja) * | 1990-11-30 | 2002-07-02 | 横河電機株式会社 | Ab効果素子を用いたa/d変換器 |
GB9100351D0 (en) | 1991-01-08 | 1991-02-20 | Secr Defence | Semiconductor heterostructure device |
JPH04372137A (ja) * | 1991-06-21 | 1992-12-25 | Nec Corp | 電界効果トランジスタ |
GB2331841A (en) | 1997-11-28 | 1999-06-02 | Secr Defence | Field effect transistor |
-
2000
- 2000-05-19 GB GB0012017A patent/GB2362506A/en not_active Withdrawn
-
2001
- 2001-02-05 US US10/258,853 patent/US6770902B2/en not_active Expired - Fee Related
- 2001-05-02 AT AT01925702T patent/ATE515801T1/de not_active IP Right Cessation
- 2001-05-02 WO PCT/GB2001/001919 patent/WO2001088995A1/en active Application Filing
- 2001-05-02 AU AU52386/01A patent/AU5238601A/en not_active Abandoned
- 2001-05-02 KR KR1020027015505A patent/KR100801955B1/ko not_active IP Right Cessation
- 2001-05-02 CA CA2406642A patent/CA2406642C/en not_active Expired - Fee Related
- 2001-05-02 EP EP01925702A patent/EP1282918B1/de not_active Expired - Lifetime
- 2001-05-02 JP JP2001584494A patent/JP4972267B2/ja not_active Expired - Fee Related
- 2001-05-02 CN CNB018096719A patent/CN1220272C/zh not_active Expired - Fee Related
-
2003
- 2003-10-20 HK HK03107593A patent/HK1055352A1/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
GB2362506A (en) | 2001-11-21 |
WO2001088995A1 (en) | 2001-11-22 |
JP4972267B2 (ja) | 2012-07-11 |
CA2406642C (en) | 2012-12-18 |
KR100801955B1 (ko) | 2008-02-12 |
CA2406642A1 (en) | 2001-11-22 |
US20030080332A1 (en) | 2003-05-01 |
JP2003533887A (ja) | 2003-11-11 |
KR20030034072A (ko) | 2003-05-01 |
US6770902B2 (en) | 2004-08-03 |
AU5238601A (en) | 2001-11-26 |
CN1220272C (zh) | 2005-09-21 |
CN1429408A (zh) | 2003-07-09 |
EP1282918A1 (de) | 2003-02-12 |
GB0012017D0 (en) | 2000-07-05 |
EP1282918B1 (de) | 2011-07-06 |
ATE515801T1 (de) | 2011-07-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB0012017D0 (en) | Extracting transistor | |
CN101523607B (zh) | 穿隧式场效应晶体管 | |
TW200707738A (en) | Substrate backgate for trigate FET | |
WO2008041249A8 (en) | Single voltage supply pseudomorphic high electron mobility transistor (phemt) power device and process for manufacturing the same | |
TWI256136B (en) | Insulated gate semiconductor device | |
TW200419803A (en) | Transistors having buried p-type layers beneath the source region and methods of fabricating the same | |
EP2293336A4 (de) | Halbleiterbauelement | |
TW200616095A (en) | Ultra-thin body super-steep retrograde well (SSRW) fet devices | |
CN104201206A (zh) | 一种横向soi功率ldmos器件 | |
TW200625645A (en) | Trench MOSFET and method of manufacturing same | |
TW200603404A (en) | Semiconductor device | |
TW200711057A (en) | SOI device with more immunity from substrate voltage | |
EP1571711A4 (de) | Lateral-kurzkanal-dmos,herstellungsverfahren dafür und halbleiterbauelement | |
US20100171155A1 (en) | Body-biased Silicon-On-Insulator Junction Field-Effect Transistor Having A Fully Depleted Body and Fabrication Method Therefor | |
WO2001047025A8 (en) | Silicon carbide lateral mosfet and method of making the same | |
TW200644258A (en) | Semiconductor device and manufacturing method therefor | |
GB2266183A (en) | Semiconductor device | |
CN105679831B (zh) | 横向扩散场效应晶体管及其制造方法 | |
US20100171154A1 (en) | Silicon-On-Insulator Junction Field-Effect Transistor Having A Fully Depleted Body and Fabrication Method Therefor | |
CN104157687A (zh) | 一种垂直环栅隧穿晶体管及其制备方法 | |
WO2000031776A3 (en) | Lateral thin-film silicon-on-insulator (soi) device having multiple doping profile slopes in the drift region | |
Kim et al. | Silicon-based field-induced band-to-band tunnelling effect transistor | |
TW466770B (en) | Semiconductor device and its manufacturing method | |
CN102148254A (zh) | 深能级杂质电离碰撞晶体管 | |
CA2048675C (en) | Fermi threshold field effect transistor |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20150502 |