HK1046165A1 - Apparatus and method for correcting sensor drift - Google Patents

Apparatus and method for correcting sensor drift

Info

Publication number
HK1046165A1
HK1046165A1 HK02107681A HK02107681A HK1046165A1 HK 1046165 A1 HK1046165 A1 HK 1046165A1 HK 02107681 A HK02107681 A HK 02107681A HK 02107681 A HK02107681 A HK 02107681A HK 1046165 A1 HK1046165 A1 HK 1046165A1
Authority
HK
Hong Kong
Prior art keywords
sensor
zero pressure
sensor drift
nominal zero
calibration
Prior art date
Application number
HK02107681A
Other languages
English (en)
Inventor
James M Harris
Babak Taheri
Errol Arkilic
Original Assignee
Smc Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Smc Corp filed Critical Smc Corp
Publication of HK1046165A1 publication Critical patent/HK1046165A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L27/00—Testing or calibrating of apparatus for measuring fluid pressure
    • G01L27/002—Calibrating, i.e. establishing true relation between transducer output value and value to be measured, zeroing, linearising or span error determination
    • G01L27/005—Apparatus for calibrating pressure sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/008—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00 with calibration coefficients stored in memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/02—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation
    • G01D3/022—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups with provision for altering or correcting the law of variation having an ideal characteristic, map or correction data stored in a digital memory
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • G01L9/02—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning
    • G01L9/06—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning of piezo-resistive devices
    • G01L9/065—Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means by making use of variations in ohmic resistance, e.g. of potentiometers, electric circuits therefor, e.g. bridges, amplifiers or signal conditioning of piezo-resistive devices with temperature compensating means
HK02107681A 1999-02-25 2002-10-23 Apparatus and method for correcting sensor drift HK1046165A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/257,874 US6237394B1 (en) 1999-02-25 1999-02-25 Apparatus and method for correcting drift in a sensor
PCT/US2000/003857 WO2000050848A1 (en) 1999-02-25 2000-02-15 Apparatus and method for correcting sensor drift

Publications (1)

Publication Number Publication Date
HK1046165A1 true HK1046165A1 (en) 2002-12-27

Family

ID=22978149

Family Applications (1)

Application Number Title Priority Date Filing Date
HK02107681A HK1046165A1 (en) 1999-02-25 2002-10-23 Apparatus and method for correcting sensor drift

Country Status (9)

Country Link
US (1) US6237394B1 (xx)
EP (1) EP1163492B1 (xx)
JP (1) JP4898984B2 (xx)
KR (1) KR20020000768A (xx)
CN (1) CN1243954C (xx)
AT (1) ATE409847T1 (xx)
DE (1) DE60040385D1 (xx)
HK (1) HK1046165A1 (xx)
WO (1) WO2000050848A1 (xx)

Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001018508A1 (en) * 1999-09-03 2001-03-15 Siemens Automotive Corporation Calibration for a vehicle seat sensor
US6450005B1 (en) * 2000-12-21 2002-09-17 Honeywell International Inc. Method and apparatus for the calibration and compensation of sensors
US6884296B2 (en) * 2002-08-23 2005-04-26 Micron Technology, Inc. Reactors having gas distributors and methods for depositing materials onto micro-device workpieces
US20040040503A1 (en) * 2002-08-29 2004-03-04 Micron Technology, Inc. Micromachines for delivering precursors and gases for film deposition
US20040040502A1 (en) * 2002-08-29 2004-03-04 Micron Technology, Inc. Micromachines for delivering precursors and gases for film deposition
JP4244652B2 (ja) * 2003-02-13 2009-03-25 株式会社デンソー 内燃機関の排気浄化装置
JP4454964B2 (ja) * 2003-06-09 2010-04-21 東京エレクトロン株式会社 分圧制御システム及び流量制御システム
JP3863505B2 (ja) 2003-06-20 2006-12-27 忠弘 大見 圧力センサ及び圧力制御装置並びに圧力式流量制御装置の自動零点補正装置
US7282239B2 (en) * 2003-09-18 2007-10-16 Micron Technology, Inc. Systems and methods for depositing material onto microfeature workpieces in reaction chambers
US7202696B1 (en) 2003-09-26 2007-04-10 Cypress Semiconductor Corporation Circuit for temperature and beta compensation
US6935156B2 (en) * 2003-09-30 2005-08-30 Rosemount Inc. Characterization of process pressure sensor
US7647886B2 (en) * 2003-10-15 2010-01-19 Micron Technology, Inc. Systems for depositing material onto workpieces in reaction chambers and methods for removing byproducts from reaction chambers
DE10351313A1 (de) * 2003-10-31 2005-05-25 Abb Patent Gmbh Verfahren zur Nullpunktkorrektur eines Messgerätes
US7258892B2 (en) 2003-12-10 2007-08-21 Micron Technology, Inc. Methods and systems for controlling temperature during microfeature workpiece processing, e.g., CVD deposition
DE10357856B4 (de) * 2003-12-11 2008-01-03 Sartorius Ag Messvorrichtung
US7906393B2 (en) 2004-01-28 2011-03-15 Micron Technology, Inc. Methods for forming small-scale capacitor structures
AU2005233983B2 (en) * 2004-04-06 2011-02-17 Tyco Valves & Control, Inc. Field replaceable sensor module and methods of use thereof
US8133554B2 (en) 2004-05-06 2012-03-13 Micron Technology, Inc. Methods for depositing material onto microfeature workpieces in reaction chambers and systems for depositing materials onto microfeature workpieces
US7699932B2 (en) 2004-06-02 2010-04-20 Micron Technology, Inc. Reactors, systems and methods for depositing thin films onto microfeature workpieces
CN100374075C (zh) * 2004-09-22 2008-03-12 合世生医科技股份有限公司 电子血压机自动校正方法及其装置
WO2006108056A1 (en) * 2005-04-05 2006-10-12 The Product Group, Llc Intelligent controller for refrigerating and air conditioning systems
US20060237138A1 (en) * 2005-04-26 2006-10-26 Micron Technology, Inc. Apparatuses and methods for supporting microelectronic devices during plasma-based fabrication processes
CN101365374B (zh) 2005-08-31 2011-11-16 弗吉尼亚大学专利基金委员会 改善连续式葡萄糖传感器的准确度
US7653425B2 (en) 2006-08-09 2010-01-26 Abbott Diabetes Care Inc. Method and system for providing calibration of an analyte sensor in an analyte monitoring system
US9119582B2 (en) 2006-06-30 2015-09-01 Abbott Diabetes Care, Inc. Integrated analyte sensor and infusion device and methods therefor
FR2927700B1 (fr) * 2008-02-18 2010-05-14 Continental Automotive France Procede d'etalonnage d'un capteur de mesure
GB2457660A (en) * 2008-02-19 2009-08-26 Sphere Medical Ltd Methods of calibrating a sensor in a patient monitoring system
CN101859109B (zh) * 2009-04-09 2012-05-30 上海富辉精密电子有限公司 含有压力传感器的设备的控制方法
CN102087123B (zh) * 2009-12-04 2013-05-29 财团法人工业技术研究院 电容式感测组件的校正装置与方法
CN102062209B (zh) * 2010-11-15 2014-01-22 奇瑞汽车股份有限公司 一种用于消除传感器漂移的自适应控制方法及装置
CN103257017B (zh) * 2011-12-29 2015-04-29 中国燃气涡轮研究院 一种传感器温度漂移补偿方法
WO2014052136A1 (en) 2012-09-26 2014-04-03 Abbott Diabetes Care Inc. Method and apparatus for improving lag correction during in vivo measurement of analyte concentration with analyte concentration variability and range data
US9804050B2 (en) * 2013-03-14 2017-10-31 Kulite Semiconductor Products, Inc. Systems and methods for sensor drift compensation
CN105723463B (zh) * 2013-11-13 2018-05-04 弗兰克公司 用于使校准测试流线化的配置文件
US9817780B2 (en) 2013-11-13 2017-11-14 Fluke Corporation Communicator with profiles
US9689770B2 (en) * 2014-07-17 2017-06-27 Infineon Technologies Ag Selfcalibration of capacitive pressure sensors with electrostatic forces
CN104296923B (zh) * 2014-09-22 2017-01-25 广东合微集成电路技术有限公司 一种晶圆级传感器的测试方法
US10598624B2 (en) 2014-10-23 2020-03-24 Abbott Diabetes Care Inc. Electrodes having at least one sensing structure and methods for making and using the same
DE102015001500A1 (de) * 2015-02-05 2016-08-11 Hella Kgaa Hueck & Co. Verfahren zur Kalibration mindestens eines Sensors, insbesondere eines Drucksensors, mit mindestens einer signalleitenden Verbindung zu mindestens einem Signalwandler
CN107543654B (zh) * 2016-06-27 2020-02-11 北京北方华创微电子装备有限公司 获取压力规的误差值的方法和装置、压力控制方法和系统
JP6748000B2 (ja) * 2017-02-08 2020-08-26 アズビル株式会社 圧力センサ
FI128841B (en) * 2018-03-22 2021-01-15 Univ Helsinki Sensor calibration
EP3640600B1 (en) 2018-10-16 2023-03-29 Infineon Technologies AG Device and method for self-correcting a sensed physical parameter in a drone or unmanned aerial vehicle
CN109738116B (zh) * 2018-12-20 2023-09-22 苏州能斯达电子科技有限公司 一种柔性压力传感器的校准方法和装置
CA3153895A1 (en) * 2019-10-22 2021-04-29 Benjamin S. Rogers Methods of operating and calibrating a gas sensor, and related gas sensors
CN114136537A (zh) * 2021-11-04 2022-03-04 歌尔微电子股份有限公司 压力传感器
CN116481713B (zh) * 2023-06-21 2023-09-08 新光维医疗科技(苏州)股份有限公司 气体输送系统中压力检测电路的校准方法、系统及介质

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7507567A (nl) * 1975-06-25 1976-12-28 Goudsche Machinefabriek Bv Sondeerinrichting voor bodemonderzoek.
US4051712A (en) * 1976-08-20 1977-10-04 National Semiconductor Corporation Pressure transducer auto reference
IL55622A0 (en) * 1978-09-22 1978-12-17 Drori Mordeki Backflushing fluid filter
GB2034992B (en) * 1978-11-17 1983-09-01 Burr Brown Res Corp Analogue-to-digital converter
DE3143061C2 (de) * 1981-10-30 1986-07-24 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Verfahren zur individuellen Bemessung der Länge der Zugstange und des Segmenthebels eines Überdruckmeßgerätes
JPS6072529A (ja) * 1983-09-28 1985-04-24 住友ベークライト株式会社 生体内圧力・温度測定器
JP2579143B2 (ja) * 1984-02-02 1997-02-05 ハネウエル・インコーポレーテッド プロセス変数センサのディジタル補正の方法およびそのためのプロセス変数発信器
JPS61221613A (ja) * 1985-03-27 1986-10-02 Shimadzu Corp 計測装置の零点補正装置
JPH0676044B2 (ja) * 1986-02-18 1994-09-28 住友電気工業株式会社 自動車ブレ−キ用センサの零点ドリフト補正法
JPH0780415B2 (ja) * 1988-03-08 1995-08-30 三菱電機株式会社 サスペンション制御装置
DE4023760C1 (xx) * 1990-07-26 1991-08-29 Alexander Wiegand Gmbh & Co., 8763 Klingenberg, De
US5469750A (en) * 1991-03-05 1995-11-28 Aradigm Corporation Method and apparatus for sensing flow in two directions and automatic calibration thereof
US5287294A (en) * 1991-05-20 1994-02-15 Micro Component Technology, Inc. Apparatus and method for automatically calibrating for temperature an input tray of an integrated circuit handler
US5422478A (en) * 1992-04-17 1995-06-06 Fiberoptic Sensor Technologies, Inc. Fiberoptic pressure sensor having drift correction means for insitu calibration
US5247171A (en) * 1992-04-17 1993-09-21 Fiberoptic Sensor Technologies, Inc. Drift correction for fiberoptic pressure sensors
US5361218A (en) * 1992-08-11 1994-11-01 Itt Corporation Self-calibrating sensor
US5287254A (en) * 1993-01-25 1994-02-15 Solman Richard D Illuminated writing table
CZ269697A3 (cs) * 1995-02-28 1998-06-17 Rosemount Inc. Zařízení pro měření pracovního tlaku
US5668320A (en) * 1995-06-19 1997-09-16 Cardiometrics, Inc. Piezoresistive pressure transducer circuitry accommodating transducer variability
US5551301A (en) * 1995-06-19 1996-09-03 Cardiometrics, Inc. Piezoresistive pressure transducer circuitry accommodating transducer variability

Also Published As

Publication number Publication date
EP1163492B1 (en) 2008-10-01
US6237394B1 (en) 2001-05-29
JP4898984B2 (ja) 2012-03-21
CN1243954C (zh) 2006-03-01
DE60040385D1 (de) 2008-11-13
EP1163492A4 (en) 2004-09-22
EP1163492A1 (en) 2001-12-19
KR20020000768A (ko) 2002-01-05
JP2002538419A (ja) 2002-11-12
CN1348541A (zh) 2002-05-08
WO2000050848A1 (en) 2000-08-31
ATE409847T1 (de) 2008-10-15

Similar Documents

Publication Publication Date Title
HK1046165A1 (en) Apparatus and method for correcting sensor drift
AU7292000A (en) Method of calibrating an analog-to-digital converter, and a calibration equipment
DK1129600T3 (da) Fremgangsmåde til in situ måling og in situ korrektion eller indstilling af en signalbehandlingsproces i et höreapparat med en referencesignalprocessor
MXPA04003217A (es) Sistema de control de suministro hacia delante para un material elastico.
TW200506574A (en) Power factor control device and method therefor
EP0790681A3 (en) External high voltage control for a laser system
CA2063498A1 (en) Respiratory gas pressure booster and control method of same
WO1997046851A3 (en) Method for calibrating a flow measuring system
TW200519558A (en) Method and apparatus for compensating for temperature drift in semiconductor processes and circuitry
EP1026501A3 (en) Gas concentration measuring apparatus compensating for error component of output signal
MY107009A (en) Apparatus and method for a temperature compensation of a catheter tip pressure transducer
DE59604283D1 (de) Verfahren und Schaltung zur Regelung eines Gasbrenners
CA2323659A1 (en) Method and system for suppressing a voltage fluctuation in a power system
HK1072357A1 (en) Stoma measuring device
AU3877999A (en) Method and apparatus for calibrating a non-contact gauging sensor with respect to an external coordinate system
WO2001050304A8 (en) Method and apparatus for mapping sources and uses of consumer funds
WO2003106945A3 (en) DEVICE AND METHOD FOR OUTPUT OF COMPENSATION PROBE
WO2006065306A3 (en) System, method and semiconductor device for charging a secondary battery
EP1047103A3 (en) ION implant dose control
WO2002050497A3 (en) Method and apparatus for the calibration and compensation of sensors
NO20012302D0 (no) Fremgangsmåte og apparat for automatisk forsterkningsstyring
EP0672898A3 (en) Semiconductor pressure transducer with polysilicon membrane and single crystal strain gauges and manufacturing process therefor.
AU2001288461A1 (en) Power amplifier saturation detection and compensation
IL144416A (en) Oscillator using calibration means
TW200622572A (en) A method of and system for regulating a power supply

Legal Events

Date Code Title Description
PE Patent expired

Effective date: 20200214