HK1017080A1 - Front-end architecture for a measurement instrument. - Google Patents

Front-end architecture for a measurement instrument.

Info

Publication number
HK1017080A1
HK1017080A1 HK99102218A HK99102218A HK1017080A1 HK 1017080 A1 HK1017080 A1 HK 1017080A1 HK 99102218 A HK99102218 A HK 99102218A HK 99102218 A HK99102218 A HK 99102218A HK 1017080 A1 HK1017080 A1 HK 1017080A1
Authority
HK
Hong Kong
Prior art keywords
measurement instrument
end architecture
architecture
instrument
measurement
Prior art date
Application number
HK99102218A
Other languages
English (en)
Inventor
Steven D Swift
Original Assignee
Fluke Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fluke Corp filed Critical Fluke Corp
Publication of HK1017080A1 publication Critical patent/HK1017080A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
    • G01R19/2509—Details concerning sampling, digitizing or waveform capturing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
    • G01R15/125—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will for digital multimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2503—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques for measuring voltage only, e.g. digital volt meters (DVM's)
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M3/00—Conversion of analogue values to or from differential modulation
    • H03M3/30—Delta-sigma modulation

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Analogue/Digital Conversion (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
HK99102218A 1997-04-09 1999-05-19 Front-end architecture for a measurement instrument. HK1017080A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/840,086 US5930745A (en) 1997-04-09 1997-04-09 Front-end architecture for a measurement instrument

Publications (1)

Publication Number Publication Date
HK1017080A1 true HK1017080A1 (en) 1999-11-12

Family

ID=25281413

Family Applications (1)

Application Number Title Priority Date Filing Date
HK99102218A HK1017080A1 (en) 1997-04-09 1999-05-19 Front-end architecture for a measurement instrument.

Country Status (7)

Country Link
US (1) US5930745A (xx)
EP (1) EP0871036A3 (xx)
JP (1) JP3565705B2 (xx)
KR (1) KR100300107B1 (xx)
CN (1) CN1159587C (xx)
HK (1) HK1017080A1 (xx)
TW (1) TW358157B (xx)

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US6392402B1 (en) * 1998-07-30 2002-05-21 Fluke Corporation High crest factor rms measurement method
DE19912410A1 (de) * 1999-03-19 2000-10-12 Reinhausen Maschf Scheubeck Meßverfahren für eine Hochspannungsdurchführung und geeignete Meßanordnung
TW483819B (en) * 1999-04-15 2002-04-21 Sulzer Chemtech Ag Method and plant for shaping strip-like films
US6615148B2 (en) * 2000-05-17 2003-09-02 Tektronix, Inc. Streaming distributed test and measurement instrument
ES2192961B1 (es) * 2001-11-19 2005-02-16 Consejo Sup. Investig. Cientificas. Dispositivo y procedimiento para la medida de parametros de señales oscilatorias periodicas.
US6859763B2 (en) 2002-02-15 2005-02-22 General Motors Corporation Technique for computing a measure on an ultrasonic signal having application to identify valve defects in operating engines
US6970118B2 (en) * 2002-08-14 2005-11-29 National Instruments Corporation High-speed high-resolution ADC for precision measurements
US6674379B1 (en) * 2002-09-30 2004-01-06 Koninklijke Philips Electronics N.V. Digital controller with two control paths
JP2005214932A (ja) * 2004-02-02 2005-08-11 Daihen Corp 信号処理装置、この信号処理装置を用いた電圧測定装置及び電流測定装置
TWI233589B (en) * 2004-03-05 2005-06-01 Ind Tech Res Inst Method for text-to-pronunciation conversion capable of increasing the accuracy by re-scoring graphemes likely to be tagged erroneously
US7034517B2 (en) * 2004-03-15 2006-04-25 Fluke Corporation Multimeter with filtered measurement mode
US7162397B2 (en) * 2004-05-07 2007-01-09 Snap-On Incorporated Decoding an alternator output signal
US7072804B2 (en) * 2004-09-28 2006-07-04 Agilent Technologies, Inc. Digital trigger filter for a real time digital oscilloscope
US7896807B2 (en) 2004-10-29 2011-03-01 Worcester Polytechnic Institute Multi-channel electrophysiologic signal data acquisition system on an integrated circuit
WO2007000427A1 (en) * 2005-06-27 2007-01-04 Novo Nordisk A/S User interface for delivery system providing dual setting of parameters
US7610178B2 (en) * 2006-08-02 2009-10-27 Tektronix, Inc. Noise reduction filter for trigger circuit
US7928721B2 (en) * 2007-07-26 2011-04-19 Fluke Corporation Method and apparatus for amplifying a signal and test device using same
US8269481B2 (en) * 2007-08-14 2012-09-18 Fluke Corporation Automatic capture and storage of measurements in digital multimeter
US9347975B2 (en) 2007-08-14 2016-05-24 Fluke Corporation Auto-numbering of measurements in digital multimeter
TWI361281B (en) * 2008-04-17 2012-04-01 Cyrustek Co A measurement unit including an auto switch low-pass filter
US8324902B2 (en) * 2008-09-23 2012-12-04 Aegis Industries, Inc. Stun device testing apparatus and methods
JP5268614B2 (ja) * 2008-12-12 2013-08-21 日置電機株式会社 測定装置
US20120116696A1 (en) * 2009-03-24 2012-05-10 Infinirel Corporation Systems, devices and methods for predicting power electronics failure
CN102714406B (zh) 2010-03-12 2017-04-19 株式会社东芝 控制系统、变量器、保护控制装置以及比特流存储部
US8271235B2 (en) 2010-03-30 2012-09-18 Qualcomm Incorporated Efficient concurrent sampling at different rates
DE102010046437A1 (de) * 2010-06-23 2011-12-29 Rohde & Schwarz Gmbh & Co. Kg Messvorrichtung und Verfahren zur Dezimation eines Datenstroms
JP2012173158A (ja) * 2011-02-22 2012-09-10 Hioki Ee Corp 測定装置
DE102013221394A1 (de) * 2013-10-22 2015-04-23 Rohde & Schwarz Gmbh & Co. Kg Messgerät und Verfahren zur Messung eines Hochfrequenzsignals mit Deembedding
DE102014205683B4 (de) * 2014-02-28 2015-10-22 Rohde & Schwarz Gmbh & Co. Kg Messgerät und Verfahren zum Anzeigen eines Messsignals
US10132842B2 (en) * 2015-04-01 2018-11-20 Eaton Intelligent Power Limited Virtual ground sensing circuit for high impedance voltage sensors
US11860189B2 (en) 2019-12-12 2024-01-02 Innova Electronics Corporation Rotational electrical probe

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JP3106450B2 (ja) * 1993-05-19 2000-11-06 横河電機株式会社 電力測定装置
US5392042A (en) * 1993-08-05 1995-02-21 Martin Marietta Corporation Sigma-delta analog-to-digital converter with filtration having controlled pole-zero locations, and apparatus therefor
US5619202A (en) * 1994-11-22 1997-04-08 Analog Devices, Inc. Variable sample rate ADC
JPH0798336A (ja) * 1993-09-28 1995-04-11 Yokogawa Electric Corp サンプリング式測定装置
JPH07249988A (ja) * 1994-03-11 1995-09-26 Sony Corp アナログ／デジタルコンバータ
US5532944A (en) * 1994-07-28 1996-07-02 Sorrento Electronics, Inc. Multi-channel analysis system and method using digital signal processing
EP0702235A1 (en) * 1994-09-15 1996-03-20 Fluke Corporation Graphical trend display methods and apparatus in a test instrument
US5475651A (en) * 1994-10-18 1995-12-12 The United States Of America As Represented By The Secretary Of The Navy Method for real-time extraction of ocean bottom properties
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US5684850A (en) * 1995-08-14 1997-11-04 William K. Warburton Method and apparatus for digitally based high speed x-ray spectrometer
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US5698984A (en) * 1996-01-30 1997-12-16 Fluke Corporation Adaptive digital filter for improved measurement accuracy in an electronic instrument

Also Published As

Publication number Publication date
EP0871036A2 (en) 1998-10-14
KR19980081216A (ko) 1998-11-25
CN1159587C (zh) 2004-07-28
CN1202623A (zh) 1998-12-23
TW358157B (en) 1999-05-11
KR100300107B1 (ko) 2001-10-27
JPH10319056A (ja) 1998-12-04
EP0871036A3 (en) 1999-03-31
US5930745A (en) 1999-07-27
JP3565705B2 (ja) 2004-09-15

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20090325