GB987971A - Process for reducing the dimensions of monocrystalline bodies of semiconductor material - Google Patents
Process for reducing the dimensions of monocrystalline bodies of semiconductor materialInfo
- Publication number
- GB987971A GB987971A GB1112864A GB1112864A GB987971A GB 987971 A GB987971 A GB 987971A GB 1112864 A GB1112864 A GB 1112864A GB 1112864 A GB1112864 A GB 1112864A GB 987971 A GB987971 A GB 987971A
- Authority
- GB
- United Kingdom
- Prior art keywords
- agent
- polishing
- agents
- reduced
- dimensions
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02024—Mirror polishing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F3/00—Brightening metals by chemical means
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F3/00—Brightening metals by chemical means
- C23F3/04—Heavy metals
Abstract
The dimensions of a monocrystalline body of semi-conductor material are reduced by treating in a polishing device in the presence of at least one mechanically active polishing agent and at least one chemically active agent, said agents being supplied and discharged at the same rate. The polishing agent is in the form of fine grains ten times smaller than those of the layer to be reduced. The chemical agent is sodium hydroxide. The bodies are rubbed against a polishing plate. The process may be carried out in stages, progressively reducing the grain size of the mechanically active agent and the concentration of the chemical agent or increasing the viscosity of one of the agents by adding a high viscosity liquid such as glycol, glycerine, paraffin oil or silcone oil.ALSO:The dimensions of a monocrystalline body of semi-conductor material are reduced by treating in a polishing device in the presence of at least one mechanically active polishing agent and at least one chemically active agent, said agents being supplied and discharged at the same rate. The polishing agent is in the form of fine grains ten times smaller than those of the layer to be reduced. The chemical agent is sodium hydroxide. The bodies are rubbed against a polishing plate. The process may be carried out in stages, progressively reducing the grain size of the mechanically active agent and the concentration of the chemical agent or increasing the viscosity of one of the agents by adding a high viscosity liquid such as glycol, glycerine, paraffin oil or silicon oil.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DES84436A DE1219764B (en) | 1963-03-28 | 1963-03-28 | Process for the polishing removal of monocrystalline semiconductor bodies, in particular semiconductor wafers |
Publications (1)
Publication Number | Publication Date |
---|---|
GB987971A true GB987971A (en) | 1965-03-31 |
Family
ID=33151854
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1112864A Expired GB987971A (en) | 1963-03-28 | 1964-03-17 | Process for reducing the dimensions of monocrystalline bodies of semiconductor material |
Country Status (4)
Country | Link |
---|---|
CH (1) | CH440907A (en) |
DE (1) | DE1219764B (en) |
FR (1) | FR1389877A (en) |
GB (1) | GB987971A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112658816A (en) * | 2020-12-27 | 2021-04-16 | 浙江师范大学 | Abrasive flow polishing method with controllable viscosity and device thereof |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1287409B (en) * | 1966-04-21 | 1969-01-16 | Telefunken Patent | Method and device for producing flat surfaces on semiconductor wafers using a pickling liquid |
DE3237235C2 (en) * | 1982-10-07 | 1986-07-10 | Wacker-Chemitronic Gesellschaft für Elektronik-Grundstoffe mbH, 8263 Burghausen | Process for polishing III-V semiconductor surfaces |
-
1963
- 1963-03-28 DE DES84436A patent/DE1219764B/en active Pending
-
1964
- 1964-01-07 CH CH10064A patent/CH440907A/en unknown
- 1964-03-17 GB GB1112864A patent/GB987971A/en not_active Expired
- 1964-03-25 FR FR968650A patent/FR1389877A/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112658816A (en) * | 2020-12-27 | 2021-04-16 | 浙江师范大学 | Abrasive flow polishing method with controllable viscosity and device thereof |
Also Published As
Publication number | Publication date |
---|---|
FR1389877A (en) | 1965-02-19 |
CH440907A (en) | 1967-07-31 |
DE1219764B (en) | 1966-06-23 |
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