HK1045602B - 高溫應用碳化硅場效應晶體管及其使用和製造方法 - Google Patents
高溫應用碳化硅場效應晶體管及其使用和製造方法Info
- Publication number
- HK1045602B HK1045602B HK02107060.8A HK02107060A HK1045602B HK 1045602 B HK1045602 B HK 1045602B HK 02107060 A HK02107060 A HK 02107060A HK 1045602 B HK1045602 B HK 1045602B
- Authority
- HK
- Hong Kong
- Prior art keywords
- transistor
- sic
- high temperature
- field effect
- temperature application
- Prior art date
Links
- 230000005669 field effect Effects 0.000 title abstract 2
- 238000004519 manufacturing process Methods 0.000 title 1
- 230000005684 electric field Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/0843—Source or drain regions of field-effect devices
- H01L29/0847—Source or drain regions of field-effect devices of field-effect transistors with insulated gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/403—Cells and electrode assemblies
- G01N27/414—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/403—Cells and electrode assemblies
- G01N27/414—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
- G01N27/4141—Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS specially adapted for gases
- G01N27/4143—Air gap between gate and channel, i.e. suspended gate [SG] FETs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/0445—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising crystalline silicon carbide
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66053—Multistep manufacturing processes of devices having a semiconductor body comprising crystalline silicon carbide
- H01L29/66068—Multistep manufacturing processes of devices having a semiconductor body comprising crystalline silicon carbide the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7827—Vertical transistors
- H01L29/7828—Vertical transistors without inversion channel, e.g. vertical ACCUFETs, normally-on vertical MISFETs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/7838—Field effect transistors with field effect produced by an insulated gate without inversion channel, e.g. buried channel lateral MISFETs, normally-on lateral MISFETs, depletion-mode lateral MISFETs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/0603—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions
- H01L29/0607—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration
- H01L29/0611—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse biased devices
- H01L29/0615—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse biased devices by the doping profile or the shape or the arrangement of the PN junction, or with supplementary regions, e.g. junction termination extension [JTE]
- H01L29/0619—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by particular constructional design considerations, e.g. for preventing surface leakage, for controlling electric field concentration or for internal isolations regions for preventing surface leakage or controlling electric field concentration for increasing or controlling the breakdown voltage of reverse biased devices by the doping profile or the shape or the arrangement of the PN junction, or with supplementary regions, e.g. junction termination extension [JTE] with a supplementary region doped oppositely to or in rectifying contact with the semiconductor containing or contacting region, e.g. guard rings with PN or Schottky junction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/16—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System
- H01L29/1608—Silicon carbide
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Pathology (AREA)
- Electrochemistry (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Molecular Biology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
- Junction Field-Effect Transistors (AREA)
- Thermistors And Varistors (AREA)
- Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9901440A SE9901440A0 (en) | 1999-04-22 | 1999-04-22 | A field effect transistor of SiC for high temperature application, use of such a transistor and a method for production thereof |
PCT/SE2000/000773 WO2000065660A2 (en) | 1999-04-22 | 2000-04-20 | A FIELD EFFECT TRANSISTOR OF SiC FOR HIGH TEMPERATURE APPLICATION, USE OF SUCH A TRANSISTOR AND A METHOD FOR PRODUCTION THEREOF |
Publications (2)
Publication Number | Publication Date |
---|---|
HK1045602A1 HK1045602A1 (en) | 2002-11-29 |
HK1045602B true HK1045602B (zh) | 2005-09-02 |
Family
ID=20415312
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK02107060.8A HK1045602B (zh) | 1999-04-22 | 2002-09-26 | 高溫應用碳化硅場效應晶體管及其使用和製造方法 |
Country Status (12)
Country | Link |
---|---|
US (1) | US6278133B1 (zh) |
EP (1) | EP1186053B1 (zh) |
JP (1) | JP5433121B2 (zh) |
KR (1) | KR100654010B1 (zh) |
CN (1) | CN1190852C (zh) |
AT (1) | ATE453928T1 (zh) |
AU (1) | AU4634700A (zh) |
CA (1) | CA2370869C (zh) |
DE (1) | DE60043614D1 (zh) |
HK (1) | HK1045602B (zh) |
SE (1) | SE9901440A0 (zh) |
WO (1) | WO2000065660A2 (zh) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5883995A (en) | 1997-05-20 | 1999-03-16 | Adc Telecommunications, Inc. | Fiber connector and adapter |
CN1302558C (zh) * | 2003-03-06 | 2007-02-28 | 北京大学 | 一种场效应晶体管 |
US7053425B2 (en) * | 2003-11-12 | 2006-05-30 | General Electric Company | Gas sensor device |
US7598134B2 (en) | 2004-07-28 | 2009-10-06 | Micron Technology, Inc. | Memory device forming methods |
JP2006269641A (ja) * | 2005-03-23 | 2006-10-05 | National Institute Of Advanced Industrial & Technology | 半導体装置及びその製造方法 |
US20060270053A1 (en) * | 2005-05-26 | 2006-11-30 | General Electric Company | Apparatus, methods, and systems having gas sensor with catalytic gate and variable bias |
JP4571957B2 (ja) * | 2007-03-29 | 2010-10-27 | 関西電力株式会社 | 電力変換装置 |
DE102012211460A1 (de) * | 2012-07-03 | 2014-01-09 | Robert Bosch Gmbh | Gassensor und Verfahren zum Herstellen eines solchen |
KR101229392B1 (ko) * | 2012-09-12 | 2013-02-05 | 주식회사 아이엠헬스케어 | 오믹 접합을 이용하는 fet 기반 바이오 센서 |
KR102046014B1 (ko) * | 2013-03-27 | 2019-12-02 | 인텔렉추얼디스커버리 주식회사 | 하이브리드형 수소센서, 그 제조 방법 및 제어 방법 |
GB2577271A (en) * | 2018-09-19 | 2020-03-25 | Sumitomo Chemical Co | Thin film transistor gas sensor |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4917182A (zh) * | 1972-05-22 | 1974-02-15 | ||
JPS5315773A (en) * | 1976-07-28 | 1978-02-14 | Hitachi Ltd | Mis type semiconductor device and its production |
JPS5832462A (ja) * | 1981-08-21 | 1983-02-25 | Toshiba Corp | 半導体装置 |
US4769338A (en) | 1984-05-14 | 1988-09-06 | Energy Conversion Devices, Inc. | Thin film field effect transistor and method of making same |
JPS63265156A (ja) * | 1987-04-23 | 1988-11-01 | Matsushita Electric Works Ltd | イオンセンサ |
JP2527775B2 (ja) | 1987-12-28 | 1996-08-28 | 三菱電機株式会社 | 電界効果トランジスタ及びその製造方法 |
US5086321A (en) | 1988-06-15 | 1992-02-04 | International Business Machines Corporation | Unpinned oxide-compound semiconductor structures and method of forming same |
US5362975A (en) * | 1992-09-02 | 1994-11-08 | Kobe Steel Usa | Diamond-based chemical sensors |
US5448085A (en) * | 1993-04-05 | 1995-09-05 | The United States Of America As Represented By The Secretary Of The Air Force | Limited current density field effect transistor with buried source and drain |
JP3246189B2 (ja) | 1994-06-28 | 2002-01-15 | 株式会社日立製作所 | 半導体表示装置 |
SE503265C2 (sv) | 1994-09-23 | 1996-04-29 | Forskarpatent Ab | Förfarande och anordning för gasdetektion |
US5698771A (en) * | 1995-03-30 | 1997-12-16 | The United States Of America As Represented By The United States National Aeronautics And Space Administration | Varying potential silicon carbide gas sensor |
JP3385938B2 (ja) * | 1997-03-05 | 2003-03-10 | 株式会社デンソー | 炭化珪素半導体装置及びその製造方法 |
-
1999
- 1999-04-22 SE SE9901440A patent/SE9901440A0/sv not_active Application Discontinuation
- 1999-04-23 US US09/298,116 patent/US6278133B1/en not_active Expired - Lifetime
-
2000
- 2000-04-20 AU AU46347/00A patent/AU4634700A/en not_active Abandoned
- 2000-04-20 CA CA2370869A patent/CA2370869C/en not_active Expired - Lifetime
- 2000-04-20 AT AT00928059T patent/ATE453928T1/de not_active IP Right Cessation
- 2000-04-20 CN CNB008065454A patent/CN1190852C/zh not_active Expired - Fee Related
- 2000-04-20 EP EP00928059A patent/EP1186053B1/en not_active Expired - Lifetime
- 2000-04-20 DE DE60043614T patent/DE60043614D1/de not_active Expired - Lifetime
- 2000-04-20 WO PCT/SE2000/000773 patent/WO2000065660A2/en active IP Right Grant
- 2000-04-20 JP JP2000614508A patent/JP5433121B2/ja not_active Expired - Lifetime
- 2000-04-20 KR KR1020017013472A patent/KR100654010B1/ko active IP Right Grant
-
2002
- 2002-09-26 HK HK02107060.8A patent/HK1045602B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
CA2370869C (en) | 2010-09-21 |
CN1190852C (zh) | 2005-02-23 |
SE9901440A0 (en) | 2000-10-23 |
DE60043614D1 (de) | 2010-02-11 |
ATE453928T1 (de) | 2010-01-15 |
JP5433121B2 (ja) | 2014-03-05 |
HK1045602A1 (en) | 2002-11-29 |
CN1347570A (zh) | 2002-05-01 |
KR100654010B1 (ko) | 2006-12-05 |
WO2000065660A3 (en) | 2001-03-08 |
KR20020002436A (ko) | 2002-01-09 |
JP2002543593A (ja) | 2002-12-17 |
CA2370869A1 (en) | 2000-11-02 |
SE9901440D0 (sv) | 1999-04-22 |
AU4634700A (en) | 2000-11-10 |
US6278133B1 (en) | 2001-08-21 |
EP1186053A2 (en) | 2002-03-13 |
WO2000065660A2 (en) | 2000-11-02 |
EP1186053B1 (en) | 2009-12-30 |
SE9901440L (zh) | 1900-01-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PE | Patent expired |
Effective date: 20200419 |