HK1017823A1 - Method and device for optical exposure - Google Patents

Method and device for optical exposure

Info

Publication number
HK1017823A1
HK1017823A1 HK98114965A HK98114965A HK1017823A1 HK 1017823 A1 HK1017823 A1 HK 1017823A1 HK 98114965 A HK98114965 A HK 98114965A HK 98114965 A HK98114965 A HK 98114965A HK 1017823 A1 HK1017823 A1 HK 1017823A1
Authority
HK
Hong Kong
Prior art keywords
optical exposure
exposure
optical
Prior art date
Application number
HK98114965A
Other languages
English (en)
Inventor
Naomasa Shiraishi
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=16713541&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=HK1017823(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Nikon Corp filed Critical Nikon Corp
Publication of HK1017823A1 publication Critical patent/HK1017823A1/xx

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7088—Alignment mark detection, e.g. TTR, TTL, off-axis detection, array detector, video detection
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
    • G03F7/201—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image characterised by an oblique exposure; characterised by the use of plural sources; characterised by the rotation of the optical device; characterised by a relative movement of the optical device, the light source, the sensitive system or the mask
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
    • G03F7/701—Off-axis setting using an aperture
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70241—Optical aspects of refractive lens systems, i.e. comprising only refractive elements
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/7025—Size or form of projection system aperture, e.g. aperture stops, diaphragms or pupil obscuration; Control thereof
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70308—Optical correction elements, filters or phase plates for manipulating imaging light, e.g. intensity, wavelength, polarisation, phase or image shift

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
HK98114965A 1990-08-21 1998-12-23 Method and device for optical exposure HK1017823A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2218030A JP2995820B2 (ja) 1990-08-21 1990-08-21 露光方法及び方法，並びにデバイス製造方法
PCT/JP1991/001103 WO1992003842A1 (en) 1990-08-21 1991-08-19 Method and device for optical exposure

Publications (1)

Publication Number Publication Date
HK1017823A1 true HK1017823A1 (en) 1999-11-26

Family

ID=16713541

Family Applications (1)

Application Number Title Priority Date Filing Date
HK98114965A HK1017823A1 (en) 1990-08-21 1998-12-23 Method and device for optical exposure

Country Status (6)

Country Link
US (1) US6233041B1 (xx)
EP (2) EP0496891B2 (xx)
JP (1) JP2995820B2 (xx)
DE (1) DE69132110T3 (xx)
HK (1) HK1017823A1 (xx)
WO (1) WO1992003842A1 (xx)

Families Citing this family (72)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6710855B2 (en) 1990-11-15 2004-03-23 Nikon Corporation Projection exposure apparatus and method
US6885433B2 (en) * 1990-11-15 2005-04-26 Nikon Corporation Projection exposure apparatus and method
US6967710B2 (en) * 1990-11-15 2005-11-22 Nikon Corporation Projection exposure apparatus and method
US5719704A (en) 1991-09-11 1998-02-17 Nikon Corporation Projection exposure apparatus
US6897942B2 (en) * 1990-11-15 2005-05-24 Nikon Corporation Projection exposure apparatus and method
JP3200894B2 (ja) 1991-03-05 2001-08-20 株式会社日立製作所 露光方法及びその装置
JP3021134B2 (ja) * 1991-10-11 2000-03-15 日本電信電話株式会社 微細パタン投影露光装置
US6078380A (en) * 1991-10-08 2000-06-20 Nikon Corporation Projection exposure apparatus and method involving variation and correction of light intensity distributions, detection and control of imaging characteristics, and control of exposure
EP0562133B1 (en) * 1992-03-23 1998-02-25 Erland Torbjörn Sandström Method and apparatus for forming an image
US5640284A (en) * 1992-09-11 1997-06-17 Nikon Corporation Optical reflector, illumination optical system, light source system and illumination optical apparatus
US6404482B1 (en) 1992-10-01 2002-06-11 Nikon Corporation Projection exposure method and apparatus
JP3316936B2 (ja) * 1992-10-22 2002-08-19 株式会社ニコン 照明光学装置、露光装置、及び該露光装置を用いた転写方法
JP3316937B2 (ja) * 1992-11-24 2002-08-19 株式会社ニコン 照明光学装置、露光装置、及び該露光装置を用いた転写方法
JPH07135134A (ja) * 1993-06-17 1995-05-23 Nec Corp 縮小投影露光装置
JPH0757993A (ja) * 1993-08-13 1995-03-03 Nikon Corp 投影露光装置
JP2590700B2 (ja) * 1993-09-16 1997-03-12 日本電気株式会社 投影露光装置
JP3395280B2 (ja) * 1993-09-21 2003-04-07 株式会社ニコン 投影露光装置及び方法
KR0153796B1 (ko) * 1993-09-24 1998-11-16 사토 후미오 노광장치 및 노광방법
EP0658810B1 (de) * 1993-12-13 1998-11-25 Carl Zeiss Beleuchtungseinrichtung für ein optisches System mit einem Reticle-Maskierungssystem
JP3368653B2 (ja) * 1994-03-11 2003-01-20 株式会社ニコン 照明方法及び装置、並びに露光方法及び装置
KR950034472A (ko) * 1994-04-06 1995-12-28 가나이 쓰토무 패턴형성방법 및 그것에 사용되는 투영노광장치
US5621500A (en) * 1995-05-25 1997-04-15 Nikon Corporation Method and apparatus for projection exposure
US5712698A (en) * 1996-03-04 1998-01-27 Siemens Aktiengesellschaft Independently controllable shutters and variable area apertures for off axis illumination
TW365652B (en) * 1996-05-08 1999-08-01 Texas Instruments Inc Method and system for improved optical imaging in microlithography
DE69931690T2 (de) 1998-04-08 2007-06-14 Asml Netherlands B.V. Lithographischer Apparat
US6466304B1 (en) 1998-10-22 2002-10-15 Asm Lithography B.V. Illumination device for projection system and method for fabricating
TW587199B (en) 1999-09-29 2004-05-11 Asml Netherlands Bv Lithographic method and apparatus
GB0118306D0 (en) * 2001-07-27 2001-09-19 Isis Innovation Method of,and apparatus for,generating a focussed light beam
JP3950731B2 (ja) * 2002-04-23 2007-08-01 キヤノン株式会社 照明光学系、当該照明光学系を有する露光装置及びデバイス製造方法
JP3950732B2 (ja) * 2002-04-23 2007-08-01 キヤノン株式会社 照明光学系、照明方法及び露光装置
DE10218989A1 (de) * 2002-04-24 2003-11-06 Zeiss Carl Smt Ag Projektionsverfahren und Projektionssystem mit optischer Filterung
US6703625B1 (en) * 2002-12-31 2004-03-09 Intel Corporation Methods and apparatus for off-axis lithographic illumination
US7180576B2 (en) 2003-02-11 2007-02-20 Asml Netherlands B.V. Exposure with intensity balancing to mimic complex illuminator shape
US7471375B2 (en) 2003-02-11 2008-12-30 Asml Netherlands B.V. Correction of optical proximity effects by intensity modulation of an illumination arrangement
KR101163435B1 (ko) * 2003-04-09 2012-07-13 가부시키가이샤 니콘 노광 방법 및 장치, 그리고 디바이스 제조 방법
US6842223B2 (en) 2003-04-11 2005-01-11 Nikon Precision Inc. Enhanced illuminator for use in photolithographic systems
US20040207829A1 (en) * 2003-04-17 2004-10-21 Asml Netherlands, B.V. Illuminator controlled tone reversal printing
TW201834020A (zh) 2003-10-28 2018-09-16 日商尼康股份有限公司 照明光學裝置、曝光裝置、曝光方法以及元件製造方法
TWI512335B (zh) 2003-11-20 2015-12-11 尼康股份有限公司 光束變換元件、光學照明裝置、曝光裝置、以及曝光方法
JP4552428B2 (ja) * 2003-12-02 2010-09-29 株式会社ニコン 照明光学装置、投影露光装置、露光方法及びデバイス製造方法
US7057709B2 (en) * 2003-12-04 2006-06-06 International Business Machines Corporation Printing a mask with maximum possible process window through adjustment of the source distribution
US8270077B2 (en) 2004-01-16 2012-09-18 Carl Zeiss Smt Gmbh Polarization-modulating optical element
US8279524B2 (en) 2004-01-16 2012-10-02 Carl Zeiss Smt Gmbh Polarization-modulating optical element
US20070019179A1 (en) 2004-01-16 2007-01-25 Damian Fiolka Polarization-modulating optical element
TWI395068B (zh) * 2004-01-27 2013-05-01 尼康股份有限公司 光學系統、曝光裝置以及曝光方法
TWI412067B (zh) 2004-02-06 2013-10-11 尼康股份有限公司 偏光變換元件、光學照明裝置、曝光裝置以及曝光方法
US7324280B2 (en) * 2004-05-25 2008-01-29 Asml Holding N.V. Apparatus for providing a pattern of polarization
US7283209B2 (en) * 2004-07-09 2007-10-16 Carl Zeiss Smt Ag Illumination system for microlithography
JP4756380B2 (ja) * 2004-12-17 2011-08-24 株式会社ニコン 露光方法および装置、ならびに電子デバイス製造方法
TWI428700B (zh) * 2005-01-14 2014-03-01 尼康股份有限公司 曝光方法、電子元件製造方法、曝光裝置及照明光學裝置
EP1839037B1 (en) * 2005-01-16 2013-10-30 Stephen C. Baer Single wavelength stimulated emission depletion microscopy
TW200923418A (en) * 2005-01-21 2009-06-01 Nikon Corp Exposure device, exposure method, fabricating method of device, exposure system, information collecting device, and measuring device
US7542013B2 (en) * 2005-01-31 2009-06-02 Asml Holding N.V. System and method for imaging enhancement via calculation of a customized optimal pupil field and illumination mode
JP4488926B2 (ja) 2005-02-21 2010-06-23 株式会社東芝 マスクパターンデータ形成方法、フォトマスク、及び半導体デバイスの製造方法
JP4822022B2 (ja) * 2005-02-25 2011-11-24 株式会社ニコン 露光方法および装置、ならびに電子デバイス製造方法
US7317506B2 (en) 2005-03-29 2008-01-08 Asml Netherlands B.V. Variable illumination source
US7548302B2 (en) 2005-03-29 2009-06-16 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP3232270A3 (en) 2005-05-12 2017-12-13 Nikon Corporation Projection optical system, exposure apparatus, and exposure method
DE102005023714A1 (de) * 2005-05-19 2006-11-23 Carl Zeiss Smt Ag Projektionsmikrolithographieanlage und Verfahren zur Erzielung eines verbesserten Auflösungsvermögens in einer Projektionsmikrolithographieanlage
US7268357B2 (en) * 2005-05-16 2007-09-11 Taiwan Semiconductor Manufacturing Company, Ltd. Immersion lithography apparatus and method
JP5267029B2 (ja) 2007-10-12 2013-08-21 株式会社ニコン 照明光学装置、露光装置及びデバイスの製造方法
US8379187B2 (en) 2007-10-24 2013-02-19 Nikon Corporation Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method
DE102008048660B4 (de) 2008-09-22 2015-06-18 Carl Zeiss Sms Gmbh Verfahren und Vorrichtung zur Vermessung von Strukturen auf Photolithographiemasken
TWI396947B (zh) * 2008-12-03 2013-05-21 Metal Ind Res & Dev Ct No-mask exposure system
US20110037962A1 (en) * 2009-08-17 2011-02-17 Nikon Corporation Polarization converting unit, illumination optical system, exposure apparatus, and device manufacturing method
JP4626719B2 (ja) * 2010-01-14 2011-02-09 株式会社ニコン 照明光学装置、投影露光装置、露光方法及びデバイス製造方法
JP4553066B2 (ja) * 2010-01-14 2010-09-29 株式会社ニコン 偏光変換部材、照明光学装置、投影露光装置、露光方法及びデバイス製造方法
US20110205519A1 (en) * 2010-02-25 2011-08-25 Nikon Corporation Polarization converting unit, illumination optical system, exposure apparatus, and device manufacturing method
DE102010040108A1 (de) * 2010-09-01 2012-03-01 Carl Zeiss Smt Gmbh Obskurationsblende
WO2012123000A1 (en) * 2011-03-15 2012-09-20 Carl Zeiss Smt Gmbh Method of operating a microlithographic projection exposure apparatus
CN112272865B (zh) 2019-03-14 2022-05-27 玛特森技术公司 具有温度不均匀性控制的热处理系统
CN113009788A (zh) * 2021-02-24 2021-06-22 上海华力微电子有限公司 光刻装置

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3639039A (en) 1964-10-22 1972-02-01 Lockheed Aircraft Corp Apparatus utilizing spatial plane filtering for performing optical image enhancement
US3492635A (en) 1966-06-22 1970-01-27 Pan American Petroleum Corp Spatial filtering system wherein different portions of an input object are differenly filtered
US3658420A (en) 1969-12-10 1972-04-25 Bell Telephone Labor Inc Photomask inspection by spatial filtering
US3630598A (en) 1970-01-02 1971-12-28 Xerox Corp Optical demodulation filter
US3729252A (en) 1970-06-05 1973-04-24 Eastman Kodak Co Optical spatial filtering with multiple light sources
DE2116713B2 (de) * 1971-04-06 1974-03-28 Ibm Deutschland Gmbh, 7000 Stuttgart Belichtungsverfahren zum Abbilden sehr fein strukturierter Lichtmuster auf Photolackschichten und dazu geeignete Belichtungsvorrichtung
US4207370A (en) * 1976-08-23 1980-06-10 Lumin Inc. Method of producing contour mapped and pseudo-colored versions of black and white photographs
JPS587123A (ja) 1981-07-06 1983-01-14 Olympus Optical Co Ltd 高解像結像光学系
JPS58147708A (ja) * 1982-02-26 1983-09-02 Nippon Kogaku Kk <Nikon> 照明用光学装置
JPS5983165A (ja) * 1982-11-04 1984-05-14 Hitachi Ltd 照明光源装置
JPS6141150A (ja) 1984-08-02 1986-02-27 Matsushita Electric Ind Co Ltd 露光装置
JPH0682598B2 (ja) * 1984-10-11 1994-10-19 日本電信電話株式会社 投影露光装置
US4828392A (en) 1985-03-13 1989-05-09 Matsushita Electric Industrial Co., Ltd. Exposure apparatus
JPH0722105B2 (ja) 1985-11-08 1995-03-08 株式会社ニコン 投影露光装置
US4854669A (en) 1987-02-27 1989-08-08 Quantum Diagnostics Ltd. Optical image processor with highly selectable modulation transfer function
JP2658051B2 (ja) 1987-05-15 1997-09-30 株式会社ニコン 位置合わせ装置，該装置を用いた投影露光装置及び投影露光方法
US5307207A (en) 1988-03-16 1994-04-26 Nikon Corporation Illuminating optical apparatus
US4947413A (en) 1988-07-26 1990-08-07 At&T Bell Laboratories Resolution doubling lithography technique
JP2699433B2 (ja) 1988-08-12 1998-01-19 株式会社ニコン 投影型露光装置及び投影露光方法
US5121160A (en) 1989-03-09 1992-06-09 Canon Kabushiki Kaisha Exposure method and apparatus
US5638211A (en) * 1990-08-21 1997-06-10 Nikon Corporation Method and apparatus for increasing the resolution power of projection lithography exposure system

Also Published As

Publication number Publication date
US6233041B1 (en) 2001-05-15
EP1128219A2 (en) 2001-08-29
EP0496891A4 (en) 1992-10-28
WO1992003842A1 (en) 1992-03-05
JPH04101148A (ja) 1992-04-02
DE69132110T2 (de) 2000-11-16
JP2995820B2 (ja) 1999-12-27
EP0496891B1 (en) 2000-04-12
EP0496891B2 (en) 2007-11-14
DE69132110T3 (de) 2008-06-12
DE69132110D1 (de) 2000-05-18
EP0496891A1 (en) 1992-08-05
EP1128219A3 (en) 2003-05-14

Similar Documents

Publication Publication Date Title
HK1017823A1 (en) Method and device for optical exposure
GB2242863B (en) Fixing method and device
EP0486316A3 (en) Projection exposure method and apparatus
IL99823A0 (en) Optical inspection method and apparatus
IL96483A0 (en) Optical inspection method and apparatus
GB2249189B (en) Exposure apparatus
EP0503472A3 (en) Exposure apparatus and method
EP0740453A3 (en) Imaging device and method
EP0507487A3 (en) Optical projection exposure method and system using the same
EP0451681A3 (en) Optical apparatus
EP0446076A3 (en) Exposure apparatus
EP0440470A3 (en) Exposure method
GB9006675D0 (en) Optical apparatus
EP0444937A3 (en) Exposure apparatus
GB2248989B (en) Focus sensing apparatus and method
EP0444936A3 (en) Exposure apparatus
GB9020285D0 (en) Optical apparatus
EP0455249A3 (en) Automatic focusing apparatus and method
EP0449180A3 (en) Film exposure apparatus and method of exposure using the same
HU913084D0 (en) Method and device for making documentation
GB2247295B (en) Method and apparatus for positioning components
EP0443106A3 (en) Exposure apparatus
DE69117629D1 (de) Bildänderungsverfahren und -gerät
EP0488418A3 (en) Mirror-following imaging method and device
EP0476694A3 (en) Method and apparatus for thermal developing

Legal Events

Date Code Title Description
PF Patent in force
PE Patent expired

Effective date: 20110818