GB995387A - Improvements in or relating to electron lens systems - Google Patents

Improvements in or relating to electron lens systems

Info

Publication number
GB995387A
GB995387A GB43081/62A GB4308162A GB995387A GB 995387 A GB995387 A GB 995387A GB 43081/62 A GB43081/62 A GB 43081/62A GB 4308162 A GB4308162 A GB 4308162A GB 995387 A GB995387 A GB 995387A
Authority
GB
United Kingdom
Prior art keywords
electron
lens
electrodes
central
nov
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB43081/62A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Philips Electronics and Pharmaceutical Industries Corp
Original Assignee
Philips Electronics and Pharmaceutical Industries Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronics and Pharmaceutical Industries Corp filed Critical Philips Electronics and Pharmaceutical Industries Corp
Publication of GB995387A publication Critical patent/GB995387A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/58Arrangements for focusing or reflecting ray or beam
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/10Lenses
    • H01J37/14Lenses magnetic
    • H01J37/141Electromagnetic lenses
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/153Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Electron Beam Exposure (AREA)
  • Electron Sources, Ion Sources (AREA)
GB43081/62A 1961-11-15 1962-11-14 Improvements in or relating to electron lens systems Expired GB995387A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US152531A US3100260A (en) 1961-11-15 1961-11-15 Electron lens for reduction of spherical aberration

Publications (1)

Publication Number Publication Date
GB995387A true GB995387A (en) 1965-06-16

Family

ID=22543323

Family Applications (1)

Application Number Title Priority Date Filing Date
GB43081/62A Expired GB995387A (en) 1961-11-15 1962-11-14 Improvements in or relating to electron lens systems

Country Status (6)

Country Link
US (1) US3100260A (de)
CH (1) CH407356A (de)
DE (1) DE1236097B (de)
GB (1) GB995387A (de)
NL (1) NL285301A (de)
SE (1) SE300852B (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3452241A (en) * 1966-09-06 1969-06-24 Rca Corp Electron gun suitable for electron microscope
DE1905937B1 (de) * 1969-02-06 1971-01-14 Corpuscular Forschungs Stiftun Stigmator zur elektrischen Kompensation von Abbildungsfehlern bei elektronenoptischen Systemen mit Hohlstrahlen und Ringblendenden
DE1937482C3 (de) * 1969-07-23 1974-10-10 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V., 3400 Goettingen Mikrostrahlsonde
NL7012387A (de) * 1970-08-21 1972-02-23 Philips Nv
US3996468A (en) * 1972-01-28 1976-12-07 Nasa Electron microscope aperture system
GB1416043A (en) * 1972-01-28 1975-12-03 Nasa Electron microscope aperture system
US4002912A (en) * 1975-12-30 1977-01-11 The United States Of America As Represented By The United States Energy Research And Development Administration Electrostatic lens to focus an ion beam to uniform density
DE2752598C3 (de) * 1977-11-25 1981-10-15 Dr.-Ing. Rudolf Hell Gmbh, 2300 Kiel Verfahren zum Betrieb einer elektromagnetischen fokussierenden elektronen-optischen Linsenanordnung und Linsenanordnung hierfür
JPS5842935B2 (ja) * 1978-04-07 1983-09-22 日本電子株式会社 走査電子顕微鏡等の対物レンズ
AU534599B2 (en) * 1978-08-25 1984-02-09 Commonwealth Scientific And Industrial Research Organisation Cold cathode ion soirce
JPS6091544A (ja) * 1983-10-24 1985-05-22 Anelva Corp オ−ジエ分析装置
US4725736A (en) * 1986-08-11 1988-02-16 Electron Beam Memories Electrostatic electron gun with integrated electron beam deflection and/or stigmating system
JP5097512B2 (ja) * 2006-11-21 2012-12-12 株式会社日立ハイテクノロジーズ 荷電粒子ビーム用軌道補正器、及び荷電粒子ビーム装置
JP5153348B2 (ja) * 2008-01-09 2013-02-27 株式会社日立ハイテクノロジーズ 荷電粒子ビーム軌道補正器及び荷電粒子ビーム装置
JP6747687B2 (ja) * 2014-08-25 2020-08-26 ナショナル ユニヴァーシティー オブ シンガポール 収差補正装置、これを有するデバイス、および荷電粒子の収差を補正するための方法
JP6351196B2 (ja) * 2015-04-27 2018-07-04 国立大学法人名古屋大学 荷電粒子ビーム用電磁レンズの球面収差補正装置
JP7124216B2 (ja) * 2019-05-15 2022-08-23 株式会社日立ハイテク 荷電粒子線装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL192009A (de) * 1953-11-02
NL185815B (nl) * 1954-03-11 Bayer Ag Werkwijze voor het bestrijden van micro-organismen alsmede gevormd voortbrengsel, geheel of ten dele bestaande uit materiaal, dat volgens deze werkwijze behandeld is.

Also Published As

Publication number Publication date
CH407356A (de) 1966-02-15
DE1236097B (de) 1967-03-09
NL285301A (de)
US3100260A (en) 1963-08-06
SE300852B (de) 1968-05-13

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